Advanced Digital System Design (2013)
Advanced Digital System Design (2013)
First Semester
Applied Electronics
(Regulation 2009)
1. What is the difference between the state graphs for Mealy and Moore
machines?
6. List out the different faults that may occur in combinational digital circuits.
11. (a) Design a sequential network to convert BCD to Excess-3 code. (16)
Or
(b) (i) Construct an 8M chart for the control network of a binary divider.
(8)
(ii) Write notes on the A8M realization using PLAs. (8)
12. (a) Illustrate the analysis of an asynchronous sequential network with 8-R
flip flops. (16)
Or
(b) Illustrate the design of an edge-triggered clocked T flip flop and find a
primitive flow table with a minimum number of rows. (16)
13. (a) (i) With an exampl illustrate the concept of path sensitizing in the
detection of faults in digital circuits. (8)
(ii) With an example, explain how test generation can be achieved in
testing a PLA. (8)
Or
(b) (i) Explain about various types of faults that may occur in PLAs. (8)
(ii) Discuss the Built in self test scheme used in digital circuits. (8)
14. (a) (i) With an example, explain how a logic function can be realized using
~~ W
(ii) Explain how Xilinx FPGA can be reprogrammed. (8)
Or
(b) Explain the block schematic and architecture of Xilinx 2000 FPGA. (16)
15. (a) (i) Write a VHDL source code for JK flipflop. (8)
(ii) Write a VHDL source code for n-bit counter. (8)
Or
(b) Write a detailed note on necessity and types of test benches in the
stimulation of VHDL code. (16)
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