A Step Towards Automatic Defect Pattern Analysis and Evaluation in Industrial Radiography using Digital Image Processing
A Step Towards Automatic Defect Pattern Analysis and Evaluation in Industrial Radiography using Digital Image Processing
Abstract
Problem Specification
False negative reactions (i.e. the overlooking of a defect area) are also
potentially prevalent with many approaches. This is because the sharp
intensity changes that characterize a defect are often blurred by the x-ray
image process, and the transition between background and defect becomes
so slight as to be of similar magnitude to noise spikes.
Once an image has been filtered, one of two post processing operators is
applied in order to segment suspect defect pixels from the image
background. These are: -
The neural network method is more sensitive and hence is likely to locate
very subtle areas but has a high false alarm rate. The variance operator is
cruder, but is also faster (speed increase of x5) and is also more 'tunable'
so it is applicable to most image types. Once suspect defect pixels have
been located, some blob analysis is carried out to eliminate any areas that
are either too small to warrant further investigation, or are likely to be part
of the component geometry (i.e. the edges of the weld structure, etc.).
Conclusion
References
https://www.ndt.net/article/wcndt00/papers/idn673/idn673.htm