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2806 01 PDF

This document provides the scope of accreditation for PK Labs Calibration & Consulting to ISO/IEC 17025:2017. It lists the various calibration parameters and equipment they are accredited for, including the measurement ranges and measurement uncertainties. They are accredited to perform calibrations related to chemical quantities, dimensional measurements, thread measurements, and more. The scope is valid until July 31, 2023.

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0% found this document useful (0 votes)
157 views33 pages

2806 01 PDF

This document provides the scope of accreditation for PK Labs Calibration & Consulting to ISO/IEC 17025:2017. It lists the various calibration parameters and equipment they are accredited for, including the measurement ranges and measurement uncertainties. They are accredited to perform calibrations related to chemical quantities, dimensional measurements, thread measurements, and more. The scope is valid until July 31, 2023.

Uploaded by

Amit
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
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SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

P.K. CALIBRATION & CONSULTING LABS LTD


d.b.a. PK LABS CALIBRATION & CONSULTING
3 Hadolev Str.
Tefen Industrial Zone, 24959
ISRAEL
Peter Kornhauser Phone: 972 4 9873345

CALIBRATION

Valid To: July 31, 2023 Certificate Number: 2806.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1, 18:

I. Chemical Quantities

Parameter/Equipment Range CMC2, 4 () Comments11

CO2 – Measure3 Up to 2.5 % CO2 0.32 % CO2 Geotech G100, ASTM


Up to 5 % CO2 0.35 % CO2 E1292, ISO 8573-6, CEI
Up to 10 % CO2 0.38 % CO2 EN 50270, CGA G-6
Up to 20 % CO2 0.52 % CO2

CO2 – Measuring 2.5 % CO2 0.24 % CO2 Reference gases


Equipment3 5 % CO2 0.26 % CO2
10 % CO2 0.31 % CO2
20 % CO2 0.46 % CO2

Conductivity – 1000 µS/cm 14 µS/cm Conductivity buffer


Measuring Equipment 10 000 µS/cm 0.19 mS/cm solutions
100 000 µS/cm 0.95 mS/cm

pH – Measuring (4, 7, 10) pH 0.02 pH pH buffer solutions


Equipment

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 1 of 32


II. Dimensional

Parameter/Equipment Range CMC2, 4 () Comments11

Calipers3 Up to 350 mm 12 µm (480 µin) Caliper checker


(>350 to 1000) mm 20 µm (790 µin) gage blocks: DIN 862;
ISO 13385; JIS B 7507

Thickness & Up to 0.01 mm 0.5 m (20 µin) Gage blocks; UMM:


Feeler Gages3 (>0.01 to 1) mm 0.6 m (24 µin) JIS B7524; DIN 2275
(>1 to 2) mm 0.7 m (28 µin)
(>2 to 3) mm 0.8 m (32 µin)
(>3 to 10) mm 0.9 m (35 µin)
(>10 to 20) mm 1 m (39 µin)
(>20 to 30) mm 1.1 m (43 µin)
(>30 to 40) mm 1.3 m (51 µin)
(>40 to 50) mm 1.5 m (59 µin)

Micrometers3,14 Up to 50 mm 0.0013 mm Gage blocks:


Up to 100 mm 0.0018 mm ISO 3611; DIN 863 Part
Up to 200 mm 0.0029 mm 1-4; JIS B 7502; JIS B
Up to 300 mm 0.0049 mm 7520
Up to 450 mm 0.0037 mm
Up to 575 mm 0.0091 mm
Up to 1000 mm 0.0170 mm

Flatness, Parallelism Up to 0.05 mm 0.0004 mm Optical flat, parallel

Length Indicators (Dial, Up to 100 mm (1 + 0.5R) µm Indicator calibrator;


Lever, Dial Gauge, Test, UMM: DIN 879; DIN
LVDT)3 879-1; DIN 879-3;
DIN 878; DIN 2270;
JIS B7503; JIS B 7533;
ISO 13102

Height Gages3 Up to 500 mm 2.8 µm (110 µin) Gage blocks, surface


(>500 to 1000) mm 19 µm (750 µin) plate: JIS B7517; BS
1643; BS EN ISO 13225

Bore Gages Up to 10 mm 1.0 µm (39 µin) Gage blocks; Ring


gages; UMM: JIS B7515

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 2 of 32


Parameter/Equipment Range CMC2, 4 () Comments11

Cylindrical & Taper


Gages –

Pins & Plain Plugs10 Up to 100 mm 1 µm (39 µin) UMM, gage blocks:
(>100 to 300) mm 2 µm (79 µin) ISO 594/1; ISO
(>300 to 550) mm 2.8 µm (110 µin) 80369-7; ASME
B1.20.5; ISO 286;
Plain Rings10 Up to 100 mm 1 µm (39 µin) ISO 286-1; ISO 286-2
(>100 to 300) mm 2 µm (79 µin) DIN 7162; DIN EN
(>300 to 450) mm 2.5 µm (98 µin) ISO 1938-1; DIN
7163; DIN 7164

Length Standards Up to 100 mm 1.5 µm (59 µin) UMM, gage blocks:


(Micrometer Settings, (>100 to 500) mm 2.7 µm (110 µin) BS 870; BS EN ISO
End Rods, Length Bars) 3611; JIS B 7502

Thread Wires Up to 7 mm 0.6 µm (24 µin) UMM, gage blocks:


BS 5590; ASME B1.2

Bevel Protractors3, Up to 5° 0.013 s Angle blocks6,


Clinometers, Bubble BS 1685; BS 958;
Levels (> 5 to 180)° 0.04 s DIN 877; JIS B 7510;

Measuring Rules3 Up to 0.2 m 0.5 mm (0.02 in) Length standards:


(> 0.2 to 0.5) m 0.9 mm (0.035 in) JIS B 7516
(> 0.5 to 1) m 1.2 mm (0.047 in)

Measuring Tapes3 Up to 5 m 1.8 mm (0.071 in) Length standards:


(> 5 to 10) m 2 mm (0.079 in) JIS B 7512; JIS B
(> 10 to 20) m 2.3 mm (0.091 in) 7522; BS 4035; BS
(> 20 to 30) m 2.9 mm (0.11 in) 4484-1
(> 30 to 40) m 3.1 mm (0.12 in)
(> 40 to 50) m 3.6 mm (0.14 in)

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 3 of 32


Parameter/Equipment Range CMC2, 4 () Comments11

Cylindrical & Taper Thread wires; UMM:


Thread Plug Gage – ISO 7-1; ISO 7-2;
ISO 965; ISO 1502;
Pitch Diameter Up to 100 mm 1.5 µm (59 µin) ISO 228; ISO 11363;
(>100 to 300) mm 2.1 µm (75 µin) ISO 15872;
(>300 to 550) mm 3.4 µm (140 µin) DIN 477; DIN 2999;
DIN 103; DIN 40431;
Major Diameter9 Up to 100 mm 1 µm (39 µin) DIN 513; DIN
(>100 to 300) mm 2 µm (79 µin) 40430;DIN 158; DIN
(>300 to 550) mm 2.8 µm (110 µin) 158-1; DIN EN 10226;
EN 10226;
DIN 405; DIN EN
144-1;
BS 93; BS 811; BS 84;
BS 919; BS 21; BS
EN 10226-1; DIN EN
10226-1;DIN EN
10226-2; DIN EN
10226-3;
BS 3409; BS 4377;
BS 1657; BS 1104;
DIN 7756;
MIL-T-21309;
A-A-59158;
FED STD H28;
ASME B1.2; ASME
B1.5; ASME B1.8;
ASME B 1.9; ASME
B1.12; ASME B1.15;
ASME B1.20.1;
ASME B1.20.3;
ASME B1.20.5;
ASME B1.20.7;
ASME B1.13M;
ASME B1.16M;
ASME B1.21M;
ASME B1.22M;
ASME B18.29.1
ASME B 1.1; BS
1580; API Spec 5B;
API Spec 7-2;
AWWA C800-05;
SAE MA 1696.

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 4 of 32


Parameter/Equipment Range CMC2, 4 () Comments11

Solid & Tapered Thread Ring Ball probe,


Gage – micrometer Tri-O-
Bor,UMM:
Pitch Diameter (0.5 to 100) mm 1.5 µm (59 µin) ISO 7-1; ISO 7-2;
(>100 to 300) mm 3.9 µm (150 µin) ISO 228 ; ISO 965;
(>300 to 450) mm 4.3 µm (170 µin) ISO 1502; ISO 11363;
ISO 15872; DIN 477;
Minor Diameter9 (6 to 50) mm 2.4 µm (94 µin) DIN 2999; DIN 103;
(>50 to 100) mm 2.9 µm (110 µin) DIN 40431; DIN 513;
DIN 40430;DIN 158;
DIN 158-1; DIN EN
10226; EN 10226;
DIN 405; DIN EN
144-1; BS 93;
BS 811;BS 84; BS
919;
BS 21; BS EN 10226-
1; DIN EN 10226-
1;DIN EN 10226-2;
DIN EN 10226-3;
BS 3409;
BS 4377; BS 1657;
BS 1104; BS 1580-1;
BS 1580-3;
DIN 7756;
MIL-T-21309;
A-A-59158;
FED STD H28;
ASME B1.3; ASME
B1.5;
ASME B1.8;
ASME B 1.9;
ASME B1.12;
ASME B1.15;
ASME B1.20.1;
ASME B1.20.3;
ASME B1.20.5;
ASME B1.20.7;
ASME B1.13M;
ASME B1.16M;
ASME B1.21M;
ASME B1.22M;
ASME B1.1;
API Spec 5B;
API Spec 7-2;
AWWA C800-05;
SAE MA 1696.

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 5 of 32


Parameter/Equipment Range CMC2, 4 () Comments11

Extensometers3 – Micrometers;
indicators, gage
Displacement (0.01 to 500) mm 2.6 µm (100 µin) blocks:
ASTM E83; ASTM
E2309; ASTM
E2309/E2309M; ISO
5893; ASTM E8/E8M
ISO 9513, ASTM
D5311; ASTM
D5311/D5311M

Length Measuring Up to 1 mm 0.12 m (4.7 µin) Gage blocks,


Instruments – UMMs, Bench (>1 to 20) mm 0.18 m (7.1 µin) LVDT
Micrometers, Indicators, (>20 to 50) mm 0.2 m (7.9 µin)
Calibrators, Caliper Checkers (>50 to 100) mm 0.24 m (9.5 µin)
(>100 to 200) mm 4 m (160 µin)
(>200 to 300) mm 5.6 m (220 µin)
(>300 to 460) mm 14 m (550 µin)
(>460 to 625) mm 20 m (790 µin)
(>625 to 1010) mm 30 m (1200 µin)

Line Standard Scales Up to 1 mm 0.7 µm (28 µin) UMM: JIS B 7541


(>1 to 10) mm 1.3 µm (51 µin)
(>10 to 50) mm 1.7 µm (67 µin)
(>50 to 200) mm 2.5 µm (98 µin)

Measuring Projectors & Line standard scales:


Microscopes3 – JIS B7184; JIS B7153;
ASTM 1951;
Displacement Up to 10 mm 1.6 µm (63 µin) ASTM 112
(>10 to 20) mm 2.0 µm (78 µin)
(>20 to 50) mm 2.8 µm (110 µin)
(>50 to 100) mm 3.3 µm (130 µin)
(>100 to 200) mm 4.8 µm (190 µin)
Angle Angle blocks
(0 to 90)° 44" (0.000 213 rad)

Surface (Granite) Plates -


Measure

Flatness Only Up to 2.5 m x 1.6 m 0.001 mm ISO 8512-2, DIN 876,


GGG-P-463cc, BS
817 to manufacturer or
customer requirements

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 6 of 32


III. Dimensional Testing/Calibration

Parameter/Equipment Range CMC2, 5 () Comments11

Linear Measurement Up to 0.2 m 0.15 mm (0.0059 in) Length standards


(Single Axis)3, 7 (>0.2 to 0.5) m 0.7 mm (0.028 in)
(>0.5 to 1.0) m 0.9 mm (0.035 in)
(>1.0 to 5.0) m 2 mm (0.079 in)
(>5.0 to 10.0) m 3.3 mm (0.13 in)

Up to 50 mm 3.0 µm (120 µin) Measuring projector

Inspection Fixtures – Up to 500 mm 2.6 µm (79 µin) LVDT; DIN 874;


Length, Single Axis JIS B 7514
(Straight Edges, Knife
Edges)12

Inspection Fixtures – BS 3731; BS 3064;


Length, Two Axis (V- JIS B 7523; JIS B 7526;
Blocks, Bar Parallels, 1-2-3 JIS B 7539; JIS B 7540;
Blocks, Squares, Sine Bars, JIS B 7514;
Sine Plates, Angle Irons)12 DIN 875; DIN 875-1; DIN
874; DIN 2273; DIN 2274

Flatness Up to 500 mm 5.6 µm (220 µin) LVDT, granite plate

Angle Up to 60° 4" (0.000 019 rad) Sine bar, granite plate
(5 to 60)° 0.6R bevel protractor
(>60 to 180)° 1.0R
(0.5 to 60)° 36" (0.000 17 rad) Measuring projector

Parallelism Up to 200 mm 3.0 µm (120 µin) LVDT, granite plate

Perpendicularity Up to 600 mm 2.8 µm (110 µin) Square, granite plate, gage


blocks

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 7 of 32


IV. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 16 () Comments11

DC Voltage – Measure3 0 mV 0.4 µV Fluke 8588A,


0.2 µV to 200 mV 9.5 µV/V Keysight 3458A
200 mV to 2 V 10 µV/V
(2 to 20) V 7.9 µV/V
(20 to 200) V 13 µV/V
(200 to 1000) V 13 µV/V

DC Voltage – Generate3 0 mV 0.54 µV Fluke 5522A,


1V 6 µV/V Fluke 5730A
10 V 3.9 µV/V
0.1 µV to 220 mV 9.2 µV/V
220 mV to 2.2 V 7.0 µV/V
(2.2 to 11) V 7 µV/V
(11 to 22) V 4 µV/V
(22 to 220) V 9.2 µV/V
(22 to 1100) V 11 µV/V

DC High Voltage – (1000 to 4000) V 1.3 V Vitrek 4700,


Measure3 (4000 to 5000) V 1.6 V HVL-35,
(5000 to 9000) V 2.8 V HVP-35
(9000 to 10 000) V 3.2 V
(10 000 to 30 000) V 9.1 V

DC Current – Measure3 0 µA 0.42 nA Fluke 8588A,


(0 to 20) µA 1 nA Keysight 3458A
(20 to 200) µA 2.6 nA
(0.2 to 1) mA 15 nA
(1 to 2) mA 25 nA
(2 to 20) mA 0.3 µA
(20 to 200) mA 12 µA
200 mA to 2 A 0.4 mA
(2 to 30) A 27 mA

DC Current – Generate3 0 mA 0.62 nA Fluke 5730A


(10 to 220) µA 8.3 nA
220 µA to 2.2 mA 0.072 µA
(2.2 to 22) mA 0.72 µA
(22 to 220) mA 9.2 µA
220 mA to 2.2 A 170 µA
(2.2 to 3) A 1.2 mA
(3 to 10) A 5.5 mA
(10 to 20) A 21 mA

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 8 of 32


Parameter/Equipment Range CMC2, 16 () Comments11

DC Current – Generate3 (20 to 150) A 1A Fluke 5522A


(cont) (150 to 500) A 2.5 A Fluke 5500A/Coil
(500 to 1000) A 4.6 A

Resistance – Measure3 0Ω 4 µΩ Fluke 8588A,


(0 to 2) Ω 25 µΩ/Ω Keysight 3458A,
(2 to 20) Ω 25 µΩ/Ω MetCal
(20 to 200) Ω 18 µΩ/Ω
200 Ω to 2 kΩ 18 µΩ/Ω
(2 to 20) kΩ 19 µΩ/Ω
(20 to 200) kΩ 19 µΩ/Ω
200 kΩ to 2 MΩ 29 µΩ/Ω
(2 to 20) MΩ 73 µΩ/Ω
(20 to 100) MΩ 580 µΩ/Ω
100 MΩ to 1 GΩ 11 mΩ/Ω

Resistance – Generate3 0Ω 40 µΩ Fluke 5730A


1Ω 95 µΩ/Ω
1.9 Ω 98 µΩ/Ω
10 Ω 25 µΩ/Ω
19 Ω 25 µΩ/Ω
100 Ω 13 µΩ/Ω
190 Ω 13 µΩ/Ω
1 kΩ 10 µΩ/Ω
1.9 kΩ 10 µΩ/Ω
10 kΩ 10 µΩ/Ω
19 kΩ 10 µΩ/Ω
100 kΩ 12 µΩ/Ω
190 kΩ 12 µΩ/Ω
1 MΩ 17 µΩ/Ω
1.9 MΩ 22 µΩ/Ω
10 MΩ 45 µΩ/Ω
19 MΩ 60 µΩ/Ω
100 MΩ 120 µΩ/Ω

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 9 of 32


Parameter/Equipment Range CMC2, 16 () Comments11

Resistance – Generate3 (0 to 11) Ω 0.0015 Ω Fluke 5522A


(cont) (11 to 33) Ω 0.0025 Ω
(33 to 110) Ω 0.0048 Ω
(110 to 330) Ω 44 µΩ/Ω
(330 to 1100) Ω 43 µΩ/Ω
(1.1 to 3.3) kΩ 47 µΩ/Ω
(3.3 to 11) kΩ 36 µΩ/Ω
(11 to 33) kΩ 46 µΩ/Ω
(33 to 110) kΩ 37 µΩ/Ω
(110 to 330) kΩ 52 µΩ/Ω
(330 to 1100) kΩ 39 µΩ/Ω
(1.1 to 3.3) MΩ 88 µΩ/Ω
(3.3 to 11) MΩ 160 µΩ/Ω
(11 to 33) MΩ 490 µΩ/Ω
(33 to 110) MΩ 840 µΩ/Ω
(110 to 330) MΩ 4 mΩ/Ω
(330 to 1100) MΩ 17 mΩ/Ω

Parameter/Range Frequency CMC2, 16 () Comments11

AC Voltage – Measure3

(10 to 100) mV 10 Hz to 2 kHz 0.01 % + 3.9 µV Fluke 8588A,


(2 to 30) kHz 0.01 % + 5.5 µV Keysight 3458A
(30 to 100) kHz 0.07 % + 36.1 µV
(100 to 300) kHz 0.3 % + 130 µV
300 kHz to 1 MHz 1.3 % + 230 µV

100 mV to 1 V 10 Hz to 2 kHz 0.01 % + 12 µV


(2 to 10) kHz 0.02 % + 19 µV
(10 to 30) kHz 0.04 % + 37 µV
(30 to 100) kHz 0.10 % + 95 µV
(100 to 300) kHz 0.10 % + 95 µV
300 kHz to 1 MHz 1.4 % + 1.4 mV
(1 to 2) MHz 2.4 % + 2.3 mV
(2 to 4) MHz 6.4 % + 6.4 mV
(4 to 8) MHz 10 % + 10 mV
(8 to 10) MHz 18 % + 18 mV

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 10 of 32


Parameter/Range Frequency CMC2, 16 () Comments11

AC Voltage – Measure3
(cont)

(1 to 10) V 10 Hz to 2 kHz 0.01 % + 120 µV Fluke 8588A,


(2 to 10) kHz 0.02 % + 190 µV Keysight 3458A
(10 to 30) kHz 0.04 % + 370 µV
(30 to 100) kHz 0.10 % + 950 µV
(100 to 300) kHz 0.39 % + 3.9 mV
300 kHz to 1 MHz 1.4 % + 14 mV
(1 to 2) MHz 2.3 % + 23 mV
(2 to 4) MHz 6.4 % + 64 mV
(4 to 8) MHz 10 % + 100 mV
(8to 10) MHz 17 % + 180 mV

(10 to 100) V 10 Hz to 2 kHz 0.01 % + 1.2 mV


(2 to 10) kHz 0.01 % + 1.2 mV
(10 to 30) kHz 0.04 % + 3.7 mV
(30 to 100) kHz 0.10 % + 9.5 mV
(100 to 300) kHz 0.62 % + 39 mV
300 kHz to 1 MHz 1.8 % + 140 mV

(100 to 1000) V 40 Hz to 2 kHz 0.02 % + 14 mV


(2 to 10) kHz 0.02 % + 14 mV
(10 to 30) kHz 0.04 % + 37 mV
(30 to 100) kHz 0.10 % + 96 mV

AC Voltage3 – Generate3

(2.2 to 22) mV (10 to 20) Hz 0.02 % + 0.8 µV Fluke 5522A,


(20 to 40) Hz 0.01 % + 0.7 µV Fluke 5730A
(40 to 20) kHz 0.01 % + 0.7 µV
(20 to 50) kHz 0.02 % + 0.9 µV
(50 to 100) kHz 0.05 % + 1.4 µV
(100 to 300) kHz 0.11 % + 2.4 µV
(300 to 500) kHz 0.14 % + 3.3 µV
500 kHz to 1 MHz 0.27 % + 7.4 µV

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 11 of 32


Parameter/Range Frequency CMC2, 16 () Comments11

AC Voltage3 – Generate3
(cont)

(22 to 220) mV (10 to 20) Hz 0.02 % + 5.3 µV Fluke 5522A,


(20 to 40) Hz 0.01 % + 2.3 µV Fluke 5730A
40 Hz to 20 kHz 0.01 % + 2.1 µV
(20 to 50) kHz 0.01 % + 4.4 µV
(50 to 100) kHz 0.03 % + 11 µV
(100 to 300) kHz 0.06 % + 22 µV
(300 to 500) kHz 0.06 % + 29 µV
500 kHz to 1 MHz 0.27 % + 56 µV

220 mV to 2.2 V (10 to 20) Hz 0.03 % + 49 µV


(20 to 40) Hz 0.01 % + 19 µV
40 Hz to 20 kHz 0.01 % + 19 µV
(20 to 50) kHz 0.01 % + 25 µV
(50 to 100) kHz 0.01 % + 64 µV
(100 to 300) kHz 0.04 % + 130 µV
(300 to 500) kHz 0.11 % + 280 µV
500 kHz to 1 MHz 0.18 % + 550 µV

(2.2 to 22) V (10 to 20) Hz 0.02 % + 0.5 mV


(20 to 40) Hz 0.03 % + 0.5 mV
40 Hz to 20 kHz 0.01 % + 0.1 mV
(20 to 50) kHz 0.004 % + 0.1 mV
(50 to 100) kHz 0.01 % + 0.2 mV
(100 to 300) kHz 0.01 % + 0.8 mV
(300 to 500) kHz 0.02 % + 2.2 mV
500 kHz to 1 MHz 0.09 % + 3.8 mV

(22 to 220) V (10 to 40) Hz 0.02 % + 5.2 mV


40 Hz to 20 kHz 0.01 % + 2.0 mV
(20 to 50) kHz 0.01 % + 1.5 mV
(50 to 100) kHz 0.01 % + 1.9 mV

(220 to 1100) V 50 Hz to 1 kHz 0.01 % + 19 mV

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 12 of 32


Parameter/Range Frequency CMC2, 16 () Comments11

AC High Voltage –
Measure

(1 to 5) kV 50/60 Hz 5.3 V Vitrek 4700,


(5 to 10) kV 10 V HVL-35
(10 to 30) kV 30 V

AC Current – Measure3

(10 to 100) µA 10 Hz to 2 kHz 0.01 % + 0.033 µA Fluke 8588A,


(2 to 10) kHz 0.01 % + 0.033 µA Keysight 3458A

100 µA to 1 mA 10 Hz to 2 kHz 0.04 % + 0.042 µA


(2 to 10) kHz 0.04 % + 0.078 µA
(10 to 30) kHz 0.07 % + 0.10 µA

(1 to 10) mA 10 Hz to 2 kHz 0.04 % + 0.4 µA


(2 to 10) kHz 0.04 % + 0.8 µA
(10 to 30) kHz 0.07 % + 1.0 µA

10 Hz to 2 kHz 0.04 % + 4.1 µA


(10 to 100) mA (2 to 10) kHz 0.08 % + 7.7 µA
(10 to 30) kHz 0.07 % + 9.9 µA

100 mA to 1 A 10 Hz to 2 kHz 0.04 % + 0.04 mA


(2 to 10) kHz 0.08 % + 0.08 mA
(10 to 30) kHz 0.10 % + 0.1 mA

(1 to 30) A 1 Hz to 2 kHz 0.26 % + 0.5 µA


(2 to 10) kHz 0.26 % + 0.8 µA

AC Current – Generate3

(0.1 to 220) µA (1 to 100) Hz 0.011 µA Fluke 5730A


(100 to 500) Hz 0.088 µA
500 Hz to 1 kHz 0.030 µA
(1 to 5) kHz 0.030 µA
(5 to 10) kHz 0.073 µA

200 µA to 2.2 mA (1 to 100) Hz 0.075 mA


(1 to 5) kHz 0.03 mA
5 kHz to 10) kHz 0.073 mA

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 13 of 32


Parameter/Range Frequency CMC2, 16 () Comments11

AC Current – Generate3
(cont)

(2.2 to 22) mA (1 to 100) Hz 0.0006 mA Fluke 5730A


(1 to 5) kHz 0.0002 mA
(5 to 10) kHz 0.0005 mA

(22 to 220) mA (1 to 100) Hz 0.005 mA


(1 to 5) kHz 0.002 mA
(5 to 10) kHz 0.005 mA

220 mA to 2.2 A (1 to 100) Hz 0.06 A


(1 to 5) kHz 0.02 A
(5 to 10) kHz 0.05 A

(2.2 to 11) A 1 Hz to 1 kHz 0.04 A


(1 to 5) kHz 0.001 A
(5 to 10) kHz 0.01 A

(11 to 20.5) A (45 to 100) Hz 0.02 A


100 Hz to 1 kHz 0.01 A
(1 to 5) kHz 0.01 A

(20.5 to 220) A (45 to 65) Hz 0.01 A

(220 to 1000) A (45 to 65) Hz 0.92 A Fluke 5522A,


Fluke 5500A/coil,
MetCal

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 14 of 32


Parameter/Range Frequency CMC2, 16 () Comments11

Capacitance, Measure

10 pF 100 kHz to 1 MHz 0.3 % Keysight E4980A LCR


(1 to 2) MHz 1%

100 pF (1 to 2) MHz 0.3 %

1000 20 Hz to 1 kHz 3%
1 kHz to 1 MHz 0.3 %
(1 to 2) MHz 1%

0.1 µF 120 Hz to 100 kHz 0.3 %

10 µF 20 Hz to 10 kHz 0.3 %
(10 to 100) kHz 7%

Parameter/Equipment Range CMC2, 16 () Comments11

Capacitance, Measuring (220 to 400) pF 0.5 % + 12 pF Fluke 5522A


Instruments (0.4 to 3.3) nF 0.5 % + 12 pF
(3.3 to 11) nF 0.27 % + 0.02 nF
(11 to 110) nF 0.27 % + 0.13 nF
(110 to 330) nF 0.29 % + 0.59 nF
(0.33 to 1.1) µF 0.12 % + 0.002 µF
(1.1 to 3.3) µF 0.25 % + 0.006 µF
(3.3 to 11) µF 0.25 % + 0.019 µF
(11 to 33) µF 0.39 % + 0.077 µF
(33 to 110) µF 0.45 % + 0.26 µF
(110 to 330) µF 0.45 % + 0.80 µF
(330 to 1100) µF 0.45 % + 2.5 µF
(1.1 to 3.3) mF 0.45 % + 0.008 mF
(3.3 to 11) mF 1.1 % + 0.025 mF
(11 to 33) mF 0.76 % + 0.11 mF
(33 to 110) mF 1.2 % + 0.48 mF

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 15 of 32


Parameter/Equipment Range CMC2, 16 () Comments11

Oscilloscope3 –

DC Voltage
50 Ω (0 to 6.6) V 0.06 V Fluke 5520A/SC1100
1 MΩ (0 to 130) V 0.05 % + 0.04 mV

Flatness

50 kHz Reference 50 kHz to 100 MHz 2.2 % + 5 mV


(100to 300) MHz 2.4 % + 5 mV
(300 to 600) MHz 3.6 % + 5 mV
600 MHz to 1.1 GHz 2.7 % + 5 mV

Squarewave
10 Hz to 10 kHz
50 Ω 1 mV to 6.6 Vp-p 0.017 V
1 MΩ 1 mV to 130 Vp-p 0.1 % + 42 μV

Sinewave Flatness
Relative to 50 kHz
5 mV to 5.5 V 50 kHz to 100 MHz 3.3 % + 5.0 mV
(100 to 300) MHz 3.6 % + 5.0 mV
(300 to 600) MHz 5.0 % + 5.0 mV

5 mV to 3.5 V (0.6 to 1.1) GHz 3.6 % + 4.9 mV

Rise Time – Generate (200 to 300) ps 120 ps


1 kHz to 2 MHz

(200 to 350) ps 100 ps


2 MHz to 10 MHz

Amplitude 5 mV to 2.5 V 0.3 mV + 10 %

Time Marker – 50 Ω 5 s to 50 ms 5 μs
20 ms to 100 ns 50 ns
(50 to 20) ns 0.13 ps
10 ns 23 fs
(5 to 2) ns 13 fs

Wave Generator
50 Ω 1.8 mVpk-pk to 2.5 Vpk-pk 0.075 Vpk-pk
1MΩ 1.8 mVpk-pk to 55 Vpk-pk 1.7 Vpk-pk

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 16 of 32


Parameter/Equipment Range CMC2, 16 () Comments11

Low Resistance (Earth 10 mΩ 0.51 mΩ Fluke 5322A


Resistance)3– Generate (100 to 500) mΩ 0.008 Ω + 0.4 %
(0.5 to 2) Ω 0.010 Ω + 0.2 %
(2 to 5) Ω 0.013 Ω + 0.24 %
(5 to 29.9) Ω 0.017 Ω + 0.16 %
(30 to 199.9) Ω 0.081 Ω + 0.15 %
(200 to 499) Ω 0.66 Ω + 0.12 %
500 Ω to 1.999 kΩ 1 Ω + 0.15 %
(2 to 4.99) kΩ 7 Ω + 0.11 %
(5 to 10) kΩ 10 Ω + 0.15 %

High Resistance (Insulation (10 to 39.99) kΩ 47 Ω + 0.16 % Fluke 5322A,


Resistance)3 – Generate (40 to 99.99) kΩ 23 Ω + 0.22 % Metcal
(100 to 199.99) kΩ 11 Ω + 0.23 %
(200 to 999.99) kΩ 8.6 Ω + 0.23 %
(1 to 9.999) MΩ 1.8 Ω + 0.35 %
(10 to 999.9) MΩ 2.9 Ω + 0.6 %
(1 to 10) GΩ 1.1 MΩ + 1.2 %
100 GΩ 3.5 GΩ

High Resistance (Insulation (0.35 to 99.99) GΩ 7 MΩ + 1.3 % Fluke 5322A


Resistance)3 – Source with (100 to 999.9) GΩ 2 GΩ + 2.4 %
R Multiplier (1 to 10) TΩ 31 GΩ + 3.5 %

Ground Bond Resistance – 1 mΩ 0.2 mΩ Fluke 5322A


Decade Source, Fixed 14 mΩ 0.7 mΩ
Points3 39 mΩ 1.7 mΩ
94 mΩ 1.8 mΩ
340 mΩ 3.5 mΩ
490 mΩ 3.5 mΩ
960 mΩ 7.9 mΩ
1.7 Ω 0.008 Ω
4.7 Ω 0.021 Ω
9Ω 0.036 Ω
17 Ω 0.039 Ω
47 Ω 0.24 Ω
90 Ω 0.40 Ω
170 Ω 0.80 Ω
470 Ω 2.0 Ω
900 Ω 4.0 Ω
1.7 kΩ 7.8 Ω

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 17 of 32


Parameter/Equipment Range CMC2 16 () Comments11

Leakage Current -
Generate3

Passive / Differential Mode (0.1 to 30) mA 2.6 μA + 0.44 %


Fluke 5322A, Metcal

Residual Current Device –

Trip Current (3 to 3000) mA 0.8 % Fluke 5322A, Metcal

Trip Time Range (10 to 5000) ms 0.29 ms + 0.029 %

AC/DC Multimeter3 – (4 to 10) V 0.009 V + 0.17 % Fluke 5322A


Voltage - DC (10 to 100) V 0.10 V + 0.20 %
(100 to 1000) V 0.75 V + 0.20 %
(1000 to 5000) V 6.8 V + 0.32 %

AC/DC Multimeter3 – (4 to 10) V 0.009 V + 0.17 % Fluke 5322A


Voltage - AC 50 Hz to 400 (10 to 100) V 0.10 V + 0.20 %
Hz (100 to 1000) V 0.75 V + 0.20 %
(1000 to 5000) V 7.7 V + 0.45 %

AC/DC High Voltage


Dividers –

DC (5000 to 10 000) V 16 V + 0.27 % Fluke 5322A

AC – (50 to 60) Hz (5000 to 7000) V 32 V + 0.56 %

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 18 of 32


Parameter/Equipment Range CMC2, 16 () Comments11

AC/DC Multimeter3 – (100 to 300) mA 0.24 mA + 0.12 % Fluke 5322A


Current – AC 50 Hz to 400 (0.3 to 3) A 2 mA + 0.12 %
Hz (3 to 20) A 23 mA + 0.24 %

AC/DC Multimeter3 – (100 to 300) mA 0.24 mA + 0.18 % Fluke 5322A


Current - DC (0.3 to 3) A 2 mA + 0.17 %
(3 to 20) A 23 mA + 0.30 %

AC Current3 (100 to 300) mA 0.33 mA + 0.25 % Fluke 5322A, Metcal


20 Hz to 400 Hz (0.3 to 3) A 2 mA + 0.23 %
(3 to 30) A 33 mA + 0.42 %

DC Current3 (100 to 300) mA 0.33 mA + 0.25 % Fluke 5322A, Metcal


(0.3 to 3) A 2 mA + 0.23 %
(3 to 30) A 33 mA + 0.42 %

AC Current – Hipot (30 to 300) μA 0.56 μA + 0.42 % Fluke 5322A, Metcal


Leakage Current (0.3 to 3) mA 4 μA + 0.29 %
Measurement3 (3 to 30) mA 39 μA + 0.29 %
20 Hz to 400 Hz (30 to 300) mA 0.39 mA + 0.29 %

DC Current – Hipot (30 to 300) μA 0.56 μA + 0.42 % Fluke 5322A, Metcal


Leakage Current (0.3 to 3) mA 4 μA + 0.29 %
Measurement3 (3 to 30) mA 39 μA + 0.29 %
(30 to 300) mA 0.39 mA + 0.29 %

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 19 of 32


Parameter/Equipment Range CMC2 () Comments11

Electrical Simulation
of RTDs3 –

Pt 50 Ω, Pt 100 Ω, (-190 to 830) °C 0.12 °C Process calibrator:


Pt 200 Ω, Pt 500 Ω EURAMET/cg-11;
Pt 1000 Ω AMS 2750

Electrical Simulation
of Thermocouples3 –

Type B (250 to 1800) °C 1.4 °C Process calibrator:


EURAMET/cg-11;
Type C (250 to 900) °C 0.31 °C AMS 2750
(>900 to 2250) °C 0.32 °C

Type E (-200 to 0) °C 0.20 °C


(>0 to 990) °C 0.25 °C

Type J (-200 to 0) °C 0.19 °C


(>0 to 1190) °C 0.20 °C

Type K (-200 to -100) °C 0.26 °C


(>-100 to 0) °C 0.20 °C
(>0 to 900) °C 0.21 °C
(>900 to 1360) °C 0.23 °C

Type N (-200 to 0) °C 0.21 °C


(>0 to 1240) °C 0.21 °C

Type S (-40 to 600) °C 0.77 °C


(>600 to 1730) °C 0.34 °C

Type T (-200 to -180) °C 0.41 °C


(>-180 to 0) °C 0.21 °C
(>0 to 390) °C 0.20 °C

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 20 of 32


V. Mechanical

Parameter/Equipment Range CMC2 () Comments11

Force3 –

Load Cell (Force ASTM E74;


Transducer) ISO 376

Compression & (0.001 to 1) kN 0.04 % of reading Dead weights


Tension (>1 to 10) kN 0.05 % of reading

(10 to 50) kN 0.057 % of reading Load cell standards


(>50 to 100) kN 0.088 % of reading

(100 to 500) kN 0.073 % of reading Load cell standards


Compression (>500 to 5000) kN 0.09 % of reading

Testing Machines ASTM E4; ISO 7500-


Force Push/Pull Gages 1; ISO 7500-2; BS EN
Dynamometers 12390-4 (Israeli
standard 26 part 4-1) 13

Compression & Up to 50 kN 0.052 % of reading Dead weights


Tension (50 to 100) kN 0.039 % of reading
(100 to 200) kN 0.063 % of reading
(200 to 500) kN 0.057 % of reading
(500 to 1000) kN 0.033 % of reading

(500 to 1000) kN 0.041 % of reading Load cell standards


Compression (1000 to 5000) kN 0.039 % of reading

Rate of Stress (0.05 to 2) MPa/s 0.07 MPa/s BS EN 12390-3;


load cell, stop watch

(0.5 to 12) MPa/s 0.3 MPa/s ASTM E2658;


Rate of Straining (0.05 to 0.8) mm/mm/min 0.02 mm/mm/min load cell, stop watch

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 21 of 32


Parameter/Equipment Range CMC2 () Comments11

Pressure Gages3– OIML/R 101;


Israeli standard 697;
Pneumatic – EA-10/17

Gage & Differential (-1250 to 1250) kPa 0.8 Pa Druck, LPE 9400
(-15 to 15) kPa 3 Pa Druck, DPI 610
(-100 to 100) kPa 0.14 kPa Druck, DPI 610

Absolute (13 to 1250) Pa 0.73 Pa Druck, LPE 940


(0.04 to 200) kPa 0.53 kPa Druck, DPI 104

Hydraulic & Pneumatic (0 to 7) MPa 0.4 kPa Druck, DPI 104


(>7 to 70) MPa 10 kPa Druck, DPI 104
(>70 to 200) MPa 32 kPa AEP Transducers
LAB DMM

Pressure Testers, Pressure


transducers, Pressure
Indicators –

Pneumatic – (-100 to 100) kPa 2 Pa Deadweight tester


YANTRIKA, REW
401HAA/1

(0 to 7) MPa 150 Pa Deadweight tester


YANTRIKA, REW
417HAA/1

Hydraulic (0 to 7) MPa 170 Pa Deadweight tester


(>7 to 140) MPa 1 kPa YANTRIKA, REW
309HAO/

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 22 of 32


Parameter/Equipment Range CMC2 () Comments11

Durometers Calibration – ASTM D 2240; ISO


868; DIN 53505; DIN
Indenter – Extension & ISO 7619-1;DIN ISO
Shape 48-4; ASTM D1415

Diameter Diameter of the base 4 µm (160 µin) Optical inspection


of the cone 0.79 mm (A, C) under magnification

Radius Tip radius


R 0.1 mm (B, D), 3 µm (120 µin)
R 1.19 mm (O, DO) 10 µm (390 µin)

Angle Cone angle


35º (A, C), 30º (B, D) 51" (0.00025 rad)

Extension 2.5 mm (A, B, C, D, O, 8 µm (320 µin) Load cell standards;


DO) dead weights

Spring Calibration Force (0.8 to 8.05) N - A, B, E, O 0.04 N


(4.4 to 44.45) N - C, D, DO 0.4 N

Scales & Balances3 Up to 20 mg 0.002 mg Mass standards: Class


(Includes Analytical (>20 to 100) mg 0.003 mg E1, E2, F1, F2, M1,
Balances) (>100 to 1000) mg 0.004 mg M2, M3, OIML R76-1,
(>1 to 10) g 0.009 mg OIML R 111-1
(>10 to 20) g 0.014 mg EURAMET/cg-18,
(>20 to 100) g 0.092 mg USP 41
(>100 to 200) g 0.169 mg
(>200 to 500) g 0.8 mg
(>500 to 1000) g 0.9 mg
(>1 to 10) kg 0.08 g
(>10 to 200) kg 1.3 g
(>200 to 1000) kg 15 g
(1000 to 2400) kg 23 g

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 23 of 32


Parameter/Equipment Range CMC2 () Comments11

Mass Pieces 1 mg & 2 mg 0.001 mg OIML R101


5 mg 0.002 mg OIML R 111-1
10 mg 0.004 mg 1 mg to 500 mg Grade
20 mg 0.007 mg E2.
50 mg & 100 mg 0.009 mg 1 g to 20 Grade F1
200 mg 0.011 mg Accuracy grades:
500 mg 0.013 mg M1, M2, M3
1g 0.000 04 g
2g 0.000 06 g
5g 0.0001 g
10 g 0.0003 g
20 g 0.0005 g
50 g 0.001 g
100 g 0.003 g
200 g 0.005 g
500 g, 1 kg, 10 kg, 20 kg 0.014 g
50 kg 0.11 g

Custom Weights/Fixtures3, 8

From (10 to 100) g 0.092 mg Precision scales6
Mass (>100 to 1000) g 0.9 mg OIML R 111-1
(>1 to 10) kg 0.08 g
(>10 to 30) kg 1.3 g

Up to 5 ml 0.001 ml Derived value


Volume (>5 to 20) ml 0.002 ml ASTM C 231
(>20 to 150) ml 0.003 ml
(>150 to 200) ml 0.004 ml
(>200 to 500) ml 0.10 ml
(>500 to 1000) ml 0.11 ml
(>1000 to 5000) ml 0.11 ml
(>5000 to 10 000) ml 0.20 ml
(>10 000 to 15 000) ml 0.21 ml
(>15 000 to 20 000) ml 0.22 ml
(>20 000 to 50 000) ml 3.1 ml

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 24 of 32


Parameter/Equipment Range CMC2 () Comments11

Torque –

Torque Wrenches & (0 to 0.25) N∙m 0.005 N∙m Torque calibrators,


Torque Drivers3 (0.25 to 0.7) N∙m 0.005 N∙m ISO 6789; ISO 6789-
(0.7 to 2.5) N∙m 0.007 N∙m 1; ISO 6789-2
(2.5 to 25) N∙m 0.047 N∙m
(25 to 250) N∙m 0.31 N∙m
Torque Calibrators (150 to 1500) N∙m 1.9 N∙m Torque meter

Up to 2.8 Nꞏm 0.002 N∙m Dead weights &


(>2.8 to 28) Nꞏm 0.0039 N∙m arms; BS 7882
(>28 to 135) Nꞏm 0.023 N∙m
(>135 to 500) Nꞏm 0.074 N∙m

Indirect Verification of HRA:


Rockwell Hardness Testers3 Low 0.24 HRA Hardness standards:
Medium 0.24 HRA ASTM E18;
High 0.18 HRA ISO 6508-2

HRBW:
Low 0.58 HRBW
Medium 0.39 HRBW
High 0.40 HRBW

HRC:
Low 0.29 HRC
Medium 0.24 HRC
High 0.40 HRC

HREW:
Low 0.19 HREW
Medium 0.28 HREW
High 0.18 HREW

HR15TW:
Low 0.28 HR15TW
Medium 0.25 HR15TW
High 0.31 HR15TW

Indirect Verification of (≥100 to 240) HV 3.3 HV Hardness standards:


Vickers Hardness Testers3 (>240 to ≤ 600) HV 6.1 HV ASTM E384, ASTM
(0.1, 0.5, 1 and& 10) kg >600 HV 8.1 HV E92; ISO 6507-2

Indirect Verification of (≥100 to 250) HK 4.7 HK Hardness standards:


Knoop Hardness Testers3 (>250 to ≤ 650) HK 5.6 HK ASTM E384; ISO
>650 HK 9.6 HK 4545-2

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 25 of 32


Parameter/Equipment Range CMC2 () Comments11

Indirect Verification of <125 HBW 1.9 HBW Hardness standards:


Brinell Hardness Testers3, (125 to 225) HBW 2.9 HBW ASTM E10; ISO
(10/3000, 10/1000, & >225 HBW 4.4 HBW 6506-2
2.5/187.5)

Volume – Fixed Points 1 µl 0.016 µl Gravimetric method


(Volumetric Apparatus, 2 µl 0.016 µl with analytical
Pipettes) 5 µl 0.016 µl balance:
10 µl 0.016 µl ISO 8655-1; ISO
20 µl 0.016 µl 8655-2; ISO 8655-3;
50 µl 0.017 µl ISO 8655-4;
100 µl 0.017 µl ISO 8655-5; ISO
200 µl 0.017 µl 8655-6
500 µl 0.017 µl
1 ml 0.018 µl
2 ml 0.021 µl
5 ml 0.40 µl
10 ml 0.49 µl
20 ml 0.66 µl
50 ml 1.9 µl
100 ml 2.4 µl

Sieves Standard Sieve 7 µm (280 µin) Measuring projector;


Designation caliper; ASTM E11;
(Customer Defined ISO 3310-1; ISO
Parameters) 3310-2;
ISO 3310-3; ISO
2395; ISO 565; ISO
9044-1999

Hammers3 –

Weighing Defined by Standard 0.0012 g ASTM D 1557;


ASTM D 698;
Height of Free Fall Defined by Standard 0.9 mm (0.035 in) ASTM D 2168;
ASTM D 1883
ASTM C805/C805M
(Israeli standard 26
part 7).
EN 12504-2

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 26 of 32


Parameter/Equipment Range CMC2 () Comments11

Impact Testing Devices3


(Direct Method Only) –

Energy (1 to 5.5) J 0.21 J ASTM D 256;


(>5.5 to 150) J 0.51 J ASTM E 23;
(>150 to 406) J 3.2 J AS 1146.3; EN 10045;
ISO 148; ISO 148-1;
Velocity (3 to 6) m/s 0.004 m/s ISO 148-2; BS 131;
BS 131-1; BS 131-5;
BS 131-6; BS 131-7;

VI. Optical Quantities

Parameter/Equipment Range CMC2 () Comments11

Optical – Gloss Meter & Up to 940 GU 1.0 GU BS-EN-ISO 2813


Gloss Tile – Measure and (940 to 1992) GU 5.1 GU ASTM D523
Measuring Equipment

VII. Thermodynamics

Parameter/Equipment Range CMC2 () Comments11

Thermocouple
Calibration –

Type E (190 to 0) °C 0.24 °C AMS 2750;


(>0 to 960) °C 0.24 °C ASTM E220

Type J (-190 to 0) °C 0.18 °C


(>0 to 960) °C 0.24 °C

Type K (-190 to 0) °C 0.19 °C


(>0 to 230) °C 0.18 °C
(>230 to 660) °C 0.22 °C
(>660 to 960) °C 0.28 °C
(>960 to 1250) °C 2.5 °C

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 27 of 32


Parameter/Equipment Range CMC2, 17 () Comments11

Thermocouple
Calibration – (cont)

Type N (-190 to 0) °C 0.28 °C AMS 2750;


(>0 to 230) °C 0.28 °C ASTM E220
(>230 to 660) °C 0.22 °C
(>660 to 960) °C 0.22 °C
(>960 to 1250) °C 2.5 °C

Type R (-40 to 0) °C 0.96 °C


(>0 to 600) °C 0.43 °C
(>600 to 960) °C 0.46 °C
(>960 to 1250) °C 2.6 °C

Type S (-40 to 0) °C 0.65 °C


(>0 to 600) °C 0.49 °C
(>600 to 960) °C 0.51 °C
(>960 to 1250) °C 2.6 °C

Type T (-190 to 0) °C 0.20 °C


(>0 to 230) °C 0.25 °C
(>230 to 420) °C 0.23 °C

RTD Probes Calibration (-190 to 0) °C 0.09 °C AMS 2750;


(>0 to 150) °C 0.09 °C ASTM E644;
(>150 to 230) °C 0.09 °C ASTM E1137; ASTM
(>230 to 660) °C 0.09 °C E1137/E1137M
(>660 to 960) °C 0.1 °C

Temperature Measuring SPRT, RTD standards:


Equipment –
ASTM E1;
Liquid in Glass (-80 to 0) °C 0.12 °C ASTM E77;
Thermometers (>0 to 100) °C 0.09 °C ISO 1770; ISO 1771
(>100 to 230) °C 0.09 °C
AMS 2750
Mechanical & (-190 to 0) °C 0.09 °C
Electrical Indicators (>0 to 100) °C 0.09 °C
with Probe(s) (>100 to 420) °C 0.09 °C
(>420 to 660) °C 0.09 °C

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 28 of 32


Parameter/Equipment Range CMC2, 17 () Comments11

Temperature – Measure PRTs & thermocouple


reference standards

Liquid Baths (-190 to -40) °C 0.09 °C


(>-40 to 0) °C 0.09 °C
(>0 to 150) °C 0.09 °C
Measurement &
Uniformity Surveys3 (-190 to 0) °C 0.39 °C uniformity surveys;
(Ovens, Furnaces, (>0 to 100) °C 0.17 °C AMS 2750;
Autoclaves & (>100 to 230) °C 0.30 °C ISO 17665-1;
Freezers) (>230 to 420) °C 0.35 °C ISO 17665-2;
(>420 to 660) °C 0.44 °C SI 1291 (Israeli
(>660 to 960) °C 0.54 °C standard)15
(>960 to 1250) °C 2.7 °C

Relative Humidity –

Measuring Equipment (10 to 20) % RH 0.68 % RH Humidity chamber


(>20 to 40) % RH 0.86 % RH
(>40 to 70) % RH 1.1 % RH
(>70 to 95) % RH 1.4 % RH

Measure3 (10 to 20) % RH 1.0 % RH Rotronic humidity


(>20 to 65) % RH 1.3 % RH indicator
(>65 to 90) % RH 1.4 % RH

Dewpoint –

Measuring Equipment (-40 to 95) °C 0.056 °C Chilled mirror


ASTM D4230, ASTM
Measure3 (-40 to 180) °C 0.2 °C E104, ASTM E546,
ASTM E576, MIL-I-
24144, MIL-M-24144

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 29 of 32


VIII. Time & Frequency

Parameter/Equipment Range CMC2, 4, 17 () Comments

Frequency – Sources (0.037 Hz to 10 MHz) 10-11 (24 h) Fluke 910R


Via GPS System
(10 MHz to 1.1 GHz) 5 x 10-9 (0.3 h) Via Ref. Locked to 910R
Keysight 53230A
MetCal

Frequency – Measure (0.1 Hz to 100 MHz) 4.8x10-9 (0.3h) Fluke 910R


Fluke 5522A
(100 MHz to 1.1 GHz) 4.8x10-10 (0.3h) System locked to 910R
Keysight 53230A

(0.1 Hz to 1.1 GHz) 1.4x10-5 (0.3h) With internal reference

Stopwatches & Timers3 1 s to 24 hr 0.09 s Stopwatch

Rotational Speed –
Measure3, 4 –
(15 to 60) RPM 0.18 RPM Optical tachometer
Optical Rotational (>60 to 3000) RPM 0.34 RPM (mode photo)
Speed (RPM) (>3000 to 24 000) RPM 4 RPM ASTM D4060
(>24000 to 48 000) RPM 30 RPM
(>48 000 to 90 000) 54 RPM
RPM

Mechanical Rotational (1.5 to 30) RPM 0.17 RPM Mechanical tachometer


Speed (RPM) (30 to 60) RPM 0.18 RPM (mode contact)
(>60 to 600) RPM 0.24 RPM
(>600 to 1000) RPM 0.63 RPM
(>1000 to 6000) RPM 2 RPM

Speed – Measure3, 4

Surface Speed (10 to 400) m/min 0.25 m/min Mechanical tachometer


(mode m/min)

Length Counter – (2 to 1000) m 0.5 m Mechanical tachometer;


Measure3 (mode m/min),
mechanical stopwatch

___________________________________________________________________________________________
1
This laboratory offers commercial calibration, dimensional testing, and field calibration services.

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 30 of 32


2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length of the device measured in meters.
In the statement of best uncertainty, R is the numerical value of the resolution of the device measured in
micrometers; LSVD represents the least significant valid displayed division of the device subject to
calibration; RPM is revolution per minute, ORM is oscillation per minute.
5
In the statement of CMC, R is the numerical value of the resolution of the angle measuring devices
measured in degrees or in minutes.
6
Calibrated by P.K. Labs
7
This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for
the types of dimensional tests listed above and is considered equivalent to that of a calibration.
8
Including weighing of distilled water (density 1 g/cm3) and conversion to the volume units.
9
Compliance according to the policy of the P.K.Labs
10
Compliance of the setting or limit gauges according to the policy of the P.K.Labs.
11
Calibration can be also performed to manufacturer or specific customer requirements.
12
This test is not equivalent to that of a calibration.
13
Calibration of the compression machines for testing of hardened concrete (Israeli standard 26 part 4-1-is
the Hebrew version)
14
Calibration of micrometers "Tri-O-Bor"(internal micrometer with three-point contact) according to test
instruction VDI/VDE/DGO 2618 as an expansion of DIN 863
15
Calibration of the vehicles for food transport in a controlled temperature (Israeli standard 1291 is the
Hebrew version)
16
The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured value
in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a
percent or fraction of the reading plus a fixed floor specification

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 31 of 32


17
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter
18
This scope meets A2LA’s P112 Flexible Scope Policy.

(A2LA Cert. No. 2806.01) Revised 10/05/2022 Page 32 of 32


Accredited Laboratory
A2LA has accredited

P.K. CALIBRATION & CONSULTING LABS LTD


d.b.a. PK LABS CALIBRATION & CONSULTING
Tefen Industrial Zone city, ISRAEL
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This laboratory also meets R205 – Specific
Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for a
defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 1ST day of November 2021.

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 2806.01
Valid to July 31, 2023

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.

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