Basics of MSE (Material Science)
Basics of MSE (Material Science)
1
1.2. Materials science and Engineering
• A multidisciplinary subject such as chemistry, physics, and
engineering
3
1.3. Classification of materials
Metals Ceramics & Glasses Polymers
• good conductors • thermally and • very large molecules
of electricity and electrically insulating • Soft, ductile, low
heat • resistant to high strength, low density
• lustrous temperatures and • Thermal & electrical
appearance harsh environments insulators
• susceptible to • hard, but brittle • Optically translucent or
corrosion transparent.
• strong, but
deformable
4
Classification of Materials: Additional
Categories
Composites Semiconductors Biomaterials
• consist of more than • electrical properties • implanted in human
one material type between conductors body
• designed to display and insulators • compatible with
a combination of • electrical properties body tissues
properties of each can be precisely
component controlled
characterization
processing properties
• method of preparing • material characteristic
material • response to external
stimulus
• mechanical,
performance electrical, thermal,
• behavior in a magnetic, optical,
particular deteriorative
application
6
Structure, Processing, & Properties
• Properties depend on structure
ex: hardness vs structure of steel
(d)
6 00
Hardness (BHN)
30 mm
5 00 (c)
Data obtained from Figs. 10.30(a)
4 00 (b) and 10.32 with 4 wt% C composition,
(a) and from Fig. 11.14 and associated
4 mm discussion, Callister & Rethwisch 8e.
3 00 Micrographs adapted from (a) Fig.
10.19; (b) Fig. 9.30;(c) Fig. 10.33;
30 mm
30 mm and (d) Fig. 10.21, Callister &
2 00 Rethwisch 8e.
100
0.01 0.1 1 10 100 1000
Cooling Rate (ºC/s)
• Processing can change structure
ex: structure vs cooling rate of steel
7
Aluminum oxide (AlO3) may be transparent,
translucent, or opaque depending on the material
structure.
8
Chapter 2: Atomic Structure &
Interatomic Bonding
ISSUES TO ADDRESS...
9
2.1 Atomic Structure and periodic table
Atomic Structure
• atom – electrons – 9.11 x 10-31 kg
protons
neutrons
}1.67 x 10-27 kg
1 amu/atom = 1g/mol
C 12.011 10
H 1.008 etc.
Atomic Structure
11
Electronic Structure
• Electrons have wavelike and particulate
properties.
– This means that electrons are in orbitals defined by a
probability.
– Each orbital at discrete energy level is determined by
quantum numbers.
Quantum # Designation
n = principal (energy level-shell) K, L, M, N, O (1, 2, 3, etc.)
l = subsidiary (orbitals) s, p, d, f (0, 1, 2, 3,…, n -1)
ml = magnetic 1, 3, 5, 7 (-l to +l)
ms = spin ½, -½
12
Electron Energy States
Electrons...
• have discrete energy states
• tend to occupy lowest available energy state.
4d
4p N-shell n = 4
3d
4s
Energy 3p M-shell n = 3
3s
Adapted from Fig. 2.4,
Callister & Rethwisch 8e.
2p L-shell n = 2
2s
1s K-shell n = 1
13
SURVEY OF ELEMENTS
• Most elements: Electron configuration not stable.
Element Atomic # Electron configuration
Hydrogen 1 1s 1
Helium 2 1s 2 (stable)
Lithium 3 1s 2 2s 1
Beryllium 4 1s 2 2s 2
Boron 5 1s 2 2s 2 2p 1 Adapted from Table 2.2,
Callister & Rethwisch 8e.
Carbon 6 1s 2 2s 2 2p 2
... ...
Neon 10 1s 2 2s 2 2p 6 (stable)
Sodium 11 1s 2 2s 2 2p 6 3s 1
Magnesium 12 1s 2 2s 2 2p 6 3s 2
Aluminum 13 1s 2 2s 2 2p 6 3s 2 3p 1
... ...
Argon 18 1s 2 2s 2 2p 6 3s 2 3p 6 (stable)
... ... ...
Krypton 36 1s 2 2s 2 2p 6 3s 2 3p 6 3d 10 4s 2 4p 6 (stable)
valence electrons
15
Electronic Configurations
ex: Fe - atomic # = 26 1s2 2s2 2p6 3s2 3p6 3d 6 4s2
4d
4p N-shell n = 4 valence
electrons
3d
4s
Energy 3p M-shell n = 3
3s
Adapted from Fig. 2.4,
Callister & Rethwisch 8e.
2p L-shell n = 2
2s
1s K-shell n = 1
16
The Periodic Table
• Columns: Similar Valence Structure
inert gases
give up 1e-
give up 2e-
accept 2e-
accept 1e-
give up 3e-
H He
Li Be O F Ne
Adapted from
Na Mg S Cl Ar Fig. 2.6,
Callister &
K Ca Sc Se Br Kr
Rethwisch 8e.
Rb Sr Y Te I Xe
Cs Ba Po At Rn
Fr Ra
18
2.2. Atomic Bonding in Solids
Ionic bond – metal + nonmetal
donates accepts
electrons electrons
Dissimilar electronegativities
19
Ionic Bonding
• Occurs between + and - ions.
• Requires electron transfer.
• Large difference in electronegativity required.
• Example: NaCl
Na (metal) Cl (nonmetal)
unstable unstable
electron
Na (cation) + - Cl (anion)
stable Coulombic stable
Attraction
20
Ionic Bonding
• Energy – minimum energy most stable
– Energy balance of attractive and repulsive terms
-+ -
A +
B
EN = EA + ER =
r rn
Repulsive energy ER
n = 8 for ions
Interatomic separation r
Net energy EN
- +
Adapted from Fig. 2.8(b),
Callister & Rethwisch 8e.
Attractive energy EA
- + 21
Examples: Ionic Bonding
• Predominant bonding in Ceramics
NaCl
MgO
CaF 2
CsCl
22
Covalent Bonding
• similar electronegativity share electrons
• bonds determined by valence – s & p orbitals
dominate bonding
• Example: CH4
shared electrons
H
C: has 4 valence e-, CH 4
from carbon atom
needs 4 more
H: has 1 valence e-, H C H
needs 1 more
shared electrons
Electronegativities H from hydrogen
are comparable. atoms
23
Primary Bonding
• Metallic Bond -- delocalized as electron cloud
( 3.5-1.2 )2
-
% ionic character 1 - e 4
x (100%) 73.4% ionic
24
METALLIC BONDING
25
SECONDARY BONDING
• Arises from interaction between dipoles
• Fluctuating dipoles
asymmetric electron ex: liquid H 2
clouds H2 H2
+ - + - H H H H
secondary secondary
bonding Adapted from Fig. 2.13,
Callister & Rethwisch 8e. bonding
Metallic Variable
large-Tungsten Nondirectional (metals)
small-Mercury
Secondary smallest Directional
inter-chain (polymer)
inter-molecular
27
Properties From Bonding: Tm
• Bond length, r • Melting Temperature, Tm
Energy
r
• Bond energy, Eo ro
r
Energy smaller Tm
unstretched length
ro larger Tm
r
Eo = Tm is larger if Eo is larger.
―bond energy‖
28
Properties From Bonding : a
• Coefficient of thermal expansion, a
length, L o coeff. thermal expansion
unheated, T1
DL DL
= a (T2 -T1)
heated, T 2 Lo
• a ~ symmetric at ro
Energy
unstretched length
ro
r a is larger if Eo is smaller.
E
larger a
o
E smaller a
o 29
Summary: Primary Bonds
Ceramics Large bond energy
(Ionic & covalent bonding): large Tm
large E
small a
30
Chapter 3: Crystalline structure and
imperfections in Solids
31
3.1. Crystal structures
• The atomic arrangement in a crystal is called crystal structure
Unit cell
34
3.2. Close-packed crystal structures
Energy and Packing
• Non dense, random packing Energy
typical neighbor
bond length
typical neighbor r
bond energy
typical neighbor
bond length
typical neighbor r
bond energy
Si Oxygen
Noncrystalline materials...
• atoms have no periodic packing
• occurs for: -complex structures
-rapid cooling
"Amorphous" = Noncrystalline noncrystalline SiO2
Adapted from Fig. 3.23(b),
Callister & Rethwisch 8e.
36
Metallic Crystal Structures
• How can we stack metal atoms to minimize
empty space?
2-dimensions
vs.
38
Simple Cubic Structure (SC)
• Rare due to low packing density (only Po has this structure)
• Close-packed directions are cube edges.
• Coordination # = 6
(# nearest neighbors)
39
Atomic Packing Factor (APF)
Volume of atoms in unit cell*
APF =
Volume of unit cell
*assume hard spheres
• APF for a simple cubic structure = 0.52
volume
atoms atom
a 4
unit cell 1 p (0.5a) 3
3
R=0.5a APF =
a3 volume
close-packed directions
unit cell
contains 8 x 1/8 =
1 atom/unit cell
Adapted from Fig. 3.24,
Callister & Rethwisch 8e. 40
Body Centered Cubic Structure (BCC)
• Atoms touch each other along cube diagonals.
--Note: All atoms are identical; the center atom is shaded
differently only for ease of viewing.
2a
Close-packed directions:
Adapted from R length = 4R = 3 a
Fig. 3.2(a), Callister &
Rethwisch 8e.
a
atoms volume
4
unit cell 2 p ( 3a/4 ) 3
3 atom
APF =
3 volume
a
unit cell 42
Face Centered Cubic Structure (FCC)
• Atoms touch each other along face diagonals.
--Note: All atoms are identical; the face-centered atoms are shaded
differently only for ease of viewing.
43
Atomic Packing Factor: FCC
• APF for a face-centered cubic structure = 0.74
maximum achievable APF
Close-packed directions:
length = 4R = 2 a
2a
Unit cell contains:
6 x 1/2 + 8 x 1/8
= 4 atoms/unit cell
a
Adapted from
Fig. 3.1(a),
Callister & atoms volume
Rethwisch 8e. 4
unit cell 4 p ( 2a/4 ) 3
3 atom
APF =
3 volume
a
unit cell
44
FCC Stacking Sequence
• ABCABC... Stacking Sequence
• 2D Projection
B B
C
A
A sites B B B
C C
B sites B B
C sites
45
Hexagonal Close-Packed Structure
(HCP)
• ABAB... Stacking Sequence
• 3D Projection • 2D Projection
nA
r =
VC NA
47
Theoretical Density, r
• Ex: Cr (BCC)
A = 52.00 g/mol
R = 0.125 nm
n = 2 atoms/unit cell
R
Adapted from
Fig. 3.2(a), Callister &
a a = 4R/ 3 = 0.2887 nm
Rethwisch 8e.
atoms
g
unit cell 2 52.00 rtheoretical = 7.18 g/cm3
mol
r= ractual = 7.19 g/cm3
a3 6.022 x 1023
volume atoms
unit cell mol 48
Densities of Material Classes
In general Graphite/
rmetals > rceramics > rpolymers
Metals/ Composites/
Ceramics/ Polymers
Alloys fibers
Semicond
30
Why? Platinum
B ased on data in Table B1, Callister
*GFRE, CFRE, & AFRE are Glass,
20 Gold, W
Metals have... Tantalum Carbon, & Aramid Fiber-Reinforced
Epoxy composites (values based on
• close-packing 60% volume fraction of aligned fibers
10 Silver, Mo in an epoxy matrix).
(metallic bonding) Cu,Ni
Steels
• often large atomic masses Tin, Zinc
Zirconia
r (g/cm3 )
5
Ceramics have... 4
Titanium
Al oxide
• less dense packing 3
Diamond
Si nitride
Aluminum Glass -soda
• often lighter elements Concrete
Silicon PTFE
Glass fibers
GFRE*
2 Carbon fibers
Polymers have... Magnesium G raphite
Silicone CFRE *
A ramid fibers
PVC
• low packing density PET
PC
AFRE *
1 HDPE, PS
(often amorphous) PP, LDPE
• lighter elements (C,H,O)
0.5
Composites have... 0.4
Wood
• Amorphous solids
-no long range order. ex. glass
50
Polymorphism
• Two or more distinct crystal structures for the same
material (allotropy/polymorphism)
iron system
ex. titanium
liquid
a, -Ti
1538ºC
BCC -Fe
ex. carbon 1394ºC
diamond, graphite FCC g-Fe
912ºC
BCC a-Fe
51
3.3. Crystallographic Directions and Planes
Point Coordinates
52
Crystallographic Directions
z Procedure
1. Any line (or vector direction) is specified by two
c points. The first point is, typically, at the origin
(000), if not, subtract.
2. Determine length of vector projection in each of
y three axes in units (or fractions) of a, b, and c.
(000)
a 3. Multiply or divide by a common factor to reduce
b the lengths to the smallest integer values, u v w.
x 4. Enclose in square brackets, no commas: [u v w].
5. Designate negative numbers by a bar.
ex: x(a), y(b), z(c)
=> 2, 0, 1 => [ 201 ]
1, 0, ½
y
pt. 1:
x tail => -2, 1/2, 1
[110]
ex: linear density of Al in [110]
direction
a = 0.405 nm
# atoms
a 2
LD 3.5 nm-1
Adapted from
Fig. 3.1(a),
length 2a
Callister &
Rethwisch 8e.
55
HCP Crystallographic Directions
z
Procedure
1. Vector repositioned (if necessary) to pass
through origin.
2. Read off projections in terms of unit
a2 cell dimensions a1, a2, a3, or c
3. Adjust to smallest integer values
- 4. Enclose in square brackets, no commas
a3
[uvtw] a
a1
2
Adapted from Fig. 3.8(a),
Callister & Rethwisch 8e.
a2 -a3
2
57
Crystallographic Planes
• Procedure
1. Read off intercepts of plane with axes in
terms of a, b, c
2. Take reciprocals of intercepts
3. Reduce to smallest integer values
4. Enclose in parentheses, no
commas i.e., (hkl)
59
Crystallographic Planes
z
example a b c
1. Intercepts 1 1 c
2. Reciprocals 1/1 1/1 1/
1 1 0
3. Reduction 1 1 0 y
a b
4. Miller Indices (110)
x
z
example a b c
1. Intercepts 1/2 c
2. Reciprocals 1/½ 1/ 1/
2 0 0
3. Reduction 2 0 0
y
4. Miller Indices (100) a b
x
60
Crystallographic Planes
z
example a b c c
1. Intercepts 1/2 1 3/4
2. Reciprocals 1/½ 1/1 1/¾
2 1 4/3 y
3. Reduction 6 3 4 a b
61
Crystallographic Planes (HCP)
• In hexagonal unit cells the same idea is used
z
example a1 a2 a3 c
1. Intercepts 1 -1 1
2. Reciprocals 1 1/ -1 1
1 0 -1 1 a2
3. Reduction 1 0 -1 1
a3
62
Crystallographic Planes
• We want to examine the atomic packing of
crystallographic planes
• Iron foil can be used as a catalyst. The
atomic packing of the exposed planes is
important.
a) Draw (100) and (111) crystallographic planes
for Fe.
b) Calculate the planar density for each of these
planes.
63
Planar Density of (100) Iron
Solution: At T < 912ºC iron has the BCC structure.
2D repeat unit
(100) 4 3
a R
3
Adapted from Fig. 3.2(c), Callister & Rethwisch 8e. Radius of iron R = 0.1241 nm
atoms
2D repeat unit 1
1 atoms atoms
19
Planar Density = = 2 = 12.1 = 1.2 x 10
area a2 4 3 nm 2 m2
R
2D repeat unit 3
64
Planar Density of (111) Iron
Solution (cont): (111) plane 1 atom in plane/ unit surface cell
2a atoms in plane
atoms above plane
atoms below plane
3
h a
2
2
4 3 16 3 2
area 2 ah 3 a 3
2
R R
atoms 3 3
2D repeat unit 1
atoms = atoms
Planar Density = = 7.0 0.70 x 1019
nm 2 m2
area 16 3 2
R
2D repeat unit 3
65
SUMMARY
• Atoms may assemble into crystalline or
amorphous structures.
• Common metallic crystal structures are FCC, BCC, and
HCP. Coordination number and atomic packing factor
are the same for both FCC and HCP crystal structures.
• We can predict the density of a material, provided we
know the atomic weight, atomic radius, and crystal
geometry (e.g., FCC, BCC, HCP).
• Crystallographic points, directions and planes are
specified in terms of indexing schemes.
Crystallographic directions and planes are related
to atomic linear densities and planar densities.
66
SUMMARY
67
3.4. Imperfections in Solids
ISSUES TO ADDRESS...
• What are the solidification mechanisms?
68
Solidification
69
Polycrystalline Materials
Grain Boundaries
• regions between crystals
• transition from lattice of
one region to that of the
other
• slightly disordered
• low density in grain
boundaries
– high mobility
– high diffusivity
– high chemical reactivity
Adapted from Fig. 4.7, Callister 7e.
70
Types of defects based on dimensionality
0D 1D 2D
(Point defect) (Line defect) (surface defect)
• vacancy • edge dislocation • grain boundary
• interstitial • screw dislocation • twin boundary
• substitutional • mixed dislocation • stacking faults
3D
(volume defect)
• cracks/voids/pores
• inclusion- foreign particles
71
Point Defects
• Vacancies:
-vacant atomic sites in a structure.
Vacancy
distortion
of planes
• Self-Interstitials:
-"extra" atoms positioned between atomic sites.
self-
interstitial
distortion
of planes
72
Equilibrium Concentration:
Point Defects
• Equilibrium concentration varies with temperature!
Nv Nv slope
ln
N N
-Qv /k
exponential
dependence!
T 1/ T
defect concentration
74
Estimating Vacancy Concentration
• Find the equil. # of vacancies in 1 m3 of Cu at 1000C.
• Given:
r = 8.4 g /cm 3 A Cu = 63.5 g/mol
Qv = 0.9 eV/atom NA = 6.02 x 1023 atoms/mol
0.9 eV/atom
-Q
exp
Nv v -4
kT = 2.7 x 10
N
1273K
8.62 x 10-5 eV/atom-K
NA
For 1 m3 , N= r x x 1 m3 = 8.0 x 1028 sites
A Cu
• Answer:
Nv = (2.7 x 10-4)(8.0 x 1028) sites = 2.2 x 1025 vacancies
75
Point Defects in Alloys
Two outcomes if impurity (B) added to host (A):
• Solid solution of B in A (i.e., random dist. of point defects)
OR
76
Conditions for substitutional solid solution (S.S.)
• W. Hume – Rothery rule
– 1. Dr (atomic radius) < 15%
– 2. Proximity in periodic table
• i.e., similar electronegativities
– 3. Same crystal structure for pure metals
– 4. Valency
• All else being equal, a metal will have a greater tendency to
dissolve a metal of higher valency than one of lower valency
77
Application of Hume–Rothery rules – Solid
Solutions
Element Atomic Crystal Electro- Valence
Radius Structure nega-
1. Would you predict (nm) tivity
more Al or Ag Cu
C
0.1278
0.071
FCC 1.9 +2
78
Line Defects
Dislocations:
• are line defects,
• slip between crystal planes result when dislocations move,
• produce permanent (plastic) deformation.
slip steps
79
Dislocations
• Edge dislocation:
– extra half-plane of atoms inserted in a crystal structure
– b to dislocation line
• Screw dislocation:
– spiral planar ramp resulting from shear deformation
– b to dislocation line
Burger‘s vector, b: measure of lattice distortion
80
Screw Dislocation
Screw Dislocation
b
Dislocation
line
Burgers vector b (b)
(a)
Adapted from Fig. 4.4, Callister 7e.
81
Edge, Screw, and Mixed Dislocations
Mixed
Edge
82
Imperfections in Solids
Dislocations are visible in electron micrographs
• Stacking faults
– For FCC metals an error in ABCABC packing sequence
– Ex: ABCABABC
• Grain boundary
- Polycrystalline material comprised
of small crystals or grains
Grain Boundary 85
Summary
• Point, Line, planar, bulk defects exist in solids.
86
Chapter 4 Diffusion
ISSUES TO ADDRESS...
• How does diffusion occur?
87
4.1. Diffusion
Diffusion - Mass transport by atomic motion
Mechanisms:
Gases & Liquids – random (Brownian) motion
Solids – vacancy diffusion or interstitial diffusion
88
Diffusion
• Self-diffusion: In an elemental solid, atoms also migrate.
Label some atoms After some time
C
C
A D
A
D
B
B
89
Diffusion Mechanisms
Vacancy Diffusion:
• atoms exchange with vacancies
• applies to substitutional impurities atoms
• rate depends on:
-- number of vacancies
-- activation energy to exchange.
91
4.2. Fick‘s Law of Diffusion
• How do we quantify the amount or rate of diffusion?
• Measured empirically
– Make thin film (membrane) of known surface area
– Impose concentration gradient
– Measure how fast atoms or molecules diffuse through the
membrane
M=
M l dM mass J slope
J diffused
At A dt
time
92
Fick‘s First Law (Steady-State Diffusion)
Rate of diffusion independent of time
dC
Flux proportional to concentration gradient =
dx
dC
C2 C2 J -D
dx
x1 x2
x
D diffusion coefficient
dC DC C2 - C1
if linear
dx Dx x2 - x1
93
Example: Chemical Protective Clothing
(CPC)
95
Diffusion and Temperature
Qd
D Do exp-
R T
96
Diffusion and Temperature
D has exponential dependence on T
1500
1000
600
300
T(C)
10-8
10-20
0.5 1.0 1.5 1000 K/T
Adapted from Fig. 5.7, Callister & Rethwisch 8e. (Date for Fig. 5.7
taken from E.A. Brandes and G.B. Brook (Ed.) Smithells Metals
Reference Book, 7th ed., Butterworth-Heinemann, Oxford, 1992.)
97
Example: At 300ºC the diffusion coefficient and
activation energy for Cu in Si are
D(300ºC) = 7.8 x 10-11 m2/s
Qd = 41.5 kJ/mol
What is the diffusion coefficient at 350ºC?
D transform ln D
data
Temp = T 1/T
Qd 1 Qd 1
lnD2 lnD0 - and lnD1 lnD0 -
R T2 R T1
D Q 1 1
lnD2 - lnD1 ln 2 - d -
D1 R T2 T1
98
Example (cont.)
Qd 1 1
D2 D1 exp- -
R T2 T1
99
Fick‘s Second Law (Non-steady State Diffusion)
• The concentration of diffusing species is a function of both
time and position C = C(x,t)
C 2C
Fick‘s Second Law D 2
t x
C x , t - Co x
Solution: 1 - erf
Cs - Co 2 Dt
2 z C(x,t)
-y 2
e dy
p 0
Co
erf(z) values are given in 100
Table 5.1 Adapted from Fig. 5.5,
Callister & Rethwisch 8e.
Processing Using Diffusion
• Case Hardening:
Adapted from
-- Diffuse carbon atoms chapter-opening
into the host iron atoms photograph,
Chapter 5,
at the surface. Callister &
Rethwisch 8e.
-- Example of interstitial (Courtesy of
Surface Division,
diffusion is a case Midland-Ross.)
hardened gear.
101
Processing Using Diffusion
• Doping silicon with phosphorus for n-type semiconductors:
• Process: 0.5 mm
1. Deposit P rich
layers on surface.
magnified image of a computer chip
silicon
2. Heat it.
3. Result: Doped light regions: Si atoms
semiconductor
regions.
103
Chapter 5: Mechanical Properties
and Failure of Materials
Mechanical Properties
ISSUES TO ADDRESS...
• Stress and strain: What are they and why are
they used instead of load and deformation?
• Elastic behavior: When loads are small, how much
deformation occurs? What materials deform least?
• Plastic behavior: At what point does permanent
deformation occur? What materials are most
resistant to permanent deformation?
• Toughness and ductility: What are they and how
do we measure them?
104
5.1. Concepts of Stress and Strain
Types of Loading
105
Concepts of Stress and Strain
(tension and compression)
To compare specimens of different sizes, the load is calculated per unit area.
•Engineering stress: σ = F / Ao
F is load applied perpendicular to specimen cross-section; A0 is cross-sectional area
(perpendicular to the force) before application of the load.
•Engineering strain: ε = Δl / lo (× 100 %)
Δl is change in length, lo is the original length.
•These definitions of stress and strain allow one to compare test results for specimens of
different cross-sectional area Ao and of different length lo.
•Stress and strain are positive for tensile loads, negative for compressive loads
106
• Shear stress: τ = F / Ao
F is load applied parallel to the upper and lower faces each of which has an area Ao.
• Shear strain: γ = tanθ (× 100 %)
θ is strain angle
• Torsion is variation of pure shear. The shear stress in this case is a function of applied
torque T, shear strain is related to the angle of twist, υ.
107
Engineering Strain
• Tensile strain: • Lateral strain:
/2
-L
e eL
Lo Lo wo
wo
L /2
• Shear strain:
q
Dx g = Dx/y = tan q
y 90º - q
Strain is always
90º dimensionless.
Adapted from Fig. 6.1(a) and (c), Callister & Rethwisch 8e. 108
Stress-Strain Testing
• Typical tensile test • Typical tensile
machine specimen
Adapted from
extensometer specimen Fig. 6.2,
Callister &
Rethwisch 8e.
gauge
length
Adapted from Fig. 6.3, Callister & Rethwisch 8e. (Fig. 6.3 is taken from H.W.
Hayden, W.G. Moffatt, and J. Wulff, The Structure and Properties of Materials,
Vol. III, Mechanical Behavior, p. 2, John Wiley and Sons, New York, 1965.)
109
5.2 Elastic and plastic deformations
Elastic Deformation
• Some materials (e.g., gray cast iron, concrete, and many polymers) exhibit
non linear elasticity
Plastic Deformation (Metals)
1. Initial 2. Small load 3. Unload
bonds
stretch planes
& planes still
shear sheared
plastic
elastic + plastic
F
F
Plastic means permanent! linear linear
elastic elastic
plastic
111
Linear Elastic Properties
• Modulus of Elasticity, E:
(also known as Young's modulus)
e
Linear-
elastic F
simple
tension
test
112
Poisson's ratio, n
• Poisson's ratio, n:
eL
The ratio of lateral strain to
n > 0.50 density increases
linear strains.
eL n < 0.50 density decreases
n- e
(voids form)
e
metals: n ~ 0.33 -n Units:
ceramics: n ~ 0.25 E: [GPa] or [psi]
polymers: n ~ 0.40 n: dimensionless
Elastic
initially
permanent (plastic)
after load is removed
ep engineering strain, e
116
Yield Strength, sy
• Stress at which noticeable plastic deformation has
occurred.
when ep = 0.002
tensile stress, s
sy = yield strength
sy
engineering strain, e
ep = 0.002 Adapted from Fig. 6.10(a),
Callister & Rethwisch 8e.
117
Stress- Strain Curve for Mild Steel (Ductile Material)
Plastic state
Of material
Stress
Elastic State
Of material
E = modulus of
elasticity
Strain
Yield Strength : Comparison
Graphite/
Metals/ Composites/
Ceramics/ Polymers
Alloys fibers
Semicond
2000
Steel (4140) qt
1000
Yield strength, sy (MPa)
Ti (5Al-2.5Sn) a
Hard to measure,
Al (6061) ag
200 Steel (1020) hr
¨
Ti (pure) a
Ta (pure)
Cu (71500) hr Based on data in Table B.4,
Callister & Rethwisch 8e.
100
a = annealed
dry
70 PC
hr = hot rolled
60 Nylon 6,6 ag = aged
50 Al (6061) a PET
cd = cold drawn
40 PVC humid
cw = cold worked
PP
30 HDPE qt = quenched & tempered
20
LDPE
Tin (pure) 119
10
Tensile Strength, TS
• Maximum stress on engineering stress-strain curve.
Adapted from Fig. 6.11,
Callister & Rethwisch 8e.
TS
F = fracture or
sy
ultimate
engineering
strength
stress
122
Toughness
• Energy to break a unit volume of material
• Approximate by the area under the stress-strain curve.
ey
Ur sde
0
If we assume a linear
stress-strain curve this
simplifies to
1
Ur sy e y
2
Adapted from Fig. 6.15,
Callister & Rethwisch 8e.
124
Elastic Strain Recovery
syi D
syo
2. Unload
Stress
1. Load 3. Reapply
load
Strain
Smaller indents
D d mean larger
hardness.
increasing hardness
126
Hardness: Measurement
• Rockwell
– No major sample damage
– Each scale runs to 130 but only useful in range
20-100.
– Minor load 10 kg
– Major load 60 (A), 100 (B) & 150 (C) kg
• A = diamond, B = 1/16 in. ball, C = diamond
• HB = Brinell Hardness
– TS (psia) = 500 x HB
– TS (MPa) = 3.45 x HB 127
Hardness: Measurement
Table 6.5
128
True Stress & Strain
Note: S.A. changes when sample
stretched
sT F Ai sT s1 + e
• True stress eT ln i o eT ln1 + e
• True strain
129
Hardening
• An increase in sy due to plastic deformation.
s
large hardening
sy
1
sy small hardening
0
e
• Curve fit to the stress-strain response:
hardening exponent:
sT K eT n n = 0.15 (some steels)
to n = 0.5 (some coppers)
―true‖ stress (F/A) ―true‖ strain: ln(L/Lo)
130
Summary
• Stress and strain: These are size-independent
measures of load and displacement, respectively.
• Elastic behavior: This reversible behavior often
shows a linear relation between stress and strain.
To minimize deformation, select a material with a
large elastic modulus (E or G).
• Plastic behavior: This permanent deformation
behavior occurs when the tensile (or compressive)
uniaxial stress reaches sy.
• Toughness: The energy needed to break a unit
volume of material.
• Ductility: The plastic strain at failure.
131
5.3. Failure in Materials
ISSUES TO ADDRESS...
• How do cracks that lead to failure form?
• How is fracture resistance quantified? How do the fracture
resistances of the different material classes compare?
• How do we estimate the stress to fracture?
• How do loading rate, loading history, and temperature
affect the failure behavior of materials?
133
Ductile vs Brittle Failure
• Classification:
Fracture Very Moderately
Brittle
behavior: Ductile Ductile
134
Example: Pipe Failures
• Ductile failure:
-- one piece
-- large deformation
• Brittle failure:
-- many pieces
-- small deformations
135
Moderately Ductile Failure
• Failure Stages:
void void growth shearing
necking fracture
nucleation and coalescence at surface
s
• Resulting 50
50mm
mm
fracture
surfaces
(steel)
100 mm
particles From V.J. Colangelo and F.A. Heiser, Fracture surface of tire cord wire
serve as void Analysis of Metallurgical Failures (2nd loaded in tension. Courtesy of F.
ed.), Fig. 11.28, p. 294, John Wiley and Roehrig, CC Technologies, Dublin,
nucleation Sons, Inc., 1987. (Orig. source: P. OH. Used with permission.
sites. Thornton, J. Mater. Sci., Vol. 6, 1971, pp.
347-56.) 136
Moderately Ductile vs. Brittle Failure
137
Brittle Failure
Arrows indicate point at which failure originated
316 S. Steel
(metal)
160 mm
4 mm
3 mm
1 mm
Al Oxide (ceramic)
Polypropylene (polymer) 139
Fracture Toughness Ranges
Graphite/
Metals/ Composites/
Ceramics/ Polymers
Alloys fibers
Semicond
100
C-C (|| fibers) 1
70 Steels
60 Ti alloys
50
40
Al alloys
30 Mg alloys Based on data in Table B.5,
K Ic (MPa · m0.5 )
141
Fatigue
• Fatigue = failure under applied cyclic stress (e.g., bridges,
aircraft, and machine components).
S = stress amplitude
• Fatigue limit, Sfat: case for
--no fatigue if S < Sfat unsafe steel (typ.)
Sfat
10 3 10 5 10 7 10 9
N = Cycles to failure
S = stress amplitude
• For some materials, case for
there is no fatigue unsafe Al (typ.)
limit!
safe Adapted from Fig.
8.19(b), Callister &
Rethwisch 8e.
10 3 10 5 10 7 10 9
N = Cycles to failure
143
Improving Fatigue Life
S = stress amplitude
1. Impose compressive Adapted from
surface stresses Fig. 8.24, Callister &
Rethwisch 8e.
(to suppress surface near zero or compressive sm
cracks from growing) moderate tensile sm
Larger tensile sm
N = Cycles to failure
144
Creep
Sample deformation at a constant stress (s) vs. time
s
s,e
0 t
tertiary
primary
secondary
elastic
146
Creep Failure
• Failure: along grain boundaries.
g.b. cavities
applied
stress
147
Prediction of Creep Rupture Lifetime
• Estimate rupture time
S-590 Iron, T = 800ºC, s = 20,000 psi
data for
S-590 Iron
12 16 20 24 28
1
(1073 K )(20 + logtr ) 24x103
103 L (K-h)
Adapted from Fig. 8.32, Callister & Rethwisch
8e. (Fig. 8.32 is from F.R. Larson and J. Ans: tr = 233 hr
Miller, Trans. ASME, 74, 765 (1952).)
148
Estimate the rupture time for
S-590 Iron, T = 750ºC, s = 20,000 psi
• Solution:
Time to rupture, tr 100
151
6.1. Dislocations & Plastic Deformations
Dislocations and Materials Classes
Edge dislocation
Screw dislocation
154
Deformation Mechanisms
Slip System
– Slip plane - plane on which easiest slippage occurs
• Highest planar densities (and large interplanar spacings)
– Slip directions - directions of movement
• Highest linear densities
A
F slip plane
tR tR = FS /AS
normal, ns
AS Fcos l A /cos f
FS
F nS f
l A
tR FS AS
F
tR s cos l cos f
156
Critical Resolved Shear Stress
• Condition for dislocation motion: tR tCRSS
• Ease of dislocation motion depends typically
on crystallographic orientation
10-4 GPa to 10-2 GPa
tR s cos l cos f
s s s
tR = 0 tR = s/2 tR = 0
l = 90° l = 45° f = 90°
f = 45°
s s y 50.5 MPa
160
Slip Motion in Polycrystals
• Polycrystals stronger than s
single crystals – grain
boundaries are barriers
to dislocation motion.
Adapted from Fig.
• Slip planes & directions 7.10, Callister &
Rethwisch 8e.
(l, f) change from one (Fig. 7.10 is
courtesy of C.
grain to another. Brady, National
Bureau of
• tR will vary from one Standards [now the
National Institute of
grain to another. Standards and
Technology,
Gaithersburg, MD].)
• The grain with the
largest tR yields first.
rolling direction
235 mm
- isotropic - anisotropic
since grains are since rolling affects grain
equiaxed & orientation and shape.
randomly oriented.
162
6.2. Strengthening Mechanisms
There are four strategies for strengthening: Reduce Grain
Size, Form Solid Solutions, Precipitation Strengthening, and
Cold Work (Strain Hardening).
A C
B D
164
Lattice Strains Around Dislocations
165
Strengthening by Solid
Solution Alloying
• Small impurities tend to concentrate at dislocations
(regions of compressive strains) - partial cancellation of
dislocation compressive strains and impurity atom tensile strains
• Reduce mobility of dislocations and increase strength
167
Ex: Solid Solution
Strengthening in Copper
• Tensile strength & yield strength increase with wt% Ni.
Tensile strength (MPa)
180
200 60
0 10 20 30 40 50 0 10 20 30 40 50
wt.% Ni, (Concentration C) wt.%Ni, (Concentration C)
168
3: Precipitation Strengthening
1
• Result: sy ~
S
169
Application:
Precipitation Strengthening
• Internal wing structure on Boeing 767
Adapted from chapter-
opening photograph,
Chapter 11, Callister &
Rethwisch 3e. (courtesy of
G.H. Narayanan and A.G.
Miller, Boeing Commercial
Airplane Company.)
1.5mm
170
4: Cold Work (Strain Hardening)
172
Dislocation Density Increases During
Cold Working
total dislocation length
Dislocation density =
unit volume
– Carefully grown single crystals
ca. 103 mm-2
– Deforming sample increases density
109-1010 mm-2
– Heat treatment reduces density
105-106 mm-2
173
Lattice Strain Interactions Between
Dislocations
174
Impact of Cold Work
As cold work is increased
• Yield strength (sy) increases.
• Tensile strength (TS) increases.
• Ductility (%EL or %AR) decreases.
175
Mechanical Property Alterations
Due to Cold Working
• What are the values of yield strength, tensile strength &
ductility after cold working Cu? 2 2
pDo pDd
-
Copper %CW 4 4 x 100
Cold pDo2
Work
4
Do2 - Dd2
x 100
Do = 15.2 mm Dd = 12.2 mm Do2
60
700 800
ductility (%EL)
40
500 600
300 MPa Cu
300 Cu 400 340 MPa 20
Cu 7%
100 200 00
0 20 40 60 0 20 40 60 20 40 60
% Cold Work % Cold Work % Cold Work
600 60
tensile strength 1. Recovery
ductility (%EL)
50 2. Recrystallization
500
40 3. Grain Growth
400 30
Adapted from Fig. 7.22, Callister & Rethwisch
ductility 20 8e. (Fig. 7.22 is adapted from G. Sachs and
300 K.R. van Horn, Practical Metallurgy, Applied
Metallurgy, and the Industrial Processing of
Ferrous and Nonferrous Metals and Alloys,
American Society for Metals, 1940, p. 139.)
178
Three Stages During Heat Treatment:
1. Recovery
Reduction of dislocation density by annihilation.
• Scenario 1 extra half-plane
of atoms Dislocations
Results from annihilate
diffusion atoms
and form
diffuse
a perfect
to regions
atomic
of tension
extra half-plane plane.
of atoms
• Scenario 2
3 . ―Climbed‖ disl. can now tR
move on new slip plane
2 . grey atoms leave by
4. opposite dislocations
vacancy diffusion
meet and annihilate
allowing disl. to ―climb‖
1. dislocation blocked; Obstacle dislocation
can‘t move to the right
179
Three Stages During Heat Treatment:
2. Recrystallization
• New grains are formed that:
-- have low dislocation densities
-- are small in size
-- consume and replace parent cold-worked grains.
0.6 mm 0.6 mm
Adapted from
Fig. 7.21(a),(b),
Callister &
Rethwisch 8e.
(Fig. 7.21(a),(b)
are courtesy of
J.E. Burke,
General Electric
Company.)
0.6 mm 0.6 mm
Adapted from
Fig. 7.21(c),(d),
Callister &
Rethwisch 8e.
(Fig. 7.21(c),(d)
are courtesy of
J.E. Burke,
General Electric
Company.)
After 4 After 8
seconds seconds
181
Three Stages During Heat Treatment:
3. Grain Growth
• At longer times, average grain size increases.
-- Small grains shrink (and ultimately disappear)
-- Large grains continue to grow
0.6 mm 0.6 mm
Adapted from
Fig. 7.21(d),(e),
Callister &
Rethwisch 8e.
(Fig. 7.21(d),(e)
are courtesy of
J.E. Burke,
General Electric
Company.)
TR
º
183
Recrystallization Temperature
TR = recrystallization temperature = temperature
at which recrystallization just reaches
completion in 1 h.
0.3Tm < TR < 0.6Tm
184
Cold Working vs. Hot Working
• Hot working deformation above TR
• Cold working deformation below TR
186
Chapter 7: Phase Diagrams
ISSUES TO ADDRESS...
• When we combine two elements...
what equilibrium state do we get?
• In particular, if we specify...
--a composition (e.g., wt% Cu - wt% Ni), and
--a temperature (T )
then...
How many phases do we get?
What is the composition of each phase?
How much of each phase do we get?
Phase A Phase B
Nickel atom
Copper atom
187
7.1 Introduction
Definitions
– Solutions – solid solutions, single phase
– Mixtures – more than one phase Adapted from Fig. 9.1,
Callister 7e.
Temperature (°C)
Solubility
which only a single phase 80 Limit L
solution occurs. (liquid)
60 +
L
Question: What is the 40 (liquid solution S
solubility limit at 20°C? i.e., syrup) (solid
20 sugar)
Answer: 65 wt% sugar.
If Co < 65 wt% sugar: syrup 0 20 40 6065 80 100
If Co > 65 wt% sugar: syrup + sugar.
Sugar
Water
Pure
Pure
188
Components and Phases
• Components:
The elements or compounds which are present in the mixture
(e.g., Al and Cu)
• Phases:
The physically and chemically distinct material regions
that result (e.g., a and ).
Aluminum- (lighter
Copper
phase)
Alloy
a (darker
phase)
Adapted from
chapter-opening
photograph,
Chapter 9,
Callister 3e.
189
Effect of T & Composition (Co)
• Changing T can change # of phases: path A to B.
• Changing Co can change # of phases: path B to D.
B (100°C,70) D (100°C,90)
1 phase 2 phases
100
L
Temperature (°C)
80
(liquid)
water- 60 +
sugar L S
system (liquid solution (solid
40 i.e., syrup) sugar)
20 A (20°C,70)
2 phases
Adapted from 0
Fig. 9.1, 0 20 40 60 70 80 100
Callister 7e.
Co =Composition (wt% sugar)
190
Phase Equilibria
Simple solution system (e.g., Ni-Cu solution)
191
7.2. Phase Diagrams
• Phase diagram is a graphical representation of all the equilibrium
phases as a function of temperature, pressure, and composition.
• For one component systems, the equilibrium state of the system is
defined by two independent parameters (P and T)
193
Phase Diagram for Cu-Ni system
T(°C)
1600
Interpretation of a binary phase
1500 diagrams
L (liquid)
1400 We can use phase diagram to determine:
1) The number & type of phases that
1300 are present
2) Compositions of the phases
1200 a 3) The relative fractions of the phases
1100
(FCC solid
solution)
1000
0 20 40 60 80 100
wt% Ni
194
The Lever Rule
• Tie line – connects the phases in equilibrium with
each other - essentially an isotherm
T(°C) How much of each phase?
tie line
Think of it as a lever (teeter-totter)
1300 L (liquid)
ML Ma
B
TB
a
1200 (solid)
R S R S
20 3 0C C
L o
40 C
a
50
M a S M L R
wt% Ni Adapted from Fig. 9.3(b),
Callister 7e.
ML S C - C0 R C - CL
WL a Wa 0
ML + Ma R + S Ca - CL R + S Ca - CL
195
The number and types of phases present
• Rule 1: If we know T and Co, then we know:
--the number and types of phases present.
T(°C)
• Examples: 1600
L (liquid)
A(1100°C, 60):
B (1250°C,35)
1 phase: a 1500
Cu-Ni
B (1250°C, 35): 1400 phase
2 phases: L + a diagram
1300 a
(FCC solid
1200 solution)
Adapted from Fig. 9.3(a), Callister 7e.
(Fig. 9.3(a) is adapted from Phase 1100 A(1100°C,60)
Diagrams of Binary Nickel Alloys, P. Nash
(Ed.), ASM International, Materials Park,
OH, 1991). 1000
0 20 40 60 80 100 wt% Ni
196
Composition of phases
• Rule 2: If we know T and Co, then we know:
--the composition of each phase. Cu-Ni
T(°C) system
• Examples:
TA A
Co = 35 wt% Ni tie line
At T A = 1320°C: 1300 L (liquid)
198
Binary-Eutectic Systems
has a special composition
2 components with a min. melting T.
Cu-Ag
T(°C) system
Ex.: Cu-Ag system 1200
• 3 single phase regions L (liquid)
(L, a, ) 1000
• Limited solubility: a L + a 779°C L +
800
a: mostly Cu TE 8.0 71.9 91.2
: mostly Ag 600
• TE : No liquid below TE a+
• CE : Min. melting TE 400
composition 200
0 20 40 60 CE 80 100
• Eutectic transition Co , wt% Ag
L(CE) a(CaE) + (CE) Adapted from Fig. 9.7,
Callister 7e.
199
EX: Pb-Sn Eutectic System (1)
• For a 40 wt% Sn-60 wt% Pb alloy at 150°C, find...
--the phases present: a + Pb-Sn
--compositions of phases: T(°C) system
CO = 40 wt% Sn
Ca = 11 wt% Sn 300
L (liquid)
C = 99 wt% Sn
--the relative amount a L+ a
200 183°C L +
of each phase: 18.3 61.9 97.8
S C - CO 150
Wa = = R S
R+S C - Ca 100
a+
99 - 40 59
= = = 67 wt%
99 - 11 88
C - Ca 0 11 20 40 60 80 99100
W = R = O Ca Co C
R+S C - C a C, wt% Sn
Adapted from Fig. 9.8,
40 - 11 29 Callister 7e.
= = = 33 wt%
99 - 11 88 200
EX: Pb-Sn Eutectic System (2)
• For a 40 wt% Sn-60 wt% Pb alloy at 200°C, find...
--the phases present: a + L Pb-Sn
--compositions of phases: T(°C) system
CO = 40 wt% Sn
Ca = 17 wt% Sn 300
L (liquid)
CL = 46 wt% Sn L+ a
--the relative amount 220
200
a R S L +
of each phase: 183°C
CL - CO 46 - 40
Wa = = 100
CL - Ca 46 - 17 a+
6
= = 21 wt%
29 100
0 17 20 40 46 60 80
Ca Co CL
CO - Ca 23 C, wt% Sn
WL = = = 79 wt% Adapted from Fig. 9.8,
CL - Ca 29 Callister 7e.
201
Summary
• Phase diagrams are useful tools to determine:
--the number and types of phases,
--the wt% of each phase,
--and the composition of each phase
for a given T and composition of the system.
• Alloying to produce a solid solution usually
--increases the tensile strength (TS)
--decreases the ductility.
• Binary eutectics and binary eutectoids allow for
a range of microstructures.
202
Chapter 8: Electrical Properties
ISSUES TO ADDRESS...
• How are electrical conductance and resistance
characterized?
• What are the physical phenomena that distinguish
conductors, semiconductors, and insulators?
• For metals, how is conductivity affected by
imperfections, temperature, and deformation?
• For semiconductors, how is conductivity affected
by impurities (doping) and temperature?
203
8.1. Electrical Conduction
• Ohm's Law: V=IR
voltage drop (volts = J/C) resistance (Ohms)
C = Coulomb current (amps = C/s)
• Resistivity, r:
-- a material property that is independent of sample size and
geometry surface area
RA
r of current flow
l
current flow
path length
• Conductivity, s 1
s
r
204
Electrical Properties
• Which will have the greater resistance?
2 2r 8r
D R1
D 2 pD 2
p
2
2D
r r R1
R2
2D 2 pD2 8
p
2
205
Definitions
Further definitions
J = s (V/ )
206
Conductivity: Comparison
• Room temperature values (Ohm-m)-1 = ( - m)-1
METALS conductors CERAMICS
-10
Silver 6.8 x 10 7 Soda-lime glass 10 -10-11
Copper 6.0 x 10 7 Concrete 10 -9
Iron 1.0 x 10 7 Aluminum oxide <10-13
SEMICONDUCTORS POLYMERS
-14
Silicon 4 x 10 -4 Polystyrene <10
Germanium 2 x 10 0 Polyethylene 10 -15-10-17
GaAs 10 -6
semiconductors insulators
Selected values from Tables 18.1, 18.3, and 18.4, Callister & Rethwisch 8e.
207
Example: Conductivity Problem
What is the minimum diameter (D) of the wire so that V < 1.5 V?
100 m
Cu wire - I = 2.5 A +
V
100 m
< 1.5 V
V
R
pD 2 As I 2.5 A
208
Electron Energy Band Structures
209
Band Structure Representation
210
Conduction & Electron Transport
• Metals (Conductors):
-- for metals empty energy states are adjacent to filled states.
-- thermal energy Partially filled band Overlapping bands
excites electrons
Energy Energy
into empty higher
empty
energy states. band
-- two types of band GAP empty
structures for metals band
- partially filled band partly
- empty band that filled filled
filled states
band
filled states
overlaps filled band band
filled filled
band band
211
Energy Band Structures: Insulators &
Semiconductors
• Insulators: • Semiconductors:
-- wide band gap (> 2 eV) -- narrow band gap (< 2 eV)
-- few electrons excited -- more electrons excited
across band gap across band gap
Energy empty Energy empty
conduction conduction
band band
GAP ?
GAP
filled filled
filled states
filled states
valence valence
band band
filled filled
band band
212
Drift Speed
When a current flows through a conductor
the electric field causes the charges to move
with a constant drift speed vd . This drift speed
is superimposed on the random motion of the
charges.
J nvd e J nevd
Consider the conductor of cross-sectional area A shown in the figure. We assume
that the current in the conductor consists of positive charges. The total charge
q within a length L is given by q nAL e. This charge moves through area A
L q nALe
in a time t . The current is i nAvd e.
vd t L / vd
i nAvd e
The current density is J nvd e.
A A
In vector form: J nevd .
Electron Mobility
J nevd
J sE
Metals: Influence of Temperature and Impurities on
Resistivity
• Presence of imperfections increases resistivity
-- grain boundaries
These act to scatter
-- dislocations
electrons so that they
-- impurity atoms take a less direct path.
-- vacancies
6
• Resistivity
Resistivity, r
(10 -8 Ohm-m)
5
increases with:
4 -- temperature
3 rd -- wt% impurity
-- %CW
2 ri
1
rt
r = rthermal
0 -200 -100 0 T (ºC) + rimpurity
Adapted from Fig. 18.8, Callister & Rethwisch 8e. (Fig. 18.8
adapted from J.O. Linde, Ann. Physik 5, p. 219 (1932); and C.A.
+ rdeformation
Wert and R.M. Thomson, Physics of Solids, 2nd ed., McGraw-Hill
Book Company, New York, 1970.) 215
Estimating Conductivity
• Question:
-- Estimate the electrical conductivity s of a Cu-Ni alloy Adapted from Fig.
18.9, Callister &
that has a yield strength of 125 MPa. Rethwisch 8e.
180
Yield strength (MPa)
(10 -8 Ohm-m)
50
Resistivity, r
160
140 40
125 30
120
100 20
21 wt% Ni 10
80
60 0
0 10 20 30 40 50 0 10 20 30 40 50
wt% Ni, (Concentration C) wt% Ni, (Concentration C)
Adapted from Fig. 7.16(b), Callister & Rethwisch 8e. -8
r 30 x 10 Ohm - m
From step 1:
1
s 3.3 x 106(Ohm - m)-1
CNi = 21 wt% Ni r
216
Charge Carriers in Insulators and
Semiconductors
Adapted from Fig. 18.6(b),
Callister & Rethwisch 8e.
Two types of electronic charge
carriers:
Free Electron
– negative charge
– in conduction band
Hole
– positive charge
– vacant electron state in
the valence band
218
Intrinsic Semiconduction in Terms of Electron
and Hole Migration
• Concept of electrons and holes:
valence electron hole electron hole
electron Si atom
pair creation pair migration
- + - +
• Ex: GaAs
s 10-6 ( m)-1
ni
e m e + m h (1.6 x10-19 C)(0.85 + 0.45 m2 /V s)
-E gap / kT
ni e
ISSUES TO ADDRESS...
• How do materials respond to the application of heat?
• How do we define and measure...
-- heat capacity?
-- thermal expansion?
-- thermal conductivity?
-- thermal shock resistance?
222
9.1. Heat Capacity
The ability of a material to absorb heat
• Quantitatively: The energy required to produce a unit rise in
temperature for one mole of a material.
energy input (J/mol)
heat capacity dQ
(J/mol-K) C
dT temperature change (K)
Gold 128
226
Thermal Expansion
Materials change size when temperature
is changed
Tinitial
initial
Tfinal > Tinitial
Tfinal
final
l -l
final initial
a l (Tfinal -Tinitial )
l initial
linear coefficient of
thermal expansion (1/K or 1/ºC)
227
Atomic Perspective: Thermal Expansion
Soda-lime glass 9
Silica (cryst. SiO2) 0.4
229
Thermal Expansion: Example
Ex: A copper wire 15 m long is cooled from
40 to -9ºC. How much change in length will it
experience?
• Answer: For Cu a 16.5 x 10-6 ( C)-1
D a 0 DT [
16.5 x 10-6 (1/ C)](15 m)[40C - ( -9C)]
D 0.012 m 12 mm
230
9.2. Thermal Conductivity
The ability of a material to transport heat.
Fourier’s Law
temperature
dT
q -k gradient
heat flux dx
(J/m2-s) thermal conductivity (J/m-K-s)
T1 T2
T2 > T1
x1 heat flux x2
231
Thermal Conductivity: Comparison
Energy Transfer
Material k (W/m-K) Mechanism
• Metals
Aluminum 247 atomic vibrations
Steel 52 and motion of free
Tungsten 178
electrons
Gold 315
• Ceramics
increasing k
Magnesia (MgO) 38
Alumina (Al2O3) 39 atomic vibrations
Soda-lime glass 1.7
Silica (cryst. SiO2) 1.4
• Polymers
Polypropylene 0.12
Polyethylene 0.46-0.50 vibration/rotation of
Polystyrene 0.13 chain molecules
Teflon 0.25
Selected values from Table 19.1, Callister & Rethwisch 8e. 232
Thermal Stresses
• Occur due to:
-- restrained thermal expansion/contraction
-- temperature gradients that lead to differential
dimensional changes
Thermal stress s
Ea (T0 -Tf ) Ea DT
E -Young's modulus
233
Example Problem
-- A brass rod is stress-free at room temperature (20ºC).
-- It is heated up, but prevented from lengthening.
-- At what temperature does the stress reach -172 MPa?
Solution:
T0 Original conditions
0
Step 1: Assume unconstrained thermal expansion
0 D D
ethermal a (Tf -T0 )
Tf room
s -E(ethermal ) -Ea
(Tf -T0 ) Ea (T0 -Tf )
20ºC
-172 MPa (since in compression)
s
Tf T0 -
Ea
237
Chap 10: Magnetic Properties
a) Transmission electron micrograph
showing the microstructure of the
perpendicular magnetic recording
medium used in hard-disk drives.
d) Laptop computer
Generation of a Magnetic Field -- Vacuum
• Created by current through a coil:
B N = total number of turns
= length of each turn (m)
I = current (ampere)
239
Generation of a Magnetic Field --
within a Solid Material
• A magnetic field is induced in the material
B
B = Magnetic field (tesla)
inside the material
current I
m
• Relative permeability (dimensionless) mr
m0
240
Origins of Magnetic Moments
• Magnetic moments arise from electron motions and the
spins on electrons.
magnetic moments
electron electron
nucleus spin
Adapted from Fig. 20.4,
Callister & Rethwisch 8e.
H (ampere-turns/m)
242
Magnetic Responses for 4 Types
No Applied Applied
Magnetic Field (H = 0) Magnetic Field (H)
opposing
None
(1) diamagnetic Adapted from Fig.
20.5(a), Callister &
No magnetic moment Rethwisch 8e.
before magnetization,
not attracted by a magnet
random
aligned
(2) paramagnetic Adapted from Fig.
20.5(b), Callister &
aligned Rethwisch 8e.
aligned
(3) ferromagnetic Adapted from Fig.
20.7, Callister &
(4) ferrimagnetic Rethwisch 8e.
243
Influence of Temperature on
Magnetic Behavior
245
Domains in Ferromagnetic & Ferrimagnetic
Materials
• As the applied field (H) increases the magnetic domains
change shape and size by movement of domain boundaries.
B sat
H
H Adapted from Fig. 20.13,
induction (B)
H=0
246
Hysteresis and Permanent
Magnetization
• The magnetic hysteresis phenomenon
B
Stage 2. Apply H,
Stage 3. Remove H, alignment align domains
remains! => permanent magnet!
Adapted from Fig. 20.14,
Callister & Rethwisch 8e.
H
Stage 4. Coercivity, HC
Negative H needed to Stage 1. Initial (unmagnetized state)
demagnitize!
247
Hard and Soft Magnetic Materials
Soft
-- example: tungsten steel --
Hc = 5900 amp-turn/m) H
249
Magnetic Storage Media Types
• Hard disk drives (granular/perpendicular media):
-- CoCr alloy grains (darker regions)
separated by oxide grain boundary Fig. 20.25, Callister
segregant layer (lighter regions)
80 nm
& Rethwisch 8e.
(Fig. 20.25 from
-- Magnetization direction of each Seagate Recording
grain is perpendicular to plane of Media)
disk
~ 500 nm
& Rethwisch 8e.
(Fig. 20.24
courtesy Fuji Film
Inc., Recording
Media Division)
ISSUES TO ADDRESS...
• What phenomena occur when light is shined on a material?
• What determines the characteristic colors of materials?
• Why are some materials transparent and others are
translucent or opaque?
• How does a laser operate?
252
11.1. Electromagnetic Radiation and Light
Interactions
Light has both particulate and wavelike characteristics
– Photon - a quantum unit of light
hc
E hn
l
E energy of a photon
l wavelength of radiation
n frequency of radiation
h Planck‘ s constant (6.62 x 10-34 J s)
c speed of light in a vacuum (3.00 x 108 m/s)
253
The spectrum of electromagnetic radiation
254
Refraction
• Transmitted light distorts electron clouds.
electron
no cloud
transmitted transmitted
+ + distorts
light light
255
Total Internal Reflectance
n1 sin f2
n2 < n1
f2 n2 sin f1
n2 f1 = incident angle
n1 f2 = refracted angle
fc = critical angle
fc fc exists when f2 = 90°
f1 For f1 > fc light is internally
reflected
• Fiber optic cables are clad in low n material so that light will
experience total internal reflectance and not escape from the optical
fiber. 256
Example: Diamond in air
• What is the critical angle fc for light passing from diamond
(n1 = 2.41) into air (n2 = 1)?
• Solution: At the critical angle, f1 fc
and f2 90
n1 sin f2
Rearranging the equation
n2 sin f1
n n2
sin f1 sin fc sin(90)
2
n1 n1
Substitution gives
1
sin fc fc 24.5
2.41
257
Light Interactions with Solids
• Incident light is reflected, absorbed, scattered, and/or
transmitted: I0 IT + IA + IR + IS
Reflected: IR Absorbed: IA
Transmitted: IT
Incident: I0
Scattered: IS
• Optical classification of materials:
Transparent Adapted from Fig. 21.10, Callister
Translucent 6e. (Fig. 21.10 is by J. Telford,
with specimen preparation by P.A.
Opaque Lessing.)
DE = hn required!
filled states
Planck‘s constant freq.
of
(6.63 x 10-34 J/s) incident
Adapted from Fig. 21.4(a),
Callister & Rethwisch 8e.
light
• Unfilled electron states are adjacent to filled states
• Near-surface electrons absorb visible light.
259
Light Absorption
The amount of light absorbed by a material is
calculated using Beer‘s Law
IT
ln -
I 0
260
Reflection of Light for Metals
• Electron transition from an excited state produces a photon.
Energy of electron
IR unfilled states
―conducting‖ electron
photon emitted Electron transition
from metal
surface
filled states
261
Reflection of Light for Metals (cont.)
• Reflectivity = IR /I0 is between 0.90 and 0.95.
• Metal surfaces appear shiny
• Most of absorbed light is reflected at the same wavelength
• Small fraction of light may be absorbed
• Color of reflected light depends on wavelength distribution
– Example: The metals copper and gold absorb light in
blue and green => reflected light has gold color
262
Reflectivity of Nonmetals
• For normal incidence and light passing into a solid
having an index of refraction n:
n -12
R reflectivity
n + 1
• Example: For Diamond n = 2.41
2
2.41- 1
R 0.17
2.41+ 1
17% of light is reflected
263
Scattering of Light in Polymers
• For highly amorphous and pore-free polymers
– Little or no scattering
– These materials are transparent
• Semicrystalline polymers
– Different indices of refraction for amorphous and
crystalline regions
– Scattering of light at boundaries
– Highly crystalline polymers may be opaque
• Examples:
– Polystyrene (amorphous) – clear and transparent
– Low-density polyethylene milk cartons – opaque
264
Selected Light Absorption in Semiconductors
Absorption of light of frequency n by by electron transition
occurs if hn > Egap Energy of electron
Examples of photon energies:
unfilled states
blue light: hn = 3.1 eV
red light: hn = 1.8 eV
Egap
incident photon
energy hn
filled states Adapted from Fig. 21.5(a),
Callister & Rethwisch 8e.
• If Egap < 1.8 eV, all light absorbed; material is opaque (e.g., Si, GaAs)
• If Egap > 3.1 eV, no light absorption; material is transparent and
colorless (e.g., diamond)
• If 1.8 eV < Egap < 3.1 eV, partial light absorption; material is colored
265
Computations of Minimum Wavelength
Absorbed
(a) What is the minimum wavelength absorbed by
Ge, for which Eg = 0.67 eV?
Solution:
hc (6.63 x 10-34 J s)(3 x 108 m/s)
lGe (min)
E g (Ge) (0.67 eV)(1.60 x 10-19 J/eV)
(b) Redoing this computation for Si which has a band gap
of
1.1 eV
lSi (min) 1.13 mm
Note: the presence of donor and/or acceptor states allows for light
absorption at other wavelengths.
266
Color of Nonmetals
• Color determined by the distribution of wavelengths:
-- transmitted light
-- re-emitted light from electron transitions
• Example 1: Cadmium Sulfide (CdS), Eg = 2.4 eV
-- absorbs higher energy visible light (blue, violet)
-- color results from red/orange/yellow light that is transmitted
• Example 2: Ruby = Sapphire (Al2O3) + (0.5 to 2) at% Cr2O3
-- Sapphire is transparent and
80
Transmittance (%)
colorless (Eg > 3.1 eV) sapphire
70
-- adding Cr2O3 : ruby
• alters the band gap 60
• blue and orange/yellow/green 50
wavelength, l (= c/n)(mm)
light is absorbed 40
0.3 0.5 0.7 0.9
• red light is transmitted Adapted from Fig. 21.9, Callister & Rethwisch 8e.
• Result: Ruby is deep (Fig. 21.9 adapted from "The Optical Properties of
Materials" by A. Javan, Scientific American, 1967.)
red in color
267
Luminescence
• Luminescence – reemission of light by a material
– Material absorbs light at one frequency and reemits it at
another (lower) frequency.
– Trapped (donor/acceptor) states introduced by
impurities/defects
Conduction band • If residence time in trapped state is
relatively long (> 10-8 s)
-- phosphorescence
UV light
electrode electrode
• Arc between electrodes excites electrons in mercury atoms in
the lamp to higher energy levels.
• As electron falls back into their ground states, UV light is emitted
(e.g., suntan lamp).
• Inside surface of tube lined with material that absorbs UV and
reemits visible light
- For example, Ca10F2P6O24 with 20% of F - replaced by Cl -
• Adjust color by doping with metal cations
Sb3+ blue
Mn2+ orange-red 269
Cathodoluminescence
• Used in cathode-ray tube devices (e.g., TVs, computer monitors)
• Inside of tube is coated with a phosphor material
– Phosphor material bombarded with electrons
– Electrons in phosphor atoms excited to higher state
– Photon (visible light) emitted as electrons drop back into
ground states
– Color of emitted light (i.e., photon wavelength) depends on
composition of phosphor
ZnS (Ag+ & Cl-) blue
(Zn, Cd) S + (Cu++Al3+) green
Y2O2S + 3% Eu red
270
Other Applications of Optical
Phenomena
• New materials must be developed to make new &
improved optical devices.
– Organic Light Emitting Diodes (OLEDs)
• More than one color available from a single diode
• Also sources of white light (multicolor)
271
Other Applications - Solar Cells
• p-n junction: • Operation:
-- incident photon of light produces elec.-hole pair.
P-doped Si -- typical potential of 0.5 V produced across junction
conductance Si -- current increases w/light intensity.
electron creation of
Si P Si hole-electron
light pair
Si - - -
n-type Si
p-n junction -
n-type Si p-type Si +
p-n junction + + +
p-type Si
• Solar powered weather station:
hole Si
Si B Si
Si
B-doped Si polycrystalline Si
Los Alamos High School weather
station (photo courtesy
P.M. Anderson)
272
SUMMARY
• Light radiation impinging on a material may be reflected
from, absorbed within, and/or transmitted through
• Light transmission characteristics:
-- transparent, translucent, opaque
• Optical properties of metals:
-- opaque and highly reflective due to electron energy band
structure.
• Optical properties of non-Metals:
-- for Egap < 1.8 eV, absorption of all wavelengths of light radiation
-- for Egap > 3.1 eV, no absorption of visible light radiation
-- for 1.8 eV < Egap < 3.1 eV, absorption of some range of light
radiation wavelengths
-- color determined by wavelength distribution of transmitted light
• Other important optical applications/devices:
-- luminescence, photoconductivity, light-emitting diodes, solar
cells, lasers, and optical fibers
273