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TDS - Xan215

The FISCHERSCOPE X-RAY XAN 215 is a cost-effective entry-level X-ray fluorescence measuring instrument designed for non-destructive analysis of jewelry and precious metals, capable of analyzing up to 24 elements simultaneously. It features a user-friendly bench-top design, integrated video microscope, and operates with advanced WinFTM software, ensuring high accuracy and minimal recalibration. The instrument complies with international standards and is suitable for various applications including the analysis of gold, silver, and dental alloys.

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19 views4 pages

TDS - Xan215

The FISCHERSCOPE X-RAY XAN 215 is a cost-effective entry-level X-ray fluorescence measuring instrument designed for non-destructive analysis of jewelry and precious metals, capable of analyzing up to 24 elements simultaneously. It features a user-friendly bench-top design, integrated video microscope, and operates with advanced WinFTM software, ensuring high accuracy and minimal recalibration. The instrument complies with international standards and is suitable for various applications including the analysis of gold, silver, and dental alloys.

Uploaded by

SRAN
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© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Data Sheet

FISCHERSCOPE® X-RAY XAN® 215

Cost-effective entry-level X-Ray Fluorescence Measuring Instrument for


fast and non-destructive Analysis and Coating Thickness Measurement of
Gold and Silver Alloys
FISCHERSCOPE® X-RAY XAN® 215
Main Features
The FISCHERSCOPE X-RAY XAN 215 is the cost-effective entry-level X-ray fluo-
rescence measuring instrument for non-destructive analysis of jewelry, coins
and precious metals.
It is particularly suited for the analysis of precious metals and their alloys in
composition and coating thickness. Up to 24 elements can be determined simul-
taneously.
Typical fields of application are the analysis of:
 Jewelry, precious metals and dental alloys
 Yellow and white gold
 Platinum and silver
 Rhodium
 Alloys and coatings
 Multi layer coatings
Outstanding accuracy and long-term stability are characteristics of all
FISCHERSCOPE X-RAY systems. The necessity of recalibration is dramatically
reduced, saving time and effort.
The modern silicon PIN detector achieves high accuracy and good detection
sensitivity.
The fundamental parameter method by Fischer allows for the analysis of solid
and liquid specimens as well as coating systems without calibration.
Design
The XAN 215 is designed as a user-friendly bench-top instrument.
Specimen positioning is quick and easy. The X-ray source and semiconductor
detector assembly is located in the instrument‘s lower chamber, so that the
measuring direction is from underneath the sample, which is supported by a
transparent window.
The integrated video-microscope with zoom and crosshairs simplifies sample
placement and allows precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear pre-
sentation of measurement data is performed on a PC, using the powerful and
user-friendly WinFTM® software.
The FISCHERSCOPE X-RAY XAN 215 fulfills DIN ISO 3497 and ASTM B 568. It is a
fully protected instrument with type approval according to German radiation
protection law.

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General Specification
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious
metals and their alloys in composition and coating thickness.
Repeatability ≤ 1 ‰ for gold, measurement time 60 sec
Design Bench top unit with upwards opening hood
Measurement direction Bottom up
X-Ray Source
X-ray tube Tungsten tube, thermally stabilized
High voltage Three steps: 30 kV, 40 kV, 50 kV, max. anode current: 1 mA
Aperture (Collimator) Ø 1 mm (39 mils), optional Ø 2 mm (79 mils)
Measurement spot size Ø 1.2 mm (47 mils) with aperture Ø 1 mm (39 mils) and flat lying sample
(measurement distance 0 mm)
X-Ray Detection
X-ray detector Silicon PIN detector with peltier cooling
Element range Sulfur S (16) to Uranium U (92) – up to 24 elements simultaneously
Resolution (fwhm for Mn-Kα) ≤ 180 eV
Measuring distance 0 … 25 mm (0 … 1 in)
Distance compensation with patented DCM method for simplified measure-
ments at varying distances. For particular applications or for higher demands
on accuracy an additional calibration might be necessary.
Sample Alignment
Sample positioning Manually
Video microscope High-resolution CCD color camera for optical monitoring of the measurement
location along the primary beam axis, Crosshairs with a calibrated scale (ruler)
and spot-indicator, Adjustable LED illumination, Laser pointer (class 1) to sup-
port accurate specimen placement
Zoom factor Digital 1x, 2x, 3x, 4x
Sample Stage
Design Fixed sample support
Usable sample placement
area 310 x 320 mm (12.2 x 12.6 in)
Max. sample weight 13 kg (29 lb)
Max. sample height 90 mm (3.5 in)

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FISCHERSCOPE® X-RAY XAN® 215
Electrical Data
Power supply AC 100 – 240 V ±10 % / 50 – 60 Hz max. 120 VA, without evaluation PC
Protection class IP40

Dimensions
External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4
Weight Approx. 45 kg (99 lb)

Environmental Conditions
Operating temperature 10 °C – 40 °C (50 °F – 104 °F)
Storage/Transport
temperature 0 °C – 50 °C (32 °F – 122 °F)
Admissible air humidity ≤ 95 %, non-condensing

Evaluation Unit
Computer Windows®-PC
Software Standard: Fischer WinFTM® BASIC including PDM®
Optional: Fischer WinFTM® SUPER
Standards
CE approval EN 61010, EN 61326
X-Ray standards DIN ISO 3497 and ASTM B 568
Approval Fully protected instrument with type approval according to German radiation
protection law.
Order
FISCHERSCOPE X-RAY XAN 215 605-083
605-692, contains all calibrated measurement applications necessary for the
analysis of jewelry, coins and precious metals
Special XDV product modification and XDV technical consultation on request
2022-05-10
952-097

FICHERSCOPE®, WinFTM®, XAN® und PDM® sind eingetragene Marken der Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfin-
gen - Deutschland. Windows® ist ein eingetragenes Warenzeichen von Microsoft Corporation in den Vereinigten Staaten und anderen Staaten.

www.helmut-fischer.com

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