SPC Training
SPC Training
SPC : INTRODUCTION
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Variation: The Heart of SPC
• That’s our goal with SPC-to reduce the variation in our processes and
then monitor the process to make sure the variation doesn’t increase.
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Continuous Improvement Steps
Among the many tools for quality improvement, the following are the most
commonly used tools of SPC:
Histograms
Cause-and-Effect diagrams
Pareto Diagrams
Control Charts
Scatter or Correlation Diagrams
Run Charts
Process Flow Diagrams
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PARETO CHART EXAMPLE
80
100
Percent
80 60
60 40
40
20
20
0 0
CLAIMS CODE r or k r r r
rro r oc ro ro he
E Er S t Er Er
O t
n s g
tio a le
rom rin oom
duc S F e e R
o ts in k
Pr Pa
r g oc
d En S t
Ba
NUMBER OF CLAIMS 68 29 12 12 12 6
Percent 48.9 20.9 8.6 8.6 8.6 4.3
Cum % 48.9 69.8 78.4 87.1 95.7 100.0
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Cause & Effect Diagram: Interface Defects
DIRTY
CONTACTS
TOO
HIGH/LOW
HEAT FROM
NOT TO MFG. INADEQUATE
SOLDERING CAUSES
SPEC INCOMING INSPECTION
CONTACTS TO MOVE
LACK OF PROPER
IN_PROCESS
BENDING/ INSPECTION TOOLS
TRIMMING
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BASIC STATISTICS
• MEAN
• RANGE
• STANDARD DEVIATION
• PPM
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Set A Set B
Measure 2, 2, 3, 5, 5, 7, 8 2, 3, 3, 4, 6, 7
The Mean Adding the numbers up gives: Adding the numbers up gives:
To find the mean, you 2 + 2 + 3 + 5 + 5 + 7 + 8 = 32 2 + 3 + 3 + 4 + 6 + 7 = 25
need to add up all the There are 7 values, so you divide There are 6 values, so you divide
data, and then divide the total by 7: 32 ÷ 7 = 4.57... the total by 6: 25 ÷ 6 = 4.166...
this total by the number So the mean is 4.57 (2 d.p.) So the mean is 4.17 (2 d.p.)
of values in the data.
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standard deviation is a measure of the variability of a data set. A low
standard deviation indicates that the data points tend to be very close to the
same value (the mean), while high standard deviation indicates that the data
are spread out over a large range of values.
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Implementing Statistical Process Control
1. Determine Measurement Method
The basic issue for the study is the behavior of gauges in a particular
environment with respect to:
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GAUGE R&R FOR AM-40 ANGLE MEASURENT TOOL
131.695 131.97
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Gage R&R Study - XBar/R Method
Study Var %Study Var
Source StdDev (SD) (6 * SD) (%SV)
Total Gage R&R 0.29179 1.7507 11.21(< 20% GOOD)
(Up to 30% Acceptable)
(> 30% Not Acceptable)
Repeatability 0.23493 1.4096 9.03
Reproducibility 0.17305 1.0383 6.65
Part-To-Part 2.58648 15.5189 99.37
Total Variation 2.60288 15.6173 100.00
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3. Initiate Data Collection and SPC Charting
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4. Assess Control.
After establishing control limits, the next step is to assess whether or not the process is
in control (statistically stable over time). This determination is made by observing the
plot point patterns.
When an out-of-control condition occurs, the points should be circled on the chart, and
the reaction plan should be followed.
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zone A = mean +/- 3 sigma
zone B = mean +/- 2 sigma
zone C = mean +/- 1 sigma
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5. Analyze Data to Identify Root Cause and Correct
A single point falls outside the 3 Sigma limit, i.e. beyond Zone 3
Two out of three successive points fall in Zone 3 or beyond, the odd point may be anywhere
Four out of Five successive points fall in Zone 2 or beyond, the odd point may be anywhere
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What is Process Capability?
Process capability compares the output of an in-control process to the
specification limits by using capability indices. The comparison is made by
forming the ratio of the spread between the process specifications (the
specification "width") to the spread of the process values, as measured by 6
process standard deviation units (the process "width").
A capable process is one where almost all the measurements fall inside
the specification limits. This can be represented pictorially by the plot
below:
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% of non
% of products in Non conformance
Range around Mean conforming
conformance out of a million
products
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7. Calculate Cp and Cpk and Compare to Benchmark
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Process Capability : Bending 134 deg. angle
LSL USL
P rocess Data W ithin
LS L 132 O verall
Target *
USL 136 P otential (Within) C apability
S ample M ean 131.843 Cp 0.39
S ample N 40 C PL -0.03
S tDev (Within) 1.70258 C PU 0.81
S tDev (O v erall) 2.36273 C pk -0.03
O v erall C apability
Pp 0.28
PPL -0.02
PPU 0.59
P pk -0.02
C pm *
NOTE: Without Tweaking (reworking), more than 50% of the parts would be rejecyed. 23 OF 28
Process Capability : Marker Cutting
LSL USL
P rocess D ata W ithin
LS L 0.94 Ov erall
Target *
USL 1.06 P otential (Within) C apability
S ample M ean 0.9897 Cp 3.51
S ample N 20 C P L 2.91
S tDev (Within) 0.00569242 C P U 4.12
S tDev (O v erall) 0.00490005 C pk 2.91
O v erall C apability
Pp 4.08
PPL 3.38
PPU 4.78
P pk 3.38
C pm *
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EXAMPLE OF Cpk IMPROVEMENT
LSL USL
P rocess D ata Within
LS L 4.9 Overall
Target *
USL 5.02 P otential (Within) C apability
S ample M ean 5.0134 Cp 2.18
S ample N 20 C P L 4.11
S tDev (Within) 0.00919186 C P U 0.24
S tDev (O v erall) 0.00914445 C pk 0.24
O v erall C apability
Pp 2.19
PPL 4.13
PPU 0.24
P pk 0.24
C pm * Process Capability of After CF
LSL USL
P rocess D ata Within
4.90 4.92 4.94 4.96 4.98 5.00 5.02 LS L 1.44 Ov erall
Target *
O bserv ed P erformance E xp. Within P erformance E xp. O v erall P erformance USL 1.56 P otential (Within) C apability
P P M < LS L 0.00 PPM < LS L 0.00 P P M < LS L 0.00 S ample M ean 1.5109 Cp 7.52
P P M > U S L 300000.00 PPM > U S L 236370.51 P P M > U S L 235224.44 S ample N 30 C P L 8.89
P P M Total 300000.00 PPM Total 236370.51 P P M Total 235224.44 S tDev (Within) 0.00265957 C P U 6.15
S tDev (O v erall) 0.00292846 C pk 6.15
O v erall C apability
Pp 6.83
PPL 8.07
PPU 5.59
P pk 5.59
C pm *
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Process Capability Sixpack of Imterface 7203-1541-021
I Chart Capability Histogram
LSL USL
0.0090 UCL=0.008996
S pecifications
Individual Value
LS L 0.000
_
0.0075 X=0.0075 U S L 0.015
0.0060 LCL=0.006004 0 2 4 6 8 0 2 4
00 .00 . 00 .00 . 00 .01 . 01 .01
1 3 5 7 9 11 13 15 17 19 21 23 25 0. 0 0 0 0 0 0 0
0.001
__
MR=0.000563
0.000 LCL=0
1 3 5 7 9 11 13 15 17 19 21 23 25 0.006 0.007 0.008 0.009
0.0078
Cp 5.01 Pp 5.22
O v erall
C pk 5.01 P pk 5.22
0.0072 C pm *
5 10 15 20 25 S pecs
Observation
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CONCLUSION:
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