NDT Visual Inspection
NDT Visual Inspection
2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Arc strikes
Porosity
TECHNOLOGY
Lack of root
penetration Toe Overlap
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Poor stop/starts
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SWI 3.2
TECHNOLOGY
Cap undercut
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SWI 3.2
TECHNOLOGY
Concave Root
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SWI 3.2
TECHNOLOGY
Burn Through
19 Sep 02
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SWI 3.2
TECHNOLOGY
Crater pipe
Crater cracks
19 Sep 02
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SWI 3.2
TECHNOLOGY
Linear Misalignment
19 Sep 02
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SWI 3.2
19 Sep 02
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SWI 3.2
SO:
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
WELD EXAMINATION
1. Different codes IS LIMITED BY: 3.Problems
and standards with
interpretation
(people see
BS
things
5289
differently)
CLUE
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
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Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
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SWI 3.2
signals
A scan Display
Material Thk
Lamination Defect
0 10 20 30 40 50
CRT Display
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Lamination Defect
0 10 20 30 40 50
CRT Display
19 Sep 02
Lamination detected using a compression probe
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
UT Set
A Scan
Display
Angle Probe
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
initial pulse
defect echo
defect 0 10 20 30 40 50
initial pulse
defect echo
defect 0 10 20 30 40 50
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
V1/A2 Block
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
60 o
50 o
40 o
50 R
0 25 100
25
70o
R
V2 (A4) Block Thickness 12 or 20mm
10
0
R
0 100 200
Advantages Disadvantages
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Instructions
TECHNOLOGY
1. Check each report number against the numbers on the report given.
2. You are required to scrutinise the attached report and submit written
comments on the technical accuracy of each report.
Client/location
TECHNOLOGY
Item number
Weld identification
Specifications/procedures
Operators name/signature/position
Date of test
Equipment used including serial numbers
Inspection sensitivities dB etc
Surface conditions
Attenuation checks/calibrations
Weld geometry as welded etc
Test limitations
Details of any flaws/sizes/sizing methods
Report numbers
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI
SWI3.2
3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Electro-magnet (yoke) DC or AC
19 Sep 02
Copyright © 2003 TWI Ltd Prods DC or AC M.S.Rogers
SWI 3.2
TECHNOLOGY
A crack like
indication
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Alternatively to contrast
inks, fluorescent inks
may be used for greater
sensitivity. These inks
require a UV-A light
source and a darkened
viewing area to inspect
the component
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Advantages Disadvantages
TECHNOLOGY
Client/location
Item number
TECHNOLOGY
Weld identification
Specifications/procedures
Operators name/signature
Date of test
Equipment used including serial numbers
Current used and type e.g AC or DC
Inspection sensitivities pentameters etc
Surface conditions
Consumables, ink, contrast paints etc.
Weld geometry as welded etc
Test limitations
Viewing conditions, details of any flaws present.
19 Sep 02
Report numbers
Copyright © 2003 TWI Ltd M.S.Rogers
SWI
SWI3.2
3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
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SWI 3.2
TECHNOLOGY
Source
10fe16
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Source
10fe16
10fe16
Test specimen
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Density Strip
Density is measured by a
densitometer
7FE12
17
12mm
Minimum Diameter for 2T Hole 0.50mm
Minimum Diameter for 4T Hole 1.00mm
38mm
T
IQI Sensitivity
1 Hole visible = 4T
2 Holes visible = 3T
3 Holes visible = 2T
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
Image Quality Indicators SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Using the same IQI pack 6-12 Din 62, How many IQI
TECHNOLOGY
= 2.0 X 16
100
Film
Film
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Film
Film
IQI’s are placed on the film side
Source outside film outside (multiple exposure)
This technique is intended for pipe diameters
19
over 100mm
Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Identification
Unique identification
EN W10
IQI placing
Pitch marks A B
indicating readable ID
film length MR11
Radiograph
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Film
IQI’s are placed on the source or film side
Source outside film outside (multiple exposure)
A minimum of two exposures
This technique is intended for pipe diameters
19
less than 100mm
Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Elliptical
exposure
Advantages Disadvantages
TECHNOLOGY
Permanent record
Expensive consumables
Little surface preparation
Bulky equipment
Defect identification
Harmful radiation
No material type limitation
Defect require significant
depth in relation to the
Not so reliant upon operator
radiation beam
skill
Slow results
Thin materials
Very little indication of
19 Sep 02
depths
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Client/location
TECHNOLOGY
Item number
Weld identification
Specifications/procedures
Operators name/signature
Date of test
Details of equipment used manual external,
battery internal crawler) including manufactures
name and serial numbers
Tube current and voltage used if applicable
Source type/strength if applicable
Exposure times
Inspection sensitivities IQI and density
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Surface conditions
TECHNOLOGY
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI
SWI3.2
3.2
TECHNOLOGY
Lack of root
penetration
Lack of root
Fusion
Lack of root
fusion with
misalignment
Excessive root
penetration
Concave root
Burn through
Cap undercut
Root undercut
Incomplete
filled groove
Longitudinal
crack
Elongated slag
lines
Lack of sidewall
fusion + slag
Cluster porosity
Cap undercut
Arc strike
Tungsten
inclusions
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Step 3. Clean off penetrant
After sufficient penetration time (dwell time) has be given the
penetrant is removed, care must be taken not to wash any
penetrant out off any defects present
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
TECHNOLOGY
Step 3. Apply developer
After the penetrant has be cleaned sufficiently a thin even
layer of developer is applied. The developer acts as a
contrast against the penetrant and allows for reverse capillary
action to take place
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
Advantages Disadvantages
TECHNOLOGY
Client/location
Item number
TECHNOLOGY
Weld identification
Specifications/procedures
Operators name/signature
Date of test
Lighting conditions
Method of pre-cleaning
Surface conditions
Consumables, penetrant, developer and removers
Both dwell and development times
Weld geometry as welded etc
Test limitations
Details of any flaws present.
19 Sep 02
Report numbers
Copyright © 2003 TWI Ltd M.S.Rogers
SWI 3.2
19 Sep 02
Copyright © 2003 TWI Ltd M.S.Rogers