adf4368
adf4368
ADF4368
Microwave Wideband Synthesizer with Integrated VCO
Rev. 0
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Data Sheet ADF4368
TABLE OF CONTENTS
Features................................................................ 1 Introduction.......................................................16
Applications........................................................... 1 Output Frequency.............................................16
General Description...............................................1 Circuit Description............................................ 16
Functional Block Diagram......................................1 Applications Information...................................... 22
Specifications........................................................ 3 Loop Filter Design............................................ 22
Serial Interface Timing Characteristics...............7 Reference Source Considerations................... 22
Timing Diagrams................................................ 7 Output Phase Noise Characteristics................ 23
Absolute Maximum Ratings...................................8 Power-Up and Initialization Sequence............. 23
Transistor Count.................................................8 Power Supply and Bypassing...........................26
Thermal Resistance........................................... 8 Register Maps..................................................... 27
Electrostatic Discharge (ESD) Ratings...............8 Register Details................................................... 30
ESD Caution.......................................................8 Outline Dimensions............................................. 54
Pin Configuration and Function Descriptions........ 9 Ordering Guide.................................................54
Typical Performance Characteristics................... 11 Evaluation Boards............................................ 54
Theory of Operation.............................................16
REVISION HISTORY
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Data Sheet ADF4368
SPECIFICATIONS
V3.3V_1 = V3.3V_2 = 3.15 V to 3.45 V, VV5_VCO = VV5_CP = VV5_CAL = 4.75 V to 5.25 V, all voltages are with respect to GND, TA = −40°C to 105°C
operating temperature range, unless otherwise noted.
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Data Sheet ADF4368
SPECIFICATIONS
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Data Sheet ADF4368
SPECIFICATIONS
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Data Sheet ADF4368
SPECIFICATIONS
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Data Sheet ADF4368
SPECIFICATIONS
TIMING DIAGRAMS
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Data Sheet ADF4368
ABSOLUTE MAXIMUM RATINGS
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Data Sheet ADF4368
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
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Data Sheet ADF4368
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
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Data Sheet ADF4368
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 6. Open Loop VCO Phase Noise vs. Offset Frequency at Various Figure 9. 1 kHz to 100 MHz Integrated Jitter in Integer Mode fPFD = 500 MHz
Frequencies
Figure 8. 1 kHz to 100 MHz Integrated Jitter in Fractional Mode fPFD = 250 MHz
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Data Sheet ADF4368
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 12. L1/f vs. Bleed Setting Figure 15. Worst Case IBS measured at 5 kHz, 50 kHz, 200 kHz, 300 kHz, 400
kHz, 960 kHz, 10 MHz offsets, fPFD = 245.76 MHz
Figure 13. LNORM-FRC, fREF = 500 MHz, fPFD = 250 MHz, RFOut = 12,001 MHz vs.
Bleed Setting Figure 16. PFD Spurs vs. Output Frequency
Figure 14. LNORM-FRC vs. Bleed Setting Figure 17. De-Embedded Single-Ended Output Power at Various Output
Power Settings
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Data Sheet ADF4368
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 18. De-Embedded Single-Ended Output Power vs. Output Frequency Figure 21. LNA Reference Input Sensitivity vs. Temperature
over Temperature and Supply
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Data Sheet ADF4368
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 24. VTUNE vs. Output Frequency when Part Locked at 25°C Figure 27. Propagation Delay vs. Bleed Setting
Figure 25. Skew Between Outputs Figure 28. Phase Shift vs. Phase Adjustment, RFOut = 12,775 MHz at Various
Temperatures
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Data Sheet ADF4368
TYPICAL PERFORMANCE CHARACTERISTICS
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Data Sheet ADF4368
THEORY OF OPERATION
INTRODUCTION
A PLL is a complex feedback system that may conceptually be
considered a frequency multiplier. The system multiplies the fre-
quency input at REFP and REFN and outputs a higher frequency
at RFOUT1P, RFOUT2P, RFOUT1N, and RFOUT2N. The PFD,
charge pump, output divider, feedback divider, VCO, and external
loop filter forms a feedback loop to accurately control the output
frequency (see Figure 33). The reference divider or reference
doubler is used to set the frequency resolution.
A high quality signal must be applied to the REFP and REFN inputs
because they provide the frequency reference to the entire PLL. To
achieve the in-band phase noise performance of the device, apply
a continuous wave signal or a square wave with a slew rate of
at least 1000 V/µs. For more information on reference input signal
Figure 33. PLL Loop Diagram requirements and interfacing, see the Applications Information sec-
tion.
OUTPUT FREQUENCY
When the REF_SEL bit is set to 0, the DMA buffer is selected. The
When the loop is locked, the fVCO (in Hz) produced at the output of DMA is optimized for high slew rate signals, such as square waves
the VCO is determined by the reference frequency (fREF) and the O, or higher frequency and higher amplitude sine waves. The DMA
R, and N values given by the following equation. has a controlled propagation delay from the reference input to clock
D×N×O output, which eases time zero and over temperature multichip clock
fVCO = fREF × R (1) alignment.
Where N is given by: When the REF_SEL bit is set to 1, the LNA is selected. The LNA
is optimized for low slew rate signals, such as lower frequency or
FRAC1WORD + FRAC2WORD
N = NINT + MOD2WORD (2) lower amplitude sine waves.
MOD1WORD
The REF_SEL bit must be set correctly to optimize the in-band
Here, the PFD frequency (fPFD) produced is given by: phase noise performance and propagation delay. For recommend-
fREF × D ed settings, see Table 7.
fPFD = R
(3)
Table 7. REF_SEL Programming
fVCO may be alternatively expressed as: REF_SEL Sine Wave Slew Rate (V/µs) Square Wave Optimized tPD
fVCO = fPFD × N × O (4) 0 ≥1000 Preferred Yes
1 <1000 Not applicable Not applicable
The output frequency, fRFOUT, produced at the output of the output
divider is given by: To calculate the slew rate of sine wave:
fRFOUT =
fVCO
(5) Slew Rate = 2 × π × f × V (6)
O
Where:
CIRCUIT DESCRIPTION
f = sine wave frequency
Reference Input Buffer V = sine wave amplitude (in VPK)
The reference frequency of the PLL is applied differentially on the The FILT_REF bit controls the low-pass filter of the reference input
REFP and REFN pin. These high impedance inputs are self-biased LNA and must be set for sine wave signals based on fREF to limit
and must be AC-coupled with 1 µF capacitors (for a simplified the wideband noise of the reference. The FILT_REF bit must be set
schematic, see Figure 34). Alternatively, the inputs may be used correctly to reach the LNORM normalized in-band phase noise floor.
as single-ended by applying the reference frequency at REFP and For recommended settings, see Table 8. Square wave inputs have
bypassing REFN to GND with a 1 µF capacitor. FILT_REF set to 0.
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Data Sheet ADF4368
THEORY OF OPERATION
The BST_REF bit must be set based on the input signal level
to prevent the LNA reference input buffer from saturating. The
BST_REF programming is the same whether the input is a sine
wave or a square wave. For recommended settings, see Table 9
and for programming examples, see the Applications Information
section.
Table 9. BST_REF Programming Figure 35. Simplified PFD Schematic
BST_REF Sine Wave fREF
Charge Pump
0 ≥ 1.6 VPP
1 < 1.6 VPP The charge pump, controlled by the PFD, forces sink (down) or
source (up) current pulses onto the CP pin, which must be connect-
Reference Peak Detector ed to an appropriate loop filter. For a simplified schematic of the
charge pump, see Figure 36.
A reference input peak detection circuit is provided on the REFP
and REFN inputs to detect the presence of a reference signal and
provides the REF_OK status flag available through serial port regis-
ter REG0058. The circuit has hysteresis to prevent the REF_OK
flag from chattering at the detection threshold.
The peak detector approximates an RMS detector. Therefore, sine
and square wave inputs give different detection thresholds by a
factor of 4/π. For REF_OK detection values, see Table 10.
Table 10. REF_OK Status Output vs. REF INPUT
Figure 36. Simplified Charge Pump Schematic
REF_OK Sine Wave fREF Square Wave fREF
1 ≥ 200 mVPP ≥ 155 mVPP The output current magnitude (ICP) may be set from 0.79 mA
0 < 180 mVPP < 140 mVPP to 11.1 mA using the CP_I bits found in REG001F. A larger ICP
can result in lower in-band noise due to the lower impedance of
Reference Divider (R) and Doubler (D) the loop filter components, and a smaller ICP can result in better
spurious performance. For programming specifics, see Table 11,
When the EN_RDBLR bit is set to 1, a frequency multiplier is and for information on designing a loop filter, see the Applications
used to double the frequency driven to the reference divider. A Information section.
6-bit divider, R_DIV, in series with the reference doubler is used
Table 11. CP Programming
to reduce the frequency seen at the PFD. The reference divide
ratio, R, may be set to any integer from 1 to 63. Use the R_DIV CP_I ICP
bits found in REG0020 to directly program the R divide ratio. For 0 0.79 mA
the relationship between R, D, and the fREF, fPFD, fVCO, and fOUT 1 0.99 mA
frequencies, see the Output Frequency section. 2 1.19 mA
3 1.38 mA
Phase/Frequency Detector (PFD) 4 1.59 mA
The phase/frequency detector (PFD), with the charge pump, pro- 5 1.98 mA
duces source and sink current pulses proportional to the phase 6 2.39 mA
difference between the outputs of the reference divider or reference 7 2.79 mA
doubler and the feedback divider. This action provides the necessa- 8 3.18 mA
ry feedback to phase lock the loop, forcing a phase alignment at 9 3.97 mA
the inputs of the PFD. For a simplified schematic of the PFD, see 10 4.77 mA
Figure 35. 11 5.57 mA
12 6.33 mA
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Data Sheet ADF4368
THEORY OF OPERATION
Table 11. CP Programming (Continued) Table 13. tBLEED and BLEED_POL for fPFD <120 MHz
CP_I ICP N ≥ 35 N < 35
13 7.91 mA BLEED_ BLEED_
14 9.51 mA RF Frequency tBLEED POL tBLEED POL
15 11.1 mA fRFOUT ≥ 4.2 GHz 390 ps 0 390 ps 0
3.0 GHz ≤ fRFOUT < 4.2 1200 ps 1 900 ps 0
Charge Pump Functions GHz
1.8 GHz ≤ fRFOUT < 3.0 1200 ps 0 1200 ps 1
When the EN_CPTEST bit is set to 1, the CP_UP bit and GHz
CP_DOWN bit can be programmed to force a constant ICP source 1.2 GHz ≤ fRFOUT < 1.8 1400 ps 0 1400 ps 1
or sink current, respectively, on the CP pin. EN_CPTEST or CP_UP GHz
and CP_DOWN must be set to 0 to allow the loop to lock. These fRFOUT < 1.2 GHz 1400 ps 0 2000 ps 1
bits are commonly used as an aid to debug PLL related issues
during the hardware and software development phase of a project. Bleed current also changes the propagation delay from the REFP
For normal operation, set EN_CPTEST, CP_UP, and CP_DOWN to and REFN input pins to the RFOUTxP and RFOUTxN output pins.
0. In integer mode, bleed current can be used to shift the output in
both directions. If BLEED_POL = 0, the propagation delay from the
Charge Pump Bleed Current Optimization REFP and REFN input pins to the RFOUTxP and RFOUTxN output
pins increases.
A small programmable constant charge pump current, known as
bleed current (IBLEED), can be used to optimize the phase noise and In fractional mode, after setting the bleed current for the best per-
fractional spurious signals in fractional mode. To enable the bleed formance, the output can be shifted by using the PHASE_ADJUST-
current, set the EN_BLEED bit to 1. When the BLEED_POL bit is MENT bits in REG0024, which are effectively used in sigma-delta
set to 1, a small constant source current is forced onto the CP pin. modulator (SDM). Phase adjustment does not cause any phase
When the BLEED_POL bit is set to 0, a small constant sink current noise degradation.
is forced from the CP pin.
Lock Detector
The 13-bits bleed current setting consists of 4-bit MSB for coarse
setting and 9-bit LSB for fine setting. The coarse step is 180 µA and The lock detector uses internal signals from the PFD to measure
the fine setting step is 490 nA. phase coincidence between RCLK and NCLK. It is enabled by
setting both the EN_LOL bit and EN_LDWIN bit to 1 in REG002D
The optimized bleed current value for fractional mode is calculated and presents the lock detector output on the LKDET pin and the
based on the charge pump current (ICP), fPFD, and bleed delay LOCKED bit in REG0058. The lock detector output can also be
(tBLEED). The recommended tBLEED and BLEED_POL are shown in presented on the MUXOUT pin by programming the MUXOUT bits
Table 12 and Table 13. in REG002E.
Table 12. tBLEED and BLEED_POL for fPFD ≥ 120 MHz
The PFD phase difference must be less than the phase difference
Output Frequency tBLEED BLEED_POL lock window time (tLDWIN) for a set number of PFD cycles before
fRFOUT ≥ 4.2 GHz 390 ps 0 the lock detector output indicates that the PLL has locked. The
3.0 GHz ≤ fRFOUT < 4.2 GHz 900 ps 0 user sets the tLDWIN for a valid lock condition with the LDWIN_PW
1.8 GHz ≤ fRFOUT < 3.0 GHz 1200 ps 0 bits depending on the operation mode, fPFD, and fRFOUT. The
fRFOUT < 1.8 GHz 1400 ps 0 recommended settings for the LDWIN_PW bits are given in Table
14.
The bleed current and BLEED_I bit are calculated by the following
Table 14. LDWIN_PW Programming
equations:
LDWIN_PW Configuration
IBLEED = TBLEED × fPFD × ICP (7)
0 Integer PLL, tBLEED ≤ 85 ps
IBLEED 1 Integer PLL, 85 ps > tBLEED < 250 ps
CoarseBleed = INT 180μ
(8)
10 Fractional PLL, fPFD > 200 MHz and RF > 6.4 GHz
FineBleed = Round 512 × 11 Fractional PLL, fPFD > 200 MHz and RF > 5 GHz
IBLEED − 180μ × CoarseBleed
(9) 100 Fractional PLL, fPFD < 200 MHz
250μ 101 Fractional PLL, fPFD < 100 MHz
110 Fractional PLL, fPFD < 50 MHz
BLEED_I = 512 × CoarseBleed + FineBleed (10)
111 Fractional PLL, fPFD < 40 MHz
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Data Sheet ADF4368
THEORY OF OPERATION
Where LPBW is loop filter bandwidth. Table 16. Lock Detector Timing, Bleed Current Disabled
Absolute Phase Difference at
Table 15. LD_COUNT Programming
Region PFD Lock Detector State
LD_COUNT Actual PFD Cycles
1 > tLDWIN Low
0 27
2 < tLDWIN Low, counts PFD cycles
1 35
3 ~0
2 51
4 ~0 High, > desired PFD cycle count
3 67
5 < tLDWIN High
4 99
6 > tLDWIN Low (immediately)
5 131
6 195 When the charge pump bleed current is enabled, a phase offset is
7 259 applied to the PFD inputs. This phase offset (tIDEL) is proportional
8 387 to the amount of bleed current. Region 3 and Region 4 in Figure
9 515 37 and Figure 38 highlight the PFD phase difference that the
10 771 PLL settles to when the charge pump bleed current is disabled or
11 1027
enabled, respectively.
12 1539
13 2051
14 3075
15 4099
16 6147
17 8195
18 12291
19 16387
20 24579 Figure 38. Lock Detector Timing, Bleed Current Enabled
21 32771
22 49155 VCO
23 65539 The VCO core consists of four separate VCOs, each of which
24 98307 uses 256 overlapping bands, which allows the device to cover a
25 131075 wide frequency range without large VCO sensitivity (KV). The output
26 196611 frequency can be further extended by using the output divider.
27 262147
28 393219
29 524291
30 786435
31 1048579
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Data Sheet ADF4368
THEORY OF OPERATION
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Data Sheet ADF4368
THEORY OF OPERATION
Output Invert (INV_CLKOUT) is recommended. For more details on the evaluation board sche-
matic, refer to the EVAL-ADF4368 user guide.
The output invert (INV_CLKOUT) is used to shift the output signal
180°. INV_CLKOUT is located inside the PLL loop. Any change
to INV_CLKOUT results in the PLL losing lock for few loop time
constants. Use the INV_CLKOUT bit found in register REG0011 to
directly program the output phase.
RF Output Buffer
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Data Sheet ADF4368
APPLICATIONS INFORMATION
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Data Sheet ADF4368
APPLICATIONS INFORMATION
500 MHz for integer mode, see Figure 49. The total phase noise is
the summation of LOUT and LOUT(1/f), calculated by Equation 20.
LOUT /10
LOUT TOTAL = 10 × log10 10
LOUT 1/f /10
(20)
+ 10
Or
LOUT = LNORM + 10 × log10 fPFD + 20 × log10
(18) Figure 50. Power-Up and Initialization Sequence
N
O
The following steps describe the recommended power-up and initi-
Output Phase Noise Due to 1/f Noise alization sequence of the ADF4368:
In-band phase noise at very low offset frequencies can be influ- 1. Apply specified voltages to the 5V, 3.3V_1, and 3.3V_2 power
enced by the 1/f noise of the ADF4368, depending on the fPFD. Use supply groups. The ADF4368 is in full power-down mode at this
the normalized in-band 1/f noise (L1/f) of −287 dBc/Hz with Equation point and SPI programming is not possible.
19 to approximate the output 1/f phase noise at a given frequency 2. Set the CE pin to a logic high. It is acceptable to connect the
offset (fOFFSET). CE pin to the V3_LDO pin via a pull-up resistor. Therefore, Step
1 and Step 2 are performed coincidentally.
LOUT 1/f = L1/f + 20 × log10 fOUT − 10 3. After waiting ≥200 μs for all SPI register bits to settle to their
(19)
× log10 fOFFSET power-on reset state (POR), begin programming the SPI to
configure the ADF4368 to a desired state. The following is the
Unlike the in-band noise floor (LOUT), the 1/f noise (LOUT(1/f)) does recommended SPI programming sequence:
not change with fPFD and is not constant over offset frequency. For
an example of in-band phase noise for fPFD equal to 100 MHz and
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Data Sheet ADF4368
APPLICATIONS INFORMATION
a. Set the SDO_ACTIVE and CMOS_OV bits to a desired 4. The PLL is locked when the lock detector sets the LKDET pin
state for future readback operations. and the LOCKED bit high.
b. Program all register addresses in descending order, 5. When changing the frequency, do the following steps:
REG0053 to REG0010. There are several required re-
served register field settings provided in Table 19 that are a. Program only the modified registers in the descending or-
required for proper device operation. der.
4. The ADF4368 remains in power-down mode until the PD_ALL b. Write REG0010 to start a new VCO autocalibration as the
bit is programmed to 0. After PD_ALL is disabled, wait at least final step whether it is modified or not.
10 μs for the VCO calibration circuitry and other circuit blocks to
settle before starting a VCO calibration. Fast Power-Up and Initialization, Manually
5. A write to REG0010 starts a VCO autocalibration. At this point, Programmed VCO Calibration Settings
the device is fully operational and new frequencies can be (Optional)
programmed as often as desired. The following steps are infor- The purpose of the fast power-up and initialization method is to
mation for PD_ALL and CE pin. avoid the automatic VCO calibration time, which is typically 3 ms
6. Setting PD_ALL to 1 power down the ADF4368, retaining the to 9 ms. For fixed clock frequency converter applications, automatic
latest programmed SPI settings and full SPI programming capa- VCO calibration times are typically acceptable. For fast frequency
bility. hopping applications, much shorter lock time is needed.
7. If only the state of PD_ALL was modified in Step 6, setting
PD_ALL to 0 returns the ADF4368 to the frequency program- The following list provides the steps to record the VCO calibration
med in Step 5. After a 10 μs wait, all circuit blocks are results on the initial power-up and then to manually program VCO
completely powered up internally. This 10 μs wait does not calibration settings on subsequent power ups:
include the frequency settling time associated with the loop filter 1. On initial power up, follow the procedure in the Standard Pow-
bandwidth. er-Up and Initialization Sequence, Automatic VCO Calibration
8. Toggling the CE pin level causes the ADF4368 to return to section.
full power-down mode and return the SPI registers to the POR 2. Record calibration results from the VCO_CORE, VCO_BAND,
state (see Step 2 and Step 3). and VCO_BIAS bit fields for each target frequency and store
the recorded results in memory. Note that each unique device
Programming Procedure and frequency combination generates different VCO_CORE,
VCO_BAND, and VCO_BIAS values.
There are two different methods to power up the ADF4368. The
most commonly used method provided in the Standard Power-Up 3. Subsequent power-up and initialization sequences (see the
and Initialization Sequence, Automatic VCO Calibration section is Power-Up and Initialization Sequence section) can bypass the
mandatory on the initial device power-up. automatic VCO calibration procedure by programming the over-
ride (O_VCO_CORE, O_VCO_BAND, and O_VCO_BIAS) and
The method provided in the Fast Power-Up and Initialization, Man- manual (M_VCO_CORE, M_VCO_BAND, and M_VCO_BIAS)
ually Programmed VCO Calibration Settings (Optional) section is an VCO bits with the register settings provided in Table 18. All
optional power-up procedure after the initial power-up. other bit fields are programmed as usual.
4. When changing the frequency, program only the modified regis-
Standard Power-Up and Initialization ters in descending order.
Sequence, Automatic VCO Calibration
Table 18. Manually Programmed VCO Calibration Settings
The following standard power-up and initialization sequence is the Bit Fields Value
recommended procedure to power up and program the ADF4368: EN_AUTOCAL 0x0
1. Follow Step 1 through Step 5 in the Power-Up and Initialization EN_DRCLK 0x0
Sequence section. EN_DNCLK 0x0
2. It is optional to monitor the status of the VCO calibration bits, EN_ADC_CLK 0x0
ADC_BUSY and FSM_BUSY. A VCO calibration is completed O_VCO_CORE 0x1
when ADC_BUSY transitions from high to low, followed by O_VCO_BAND 0x1
FSM_BUSY transitioning from high to low. Typical automatic O_VCO_BIAS 0x1
VCO calibration times range from 3 ms to 9 ms. M_VCO_CORE Program with recorded values
3. After the VCO calibration is complete, disable the VCO M_VCO_BAND Program with recorded values
calibration clocks by setting EN_DRCLK = EN_DNCLK = M_VCO_BIAS Program with recorded values
EN_ADC_CLK = 0. Disabling the VCO calibration clocks re-
duces unwanted spurious content.
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Data Sheet ADF4368
APPLICATIONS INFORMATION
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Data Sheet ADF4368
APPLICATIONS INFORMATION
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Data Sheet ADF4368
REGISTER MAPS
The reset column refers to the initial register state on power up or after the SOFT_RESET bit is toggled. The bit columns provide bit names
or the required programmed state of write-able reserved registers for proper device operation. Register bit fields labeled RESERVED are read
only.
Table 19. ADF4368 Register Summary
Reg Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 Reset RW
0x00 SOFT_RESET_R LSB_FIRST_R ADDRESS_ASCE SDO_ACTIV SDO_ACTIV ADDRESS LSB_FIRS SOFT_RESET 0x00 R/W
NSION_R E_R E _ASCENSI T
ON
0x01 SINGLE_INSTRUCT REG01_RSV6 MAIN_READBACK REG01_RSV RESERVED REG01_RS REG01_R RESERVED 0x00 R/W
ION _CONTROL 4 V1 SV0
0x02 RESERVED CHIP_STATUS 0x00 R
0x03 RESERVED CHIP_TYPE 0x00 R
0x04 PRODUCT_ID[7:0] 0x00 R
0x05 PRODUCT_ID[15:8] 0x00 R
0x06 PRODUCT_GRADE DEVICE_REVISION 0x00 R
0x0A SCRATCHPAD 0x00 R/W
0x0B SPI_REVISION 0x00 R
0x0C VENDOR_ID[7:0] 0x56 R
0x0D VENDOR_ID[15:8] 0x04 R
0x0F RESERVED 0 0x00 R/W
0x10 N_INT[7:0] 0x80 R/W
0x11 CLKOUT_DIV INT_MODE INV_CLKOUT N_INT[11:8] 0x00 R/W
0x12 FRAC1WORD[7:0] 0x00 R/W
0x13 FRAC1WORD[15:8] 0x00 R/W
0x14 FRAC1WORD[23:16] 0x00 R/W
CMOS_O
0x15 M_VCO_CORE M_VCO_BIAS V FRAC1WORD[24] 0x00 R/W
0x16 M_VCO_BAND 0x00 R/W
0x17 FRAC2WORD[7:0] 0x00 R/W
0x18 FRAC2WORD[15:8] 0x00 R/W
0x19 FRAC2WORD[23:16] 0x00 R/W
0x1A MOD2WORD[7:0] 0x00 R/W
0x1B MOD2WORD[15:8] 0x00 R/W
0x1C MOD2WORD[23:16] 0x00 R/W
0x1D BLEED_I[7:0] 0x00 R/W
EN_PHASE_RESY
0x1E NC EN_REF_RST TIMED_SYNC BLEED_I[12:8] 0x00 R/W
0x1F SW_SYNC PHASE_ADJ BLEED_POL EN_BLEED CP_I 0x00 R/W
0x20 EN_AUTOCAL EN_RDBLR R_DIV 0x01 R/W
0x21 PHASE_WORD[7:0] 0x00 R/W
0x22 PHASE_WORD[15:8] 0x00 R/W
0x23 PHASE_WORD[23:16] 0x00 R/W
0x24 PHASE_ADJUSTMENT 0x00 R/W
0x25 RESYNC_WAIT[7:0] 0x00 R/W
0x26 RESYNC_WAIT[15:8] 0x00 R/W
0x27 RESYNC_WAIT[23:16] 0x00 R/W
0x28 0 LSB_P1 VAR_MOD_EN 0 0 0 0 0 0x00 R/W
0x29 CLK2_OPWR CLK1_OPWR 0x00 R/W
PHASE_ADJ_PO
0x2A 0 L 0 PD_SYNC 0 PD_RDET 0 0 0x04 R/W
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Data Sheet ADF4368
REGISTER MAPS
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REGISTER MAPS
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Data Sheet ADF4368
REGISTER DETAILS
Figure 51.
Figure 52.
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REGISTER DETAILS
Figure 53.
Figure 54.
Figure 55.
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REGISTER DETAILS
Figure 56.
Figure 57.
Figure 58.
Figure 59.
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REGISTER DETAILS
Figure 60.
Figure 61.
Figure 62.
Figure 63.
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REGISTER DETAILS
Figure 64.
Figure 65.
Figure 66.
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Data Sheet ADF4368
REGISTER DETAILS
Figure 67.
Figure 68.
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Data Sheet ADF4368
REGISTER DETAILS
Figure 69.
Figure 70.
Figure 71.
Figure 72.
Figure 73.
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OUTLINE DIMENSIONS
EVALUATION BOARDS
Model1 Description
EV-ADF4368SD1Z Evaluation Board
1 Z = RoHS-Compliant Part.
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