3151105 (1)
3151105 (1)
/Seat No_____________
OR
(c) For an enhancement type NMOS transistor has its source terminal connected 07
to ground and 3 V connected to ground and 3 V connected to the gate. NMOS
has VT= 2 V , = 0.04 1/V , n *Cox=20A/V2, W= 200m and L =10m , VG=
3V , VD=0.5 V and 1 V. Calculate Drain Current ID.
Physical constants :
Thermal voltage =KT/q = 0.026 volt.
Energy Gap of silicon (Si) =Eg = 1.12 Ev.
Intrinsic Carrier Concentration of silicon=ni=1.45x1010cm–3 .
Dielectric constant of vaccume =εo=8.85 x 10-14F/cm.
Dielectric constant of silicon =εsi= 11.7 xεoF/cm.
Dielectric constant of silicon dioxide =εox= 3.97 xεoF/cm
Q.4 (a) What are the limitations of Dynamic circuits? Discuss the effect of 03
charge sharing and charge leakage in dynamic pass transistor logic.
(b) Two nMOS transistors (M1 and M2) connected in series is shown in 04
Figure 1. The power supply is VDD =3.3 V and the nMOS threshold
VTN = 0.55 V. Find the output voltage at node b. Consider i) Va = 2.7 V
and ii) Va = 3V.
Figure 1
(c) Explain the Euler path approach to find the optimized stick-diagram for 07
any CMOS logic circuit. Draw the optimized stick-diagram for the
following Boolean function (CMOS Logic), F= (A(D+E)+ BC)’.
Explain the importance of Euler path approach.
OR
Q.4 (a) What do you mean by stick diagram? Implement the following Boolean 03
function using stick diagram.
Y = (A*(D+E)+B*C)’
2
(c) What is clock-skew? Explain on-chip clock generation and distribution. 07
OR
Q.5 (a) Draw and discuss three stage ring oscillator 03
(b) Implement and Describe CMOS clocked SR flip-flop 04
(c) What is need of Design of Testability (DFT) in VLSI IC design and 07
explain Built in Self Test (BIST) techniques of DFT
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