DIC Lec5
DIC Lec5
h
2
• r = resistivity (W*m)
• t: thickness w w
• L: Conducting length
• W: conductor width l
r l l
R= =R
w
t w w
• Rs: sheet resistance l l
t t
3
Choice of Metals
• Until 180 nm generation, most wires were aluminum
• Contemporary processes normally use copper
– Cu atoms diffuse into silicon and damage FETs
– Must be surrounded by a diffusion barrier
5
Resistance for Rectangular Conductors
6
Metal Layer: Wiring
• Modern processes: 6-10+ metal layers
• M1-M3: thin, narrow for high density cells
• M4-M6: thicker for longer wires
• M7-M9: thickest for VDD, GNS and Clock, Reset
7
Contact Resistance
• Contacts and Vias also have 2-20W
• Use many contacts for lower R
– Many small contacts for current crowding around periphery
8
MOS Channel Resistance
• In linear region → Rc = K(L/W)
– Ids = β[ (Vgs-Vt)Vds -V ds2/2]
−1
ox
where K= m (V gs −V t )
t ox
– Neglect Vds2
9
Capacitance Estimation
• For conventional CMOS process, a capacitor can be formed using
– The gate and channel of an MOS transistor
– Has good capacitance per are but is relatively nonlinear if operated over
large voltage ranges
– A diffusion area (to ground or VDD): The diffusion capacitor cannot be
used for a floating capacitor (where two terminals are not connected to
fixed voltage supply like VDD/GND)
– A parallel metal plate capacitor (using stacked metal layers or finger
capacitors on the same layer)
A
• Parallel plate capacitor: C = s o
d
• A: Area, d: separation, : dielectric constant
10