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Atpg Coverage and Simulation

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Mukul Tanwar
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140 views

Atpg Coverage and Simulation

Uploaded by

Mukul Tanwar
Copyright
© © All Rights Reserved
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
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ATPG COVERAGE & SIMULATION MISMATCH

Topics to be covered:
a. Introduction to fault
b. Fault classes
c. Test coverage reporting
d. Trouble shooting low test coverage
e. Simulation mismatch
FAULT
• A fault is a model that is used with a fault simulator in an attempt to mimic
the logical behavior of the failing circuit.
• Before pattern generation tools get the information for total number of
faults, specific fault types.. Etc.
• Fault sampling : By this we can access only the fraction of total number of
faults.
set_fault_sampling 10 i.e only 10% of total faults are processed.
Fault classes
TESTABLE (TE) FAULTS CLASSIFICATION
• Detected by Implication (DI) : Faults on the scan chain data path are
marked as DI. The chain test patterns will detect these faults.
• Detected by Simulation (DS) : Faults are detected when tool performs
fault simulation of the created test pattern.
• Above marked as Detected faults (DE) :
 (DI+DS)
Possible-Detected (POSDET)
• It includes all faults that fault simulation identifies as possible
detected but not hard detected.
• Posdet_testable (PT): potentially detectable posdet faults
• Posdet_untestable (PU): proven ATPG_untestable and hard
undetectable posdet faults.
ATPG Untestable faults

• It includes all the faults for which ATPG is unable to find a pattern to
create a test.
• Causes :
a. Constraints
b. Non scan cells and insufficient clock sequential depth.
c. black boxes
Undetected faults
• It includes undetected faults that cannot be proven
untestable or ATPG_untestable.
UNTESTABLE (UT) FAULTS CLASSIFICATION
• No patterns exist to detect these faults.
Fault summary :
TEST COVERAGE REPORTING
TROUBLESHOOTING LOW TEST COVERAGE

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