Markov Paper Programable
Markov Paper Programable
Markov Models
István Matijevics
Polytechnical Engineering College, Subotica, Serbia and Montenegro,
[email protected]
Zoltán Jeges
Polytechnical Engineering College, Subotica, Serbia and Montenegro,
[email protected]
Abstract: Programmable Electronic Systems are tools for safety protection applications in
industrial processes. These electronic solutions have special circuits and architectures.
Markov Models can expressively represent the operation of a programmable electronic
system as various system components fail and/or are repaired. This paper describes one
method and shows examples of the reliability analysis of control system. In model are
multiple failure rates as a function of failure state, common cause failures, on-line
diagnostic capability of a programmable electronic system, multiple failure modes, and
different repair rates as a function of failure state.
1 Introduction [2]
In process industry nowadays there are a great number of PES (Programmable
Electronic Systems) system applications. These systems are very important for the
management of risk. These systems consist of sensors, computers
(microcontrollers) and actuators. The unwanted failure events damage the
environment and cause loss of production and investments in equipment.
New international standards (IEC61508 [3] and ISA-S84.01 [4,5]) are required
especially for high safety applications and quantification of the achieved safety.
The following main objectives are necessary in the teaching on reliability in PES
(Programmable Electronic Systems) [1]:
• Reliability specifications-oriented design,
• Re-design after analyzing field data,
• Reliability analysis of an existing design,
• Failure analysis of components, circuits or systems,
• Maintainability analysis of an existing design and
Understand and apply reliability standard.
Figure 1
Most used analysis techniques
Figure 2
PES input circuits
Figure 3
FMEDA for PES input circuit
Figure 4
Markov model of repairable component
The component is in state 1, if it is successful, or in state 2, if it failed. The model
can move from state 1 to state 2 at a rate of λ12 (the failure rate), or from state 2
to state 1 at µ 21 (the repair rate).
Figure 5
State-time diagram including common cause failures
The stochastic model for common cause failures will be derived from the state
space of two stochastically independent components (Fig. 4). λ1 and λ2 are the
outage rates of components 1 and 2, while µ1 and µ2 denote their repair rates.
λ and µ are generally known as transition rates.
Figure 6
State-space of a system with two stochastically independent components
In the state space in Fig. 7, containing the possibility of the occurrence of common
mode failures of two components, there is a direct transition from state 1 to 4,
determined by the common cause outage rate. This rate is determined by the mean
time T ( Bc ) between two successive common cause outages:
1
λc = (1)
T ( Bc )
Figure 7
State-space of the system with two components including common cause outages
The rateλc (which will be further assumed as being equal for both components) is
dependent on the system, in contrast to the component-specific rates λ1 and λ2 , so
it is system-specific.
According to Fig. 7, to determine the transition rates from state 1 to state 2 and 3,
respectively, the outage rates λ1 and λ2 must be reduced by λc . The reason for
this is that the outage rates λ1 and λ2 represent all the outages of the separately
studied components. However, inside the system, some of them are single outages,
while the rest are common cause outages. So, the sum of the transition rates for
transitions starting from state 1 is equal to λ1 + λ2 , just as in case of independent
outages.
Figure 9
State-space of a single component including repair postponability
Figure 10
State-space for a system with only one repair team
Figure 11
Two channel logic architectures
There are detected and undetected failures:
To properly account for common cause failures, each failure rate should be
partitioned into normal and common cause. This result in eight failure rates for
each physical set of channels in PES:
Figure 12
Markov model of PES (calculate-calculate mode)
Figure 13
Markov model of PES (calculate-verify mode)
References
[1] Jorge Marcos, Luis Molinelli, Santiago Fernandez-Gomez, “Software-
Aided Reliability Education”, ASEE/IEEE Frontiers in Education
Conference, TIC-18, October 10-13, 2001 Reno
[2] J. L. Roovroye, E. G. van den Bliek, “Comparing safety analysis
techniques”, Reliability Engineering and System Safety”, 75 (2002) 289-
294
[3] Julia V. Bukowski, Wiliam M. Goble, “Using Markov models for safety
analysis of programmable electronic systems”, Elsevier, Isa Transactions
34, 1995 pp. 193-198
[4] István Matijevics, Lajos Józsa, “An Expert-system-assisted Reliability
Analysis of Electric Power Networks, Engng Applic. Artif. Intell. Vol. 8,
No. 4, pp. 449-460, 1995
[5] William M. Goble, Julia V. Bukowski, A. C. Brombacher, “How
diagnostic coverage improves safety in programmable electronic systems”,
Elsevier, Isa Transactions 36, pp. 345-350, 1998