Advanced Energy Materials and Systems Laboratory USPCAS-E
ADVANCED
ENERGY MATERIALS &
SYSTEMS LABORATORY
Advanced Energy Materials & Systems (AEMS) Lab was established in 2013 with funding from NUST, HEC and a
USAID-funded project. The Lab is one of a kind lab, equipped with facilities for materials’ modelling/simulation,
processing, sample preparation, coatings, device fabrication, and characterisation. It is fully geared up to solving
the problems of industries such as Steel, Auto-manufacturing, Chemical, Petrochemical, Surgical, Defence and
Tool Manufacturing. In AEMS Lab, materials development through wet chemical, solid state, and vapour phase
deposition techniques are frequently practiced. Different types of ball milling machines and hydrothermal
reactor are often employed for nano powders and nanocomposites development. Several coating techniques for
film deposition like spin coating, dip coating, electrophoresis, nanofiber electrospinning, ultrasonic spraying,
thermal & e-beam evaporation, reactive sputtering, chemical vapour deposition and thermal spraying are
available. A number of heat treatment facilities for thermal treatment at different temperatures and in different
atmospheres are integral part of the AEMS Lab. Facilities like hydraulic press, sand blasters, lapping, grinding &
polishing tools, diamond saw cutter, and plasma cleaner are often employed for sample preparation and other
such practices. The characterisation facility offers a broad range of tools for the morphological, chemical,
electrical & electronic, structural, and thermal behaviour of different material systems and devices.
LAB MISSION
To develop highly efficient and environmentally
benign materials for sustainable energy needs of
Pakistan.
RESEARCH PORTFOLIO
Solar Cells
High-Temperature Fuel Cells
Thermal Barrier Coatings
Anti-Reflective Coatings
Batteries
High heat flux and radiation tolerant materials
National University of Sciences & Technology
Advanced Energy Materials and Systems Laboratory USPCAS-E
RESEARCH EQUIPMENT
Equipment Descrip�on Specifica�on
Highly resolved morphological images
Scanning electron microscope at the nanoscale are obtained and Accelerating voltage: 200 V to 30 kV
with energy dispersive X-ray elemental composition of the sample is
spectroscope traceable with the EDS detector fitted
with the system.
To extract and analyze the crystal
X-ray diffractometer structure and phase information of Cu Kα radiations with LYNXEYE 1-D detector
different materials.
To develops a sub nanometrically
Atomic Force Microscope Linear electromagnetic scanner with devia-
precise topographical image of a tion less than 0.1% over the full scan range.
surface
The relative change in length as a Sample length: 0-50 mm
Thermal dilatometer Sample diameter: Max. 10 mm
function of temperature.
Temperature upto 1500 ºC max.
TG/DTA can measure the weight loss as
Simultaneous Thermogravimet- a function of temperature and useful Sample length: 0-50 mm
ric/ Differential Thermal Analyzer information such as the temperature of Sample diameter: Max. 10 mm
(TG/DTA) crystallization or pyrolysis temperature Temperature upto 1500 ºC max.
can be extracted.
TG/DTA can measure the weight loss as
Simultaneous Thermogravimet- a function of temperature and useful Temperature range: Ambient -1500 ºC
ric/ Differential Thermal Analyzer information such as the temperature of Measurable range (TG): ± 500mg
(TG/DTA) crystallization or pyrolysis temperature Measurable range (DTA): ± 1000 μV
can be extracted.
Information about the optical response, Transmittance measurements of solids as well
UV-Vis-NIR Spectrophotometer thickness estimation, electronic band as liquids, in the range of 200 – 3200 nm
structure, etc.
It is a complete system for measuring Precise Constant current source: 1nA to 20mA
Hall Effect Measurement System the resistivity, carrier concentration, range.
and mobility of semiconductors.
FTIR spectrometer is a versatile tool for
FTIR Spectrometer the chemical analysis of solids, Spectral range: 4000 cm-1 to 650 cm-1
powders, liquids, and pastes
Surface Area and Pore Size NOVA 2200e is a simultaneous rapid Analyze up to 200 data points
Analyzer two-sample surface area and pore size
analyzer.
Microhardness Tester (FM-810, Vickers hardness (HV) and Knopp Test loads (gf ): 5, 10, 25, 50, 100, 200, 300, 500,
Future-Tech Corp., Japan) hardness (HK) measurements possible 1000, 2000
National University of Sciences & Technology
