VLSI Assignment-1
1. Given the following code sample:
byte my_byte;
integer my_integer;
int my_int;
bit [15:0] my_bit;
shortint my_short_int1;
shortint my_short_int2;
my_integer = 32’b 0000 1111 xxxx zzzz;
my_int = my_integer;
my_bit = 16’h 8000;
my_short_int1 = my_bit;
my_short_int2 = my_short_int1-1;
a. What is the range of values my_byte can take?
b. What is the value of my_int in Hexadecimal?
c. What is the value of my_bit in Decimal?
d. What is the value of my_short_int1 in Decimal?
e. What is the value of my_short_int2 in Decimal?
2. Given the following code sample:
bit [7:0] my_mem[3];
logic [3:0] my_logicmem[4];
logic [3:0] my_logic;
my_mem = ‘{default: 8h’ 45};
my_logicmem = ‘{0,1,2,3};
my_logic = 4’h F;
Evaluate the following statements in order and give the result for each assignment:
a. my_mem [2] = my_logicmem [4];
b. my_logic = my_logicmem [4];
c. my_logicmem [3] = my_mem [3];
d. my_mem [3] = my_logic;
e. my_logic = my_logicmem[1];
f. my_logic = my_mem[1];
g. my_logic = my_logicmem[my_logicmem[4]];
3. What are the Advantages and Disadvantages to Testing at the Block-level? Why?
4. What are the Advantages and Disadvantages to Testing at the System-level? Why?
5. Give the Advantages and Disadvantages of Directed-Testing in System Verilog(SV)?
6. List out and also Elaborate the Advantages and Disadvantages of Constrained
Random Testing(CRT)?
7. Explain in-detail the Data-types in System Verilog?
8. Explain the CRT(Constrained Random Testing) in-detail with-respect-to SV?