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High Voltage Slides

The document discusses techniques for high voltage testing based on IEEE standards. It covers requirements for test voltage such as frequency and waveform, methods for generating and measuring high voltages using transformers, resonant circuits and voltage dividers, procedures for withstand voltage and breakdown tests, and methods for measuring capacitance and dielectric losses of insulating materials including equivalent circuit models and bridge techniques. Temperature correction factors are also discussed for normalization of measurements.

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33 views

High Voltage Slides

The document discusses techniques for high voltage testing based on IEEE standards. It covers requirements for test voltage such as frequency and waveform, methods for generating and measuring high voltages using transformers, resonant circuits and voltage dividers, procedures for withstand voltage and breakdown tests, and methods for measuring capacitance and dielectric losses of insulating materials including equivalent circuit models and bridge techniques. Temperature correction factors are also discussed for normalization of measurements.

Uploaded by

usama
Copyright
© © All Rights Reserved
Available Formats
Download as PPTX, PDF, TXT or read online on Scribd
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HIGH VOLTAGE

ENGINEERING
IEEE Standard Techniques
for High
Voltage Testing
Presented To:
Engr. Waqas Javed
Presented By:
2012-EE-503
2012-EE-520
2012-EE-521
Tests with alternating
voltage
TEST VOLTAGE REQUIREMENTS
Frequency ( 45 HZ 65HZ )
The voltage wave-shape should approximate a
sinusoid with both half cycles closely alike.
it should have a ratio of peak-to- rms values
equal to the square root of 2 within ±5%.
Generation of the test voltage

Generally supplied by a transformer or a


resonant circuit.
The voltage in the test circuit should be stable
enough to be practically unaffected by varying
leakage currents.
Requirements for the transformer test
circuit
the short-circuit current delivered by the
transformer should be sufficient to maintain
the test voltage within 3% during transient
current pulses or discharges.
Guidelines for achieving this
requirement are
 For dry tests on small samples of solid insulation,
insulating liquids, or combinations of the two, a
short-circuit current on the order of 0.1 A (rms)
to 0.5 A is normally sufficient
 For artificial contamination tests or for tests on
external self-restoring insulation (insulators,
disconnecting switches,etc.),short-circuit currents
above 0.5 A may be required
The high-voltage series
resonant circuit

Consists of an inductor in series with a


capacitive test object.
May consist of a capacitor in series with
an inductive test object.
The parallel resonant circuit

The parallel resonant circuit consists essentially


of a capacitive test object or load in parallel with
a variable inductance and a high-voltage source.
By varying the inductance, the circuit can be
tuned, resulting in a considerable reduction in
the current drawn from the high-voltage source.
Measurement of
the test voltage
• Instrument used with voltage transformer
A voltmeter is connected across the low-
voltage winding of a voltage transformer
• Instrument used with voltage divider
A voltmeter or an oscilloscope is connected
across the low voltage arm of the divider
through a measuring cable.
Capacitor used with a rectifying device
A capacitor in series with a full-wave rectifier is
connected to the points between which the
voltage is to be measured.

𝐼r
Vp = 4𝐶𝑓
Electrostatic voltmeter
An electrostatic voltmeter has two electrodes that
are connected to the points between which the
high voltage is to be measured.
Generating voltmeter
A generating voltmeter is a capacitive device, the
input terminals of which are connected to the
points between which the voltage is to be
measured.
Instrument used with series resistor
An ac measuring instrument is connected in
series with a stable high ohmic value resistor.
Systems for measuring the
amplitude of harmonics
Oscilloscope used with voltage divider
An oscilloscope is connected across the low-
voltage arm of a capacitor voltage divider. This
method is sufficient only if the accuracies of
both the recording and the subsequent analysis
are sufficient to ensure that the requirements
are met.
The method has limited accuracy, especially in
the case of low-amplitude harmonics.
Instrument used with filter
A filter is used to suppress the fundamental
component of the voltage, and the rms value of
the residual harmonics is measured with an
appropriate instrument. Alternatively, but with
less accuracy, the peak value of the combined
harmonics may be measured with an
appropriate instrument.
Wave analyzer used with voltage divider
This system permits separate measurement of
the rms value of the fundamental and each
harmonic.
Measurement with
approved devices
Calibration of a nonapproved
measuring device with an approved
measuring device
The procedure usually consists of establishing a
relationship between the output signal of some
device related to the test voltage and a
measurement of the same voltage performed in
accordance with a sphere gap.
 This relationship may be dependent on
Presence of the test object
The sphere gap
The precipitation in wet tests

The calibration is preferably made at three levels


(approximately 50%, 65%, and 80%) of the test
voltage.
TEST PROCEDURES
Withstand voltage tests
The voltage shall be applied to the test object
starting at a value sufficiently low to prevent any
effect of over-voltages due to switching
transients.
Assured disruptive discharge
voltage tests
The voltage should be raised in the manner
described earlier until a disruptive discharge
occurs on the test object. The value of the test
voltage reached just prior to the disruptive
discharge should be recorded. The requirements
of the test are generally satisfied if this voltage is
not higher than the assured disruptive discharge
voltage on each one of a specified number of
voltage applications.
Capacitance and dielectric
loss measurements

General
Insulating materials are generally used to:
 Support components of a system physically
and, at the same time, insulate them
electrically from each other and from ground
 Act as a dielectric in a capacitor system
• Practical insulating materials are imperfect and
exhibit losses when subjected to high-voltage
stresses.
• Knowledge of these losses is of importance to the
designer and operator of power apparatus in
order to avoid excessive energy dissipation, which
could cause thermal instability leading to
breakdown as a result of dielectric heating
effects.
• The effects of temperature on power factor
are well known for many different types of
power apparatus.
Measurements of power factor at a reference
temperature may be obtained from
measurements at another
temperature by the application of
temperature correction factors.
Temperature Correction Factor
• A temperature correction factor (TCF) is used to
normalize the flowrate.
Example: A system running at 200 GPD @ 35°C
must now be normalized to 25°C.
From table: TCF=1.2894
The flowrate (or flux value) is divided by the TCF
to obtain the normalized flow rate:
Normalized flow = 200 gpd / 1.2894 = 155 gpd @
25°C
Equivalent circuits
Any insulation structure is highly complex and,
for numerical and experimental evaluation of
dielectric losses, simplified equivalent circuits
are normally used. Two equivalent circuits that
are in common use are:
 The parallel equivalent circuit
 The series equivalent circuit
Evaluation of dielectric loss parameters
• and the resistances are
Measurement methods
Dielectric measurements at power frequency
are generally made by means of bridge
measurement techniques.
The two basic types of bridges that are
commonly used are:
Schering Bridge
Transformer Ratio-Arm Bridge
Schering Bridge
At balance, the values of Rp and Cp are:

Rp = R3 (C4 / Cs)
Cp = Cs (R4 / Rs)
δ = 1 / (ω Rp Cp)
Transformer Ratio-Arm Bridge
A special transformer having two ratio windings,
N1 and N2, and a detection winding, D, is used.
Adjustment is accomplished by varying the
number of turns (N1) until the ampere-turn
balance is obtained.
The balance condition results in zero magnetic
flux in the core. The null indicator connected
to the detection winding responds to the net
flux in the core and thus indicates the state of
balance.
At balance, the values of Rp and Cp are:
Rp = (N1/N2)(1/ω2 R2 Cs C2)
Cp = (N1 / N2) (Cs/1+ω2 R22 C22
δ = 1 / (ω Rp Cp)
Or
δ = ω R2 C2
Systems for measuring the
amplitude of alternating
voltages
Measuring Errors
Overstressing of components in measuring
equipment can occur upon flashover of a test
object.
by partial discharges.

Generally caused by residual inductances and


stray capacitances.

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