Sofics

esd esd protection on-chip esd electrostatic discharge finfet tsmc analog i/o semiconductor 65nm soi cdm hbm serdes peer-reviewed ic design iec 61000-4-2 publication 28nm 7nm reliability ic esd clamp low leakage 16nm mm communication cmos low-cap esd protection charged device model chip design silicon controlled rectifier scr 12nm silicon on insulator iot optical communication eos electrical overstress cold spare overvoltage tolerant open drain hot swap automotive electronics 40nm takecharge rf bluetooth internet of things bcd wifi gps capacitance gprs system level protection component level protection machine model electronics 150ff esd cap hdmi iec 62132 iso 7637-2 load dump pulse dpi powerqubic 8kv hbm body coupled mos patent human body model microelectronics dynamic avalanche iec 61000-4-5 surge 180nm 130nm 90nm scaling moore's law tsmc bcd hebistor high voltage 180nm bcd 250nm bcd transient latch-up dual diode fail safe physics of semiconductor devices 3.3v io high voltage tolerance oip local clamp silicon photonics data center graphcore nfc wireless interface antenna i/o protection n5 analog io workshop leakage reduction gated diode 5v tolerant low cap sofics n16 n12 n7 wireless tsmc 28nm tsmc 7nm bicmos