Module 4 CHDX04_copy
Module 4 CHDX04_copy
s*
s s* alkanes
Unoccupied levels
p*
s p* carbonyls
s
Molecular orbitals
Principle of Ultraviolet Spectroscopy
s s* alkanes 150 nm
s p* carbonyls 170 nm
n s* O, N, S, halogens 190 nm
n p* carbonyls 300 nm √
Schematic Diagram of the Ultraviolet Spectrometer
log(I0/I) = A
UV sources I0 I
sample
200 400
l, nm
detector
monochromator/
beam splitter optics I0 I0
reference
The limit of
resolution of the
human eye is
about 0.1 mm,
or 100 microns
Light Microscope Electron Microscope
Illuminating source is the Light. Illuminating source is the beam of
electrons.
Specimen preparation takes usually few Specimen preparation takes
minutes to hours. usually takes few days.
Live or Dead specimen may be seen. Only Dead or Dried specimens are seen.
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Scanning Electron Microscope (SEM)
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•A Scanning Electron Microscope (SEM) is a type of electron
microscope that images a sample by scanning it with a high energy beam
of electrons in a raster scan pattern.
•The electrons interact with the atoms that make up the sample
producing signals that contain information about the sample’s surface
topography, composition, and other properties such as electrical
conductivity.
Principle
•The basic principle is that a beam of electrons is generated by a
suitable source, typically a tungsten filament or a field emission gun.
•The electron beam is accelerated through a high voltage and pass
through a system of apertures and electromagnetic lenses to produce a
thin beam of electrons.
•Then the beam scans the surface of the specimen, electrons are
emitted from the specimen by the action of the scanning beam and
collected by a suitably positioned detector.
When electrons from the microscope interact with a sample, this can
generate different kinds of other electrons and photons.
The two types of electrons essential for imaging are backscattered
electrons (BSEs) and secondary electrons (SEs).
Backscattered electrons are reflected back when the primary
electron beam interacts with the sample object. These are elastic
interactions.
Secondary electrons are different, because they come from the
atoms of the sample, and are the result of inelastic interactions.
What is the difference between these elastic and inelastic
interactions?
Elastic interactions occur when there is no loss of energy of the
primary electron, and when this happens, the electrons can change
direction but do not change their wavelength
Inelastic interactions occur when an interaction causes a loss of
energy of the primary electron.
BSEs and SEs contain different types of information. BSEs
originate from deeper areas of the sample, whereas SEs come from
surface regions.
Images from BSEs display high sensitivity to differences in atomic
numbers, which will show up as brighter or darker.
SE images contain more detailed surface information.
The scanning electron microscope requires different types of
detectors for backscattered and secondary electrons.
Typically, for SEs, this will be an Everhart-Thornley detector. This
consists of a scintillator inside a Faraday cage. This detector is
positively charged to attract SEs.
For detecting BSEs, the microscope will use solid state detectors,
placed above the sample.
Electron source
Condenser lenses
Objective aperture
Scan coils
Chamber (specimen)
Detectors
Computer hardware and software.
SEM Instruments
The instrument used for SEM includes these components:
Electron source
Anode
Condenser lens
Scanning coils
Objective lens.
(
b
)
100 nm
Applications
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SARS-CoV Cancer Cell
Transmission Electron Microscopy
(TEM)
Principle
TEM SEM
Electron beam passes Electron beam scan over
through the thin sample. surface of sample.
Specially prepared thin Sample can be of any thickness
samples are supported on and is mounted on an
TEM grids. aluminum stub, carbon tape.
Specimen stage halfway Specimen stage in the chamber
down column. at the bottom of the column.
Image shown on fluorescent Image shown on TV monitor.
screen. Image is of the surface of the
Image is a 2D projection of sample.
the sample
Atomic Force Microscope (AFM)
What is AFM?
Working Concept
Bragg’s Law
What is X-ray Powder Diffraction (XRD)
Weight Loss:
Desorption.
Weight Gain:
Absorption or Adsorption.
Interpretation of TGA Curves
H2O
CO
CO2
TGA and DTA: Calcium Oxalate Monohydrate
1st Step, H2O Release
CaC2O4•H2O (s) → CaC2O4 (s) + H2O (g)
2nd Step, CO Release
CaC2O4 (s) → CaCO3 (s) + CO (g)
3rd Step, CO Release
CaCO3 (s) → CaO (s) + CO2 (g)
1) ChemDraw
3) Chem3D
4) ChemFinder
What is Origin ?
Origin is a proprietary computer program for interactive scientific
graphing and data analysis.
Each column has associated attributes like name, units and other
user definable labels.
Here, the protein can be thought of as the “lock” and the ligand can
be thought of as a “key”.