STGF 30 M 65 DF 2
STGF 30 M 65 DF 2
Features
6 µs of short-circuit withstand time
VCE(sat) = 1.55 V (typ.) @ IC = 30 A
Tight parameters distribution
Safer paralleling
Low thermal resistance
Soft and very fast recovery antiparallel diode
Applications
Motor control
TO-220FP UPS
PFC
Figure 1: Internal schematic diagram
Description
C (2) This device is an IGBT developed using an
advanced proprietary trench gate field-stop
structure. The device is part of the M series
IGBTs, which represent an optimal balance
between inverter system performance and
efficiency where low-loss and short-circuit
G (1) functionality are essential. Furthermore, the
positive VCE(sat) temperature coefficient and tight
parameter distribution result in safer paralleling
operation.
Sc12850_no_tab
E (3)
Contents
1 Electrical ratings ............................................................................. 3
2 Electrical characteristics ................................................................ 4
2.1 Electrical characteristics (curves) ...................................................... 6
3 Test circuits ................................................................................... 11
4 Package information ..................................................................... 12
4.1 TO-220FP package information ...................................................... 13
5 Revision history ............................................................................ 15
1 Electrical ratings
Table 2: Absolute maximum ratings
Symbol Parameter Value Unit
VCES Collector-emitter voltage (VGE = 0 V) 650 V
IC(1) Continuous collector current at TC = 25 °C 60 A
IC(1) Continuous collector current at TC = 100 °C 30 A
ICP(2) Pulsed collector current 120 A
VGE Gate-emitter voltage ±20 V
(1)
IF Continuous forward current at TC = 25 °C 60 A
(1)
IF Continuous forward current at TC = 100 °C 30 A
IFP(2) Pulsed forward current 120 A
Insulation withstand voltage (RMS) from all three leads to external
VISO 2.5 kV
heat sink (t = 1 s, TC = 25 °C)
PTOT Total dissipation at TC = 25 °C 38 W
TSTG Storage temperature range -55 to 150 °C
TJ Operating junction temperature range -55 to 175 °C
Notes:
(1)Limited by maximum junction temperature.
(2)Pulse width limited by maximum junction temperature.
2 Electrical characteristics
TC = 25 °C unless otherwise specified
Table 4: Static characteristics
Symbol Parameter Test conditions Min. Typ. Max. Unit
Collector-emitter breakdown
V(BR)CES VGE = 0 V, IC = 250 µA 650 V
voltage
VGE = 15 V, IC = 30 A 1.55 2.0
VGE = 15 V, IC = 30 A,
Collector-emitter saturation 1.95
VCE(sat) TJ = 125 °C V
voltage
VGE = 15 V, IC = 30 A,
2.1
TJ = 175 °C
IF = 30 A 1.85 2.65
VF Forward on-voltage IF = 30 A, TJ = 125 °C 1.6 V
IF = 30 A, TJ = 175 °C 1.5
VGE(th) Gate threshold voltage VCE = VGE, IC = 500 µA 5 6 7 V
ICES Collector cut-off current VGE = 0 V, VCE = 650 V 25 µA
IGES Gate-emitter leakage current VCE = 0 V, VGE = ±20 V ±250 µA
Notes:
(1)Including the reverse recovery of the diode.
(2)Including the tail of the collector current.
32 20
24 15
16 10
8 5
VGE ≥ 15V, TJ ≤ 175 °C VGE ≥ 15V, TJ ≤ 175 °C
0 0
-50 0 50 100 150 TC(°C) -50 0 50 100 150 TC(°C)
Figure 4: Output characteristics (TJ = 25 °C) Figure 5: Output characteristics (TJ = 175 °C)
GIPD100420151008FSR GIPD100420151025FSR
IC IC
(A) (A) VGE=15V
VGE=15V
13V
100 100
13V
11V
80 80
60 60 11V
40 40
9V 9V
20 20
7V
0 0
0 1 2 3 4 5 VCE(V) 0 1 2 3 4 5 VCE(V)
Figure 6: VCE(sat) vs. junction temperature Figure 7: VCE(sat) vs. collector current
GIPD281020131418FSR GIPD281020131116FSR
VCE(sat) VCE(sat)
(V) IC= 60A (V)
TJ= 175°C
VGE= 15V VGE= 15V
3 5
2.6 4
TJ= 25°C
IC= 30A
2.2 3
1.8 2
IC= 15A TJ= -40°C
1.4 1
1 0
-50 0 50 100 150 TJ(°C) 0 20 40 60 80 100 IC(A)
20
16 100
Tc=80°C
Tc=100 °C 1 µs
12
10 µs
8 10
Figure 10: Transfer characteristics Figure 11: Diode VF vs. forward current
GIPD100420151152FSR GIPD100420151209FSR
IC VF (V)
(A)
VCE= 5V 3
100 TJ= 25 °C TJ= -40°C
2.5
80
2 TJ= 175°C
60
1.5
40
1 TJ= 25°C
TJ= 175 °C
20
0.5
0 0
5 6 7 8 9 10 11 VGE(V) 0 20 40 60 80 100 IF(A)
Figure 12: Normalized VGE(th) vs. junction Figure 13: Normalized V(BR)CES vs. junction
temperature temperature
GIPD100420151232FSR GIPD100420151240FSR
VGE(th) V(BR)ces
(norm) (norm)
IC= 500µA IC= 250µA
VCE= VGE
1.1 1.1
1.0 1.05
0.9 1.0
0.8 0.95
0.7 0.9
-50 0 50 100 150 TJ(°C) -50 0 50 100 150 TJ(°C)
16 IC= 30A
Cies
IG= 1mA
1000 VCC= 520V
12
8
100
Coes 4
Cres 0
10
0.1 1 10 100 VCE(V) 0 20 40 60 80 Qg(nC)
Figure 16: Switching energy vs. collector current Figure 17: Switching energy vs. gate resistance
GIPD100420151322FSR GIPD100420151328FSR
E E
(mJ) (mJ)
VCC = 400V, VGE = 15V,
RG = 10Ω, TJ = 175°C VCC = 400 V, VGE = 15 V,
4 4 IC = 30 A, TJ = 175 °C
3 Etot 3
Etot
Eoff
2 2
Eoff
1 1
Eon
Eon
0 0
0 10 20 30 40 50 60 IC(A) 0 20 40 60 80 100 RG(Ω)
Figure 18: Switching energy vs. temperature Figure 19: Switching energy vs. collector emitter
voltage
GIPD100420151336FSR GIPD100420151340FSR
E E
(mJ) (mJ)
VCC= 400V, VGE= 15V, TJ= 175°C, VGE= 15V,
RG= 10Ω, IC= 30A RG= 10Ω, IC= 30A
2.5
2
2
Etot Etot Eoff
1.5
Eoff
1.5
1
1
0.5 Eon
0.5
Eon
0 0
0 50 100 150 TJ(°C) 150 250 350 450 VCE(V)
10 90
10 tr
5 60
0 30 1
9 10 11 12 13 14 15 VGE(V) 0 10 20 30 40 50 IC(A)
Figure 22: Switching times vs. gate resistance Figure 23: Reverse recovery current vs. diode
current slope
GIPD100420151412FSR GIPD100420151417FSR
t Irm
(ns) (A)
TJ= 175°C, VGE= 15V, IF = 30A, VCC = 400V
IC= 30A, VCC= 400V VGE = 15V
40
tf 35
100 td(off) 30
TJ =175°C
td(on) 25
20
tr
10 15
0 20 40 60 80 RG(Ω) 200 600 1000 1400 1800 di/dt(A/µs)
Figure 24: Reverse recovery time vs. diode current Figure 25: Reverse recovery charge vs. diode
slope current slope
GIPD100420151434FSR GIPD100420151442FSR
trr Qrr
(ns) IF = 30A, VCC = 400V, (µC)
IF = 30A, VCC = 400V,
VGE = 15V VGE = 15V
280
2.9
260
2.8
240
TJ =175°C
2.7
220
2.6
200 TJ =175°C
180 2.5
200 600 1000 1400 1800 di/dt(A/µs) 200 600 1000 1400 1800 di/dt(A/µs)
0.34
0.3
TJ =175°C
0.26
0.22
0.18
200 600 1000 1400 1800 di/dt(A/µs)
3 Test circuits
Figure 29: Test circuit for inductive load Figure 30: Gate charge test circuit
switching
A A
C
G L=100 µH
E B
B
C 3.3 1000 VCC
µF µF
G D.U.T
RG E
+
-
AM01504v 1
Figure 31: Switching waveform Figure 32: Diode reverse recovery waveform
di/dt Qrr
trr
IF
ts tf
IRRM t
10%
IRRM
VRRM
dv/dt
AM01507v1
4 Package information
In order to meet environmental requirements, ST offers these devices in different grades of
ECOPACK® packages, depending on their level of environmental compliance. ECOPACK®
specifications, grade definitions and product status are available at: www.st.com.
ECOPACK® is an ST trademark.
7012510_Rev_12_B
5 Revision history
Table 9: Document revision history
Date Revision Changes
28-Jan-2015 1 First release.
04-May-2015 2 Added STGF30M65DF2 electrical characteristics curves.
19-Oct-2015 3 Changed Figure 27: "Thermal impedance for IGBT".
Datasheet promoted from preliminary data to production data
08-Feb-2016 4
Minor text changes
Updated document title.
Updated Table 4: "Static characteristics", Table 6: "IGBT switching
characteristics (inductive load)" and Table 7: "Diode switching
11-Apr-2017 5 characteristics (inductive load)".
Updated Figure 13: "Normalized V(BR)CES vs. junction temperature ".
Updated Section 4.1: "TO-220FP package information".
Minor text changes
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