IS0

INTERNATIONAL STANDARD 8503-3

First edition
1988-02-01

INTERNATIONAL ORGANIZATION FOR STANDARDIZATION

ORGANISATION INTERNATIONALE DE NORMALISATION
MEXfiYHAPO,QHAR OPrAHkl3A~MR 10 CTAHAAPTM3A~klM

Preparation of steel substrates before application of

paints and related products - Surface roughness
characteristics of blast-cleaned steel substrates -

Part 3 :
Method for the calibration of IS0 surface profile
comparators and for the determination of surface profile -
Focusing microscope procedure
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Pkparation des subjectiles d’acier avant application de peintures et de produits assimilk -

Caracttkistiques de rugositt? des subjectiles d’acier dkap6s -

Partie 3 : M&hode pour Btalonner les Bchantillons de comparaison viso-tactile IS0 et pour
caractdriser un profil de surface - Utilisation d’un microscope optique

Reference number
IS0 8503-3 : 1988 (E)

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 Foreword
IS0 (the International Organization for Standardization) is a worldwide federation of
national standards bodies (IS0 member bodies). The work of preparing International
Standards is normally carried out through IS0 technical committees. Each member
body interested in a subject for which a technical committee has been established has
the right to be represented on that committee. International organizations, govern-
mental andnon-governmental, in liaison with ISO, also take part in the work.

Draft International Standards adopted by the technical committees are circulated to

the member bodies for approval before their acceptance as International Standards by
the IS0 Council. They are approved in accordance with IS0 procedures requiring at
least 75 % approval by the member bodies voting.

International Standard IS0 8503-3 was prepared by Technical Committee ISO/TC 35,
Paints and varnishes.

Users should note that all International Standards undergo revision from time to time
and that any reference made herein to any other International Standard implies its
latest edition, unless otherwise stated.

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0 International Organization for Standardization, 1988 0

Printed in Switzedand

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 INTERNATIONAL STANDARD IS0 8503-3 : 1988 (El

Preparation of steel substrates before application of

paints and related products - Surface roughness
characteristics of blast-cleaned steel substrates -

Part 3 :
Method for the calibration of IS0 surface profile
comparators and for the determination of surface profile -
Focusing microscope procedure

0 Introduction IS0 8502 - Tests for the assessment of surface clean-

liness;
The performance of protective coatings of paint and related
products applied to steel is significantly affected by the state of IS0 8503 - Surface roughness characteristics of blast-
the steel surface immediately prior to painting. The principal cleaned steel substrates;
factors that are known to influence this performance are
IS0 8504 - Surface preparation methods.

a) the presence of rust and mill scale;

Each of these International Standards is in turn divided into
b) the presence of surface contaminants, including salts, separate parts.
dust, oils and greases;
The optical microscope is one of the most widely used in-
c) the surface profile. struments for measuring surface profile. The method can be
used by any laboratory equipped with a good microscope that
International Standards IS0 8501, IS0 8502 and IS0 8503 have has a calibrated focusing mechanism meeting the requirements
been prepared to provide methods of assessing these factors, of 5.1. This procedure may also be used to determine the pro-
while IS0 8504 provides guidance on the preparation methods file of a substrate after abrasive blast-cleaning either directly or
that are available for cleaning steel substrates, indicating the from a replica.
capabilities of each in attaining specified levels of cleanliness.
This method is based on that developed in the USA by the
These International Standards do not contain recommenda- Steel Structures Painting Council. It entails averaging a series
tions for the protective coating systems to be applied to the of maximum peak-to-valley measurements obtained by focus-
steel surface. Neither do they contain recommendations for the ing a specified microscope - first on the highest peak and then
surface quality requirements for specific situations even though on the lowest valley in the same field of view, noting the
surface quality can have a direct influence on the choice of distance of movement of the stage (or objective).
protective coating to be applied and on its performance. Such
This method has the disadvantage of requiring a series of
recommendations are found in other documents such as
tedious measurements, but good precision and agreement be-
national standards and codes of practice. It will be necessary
tween laboratories and between operators can be obtained by
for the users of these International Standards to ensure that the
specifying closely the field of view and depth of field of the
qualities specified are
microscope. To avoid a widespread divergence in measuring
- compatible and appropriate both for the environmental profile within and between laboratories, this method requires a
conditions to which the steel will be exposed and for the significant number of measurements as well as correct calibra-
protective coating system to be used; tion, proper focus movement, standardized depth of field and
field diameter of the microscope necessary to measure properly
- within the capability of the cleaning procedure speci- both coarse and fine profiles under a single set of conditions.
fied.
IS0 8503-4 describes the procedure using a stylus instrument.
The four International Standards referred to above deal with IS0 8503-l specifies the requirements for IS0 surface profile
the following aspects of preparation of steel substrates : comparators and IS0 8503-2 describes their use. The many
abrasive blast-cleaning procedures in common use are describ-
IS0 8501 - Visual assessment of surface cleanliness; ed in IS0 85042.

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 IS0 8503-3 : 1966 (E)

1 Scope and field of application 5 Apparatus

1 .l This part of IS0 8503 specifies the focusing microscope 5.1 Optical microscope, having a fine focus adjustment
and describes the procedure for calibrating IS0 surface profile with little or no backlash (play) (see clause A.5 in annex A). The
comparators complying with the requirements of IS0 8563-l. adjustment shall give fine control of the movement of the ob-
iective or stage and shall be fitted with a graduated vernier scale
having a scale value of not more than i urn. The microscope
1.2 This part of IS0 8503 is also applicable to the determina-
shall have an objective lens with a numerical aperture of not
tion of the surface profile, within the range h, = 20 to 200 pm,
less than 0.5 together with an eyepiece lens to give a field of
of essentially planar blast-cleaned steel. The determination may
view greater than 0.5 mm in diameter. The field of view may be
be carried out on a representative section of the blast-cleaned
reduced by the use of a circular eyepiece reticle or by a stop in
substrate or, if direct observation of the surface is not feasible,
the lamphouse.
on a replica of the surface (see annex El.
NOTE - Advice concerning the use of the microscope is given in
NOTE - Where appropriate, this procedure may be used for assessing
annexes A and D. Annex A describes a procedure for determining the
the roughness profile of other abrasive blast-cleaned substrates.
microscooe backlash. Annex D exolains the significance of the defined
variables’for the microscope. (See also the note to 5.2.)
An alternative procedure is described in IS0 8503-4.

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5.2 Light source, fitted to the microscope (5.1) to illuminate
2 References the test surface perpendicular to its plane. Light filters may be
used to minimize glare.
IS0 4618, Paints and varnishes - Vocabulary.
NOTE - These requirements for the apparatus (5.1 and 5.2) are
IS0 8503, Preparation of steel substrates before application of generally met by microscopes for metallurgical purposes.
paints and related products - Surface roughness character-
istics of blast-cleaned steel substrates
6 Test surfaces
- Part 1 : Specifications and definitions for IS0 surface
profile comparators for the assessment of abrasive blast-
6.1 IS0 surface profile comparator
cleaned surfaces.

- Visually check that each segment of the IS0 surface profile

Part 2 : Method for the grading of surface profile of
comparator (see IS0 8503-l) that is to be calibrated is un-
abrasive blast-cleaned steel - Comparator procedure.
damaged. Lightly clean the surface with a dry, fine bristle brush
- Part 4 : Method for the calibration of IS0 surface to remove any particles of dust and then, using a similar brush,
profile comparators and for the determination of surface wash the surface with petroleum spirit, 40/60 (commercial
profile - Stylus instrument procedure. grade), to remove oil and grease residues. Allow to dry before
carrying out the calibration.
IS0 8504-2, Preparation of steelsubstrates before application of
paints and related products - Surface preparation methods - Calibrate each segment of the comparator as described in
Part 2 : Abrasive blast-cleaning. ’) clause 7.

6.2 Blast-cleaned steel substrates/replica

3 Definitions
Visually check that the surface that is to be measured is un-
For the purpose of this part of IS0 8503, the definitions given in damaged. Lightly clean the surface with a dry, fine bristle brush
IS0 4618 and IS0 8503-l apply. to remove any particles of dust and then, using a similar brush,
wash the surface with petroleum spirit, 40/60 (commercial
grade), to remove oil and grease residues. Allow to dry before
4 Principle carrying out the procedure.

Observation of the test surface over a specified field of view Determine the surface profile as described in clause 7.
using a specified microscope. Adjustment of the microscope,
by movement of the objective (or the stage), to focus on the NOTE - if a replica (see annex E) is to be measured, clean it only with
highest peak within the field of view. Determination of the a dry brush.

distance h, moved by the objective (or the stage) in order to

focus on the lowest valley within the same field of view.
7 Procedure for measurement of maximum
Repetition of the procedure to obtain values for a further 19 dif- peak-to-valley height h,
ferent fields of view and calculation of the arithmetic mean
of the distance h, between the highest peak and lowest valley 7.1 Locate the test surface (clause 6) under the objective of
in each field of view as the mean maximum peak-to-valley the microscope (5.1) so that the measurements are taken on a
height h,. test area not less than 5 mm from any edge. Adjust the light

1) At present at the stage of draft.

2
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 IS0 8503-3 : 1988 (E)

source (5.2) to illuminate the test area, normal to the plane of 8.2 If the method is used to calibrate an IS0 surface profile
the surface. Focus the microscope approximately on the sur- comparator and if the standard deviation obtained is more than
face. one-third of the mean result, repeat the procedure (clause 71,
and obtain the mean and standard deviation for the 40
readings. If the standard deviation is still more than one-third of
7.2 Raise the objective until no part of the test area is in focus
the mean, reject the comparator as the profile is of inadequate
(see the notes). Then slowly lower the objective, using the fine
uniformity.
adjustment knob, until the first point in the observed area just
comes into focus. On the form given in annex C, record the
reading r, on the vernier scale as the height of the highest peak 8.3 If the method is used to determine the profile of a blast-
in that field of view. cleaned surface, either directly or from a replica, report h,,
together with the standard deviation and the maximum reading
NOTES
of h, to indicate the degree of uniformity of the surface
1 On some microscopes, the objective is fixed and the stage is roughness.
movable. Adjustment of focus is achieved by raising or lowering the
stage.

2 It is recommended that focusing should always be carried out in the

9 Test report
same direction (see clause D.2).

The form of the test report is given in annex B and shall contain
7.3 Lower the objective until no part of the test area is in at least the following information :
focus (see the notes to 7.2). Then slowly raise the objective un-
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til the first point in the observed area just comes into focus. On a) the identification of the IS0 surface profile comparator
the form given in annex C, record the reading r2 on the vernier and the segments tested or, if the profile of a steel substrate
scale, corrected for any backlash (see annex A), as the depth of was determined, the identification of the steel substrate and
the lowest valley in that field of view. If the reading cannot be whether a replica of the substrate was used;
corrected for backlash in the microscope movement, continue
to raise the objective until the lowest valley is no longer in b) a reference to this part of IS0 8503 (IS0 8503-3);
focus. Then slowly lower the objective until the lowest valley is
once more in focus. Record the reading r2 on the vernier scale cl the magnification of the objective lens, and its
as the depth of the lowest valley in that field of view. numerical aperture;

d) the magnification of the eyepiece lens and of any in-

7.4 The difference between the readings (r, - r2) is the maxi-
termediate magnification;
mum peak-to-valley height h, for that field of view.
e) the diameter of the field of view of the test area;
7.5 Repeat the procedure described in 7.2, 7.3 and 7.4 until
the maximum peak-to-valley height has been determined for 20 fl the total magnification of the microscope:
completely different fields of view, uniformly distributed over
the test surface, but not less than 5 mm from any edge. g) the result of the test as indicated in clause 8 and, if
the profile of an IS0 surface profile comparator was deter-
mined, the limits for the comparator (see 8503-l );
8 Calculation and expression of results
h) any deviation, by agreement or otherwise, from the
8.1 Calculate the mean value h, and the standard deviation procedure described and, if the profile of a steel substrate
for the 20 maximum peak-to-valley readings h, for each test was determined on a replica, the method of preparation of
surface. the replica (see annex El;

If the standard deviation obtained is less than one-third of the i) the name of the operator;
mean, report the standard deviation and the result as the
“mean maximum peak-to-valley height h,“. j) the date of the test.

3
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 IS0 8503-3 : 1988 (EI

Annex A

Determination of backlash (play) in the microscope adjustment mechanism

(This annex forms an integral part of the Standard.)

A.1 Carry out the following procedure using the microcope Repeat this procedure without moving the comparator until 20
(5.1) but with the magnification increased to between X 360 to readings have been obtained, and then calculate their mean
x 450. ifi).

A.4 Without displacing the comparator, lower the objective

A.2 Place an IS0 surface profile comparator (6.1) on the
until the highest peak is no longer in focus. Slowly raise the ob-
stage of the microscope so that the area to be examined is not
jective until the highest peak in the observed area just comes
less than 5 mm from any edge. Adjust the light source to il-
into focus. Record the reading (~2) of the vernier scale.
luminate the test area normal to the plane of the surface. Focus
approximately the microscope on the surface.
Repeat this procedure without moving the comparator until 20
readings have been obtained, and then calculate their mean
(p,).
A.3 Raise the objective (see note 1 to 7.2) until no part of
the test areas is in focus. Slowly lower the objective using the
fine adjustment knob, until the first point (i.e. the highest peak) A.5 Calculate the backlash as the difference (p1 - p2) and
in the observed area just comes into focus. Record the reading provided that the value is not greater than 3 urn, use this value
(~~1 of the vernier scale. in 7.3. If the value is greater than 3 urn, reject the microscope.
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 Annex B

Test report for the calibration of IS0 surface profile comparators

and for the determination of surface profiles
(This annex forms an integral part of the Standard.)

1. Test laboratory and address

2. Test surface identification

a) IS0 surface profile comparator

bl steel substrate/replica”

3. international Standard reference IS0 8503-3

4. Microscope details

Objective lens magnification x

Objective numerical aperture NA

intermediate magnification’l x

Eyepiece magnification x

Diameter of field of view mm

Total magnification x

I 5. Results3’ I Mean Maximum

Nominal value reading Standard
! reading of h, deviation
h,
m wm
-_
Segment 1 1

Segment 2

Segment 3
-
Segment 4

Steel substrate/replica4)
:
6. Any deviations from the standard procedure’)

7. Name and position of person authorizing the deviations

(see 6 above) I

8. Date of present test(s) I

9. Date(s) of any previous testk12’

10. Name of operator

1) If profile measurement is of i) a steel substrate or ii) a replica, give details

21 If applicable.

3) See separate form (annex CI for actual readings.

4) Delete as appropriate.

5
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 IS0 8503-3 : 1988 (E)

Annex C

Form for recording surface profile measurements made in accordance

with IS0 8503-3
(This annex forms an integral part of the Standard.)

Test laboratory and address

Objective lens magnification x ............. Diameter of field of view ......... mm

Objective lens numerical aperture NA ........... Total magnification x .............

Eyepiece magnification x .............

Intermediate magnification x .............

Item reference’) a) IS0 surface profile comparatci

bj Steel substrate/replica2)

Segment 2
Readinq3’ 1
No.-
‘2

1
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1) Delete as appropriate.

2) If profile measurement is of i) a steel substrate or ii) a replica, give details

3) All readings in micrometres.

4) Replace by “steel substrate” or “replica”, if applicable.

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 IS0 8503-3 : 1888 (El

Annex D

Guidance notes for calibrating IS0 surface profile comparators using a

focusing microscope
(This annex does not form an integral part of the Standard.)

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D.l Depth of field and field diameter the procedure outlined in clause 7 suggests that, for a
microscope with a fine adjustment mechanism that is free from
When using an optical microscope, the choice of lenses
backlash (play), the direction of the final focusing movement
available to obtain the magnification required for observations
for the valley depths can be the opposite of that used when
dictates the depth of field and the maximum field diameter. The
measuring the peak heights. This deviation is permitted in order
depth of field is controlled by the numerical aperture of the
to increase substantially the speed of operation, because a fine
objective lens which permits the accurate determination of
adjustment mechanism that is free from backlash would in-
peak heights and valley depths. However, the smaller field
troduce no error when focusing from opposite directions.
diameter that results from the use of a high numerical aperture
lens and the consequent higher magnification, may fail to con-
Therefore, if the fine adjustment mechanism of the microscope
tain an adequate representation of high peaks and low valleys.
has backlash, it is imperative either that the final focus move-
At lower magnifications, the field diameter is larger and hence
ment be always made in the same direction to prevent the
representative peaks and valleys are more likely to be present,
introduction of error or that the backlash determined in
but the coarser depth of field may prevent a precise determina-
clause A.5 of annex A be used.
tion of their respective heights.

The distribution of the magnification between the objective and Obviously, the procedure for a microscope where its fine ad-
eyepiece lenses is important in controlling the depth of field. justment mechanism is free from backlash is much easier for
When a magnification of X 150 is required, the selection of a the observer and is more efficient. Therefore, it is suggested
X 10 objective and a X 15 eyepiece would comply. However, a that every effort be made to ensure the proper movement of the
typical X 10 objective has a numerical aperture of 0,26 and fine adjustment mechanism.
would give a depth of field of about 7 urn. By selecting a X 20
objective with a numerical aperture of not less than 0,5, the Annex A gives the procedure for determining the backlash in
depth of field is reduced to the acceptable value of 2 pm. The the fine adjustment. Using this procedure, a particular instru-
field diameter is in inverse relation to the total magnification, ment can be inspected and the necessary corrections im-
the latter being obtained by multiplying the magnification of the plemented.
individual lenses in the microscope system. Many microscopes
have a fixed intermediate lens which usually adds a factor of
X I,25 or X 1,5.
D.3 Variability of surface profile
When these considerations are taken into account along with
the desire to produce a test method for measuring the surface To obtain a representative value for the surface profile of
profiles of IS0 comparators, it is necessary that standard re- abrasive blast-cleaned structural steel, it is necessary to
quirements be specified in order to obtain figures aligning with average at least 20 maximum peak-to-valley heights h, obtain-
visual and tactile assessments. By controlling the numerical ed by using the procedure described in clause 7. This average,
aperture of the objective lens and the field of view, the known as the mean maximum peak-to-valley height h,,
magnification is indirectly controlled. To meet the requirement minimizes irregularities caused by rogue peaks, cracks, hackles,
for an objective with a numerical aperture not less than 0,5 and etc.
a field of view greater than 0.5 mm diameter, a microscope with
an objective lens of X 20, a numerical aperture of 0.5 and an The standard deviation for a set of 20 peak-to-valley
eyepiece lens of X 10 is typical and provides a total magnifica- measurements that have been carried out correctly is usually
tion of X 200. between 15 % and 25 % of the mean of the measurements.
Thus, a standard deviation greater than 33 % of the mean in-
dicates an unacceptably high variability in the measuring pro-
D.2 Focus movement
cedure or in the test area, and a further set of peak-to-valley
Normal microscopy procedures require the final focusing measurements is to be made to establish whether the initial set
movement to be always made in the same direction. However, of readings was representative (see clause 8).

7
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 ISO8!503-3:1988(E)

Annex E

Guidance notes for the preparation and measurement of replicas

(This annex does not form an integral part of the Standard.)

When the test method is used to verify the profile of a steel substrate, it is usually impractical to obtain a small sample of the actual
surface whose profile is to be determined. In this case, it is still possible, by examining a replica of the steel surface, to determine the
surface profile.

A replica produces the reverse of the metal surface (that is, the peaks of the steel substrate become the valleys of the replica and the
valleys of the steel become the peaks of the replica), but this reversal does not affect the validity of the measurement methods
described in IS0 8503-4 and this Part of IS0 8503.

A variety of replicating techniques is available including solventless two-component organic polymers that cross-link to give a hard
solid surface. These polymers may have disadvantages in that they do not penetrate into the deepest, sharpest valleys and that
a release agent may be required. They provide, however, a hard enough surface to enable the stylus measurements described in
IS0 8503-4 to be made.

A two-component pigmented silicone rubber product has also been used with success. Its initial viscosity and flexible nature when
cross-linked mean that penetration into re-entrants of grit-blasted profiles, and subsequent removal, is good. Due to its softness,
however, measurement is restricted to the microscope method described in this part of IS0 8503.

Before any replicating technique is used, it should be examined for accuracy by replicating at least five steel surfaces whose profiles
have been determined directly. These steel surfaces should have been prepared by use of abrasive of the same type as that used on
the surface to be tested, and they should have profiles that span the test surface profile range. It is preferable that the profile obtained
from the replica should be within 10 % of that obtained on the steel surfaces.

If a replicating technique is used to determine the surface profile of a substrate, this should be stated when reporting the “mean max-
imum peak-to-valley height”.

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 IS0 6603-3 : 1969 (E)

UDC 667.6 : 669.14 : 620.179.11

Descriptors : paints, varnishes, substrates, steel products, tests, determination, surface condition, profile criteria, roughness, viso-tactile
comparison specimens, microscopes.

Price based on 8 pages

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