Unit 5
Unit 5
Machine learning working principle has been shown. The algorithms are design to work in three steps.
1. The computer has been asked to perform a task
2. The task performance will be evaluated, and a reward will be given
3. With the reward the computer will gain experience and finally with the experience gain it will perform the task again
This cycle will go on a training data and computer will build a model. Finally, the model will be tested in a training set for
prediction and validation.
Machine Learning in Materials Science
o Unsupervised learning: In unsupervised learning, the agent learns patterns in the input, even when no explicit
feedback is supplied. Clustering is a common example of an unsupervised task, which detects meaningful clusters
among input data. For example, a regular office goer, Mr. Neogy, traveling from one area to the other in New York
City, will develop a concept or percept of “good traffic days” and “bad traffic days” based on day to day
experiences, without ever consulting motor vehicles department or traffic controllers for labelled examples of
each.
o Supervised learning: In this mode, the agent learns from a function that maps the input output pairs from some
observed instances present in the data. In Mr. Neogy’s case, inputs are percepts about traffic conditions that he has
developed over time and outputs are provided by him, where he gives directions to the cab-driver. Besides the inputs
provided by Mr. Neogy, here the cab-driver can also alter the outcome based on let’s say if he passes a bus or a car or
a pedestrian on the road and decides to take a different route or more time. Now, Mr. Neogy’s final outcome of
reaching office on time or late is a function of states such as his own perceptions as well as the cab driver’s actions
like braking, accelerating or stopping distance. The output is directly available from the agent’s percepts, the cab-
driver is the environment and the final outcome can be changed if either the percept or environment changes.
o Semi-supervised learning: In this mode, we are given a few labelled instances and a large set of unlabeled ones. Let’s
assume, we are given a task of creating a model to predict what type of coffee a person drinks on a regular basis. We can
gather some data (labelled examples) by interviewing people and / or by visiting multiple coffee shops, which would be
identical to supervised learning. However, in reality, some of the people interviewed may not be truthful in their
responses. Furthermore, the collected data may be inaccurate for other reasons, e.g., people not knowing specific coffee
types and naming different coffee brands instead. Therefore, there is not only random noise in the data, but there are
systematic inaccuracies present that can only be identified by utilizing unsupervised learning techniques. In other words,
noise and lack of labelled instances create a continuum between supervised and unsupervised learning modes, which
constitutes the domain of applicability of semi-supervised approaches.
o Reinforcement learning: This is another hybrid mode in which the agent learns from a series of past events or reinforcements
(success or failure). Here, the model gets either rewards or penalties for the actions it performs, such as searches or trials,
with a goal to maximize the total reward. For example, if Mr. Neogy reaches his office on time, that gives him an indication
that he did something right along the way. It then falls on the agent to decide which of the actions prior to reinforcement had
the most pronounced impact on the outcome.
What is electron microscopy? (Ref: https://www.thermofisher.com/us/en/home/materials-science/learning-
center/applications/sem-tem-difference.html )
• Electron microscopes have emerged as a powerful tool for the characterization of a wide range of materials. Their
versatility and extremely high spatial resolution render them a very valuable tool for many applications. The two
main types of electron microscopes are the transmission electron microscope (TEM) and the scanning electron
microscope (SEM).
• The main difference between SEM and TEM is that SEM creates an image by detecting reflected or knocked-off
electrons, while TEM uses transmitted electrons (electrons that are passing through the sample) to create an image. As a
result, TEM offers valuable information on the inner structure of the sample, such as crystal structure, morphology and
stress state information, while SEM provides information on the sample’s surface and its composition.
• For both techniques, electrons are used to acquire images of samples. Their main components are the same:
o An electron source
o A series of electromagnetic and electrostatic lenses to control the shape and trajectory of the electron beam
o Electron apertures
• All of these components are housed inside a chamber that is under high vacuum.
What is a 2D material for example Graphene ?
Graphene is a single atomic layer of carbon atoms tightly packed in a two-dimensional honeycomb
lattice. This novel material is atomically thin, chemically inert, consists of light atoms, and
possesses a highly ordered structure. Graphene is electrically and thermally conductive, and is the
strongest material ever measured. These remarkable properties make graphene the ideal support
film for electron microscopy.
How electron microscopy can be used to take images of a 2D
Graphene
• Now that we know about SEM, TEM and STEM, their working
principles, we can use either of the techniques to image a 2D
graphene
Although the general structure of hexagonal rings of carbon can be seen by high-resolution microscopes, imaging the
individual atoms and measuring their positions is not as straightforward.
The electron tip must scan the surface of the Graphene to take an electron microscope image. This way if the graphene
surface is exposed to the electron beam for longer time, then defects will be formed in the Graphene.
How can machine learning help?
The machine learning models build from a previous large data set (taken from previous experiments) can help
to guide on the (key points but not limited to)
References
o Scanning Transmission Electron Microscopy Imaging and Analysis by Stephen J. Pennycook, Peter D. Nellist