Oh

sFabricated
tiths
Considened aelel
evern
nanaJeasle.
beomes
hanta oninbdúiale
Hed VLSI Hierarchy?
the Desisn
no9nammabie 0n Sub Bb- and
Mehe
FraN design
imiementaton
logic Chiphn
maellemoees
Congun"
of aele
are logic Chifs hnchors.
Sayle:
eContanig add'y and
gates bate ntl echrigue
Beverad the hen The
nth Atuy
to tes Complexity
hebctHingAnvohes
openabon
hejotinghi
pal se
to
(FPGA) elesign
hndreds Speciked
algjoof of
dividig the
o
as Styles
le Hehueranchy
hully
Of aaled
thawsards Can malle rodule aa

be a
ustom hardsare þroghamiy to trealie desied hncto
tiauy. This deign Byle provieles a eens fon Fast
þrotoying and also fon Cost efecive Chit design,
ecially fon los Volume abplicahors AFPGA Chit
Conists of Jlo buffes, an anay of Conigunable
Llogic blocks CCLB) and onog nammable nconnect
souchwes. Ihe noghamming of the intenco rnects
ds ACComlished by þnaghamirg of RAH Cells
Whose ol teirals ane Cohhected to he gates
Of Mos bas tnansiston - hs, he sls houtig
lis
b}w the CLB< and he Iio_blocks ds Gccormt
Seting the Cont gwable Sitch matrices
hed by
acconding

Ventcat
Routing thannd
 aelvantege: FPoA -based desgn s the Verg Shotet twn
ond Hre, i.e, the Hme hequteel krom he Stat
OP he lesign roces util 4 hunchonal Chij s
aveilable.
tensitot,
Gate Anay Designotenms of fast nototybis
he
Capabiliyihe gate aay harks Second Mten fes
PaA ith a tybical twn-arounel time of A
he
Cays thile usen rognamming s Centtrad tomelal masse
aesign implementaion Of te FPeA Chip,
is Useed fon GR. Cate Ajoay
design and procesig
iylemertahon hegies a to- Steh antacheij
process ? The hrst
fnst fhase, which is based on geredc
Ctandare) Mast, seslts cn an amay of lnomm
THed toansista on eech GA Chit. hese tun mi
Hed Chis Can be Brhed fon laten austomi2ahon,
htenarnecs
LWhch is Compleled by aehring he melal he fatemig
b|w He trensistons of the aney. heSnce
atend of he
OF retallic intenCornects is lone
Of
praess , he hn arond Hime Can
Chit kabicahon
Sh) be bhott a few days to a fes weets.
libray
he Shandadl -Cell
onelard- tells based dewign
elesign us one of he rost brevalent hl Custom
desgn tyles Which tequte deelilment Of e hull Cstom
ast et. he Btandad Cell ds also Called he olycell.
 Shyle, alu of he Commonly wscel Logt dike
thes desig terized and Stareed n g
Chanac
e s ahe dwelobed ,
Cells Cortain
Standard Cel librang Atypical libray mag
gares
a fes hndved Cells incluliny iventers , NAND
Nok Jales Cormpiex Aot, 0AT gates Dlalches and
Hit- flops. Each gate type Can be impienended n
Several Vensiors to fnoviele Qeleguate driig Capabiiy
ton diferent tan-Ôuts. Each Cel is Characteried
ACconeling to Several elifenent Cheacterizahon
Catgoies , fncluding
Deleuy time Vensus doal Copacitance
Cihcuit 3imulahorn moelel.
limiryg imlahion model.
Fault BimuetHon moelel.
" Cell eleta on plAce and tote. N
Mase data.
1o enable Qutomated lacement of HeLayout Cells Gnd touhing
Cell ConnecHon, eech el is desigr
Of inten-
height, Bo ha a numben of Cells
with a hixed
abutted sele- by- Side to fanm hows.
Cen be

hll Custom eleign;: Athosh he Shandrd Cels based

s Semehines Caled hull Custom design, in
deign yle is
Hhah
a Snic Sense, t s Sonehat tess
Customied Bince he Cels ohe heelesghed han generay
tuse ard he Same lels nany
ne uilreel h many
 elsgns. Jn atruy hl-Custam ddsgn,he
difeert Chiy withot wse o
ertie ast design is elone a neus
any ibvay. Cost

Design ualiy' : s desinable to measure te Qlality

Chelen to nprove he Chip deign.jheth
OF design án
of
Consielered to be impontart
he kolowing Chiteni ane
(O testabíliy
Yield g melachvabiliby
9 Reiability
4echnolegg Uþelateabiity
Tetabiliby: Develobed Chis ane evenhally insented
modules f
inte rited Cihcit boaveds oh ulichi of
sstem ahplicalons . he Conect huncHonalihy
Uton he Conrech hunchonality
the &ystem hinjes Chits sheuld be
the Chits Wsed. thentne febricateel
ensne that all he Chats asy
hlly testabie to insented dno the
he shecihed Chit test Can be
Syotem, eithen do fackyal
without Cawsing failures. suh a Joal tequines:
" Geneahors o Bevd te Vechos.
Availabiliby of seliabie test fahue at sjecd.
Design or testase chip.
 Yield and Manufac twrabily # we assune Hat
the test phocedwne s flasless, Hhe Chy yield Can be
Clated by dividing the numbey of good tested
Chips
ups by Hhe total humben of testel Chils. Hoseven
Hhis Calclaions mey
may not Gecty trefiect the
Stality of the design cn he frocessiny. he Ch
Yield Can be huthy aliviaed nto he
klousing
" func Honal Yield Pave mebric yfele
he hunchiona! Yield ds obtained ty testig Hhe
hnchionaliy of the chit at a Specd lusaly lawes
Hhan he uquted Chiy Syeed. the hnchional test weds
Cwvnent, and Can dehec+ Loic and Ciscuit esign
fauts.
he hanamettic tes uis wally portanmed at
sheed on chits Hat hased he huncho
He heguihed
hal test. Au the delay tesig vis pentrmd
Stage.
Meliability: he teliabiily of the Chip depords
On he eesign Qnd phocess Concutiony. the mojas
Causes fon Chif teliability fhoblems Can be
Charucterited into the olouing :
at
Elecoostaic dúchange and Elecrical overstess
be
- Eleczo igralion
LaBch Uy in CNos I|o Rne internal CNclts
Oxiele beenpelon
ally the efen dots with þos Yiells also Cose
Jualitilily probems .
lthrolegy Uþdateabiity: Brocess tchnologgy dueloh
7777777T
et tas rogrcsed hapielly and as a teult,
he litestan of a given technalogy genirekion has
umained almost Constant eien foh Submicnon
technclgjs.
Comhuter-Aided Design technolegy lAD): CAD
tools are essenial tN irely
eleveloþment OF irtegrated
Cincuits. lhogh CAD Frold, Cannot heplace te Cheeive
and Invenive hants of he design Gciuiies, the gaiy
Of Hme Consumig ahcd Computahion irtensse mechani
stic pants of he dessn Can be aecuted ty wing CAD
tuols. 1he CAD technology fon VL8I CHb eesign an
be caiegonized Jnto Hhe dlaing auas:
Hiyh level Syntesis
Logic Sypihess
Grnulahion
Deviyn ules Checkig
"Chuit Oþinizalòn " fhmal Vehiicahin
Layout
 Synhesis trols he hiah level Syrhesls hrols sing
descriphon danjuages (HDLs) ,Sch as
1duiane
VHDL a Veilos I AddyeM. he h auto malion Of he
top level cof the elesign hienanby
design yhse lo he
Cebgn lowen level desgh
of
h an GCeuate esimabon
feahwes Such as Chip ana Ahd Signal elela
eleenmine the types and
if Can Veny ethechwely incudee w he
Rlaniies Of molules to be
Chiy elesig
Layout tr)s; he toos fon Cincih obimizah'on
Qne Concened lwith transistan si 2irg Fuy mininizabon
elelays andl wilh þrocess Variahono, noise eand
of incluele
eliatlihy hagando. the layot CAD tuols
tlace -ahd-toute and moelde
Humlanning

Gimulahon and Veihcakon tolb: the Simulahon Categony

wtich s he Ust mathine aneA of VLS1 CAD,ipc ludes
Many bolshangirg rom Cincuát-level mulahin
(3ICEDh its eleri vAves i Sucth as H3fICE ), imárg
level Simunlaion Logic level Bilakon and behavotal
imuaton. he ain of aU Snuahon CAD toolA us to
datermine uf the esgncd Chcuit meta he seguined
Syecikcakions 1at all stag of me deign bhoces.
 ()Betaiohal nellit i t0iten to elesci be
He uncHonalihy of he design
9o ne Hrogh VHDL 0s Vei log -
netlist is Syntheseed to Come U wih he
Jae level eleuign.
(5 he loic block ino ayajlable logic
Cells.