Production Technology Ch31
Production Technology Ch31
2001 Prentice-Hall
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Figure 31.1 Schematic illustration of a cross-section of the surface structure of metals. The thickness of the individual layers is dependent on processing conditions and processing environment.
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Figure 31.5
Kalpakjian Schmid Manufacturing Engineering and Technology 2001 Prentice-Hall Page 31-6
Figure 31.6 (a) Measuring surface roughness with a stylus. The rider supports the stylus and guards against damage. (b) Surface measuring instrument. Source: Sheffield Measurement Division of Warner & Swasey Co. (c) Path of stylus in surface roughness measurements (broken line) compared to actual roughness profile. Note that the profile of the stylus path is smoother than that of the actual surface. Source: D. H. Buckley
Kalpakjian Schmid Manufacturing Engineering and Technology
2001 Prentice-Hall
Page 31-7
Surface Profiles
Figure 31.7 Typical surface profiles produced by various machining and surface-finishing processes. Note the difference between the vertical and horizontal scales. See also Fig. 32.4. Source: D. B Dallas (ed.), Tools and Manufacturing Engineers Handbook, 3d ed. Copyright 1976, McGraw-Hill Publishing Company. Used with permission.
2001 Prentice-Hall
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Figure 31.9 A highly polished silicon surface measured in an atomic force microscope. The surface roughness is Rq = 0.134 nm.
Kalpakjian Schmid Manufacturing Engineering and Technology 2001 Prentice-Hall Page 31-9