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IEEE P1500-Compliant Test Wrapper Design For Hierarchical Cores
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10 Tips For Successful Scan Design: Part One: Designfeature
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Overview of The IEEE P1500 Standard: Itc International Test Conference Paper 38.1 988
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The IEEE P1500 Embedded Core Test: Presented by Wei Chen, Wang
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10 Tips For Successful Scan Design: Part Two: Designfeature
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Debugging Simulation Mismatches in Fastscan: by Geir Eide Last Modified: July 03, 2001
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Scan Chain Operation For Stuck at Test
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