Quality and Operations Management: Process Control and Capability Analysis
Quality and Operations Management: Process Control and Capability Analysis
Management
Process Control and Capability Analysis
Process Control
Recognizes that variance exists in all processes
Sources of variation
systematic
assignable
Purpose
to detect and eliminate out-of-control conditions
to return a process to an in-control state
Measuring A Process
Types of measurements
variables data
length, weight, speed, output, etc
discrete values
attributes data
good vs bad, pass vs fail, etc
binary values
Types of charts
variables -- X-R chart
attributes -- p, np, c and u
UCLx
LCLx
Construct
R control
LCLr chart UCLr
Plot data points
Determine outliers and eliminate assignable causes
Recalculate control limits with reduced data set
Implement new process control chart
Basic Properties
x = std dev of sample mean = /n
(where = process standard deviation)
In Control
Out of Control
Alarm
No Alarm
Type 1
error
No error
No error
Type 2
error
UCLx
Outer 3rd
Probability = .02135
+3
Middle 3rd
Probability = .1360
+2
Inner 3rd
B
C
Probability = .3413
+1
Inner 3rd
Probability = .3413
Middle 3rd
Probability = .1360
-2
Outer 3rd
Probability = .02135
-3
Probability = .00135
LCLx
-1
4 out of 5 in B or beyond
.15874 x (1-.1587) x 5 = .0027
Other Charts
P-chart
based on fraction (percentage) of defective units in a
varying sample size
np-chart
based on number of defective units in a fixed sample size
u-chart
based on the counts of defects in a varying sample size
c-chart
based on the count of defects found in a fixed sample size
P-chart
based on fraction (percentage) of defective units in a varying sample size
UCL/LCLp = p 3(p)(1-p)/n
np-chart
based on number of defective units in a fixed sample size
UCL/LCLnp = np 3(np)(1-p)
u-chart
based on the counts of defects in a varying sample size
UCL/LCLu = u 3u/n
c-chart
based on the count of defects found in a fixed sample size
UCL/LCLc = c 3c
X-R chart
variables data
UCL/LCLX = X 3 x = X 3 / n = X A2R where R/d2
UCLR = D4R
and A2 = 3/d2 n
LCLR = D3R
for p, np, u, c and R chart the LCL can not be less than zero.
Process Capability
Cp: process capability ratio
a measure of how the distribution compares to the width of the
specification
not a measure of conformance
a measure of capability, if distribution center were to match
center of specification range