An electron microscope (EM) uses accelerated electrons instead of light to achieve higher resolution images, allowing detailed visualization of biological and non-biological specimens. There are two main types of electron microscopes: Transmission Electron Microscopes (TEM), which provide internal structure images, and Scanning Electron Microscopes (SEM), which focus on surface details. EM has significantly higher resolving power compared to light microscopes, with resolutions as low as 0.5 nm and magnifications up to 10 million times.
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1- Electron microscope
An electron microscope (EM) uses accelerated electrons instead of light to achieve higher resolution images, allowing detailed visualization of biological and non-biological specimens. There are two main types of electron microscopes: Transmission Electron Microscopes (TEM), which provide internal structure images, and Scanning Electron Microscopes (SEM), which focus on surface details. EM has significantly higher resolving power compared to light microscopes, with resolutions as low as 0.5 nm and magnifications up to 10 million times.
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Electron microscope
Electron microscope (EM):
Is a microscope that uses a beam of accelerated electrons as a source of illumination rather than a beam of light.
Principle of electron microscope:
Electrons are small particles (like photons of light) which act as waves. A beam of electrons passes through the specimen then into the lenses (that magnify the image). The image results from scattering of electrons by atoms in the specimen.
Electron microscopes have a higher resolving power
than light microscopes and can reveal the structure of smaller objects. This is due to its short wavelength (which can be up to 100,000 times shorter than that of visible light photons, and this allows electron microscope to produce higher resolution images).
N.B. the smaller the resolution value, the higher the
resolving power of the microscope and the better the clarity and detail of the image.
The main idea and functions of electron microscope
Electron microscopy (EM) is a technique for obtaining high resolution images of biological and non-biological specimens. It is used in biomedical research to investigate not just the whole cells, but also the detailed (subcellular) structure of tissues, cells, organelles and macromolecular complexes. The original idea of the electron microscope is to use a high voltage electron beam to illuminate the specimen and create an image.
The ancillary (support) techniques used with electron
microscope in order to obtain excellent results are Thin sections, immune-labeling and negative stain.
The main differences between light microscope and
electron microscope as regards resolution (is the smallest distance by which two points can be separated and still be distinguished as separate objects) and magnifications ( is a measure of how much larger a microscope causes object to appear)
- Light microscope: 200 nm resolution and 2000
magnifications (i.e. magnify up to about 400times actual size. So something that was 1 mm wide in real life would be 400mm wide in the microscope image).
- Electron microscope: 0.5 nm resolution and 10,000,000
magnifications The difference between light microscope and electron microscope as regards lens system Use of electron microscope: Electron microscope is used to visualize: -Ultrastructure of microorganisms and cells -Ultrastructure of metals and crystals.
The electron micrographs
-Electron micrographs are obtained by using specialized digital cameras and frame grabbers.
The steps and function of each component in electron
microscope: -Electron gun: Release electrons (the source of electrons). -Anode : Accelerates and focus the electrons into the electromagnetic lens. -Electromagnetic lenses: Focus the electrons to obtain a sharp image (not blurred image). They are 3 types: condenser, objective and projector. -Scanning coil: Sending image to TV scanner. -Electron detector: Sending image to TV scanner. -Stage: Sending image to TV scanner. Types of electron microscopes and their criteria
There are 2 main types :- Transmission and Scanning
A-Transmission electron microscope: The original form
of the electron microscope. The electron beam is transmitted through the specimen (passes through the slice rather than skimming over its surface) that is in part transparent to electrons and in part scatters them out of the beam. When it emerges from the specimen, the electron beam carries information about the structure of the specimen that is magnified by the objective lens system of the microscope. Transmission electron microscopes (TEM) generate high resolution cross-sections of objects, so it is used to obtain detailed images of the internal structures of cells.
B-Scanning electron microscope: It produces images by
probing the specimen with a focused electron beam (primary electrons) that is scanned across a rectangular area of the specimen. The secondary electrons released from each point in the specimen for a rectangular view. Scanning electron microscopes (SEM) display enhanced depth to map the surface of objects in 3D image.
C-Serial section electron microscope: It is a type of
transmission electron microscope that produces many thin sections in sequences.
D-Reflection electron microscope: An electron beam is
fallen on a surface but instead of using the transmission or secondary electrons, the beam of electron is reflected in elastic surface. This type is used to study surface details of crystalline materials. E-Scanning transmission electron microscope: Focus a probe across specimens and various signals are collected point by point to form an image.
Differences between the idea of function of
Transmission electron microscope (TEM) and Scanning electron microscope (SEM):
The main difference between SEM and TEM is
that SEM creates an image by detecting reflected or knocked-off electrons, while TEM uses transmitted electrons (electrons that are passing through the sample) to create an image.
So, TEM is used to examine the inner structures using
maximum magnification, while SEM is used to examine the surface structure of the specimen (no need to penetrate the specimen and no need thin slice).