AON6380
AON6380
DFN5X6 D
Top View Bottom View Top View
1 8
2 7
3 6
4 5 G
PIN1
S
PIN1
Thermal Characteristics
Parameter Symbol Typ Max Units
Maximum Junction-to-Ambient A t ≤ 10s 20 25 °C/W
RθJA
Maximum Junction-to-Ambient A D Steady-State 45 55 °C/W
Maximum Junction-to-Case Steady-State RθJC 3.8 4.8 °C/W
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power
dissipation PDSM is based on R θJA t≤ 10s and the maximum allowed junction temperature of 150°C. The value in any given application depends on the
user's specific board design.
B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation
limit for cases where additional heatsinking is used.
C. Single pulse width limited by junction temperature TJ(MAX)=150°C.
D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a
maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating.
G. The maximum current rating is package limited.
H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.
I. For application requiring slow >1ms turn-on/turn-off, please consult AOS FAE for proper product selection.
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
80 80
4V VDS=5V
10V
4.5V
60 60
3.5V
ID (A)
ID (A)
40 40
125°C 25°C
20 20
VGS=3V
0 0
0 1 2 3 4 5 0 1 2 3 4 5 6
10 1.6
VGS=4.5V
Normalized On-Resistance
8 VGS=10V
1.4 ID=20A
RDS(ON) (mΩ)
6
1.2
VGS=10V
4
VGS=4.5V
1 ID=20A
2
0 0.8
0 5 10 15 20 25 30 0 25 50 75 100 125 150 175
20 1.0E+01
ID=20A
1.0E+00
15
1.0E-01 125°C
RDS(ON) (mΩ)
IS (A)
125°C
10 1.0E-02
25°C
1.0E-03
5
25°C
1.0E-04
0 1.0E-05
2 4 6 8 10 0.0 0.2 0.4 0.6 0.8 1.0
VGS (Volts) VSD (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage Figure 6: Body-Diode Characteristics
(Note E) (Note E)
10 1200
VDS=15V
ID=20A
1000
8 Ciss
Capacitance (pF)
800
VGS (Volts)
6
600
4
400 Coss
2
200 Crss
0 0
0 3 6 9 12 15 0 5 10 15 20 25 30
1000.0 180
TJ(Max)=150°C
150 TC=25°C
100.0 10µs
10µs
RDS(ON) 120
Power (W)
10.0 limited
ID (Amps)
100µs
90
1ms
DC
1.0 10ms
60
0.1 30
TJ(Max)=150°C
TC=25°C
0
0.0 0.0001 0.001 0.01 0.1 1 10
0.01 0.1 1 10 100
Pulse Width (s)
VDS (Volts)
Figure 10: Single Pulse Power Rating Junction-to-
VGS> or equal to 4.5V Case (Note F)
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
10
D=Ton/T In descending order
ZθJC Normalized Transient
RθJC=4.8°C/W
1
Ton
T
0.01
1E-05 0.0001 0.001 0.01 0.1 1 10 100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
30 30
25 25
Power Dissipation (W)
20 20
10 10
5 5
0 0
0 25 50 75 100 125 150 0 25 50 75 100 125 150
10000
TA=25°C
1000
Power (W)
100
10
1
1E-05 0.001 0.1 10 1000
10
ZθJA Normalized Transient
0.1
PDM
0.01 Single Pulse
Ton
T
0.001
0.0001 0.001 0.01 0.1 1 10 100 1000
Pulse Width (s)
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)
Figure
GateA: Charge
Gate Charge Test Circuit
Test Circuit & Waveforms
& Waveform
Vgs
Qg
10V
+
VDC
+ Vds Qgs Qgd
- VDC
DUT -
Vgs
Ig
Charge
Figure B:Resistive
ResistiveSwitching
Switching Test
Test Circuit
Circuit&&Waveforms
Waveforms
RL
Vds
Vds
90%
DUT
+ Vdd
Vgs VDC
Rg - 10%
ton toff
Figure C: UnclampedInductive
Unclamped InductiveSwitching
Switching (UIS) Test
Test Circuit
Circuit&&Waveforms
Waveforms
L 2
Vds EAR= 1/2 LIAR BVDSS
Id Vds
Vgs + Vdd I AR
Vgs VDC
Rg - Id
DUT
Vgs Vgs
Figure D: Recovery
Diode Diode Recovery Test Circuit
Test Circuit & Waveforms
& Waveforms
Vds + Q rr = - Idt
DUT
Vgs
t rr
Vds - L Isd IF
Isd dI/dt
+ Vdd I RM
Vgs VDC
Vdd
Ig
- Vds