Lecture 2
Lecture 2
Metrics
DIGITAL GATES
Fundamental Metrics
l Functionality
l Cost
l Reliability, Robustness
l Performance
» Speed (delay)
» Power Consumption
» Energy
1
Cost of Integrated Circuits
2
Reliability
Noise in Digital Integrated Circuits
VDD
v(t)
i(t)
(a) Inductive coupling (b) Capacitive coupling (c) Power and ground
noise
DC Operation
Voltage Transfer Characteristic
V(y)
V f
OH
V(y)=V(x)
V Switching Threshold
M
VOL
VOL V V(x)
OH
3
Mapping between analog and digital signals
V V(y)
"1" OH Slope = -1
V V
IH OH
Undefined
Region
Slope = -1
V
IL VOL
"0"
V
OL V V V(x)
IL IH
"1"
V
OH
NMH
V
IH
Undefined
Region
NML V
V IL
OL
"0"
Gate Output Gate Input
4
Noise Budget
Impedance -
Another Key Reliability Property
5
The Regenerative Property
...
v0 v v v v v v
1 2 3 4 5 6
f(v) finv(v)
finv(v) f(v)
(a) Fan-out N
M
(b) Fan-in M
N
6
The Ideal Gate
Vout
Ri = ∞
Ro = 0
g=− ∞
Fanout = ∞
5.0
4.0 NM L
3.0
Vout (V)
2.0
VM
NM H
1.0
7
Delay Definitions
Vin
50%
t
t t
pHL pLH
Vout
90%
50%
10% t
tf tr
Ring Oscillator
v v v v v v
0 1 2 3 4 5
v v v
0 1 5
T = 2 × tp × N
8
Power Dissipation