NEMA Standards Publi ion No. XR 11-1993 (R199) Test Standard for Determination of the Limiting Spatial Resolution of X-Ray Image intensifier Systems Published by: National Electrical Manufacturers Association 1300 North 17th Street, Suite 1847 Rossiyn, VA 22209 © Copyright 2001 by the National Electrical Manufacturers. All rights including translation into other languages reserved under the Universal Copyright Convention, the Berne Convention for the Protection of Literary and Artistic Works, and the International and Pan American Copyright Conventions.STD.NEMA XR DI-ENGL 15993 MM bY70247 OSRb2Sb O88 A XR 11-1993 TABLE OF CONTENTS Section 1 HEFERENCED STANDARDS AND DEFNTTONS Section 2. TESTEQUPMENT Resolution Test Object... .....++ ‘Image Position Calibration Template . . . - ‘Section 3 STANDARD SYSTEM TEST CONDITIONS 5 5 ‘5 5 ae) 5 16 Section 4 +7 7 Section 5 9STD-NEMA XR L3-ENGL 2993 MM 470247 OSLbES? Ths Me XR 11-1993 Pagei FOREWORD ‘This NEMA Standards Publication is one of a series of test standards developed by the X-Ray Imag ing Products Section and the medical diagnostic imaging industry for the measurement of performance characteristics governing the image quality of X-Ray image intensifier (ARID) systems. These test Standards are intended for the use of equipment manufacturers, prospective purchasers, and users alike. ‘Manufacturers may find these standards useful in establishing standard test conditions for the detcrmi- zation of system performance specifications. Prospective equipment purchasers may benefit from these standards as the employment of standard test conditions and methods enables meaningful com- parisons to be made of NEMA-referenced, competitive, equipment performance specifications. Users may also benefit from these standards through a beter appreciation of the performance XRIT systems, ‘Characterizing the parameters that govern image quality is a non-trivial task. The assessment of im- age quality lies in the eye ofthe beholder and so is a somewhat subjective measure influenced by the spatial, temporal, contrast, and noise characteristics of the image. Historically, many techniques have ‘been developed employing varying degrees of sophistication 1 establish subjective and objective meas- tures ofthese parameters and the following non-exhaustive list of parameters can be considered as rele~ vant to image quality. Contrast Ratio Detective Quantum Efficiency (DQE) Fixed Pattern Noise Gain Image Signal Uniformity Lay B . Limiting Spatial Resolution ‘Modulation Transfer Function (MTF) Noise Power Spectrum j. Radial Image Distortion K. Signal to Noise Ratio L._ Visible Entrance Field Size “These parameters are not all independent and some of them may partially overlap in assessing the im- ‘age quality. Moreover, it must be recognized, however, that not all tst standards lend themseives to measurement atthe installation site. Some parameters require instrumentation better suited to factory measurements while others require the facilities of an instrumentation laboratory to assure stable test conditions necessary for reliable measurements. The NEMA X-Ray Image Intensifier Systems Sub- ‘commitice intends to make a selection from the above-mentioned list of parameters where practical and technically feasible measurements can be made at the system level and to prepare a set of NEMA stand- ards, “This publication has been prepared by the X-Ray Imaging Products Section of NEMA which peri- odically reviews it for any revisions necessary to keep it up to date with advancing technology. Com- ‘ments or proposed revisions are welcomed and should be submitted to: Vice President, Engineering Department ‘National Electrical Manufacturers Association 2101 L Street, N.W. ‘Washington, D.C. 20037STD-NENA XR 2I-ENGL 1993 MH 6470247 0526258 950 a XR 11-1993, Page ii INTRODUCTION ‘The procedures in this standard determine the highest spatial frequency of a bar pattem test object that can be resolved by visual observation of the image of the test object produced by an X-ray image intensifier (RID system under a given set of test conditions. The standard is intended as a means of determining the limiting spatial resolution (LSR) of a system set up according tothe specifications of the system designer or manufacturer, and specifies the determination of the LSR at the central axis of the imaging system and the minimum LSR at a radius specified by the manufacturer or system designer. “The LSR is a subjective measure of the highest spatial frequency that is resolvable by the experi- ‘enced observer throughout the region of measurement. While it is generally acknowledged that a sys~ tem's resolving capability i best measured in terms of its modulation transfer function (MTF), which is both more definitive and more objective than the LSR, the LSR test, although subjective, is much simpler to perform. Since both techniques are widely used and find broad application, they are deemed worthy of coverage as separate NEMA Standart Publications. Each stage of the imaging chain introduces an MTF loss, These losses are generally greater in areas away from the central axis of the imaging system than near the central axis causing the system resolu- tion to be spatially (primarily radially) variant. The LSR also depends on the radiation contrast of the test object (a set of parallel, equidistant, lead bars described in 2.1), and the contrast is dependent on the energy spectrum of the radiation. Since the thickness of the lead foil in the test object is only 0.05 100.1 mm, radiation less penetrating than the standard, 7 mm aluminum half-value-layer radiation of the International Commission on Radiological Units and Measurements (ICRU) is required to assure adequate contrast to the pattern, SCOPE ‘This document isthe test standard for the determination ofthe limiting spatial resolution (LSR) of X- ray image intensifier (XRI) systems. These systems include optical viewing systems, video systems, pphotofluorographic film recording systems, and cine film recording and projection systems.STD-NENA XR LB-ENGL 2993 MM 470247 OS1b259 897 Ow XR 11-1993 Page 1 Section 1 REFERENCED STANDARDS AND DEFINITIONS 1.1 Referenced Standards ‘The Aluminum Association 818 Connecticut Avenue, N.W. ‘Washington, D.C, 20006 ASD-1 1979 ‘Aluminum Standards and Data International Commission on Radiological Units and Measurements 7910 Woodmont Avenue ‘Washington, D.C. 20014 lof Methods of Evaluating Radiological Equipment and Materials National Electrical Manufacturers Association ‘2101 L Street, NW. ‘Washington, D.C. 20037 XR 5-1991 1.2. DEFINITIONS 1.21 Actual Focal Spot ‘Area on the surface of the X-ray tube target that intercepts the beam of electrons. 1.22 Aluminum Equivalent ‘The thickness of 99.8 percent pure aluminum afford- {ng the same attenuation, under specific conditions, as the ‘material in question. 1.23 Automatic Brightness Contro! ‘A device that automatically controls the brightness at preselected location in the output of the XRII by control of one or more ofthe factors (¢.g., X-ray tube currentand voltage) influencing the electrical energy supplied tothe ‘X-ray tube. (Equivalent to IEC rm-36-47 Automatic Ex- posure Rate Control) 1.2.4 Automatic Exposure Controt In an X-ray generator, mode of operation in which one cor more loading factors are controlled automatically in ‘order to obtain ata preselected location a desired quantity ‘of radiation. Loading factors are equivalent to technique factors. 1.25. Central Axis of the Imaging System ‘The line perpendicular tothe entrance plane of the xrii system passing through the geometric center ofthe output image of the XRU system. Measurement of Dimensions and Properties of Focal Spots of Diagnostic X-Ray Tubes 1.26 Central Axis of the X-Ray Field ‘The line perpendicular to the entrance plane of the XRI system passing through the center of the actual focal spot. 1.2.7. Central Limiting Spatial Resolution (LSR) The limiting spatial resolution determined at, or 2s near as possible to, the central axis of the imaging system. 1.28 Composite Video Signal ‘The video signal resulting from the combination ofthe image signal with the blanking and synchronization (sync) signals. 1.29 Entrance Field Size ‘The diameter of the field in the entrance plane of the XRII system that, under specific conditions, is used for the transmission of information contained in the X-ray ‘beam regarding objects through which the beam has assed. 1.2.10 Entrance Plane of the XRII System ‘The plane perpendicular to the axis of the XRII and sg7azing the part of the XRII, including its housing, that ‘protrudes most in the direction of the radiation source. ‘The following components shall not be considered ele- ments of the XR housing. & Antiscaner grid b. Collision sensor c. Ionization chambersSTD-NEMA XR DL-ENGL 1993 mM 6470247 OS%b260 S09 mm XR 11-1993 Page2 4. Removable magnetic shields and coils e. Protective covers £. Spotfilm devices 1.2.11 Geometric Magnification ‘Magnification of an object in the X-ray field atribut- ableto the relative distances of the object and the entrance ‘plane of the XRII system from the actual focal spot. 1.2.12 Half Value Layer ‘The thickness of a specified material required to de- crease the exposure rate of a beam of X-rays to one-half of ts initial value, For the purpose of this definition, the solid angle of the radiation beam shall be as small as possible so that the quantity of scattered radiation in- cluded inthe beam is minimized. 1.2.13 Kilovolts Peak (kVp) The maximum potential difference in kilovolts, ap- plied, during an exposure, between the anode and cathode of an X-ray tube. 1.2.14 Limiting Spatial Resolution (LSR) Foran XRII system, the highest spatial frequency bar pattern that an experienced observer can visually resolve, ‘A bar pattem (of the type described in 2.1) is deemed to be resolved if the observer can visually distinguish the complete pattern of two lead bars and three spaces, with the assistance of optical magnification, in the output image of the XRII system. The LSR determined by experienced observers is generally 5 to 10 percent higher than that determined by inexperienced observers, 1.2.15 Multiple Field XRIl System ‘An XRII system incorporating an XRII having more than one, discretely selectable, entrance field size. 1.2.16 Off-Axis Limiting Spatial Resolution ‘The lowest value of the LSR, either radial or tangen- tial, determined in any quadrant of the output image of, the xri system at specific radii measured from the central axis of the imaging system and referred to the entrance plane of the XRII system. The radii are to be specified by the system manufacturer. Specification of an off-axis LSR provides a means of establishing the system re- sponse to optical and electron-optical aberrations. 1.2.17 Output Image ‘The image produced by the XRII system that is visu- ally perceivable by a human observer. Output channels of the sysiem include the following. Processed photofluorographic film Processed cine film Television monitor display screen 4. Direct viewing system 1.2.18 Radial Limiting Spatial Resolution ‘The LSR determined with the bars ofthe test object perpendicular to the radius from the central axis of the imaging system to the position ofthe test object. 1.2.19 Radiation Quality ‘The characteristic of ionizing radiation determined by the spectral distribution of a radiation quantity with re- spect to radiation energy. 1.2.20 Source to Entrance Plane Distance (SED) ‘The distance from the actual focal spot tothe entrance plane of the XRII system measured along the central axis of the X-ray field. 1.2.21 Tangential Limiting Spatial Resolution ‘The LSR determined with the bars of the test object parallel to the radius from the central axis ofthe imaging ‘system to the position of the test object. 1.2.22 Total Filtration ‘The filtration, expressed in the definition for alumi- ‘num equivalent, due to all ofthe X-ray attenuating mate- rials that are interposed between the X-ray tube actual focal spot and the X-ray beam entrance plane ofthe object being imaged. 1.2.23 X-Ray Tube Voltage Potential difference applied to an X-ray tube between anode and the cathode. Usually, X-ray tube voltage is expressed by its peak value in kilovolts (kV) 1.2.24 X-Ray Image intensifier (XIN) System ‘That portion of an X-ray imaging system consisting of the XRII with its housing and the subsequent components of the imaging chain responsible for transmitting and displaying the detected X-ray patiems. The following ‘components shall not be considered elements of the XR system. a. Antiscater grid b. Spotfilm device ¢. Collision sensors 4. Removable magnetic shields © CoilsSTD-NEMA XR DI-ENGL 1993 MM 470247 OSLb26) 44S Mt XR 11-1993 Page Section 2 TEST EQUIPMENT 2.1. RESOLUTION TEST OBJECT ‘The test object includes several pairs of orthogonal square wave pattems at several spatial frequencies. Each member of a pattem pair consists of three equidistant, parallel spaces separating two bars. A bar and space are of equal width and constitute a line pair. Spatial fre- quency is measured in terms of line pairs per mm ‘Qp/mm). An example of a suitable test pattern is shown in Figure 2-1. ‘The test object is formed from 0.1 mm thick lead foil for spatial frequencies less than 5 Ipfmm and from 0.05 ‘mm thick lead foil for frequencies greater than or equal 105 tpAnm, The length of the bar shall beat least ten times. its width. The test object is encased between thin protec- tive covers having low X-ray absorption. For test objects containing frequencies less than or ‘equal to 5 Ip/mm, the increment between frequencies shall not exceed 0.2 Ipfmm. For objects containing fre- ‘quencies greater than 5 Ip/mm, the frequency increment shall not exceed 0.4 Ip/mm. When the determination of SR is made, there shall be present on the test object at least one square wave patter of a frequency one incre- ‘ment higher than the LSR and one square wave patter of a frequency one increment lower than the LSR. It is ‘necessary thatthe spatial frequencies of a test object be determined by measurement rather than by reference to the nominal values provided with the pattern. Figure 2-1 EXAMPLE OF A TEST OBJECT SUITABLE FOR THE DETERMINATION OF LIMITING SPATIAL RESOLUTIONSTD-NEMA XR LE-ENGL 1993 mm 6470247 O51b2b2 38) Mm XR 11-1993, Page 4 2.2 IMAGE POSITION CALIBRATION marcations to provide orthogonal axes along which dis- TEMPLATE tance measurements are made. The interval between the ‘An image position calibration template, such as that demarcations shall not exceed 2 cm. The overall size of shown in Figure 2-2, is used to locate the central axis of _‘the template shall equal or exceed the maximum entrance the imaging system and the radii of off-axis positions at _‘field size of the XRII system. which the LSR is determined. The template consists of a thin, radiolucent pane! imprinted with radio-opaque de- 24 6 8 1012141618 Pitt r tt tt | 40em [NOTE: Overall dimensions can be adjuned to scoommodie variions nthe maximom eatrnc: field size among imaging yes. Figure 2-2 IMAGE POSITION CALIBRATION TEMPLATESTD-NEMA XR DI-ENGL 1993 Mm 470247 OSLL263 218 me XR 11-1993 Page 5 Section 3 STANDARD SYSTEM TEST CONDITIONS 3.1 GENERAL REQUIREMENTS: ‘The system is to be set up according to the specifica- tions of the manufacturer, except as noted in paragraphs below. During the test, except where explicitly permit- ted, no changes shall be made of the system setup. This includes, but is not Limited to adjustment of the XRII and vvideo camera, as well the focus of the XRII and any lenses and video camera. LSR must be determined at ‘center and off-axis, in the radial and tangential directions, and for each entrance field size with a single system configuration. Itis recognized that under some conditions, it will be necessary to remove a grid or disassemble a window covering to satisfy the test conditions. Deviations from the standard test shall be permited only where it is impractical to meet those conditions. Such deviations must be explicitly tated in the Statement of Compliance. 3.2 LSR TEST CONDITIONS ‘The following standard LSR test conditions are man- datory on equipment where they can be realized. a Radiation Source The focal spot size rec- ‘ommended by the system manufacturer shall ‘be used for the resolution test If this is other + than a NEMA Standard 0.6 mm (NEMA ‘Standards Publication XR 5) then the NEMA ‘equivalent focal spot employed shall be indi- ‘cated in the Statement of Compliance (Sec- tion 5). b. Total Filtration The total filtration shall be 2.5 mm Aluminum equivalent. The LSR shall be determined with no additional filta- tion between the X-ray tube and the test patter (other than such filtration as the sys- tem may impose, e.g., tabletop, spot film window, etc.) ¢. Radiation Energy Spectrum The LSR ‘determination shall be made at 50 KVp or the ‘minimum kVp of the system’s X-ray gener- ator if this later value exceeds 50 kVp. The KVpat which the determination is made shall ‘be included in the Statement of Compliance (ection 5). 4. Collimator Aperture The collimator ap- ceture shall be in correspondence with the entrance field size image. ‘The maximum entrance field size shall be implied. If less than the maximum field is imaged, eg.. due to overframing (displaying less than the en- tire entrance field area in the output of the XRII system) or by selection of a reduced field size of a multiple field xi system, then the actual field size imaged, referred to the entrance plane of the XRI system shall be stated in the Statement of Compliance (See- tion 5). 3.3 SOURCE TO ENTRANCE PLANE DISTANCE (SED) ‘The standard SED shall be 100 cm #1 cm. Equipment of fixed SED or equipment whose adjustment range does ‘not span the standard SED shall be tested atthe spacing recommended by the manufacturer, and such spacing shall be reported with the Statement of Compliance. (ection 5). 3.4 ALIGNMENT The central axis of the X-ray field shall be collinear with the central axis of the imaging system. The dis- placement of these two axes shall not exceed 2 percent of the SED in the entrance plane of the XRII system. 35 POSITION OF THE RESOLUTION TEST OBJECT If the entrance plane of the XRII system is accessible, the test object shall be positioned directly inthe entrance plane. Ifthe entrance plane is inaccessible, the test object shall be placed as close to the entrance plane as possible, eg. directly on the antscatter grid, tabletop, etc.,and the distance between the test pattem and the XRII entrance plane shall be stated. The resulting geometric magnifi- ‘cation ofthe test object shall be stated forthe central axis of the X-ray field and the LSR so determined shall be corrected for geometric magnification disregarding any effects ofa finite focal spot. In order to avoid interfer- ‘ence, the bars of the test object shall be oriented at an angle of 45 degrees with respect tothe TV raster lines or the lines of an unremovable grid. For the determination of central and off-axis LSR, the resolution test object shall be located in the entrance plane of the XR system with the aid of an image position ‘calibration template such as that described in 2.2. The template shall be positioned in the entrance plane of the ‘RI system and centered in the output image of the XRI ‘system using the demarcations along the template’s axes. 3.6 ANTISCATTER GRID “The antiscatier grid shall be removed since the LSR is determined without a scattering object interposed be- tween the radiation source and the XRIT entrance plane (except for relatively X-ray transparent objects such as the tabletop and automatic exposure control detectors).STD-NEMA XR DI-ENGL 1993 MM 6470247 O52b2b4 155 mm XR 11-1993, Page If removal is not feasible, the LSR shall be determined withthe grid left in place, and the grid characteristics, i.e, {7d ratio, lines per cm or inch, interspace material, and ‘cover material, shall be stated in the Statement of Com- pliance (Section 5). 3,7 EXPOSURE RECORDING AND PROCESSING CONDITIONS Since the radiation is not attenuated by a patient or a patient-equivalent phantom during the determination of the LSR, the automatic brightness control or automatic ‘exposure control of the equipment can be expected to ‘cause an over-exposure at the radiation energy spectrum required. In such an event, the exposure rate or exposure ‘per frame shall be adjusted manually in order to obtain the manufacturer's prescribed video signal or the proper density of the test film. Systems with fixed or variable ‘optical apertures shall employ the aperture required when the system is calibrated to the manufacturer's criteria, ‘The film recording materials and development process- ing employed in the determination of the LSR of filming. systems shall be those recommended by the system ‘manufacturer for conventional clinical applications. A. ‘series of test exposures over a range of densities shall be taken at the beginning of the determination, and the ‘exposure that shows the test patiern optimally resolved ‘shall be used. 3.7.1 XRIl Photofluorographic System ‘The camera shall be set for single exposures. 3.7.2 XRIlCine System Cine film shall be projected at 60 frames per second employing the system manufacturer's recommended projection system. 3.7.3. XRIl Video System ‘The exposure rate shall be adjusted to achieve the manufacturer's recommended composite video signal level at the TV monitor input. The brightness and con- trast controls of the TV monitor the room illumination, and the viewing distance shall be adjusted to obtain the best overall discembilty of the test object. 3.7.4 XRIl Optical Viewing System ‘The exposure rate shall be adjusted so thatthe resolu- tion ofthe test object is not limited by insufficient bright- ness, The room illumination shall be adjusted to obtain the best overall discemibility of the test object.STD-NEMA XR DI-ENGL 1993 ml 6470247 OSib2b5 090 Wm XR 11-1983 Page 7 Section 4 DETERMINATION 4.1 MEASUREMENT PROCEDURE ‘The LSR shall be determined at the central axis of the imaging system and at off-axis locations in the four ‘quadrants of the image at one or more specific radii referred to the entrance plane of the XRII system, as specified by the system manufacturer. 42 PRESENTATION OF RESULTS “The presentation of results shall specify the following. _XRII system type identification Image field size kVp Central LSR in the system output image (Off-axis LSR in the system output image Entrance plane radius for off-axis LSR value Statement of accuracy of results Deviations from standard test conditions Fepeae ge ‘The off-axis LSR at the corresponding entrance plane ‘radius shal be stated as the single value determined to be the minimum of all of the respective radial and tangential resolution determinations in the four quadrants of the system outputimage. Average or typical values shall not ‘be used in the determination, It is recommended that the following tabular format for the presentation of the required data be used. LIMITING SPATIAL RESOLUTION PER NEMA STANDARD XR 11-1993" ‘Of Axis Radtas®® (am) ‘Deviations from the sandard tet conditions of Secon 3 ball be Tied: 2, ‘Spatial resohton at ther than the specified mdiation quality: tae the Vp and fitation sed ‘b_Determinstion with te Resoltin Test Object out ofthe entrance plane ofthe XRIL syne: sate the distance of he object from the ‘ectrance plane an the geometric magnification factor employed Giid no removable: sate grid charaaernor: i, rai, line freqpency, intemmpece material, and cover material 4. Determination st powstandard SED: mate the SED osed Referred othe entree plane ofthe XII syne. ‘tNoinl camer frame tte designation ¢., 35 mam or 105 mn.STD-NEMA XR DU-ENGL 1993 MM 6470247 OSUb2bb T2? mm XR 11-1993 Page9 Section 5 STATEMENT OF COMPLIANCE ‘fa manufacturer states that a producti in compliance with this NEMA Standard, the presentation of the results| ‘of the determination shall be according to 4.2, Any eviations from the standard test conditions shall be stated. Previous page is blank ‘Compliance with this Standard shall be stated as" iting spatial resolution per NEMA Standard XR. 11 1993."STD-NEMA XR_LL-ENGL 2993 bu70247 OSbb2b7 9b3 ees NO Oe eC oe ete ee cee Reet)