Unit 5
Unit 5
Active Region :
❑The base-emitter junction is forward biased, while
the collector-base junction is reverse biased.
❑ All the carriers that are injected into the emitter are
swept away through the base to the collector.
❑ As a result, as already shown that
𝑰𝑪 = 𝜶𝑰𝑬 𝑜𝑟 𝑰𝑪 ≈ 𝑰𝑬 𝒂𝒔 𝜶 = 𝟏
Where 𝛼 is the common-base forward current gain
Saturation Region :
❑ In this region, both base-emitter and collector-base
junctions are forward biased. This region is to the left of
𝑉𝐶𝐵 = 0. Cut-off Region : In this region, both base-
❑ In this region, the collector current rises exponentially to emitter and collector-base junctions are both
the 𝐼𝐸 value set by 𝑉𝐵𝐸 circuit as 𝑉𝐶𝐵 increases towards reverse biased. As a result, 𝑰𝑬 = 𝟎 and so 𝑰𝑪 = 𝟎.
reverse bias.
Common-Emitter (CE) Configuration
➢ In the common emitter configuration, base acts as input terminal and collector acts as
output terminal.
➢ It is the most frequently used configuration.
Input Characteristics:
➢ It is seen from the base characteristics that 𝐼𝐵 is practically independent of 𝑉𝐵𝐸 . The
base-emitter junction goes ‘on’ at 𝑉𝐵𝐸 = 0.7 𝑉 and then stays there, while 𝐼𝐵 is adjusted
by the external resistance 𝑅𝐵 .
Output Characteristics:
➢ These relate output current (𝐼𝐶 ) with output voltage (𝑉𝐶𝐸 ) for
varying values of input current (𝐼𝐵 ).
➢ The characteristics can be divided into three regions.
❑ Active Region
❑ Cutoff Region
❑ Saturation Region
Active Region :
❑ Base-emitter is forward biased and collector-base is
reverse biased.
𝑰𝑪𝑬 ≅ 𝜷 𝑰𝑪𝑩
❑ The middle of this region is linear w.r.t. 𝐼𝐵 and 𝑉𝐶𝐸
Saturation Region :
❑ It is to the left of 𝑉𝐶𝐸(𝑆𝑎𝑡) = 0.2 𝑉.
❑ In this region, the CB junction becomes forward biased
and 𝐼𝐵 no longer controls 𝐼𝐶 Cut-off Region : It is below 𝐼𝐵 = 0; the EB junction
𝐼 becomes reverse biased but the corresponding 𝐼𝐶 ≠ 0.
❑ 𝛽𝑑𝑐 = 𝐼𝐶 , large signal gain
𝐵
∆𝐼𝐶 𝑰𝑪 = 𝜷𝑰𝑩 + (𝟏 + 𝜷)𝑰𝑪𝑩𝟎
❑ 𝛽𝑎𝑐 = If 𝐼𝐵 = 0, 𝑰𝑪 = 𝟏 + 𝜷 𝑰𝑪𝑩𝟎 = 𝜷𝑰𝑪𝑩𝟎
∆𝐼𝐵
❑ 𝛽𝑑𝑐 ≈ 𝛽𝑎𝑐 = 𝛽 → Common-emitter forward-current gain
Common Collector (CC) Configuration
➢ In common collector configuration, base acts as input terminal and emitter acts as
output terminal.
➢ This connection is similar to common emitter, except that output is taken from the
emitter.
➢ This causes, the output to be in phase with input (signal).
➢ It offers a high input resistance and low output resistance.
➢ It is, therefore, employed for impedance matching.
➢ In this configuration, 𝛼𝑅 factor will exist which shows the amplification of input at
output.
∆𝐼𝐸
𝛾=
∆𝐼𝐵
Limits of operations
➢ For each transistor, there are limits of operation which identify the region on its characteristics
within which the signal exhibits least distortion.
➢ The region is bounded by cut-off region, saturation region 𝐼𝐶(𝑚𝑎𝑥) , maximum power dissipation
𝑃𝐷(𝑚𝑎𝑥) = 𝑉𝐶𝐸 𝐼𝐶 , an inverse hyperbola and 𝑉𝐶𝐸(𝑚𝑎𝑥) .
Comparison of the three configurations
Parameter CE CB CC
Input Resistance Low Very low High
Output Resistance High Very high Low
Current Gain High Less than 1 High
Voltage Gain High High Less than 1
Application Audio frequency High frequency Impedance
applications applications matching
➢ SCR is a four layer, three terminal, three junction, unidirectional switching device.
➢ The three terminals are anode, cathode and gate.
➢ The four layers are of alternate P-type and N-type silicon semiconductors forming three junctions.
➢ The layers and junctions are formed by gaseous diffusion and alloying techniques.
➢ The PNP silicon pellet if formed by diffusion.
➢ An aluminum wire connected to top P-layer acts as gate.
➢ The upper N-region is made by alloying gold-antimony into the P-type silicon.
➢ To minimize the mechanical stresses and the thermal expansion, molybdenum disk is employed both at
the top and bottom.
The outer layers are connected to terminals to form anode (positive terminal) and cathode
(negative terminal). The P-layer closer to the cathode is connected to the gate terminal.
Operation of SCR
➢ As a forward voltage is applied across the anode (+) and cathode (–), no conduction takes place as the
middle np-junction is reverse biased.
➢ If a positive pulse is applied at the gate, such that a current of magnitude equal to more than 𝐼𝐺 (turn-
on) flows into the gate, the processes in the device cause it to go into conduction.
➢ The forward current (anode to cathode) is offered a resistance as low as 0.01 to 0.1 ohm.
➢ However, because of regenerative action, removing the gate current does not cause the device to turn
off.
➢ The dynamic reverse resistance of an SCR is as high as 100 k-ohm or more.
➢ SCR can be brought to on state by two ways.
➢ In the first method, gate terminal is kept open and the supply voltage is made equal to the break over
voltage and then turning it on by applying small voltage to the gate.
➢ Once the SCR starts conducting the gate loses the control i.e. even if the gate pulse is removed, SCR
will not stop conducting.
➢ The only way to stop conduction is to reduce the applied voltage to zero.
The important terms that are related to the study of SCR:
1. Break over voltage : Gate terminal being kept open. The minimum forward voltage at
which SCR starts conducting is called break over voltage.
2. Peak reverse voltage: The maximum reverse voltage that can be applied to SCR in the
reverse direction (with conducting) is called peak reverse voltage.
3. Holding Current: The minimum value of anode current below which it must fall to bring
the SCR to OFF state from ON state is called holding current.
4. Forward Current rating: The maximum anode current that an SCR is capable of
withstanding without getting damaged is called forward current rating.
5. Latching Current: It is the minimum value of anode current which the SCR must attain
during turn-on, to maintain conduction, when the gate signal is removed.
Note:
❖ Latching current is associated in the turn-on process whereas holding current is
associated with turn-off process.
❖ Latching current is greater than holding current.
Characteristics of SCR Reverse breakdown voltage
corresponds to Zener or avalanche
➢ The characteristics curve gives forward characteristics of SCR at 𝐼𝑔 = 0.
region of a diode.
➢ If the supply voltage is increased above 𝑉𝐹𝑂 , the SCR starts conducting.
➢ At this juncture, the voltage across the SCR falls down.
➢ The SCR can also be brought to conducting state below 𝑉𝐹𝑂 , by making gate positive with respect to
cathode.
➢ This causes the gate current 𝐼𝑔 increases the 𝑉𝐹𝑂 decreases.
➢ Forward and reverse blocking regions are those regions in which the SCR is open circuited and no current
flows from anode to cathode.
MOSFET
• Enhancement
MOSFET
• Depletion MOSFET
Junction Field Effect Transistor (JFET)
➢ In the N-Channel JFET, the electrons are the majority carriers whereas in P-channel JFET, the holes are
the majority carriers.
➢ In bipolar transistor both majority and minority carriers constitute the current flow.
➢ Hence FET is also known as unipolar device.
➢ Hence FET is a three-terminal semiconductor device in which the conduction is due to any one type of
majority carriers i.e. either electrons or holes.
➢ Channel → The space between source and drain (between two gates) is called channel which allows the
movement of majority carriers from source to drain.
➢ The three terminals are,
❑ Source (S) → At this terminal the majority carriers enter the bar
❑ Drain (D) → At this terminal the majority carriers leave the bar
❑ Gate (G) → The heavily doped P regions introduced on both the sides of the N-type bar (in N
channel JFET) is called gate. (Vice-versa in P Channel JFET)
➢ N Channel JFET:
❖ It consists of n-type silicon bar forming the conducting channel for the charge carriers.
❖ The heavily doped P regions introduced on both sides of the bar form the gate.
❖ This is used to control the flow of electrons from source to drain.
➢ P Channel JFET:
❖ It consists of p-type silicon bar forming the conducting channel for the charge carriers.
❖ The heavily doped N regions introduced on both sides of the bar form the gate.
❖ This is used to control the flow of holes from source to drain.
Operation of JFET
➢ Voltage VDS > 0 is applied across the DS terminals, VDS can be varied by the source VD𝐷 .
➢ The gate terminal G is connected to the source terminal S so that VGS = 0. VDS causes the
channel electrons to flow from S to D, the conventional current ID flows into D and IS flows
out of S; obviously, ID = IS
𝒓𝟎
𝒓𝒅 = 𝟐
𝑽
𝟏 − 𝑮𝑺
𝑽𝑷
Where,
𝑟0 → Resistance with 𝑉𝐺𝑆 = 0
𝑟𝑑 → Drain Resistance
Transfer Characteristic
➢ It is observed from the characteristics of JFET that the characteristics to the right of VP locus, the
saturation region (the major part of the characteristics), that ID is dependent on VGS but is independent
of VDS .
➢ For any value of VDS, (preferably in the middle), we can read ID for various values of VGS (from zero
to VP ) and plot ID vs VGS .
➢ This plot is known as the transfer characteristic [it transfers VGS (input) to ID (output)].
➢ That is why JFET is a voltage-controlled device in which input voltage controls the output current.
Shockley’s Equation
𝟐
𝑽𝑮𝑺
𝑰𝑫 = 𝑰𝑫𝑺𝑺 𝟏−
𝑽𝑷
At VGS = 0, 𝑰𝑫 = 𝑰𝑫𝑺𝑺
At VGS = VP , 𝑰𝑫 = 𝟎
𝑰𝑫
𝑽𝑮𝑺 = 𝑽𝑷 𝟏 −
𝑰𝑫𝑺𝑺
JFET Parameters
➢ Dynamic Drain Resistance:
It is the ratio of small change in drain-source voltage to the small change in drain current, at
constant gate-source voltage.
∆𝑽𝑫𝑺
𝒓𝒅 = 𝒂𝒕 𝒄𝒐𝒏𝒔𝒕𝒂𝒏𝒕 𝑽𝑮𝑺
∆𝑰𝑫
➢ Transconductance:
It is the ratio of small change in drain current to small change in gate-source voltage at constant
drain-source voltage.
∆𝑰𝑫
𝒈𝒎 = 𝒂𝒕 𝒄𝒐𝒏𝒔𝒕𝒂𝒏𝒕 𝑽𝑫𝑺
∆𝑽𝑮𝑺
➢ Amplification Factor:
It is the ratio of small change in drain-source voltage to small change in gate-source voltage at
constant drain current.
∆𝑽𝑫𝑺
𝝁= 𝒂𝒕 𝒄𝒐𝒏𝒔𝒕𝒂𝒏𝒕 𝑰𝑫
∆𝑽𝑮𝑺
MOSFET - Metal Oxide Semiconductor Field Effect Transistor
➢ The MOSFET transistor has become the most important device for construction of integrated circuits
for digital computers.
➢ Its thermal stability and other general features make it very suitable for IC design and construction
because of smaller silicon-chip space needed.
➢ It is available in two forms.
❑ Enhancement MOSFET
❑ Depletion MOSFET
➢ Due to very small leakage current, the input impedance of MOSFET is much higher than that of FET.
➢ By applying an electric field across the insulator deposited on the semiconductor material, the width of
the conducting channel can be controlled.
➢ MOSFET is also known as insulated gate field effect transistor (IGFET).
➢ The two special features of MOSFET are small chip area and low power consumption.
Depletion-Type MOSFET
➢ A lightly doped P-type semiconductor is taken as substrate.
➢ The two highly doped 𝑁 + regions formed, act as source and drain respectively.
➢ Between these two, a shallow N region called Channel is diffused.
➢ A thin aluminium metallic film deposited over the N regions.
➢ Here the important point to note is that, the gate does not form a junction with the
source and the drain unlike JFET.