Xilinx XC6SLX9 2TQG144C Datasheet
Xilinx XC6SLX9 2TQG144C Datasheet
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Notes:
1. Stresses beyond those listed under Absolute Maximum Ratings might cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those listed under Operating Conditions is not implied. Exposure to
Absolute Maximum Ratings conditions for extended periods of time might affect device reliability.
2. When programming eFUSE, VFS VCCAUX. Requires up to 40 mA current. For read mode, VFS can be between GND and 3.45 V.
3. I/O absolute maximum limit applied to DC and AC signals. Overshoot duration is the percentage of a data period that the I/O is stressed beyond
3.45V.
4. For I/O operation, refer to the Spartan-6 FPGA SelectIO Resources User Guide.
5. Maximum percent overshoot duration to meet 4.40V maximum.
6. For soldering guidelines and thermal considerations, see Spartan-6 FPGA Packaging and Pinout Specification.
Notes:
1. All voltages are relative to ground.
2. See Interface Performances for Memory Interfaces in Table 25. The standard VCCINT voltage range applies to designs not using an MCB, or to
devices that do not support MCB functionality including the LX4 device, the TQG144 and CPG196 packages, and the -3N speed grade.
3. Recommended maximum voltage droop for VCCAUX is 10 mV/ms.
4. During configuration, if VCCO_2 is 1.8V, then VCCAUX must be 2.5V.
5. The -1L devices require VCCAUX = 2.5V when using the LVDS_25, LVDS_33, BLVDS_25, LVPECL_25, RSDS_25, RSDS_33, PPDS_25,
and PPDS_33 I/O standards on inputs. LVPECL_33 is not supported in the -1L devices.
6. Configuration data is retained even if VCCO drops to 0V.
7. Includes VCCO of 1.2V, 1.5V, 1.8V, 2.5V, and 3.3V.
8. For PCI systems, the transmitter and receiver should have common supplies for VCCO.
9. Devices with a -1L speed grade do not support Xilinx PCI IP.
10. Do not exceed a total of 100 mA per bank.
11. VBATT is required to maintain the battery backed RAM (BBR) AES key when VCCAUX is not applied. Once VCCAUX is applied, VBATT can be
unconnected. When BBR is not used, Xilinx recommends connecting to VCCAUX or GND. However, VBATT can be unconnected.
Notes:
1. These specifications apply during programming of the eFUSE AES key. Programming is only supported through JTAG.The AES key is only supported
in the following devices: XC6SLX75, XC6SLX75T, XC6SLX100, XC6SLX100T, XC6SLX150, and XC6SLX150T.
2. When programming eFUSE, VFS must be less than or equal to VCCAUX. When not programming or when eFUSE is not used, Xilinx recommends
connecting VFS to GND. However, VFS can be between GND and 3.45 V.
3. An RFUSE resistor is required when programming the eFUSE AES key. When not programming or when eFUSE is not used, Xilinx recommends
connecting the RFUSE pin to VCCAUX or GND. However, RFUSE can be unconnected.
Notes:
1. Maximum value specified for worst case process at 25°C. XC6SLX75, XC6SLX75T, XC6SLX100, XC6SLX100T, XC6SLX150, and XC6SLX150T
only.
2. Refer to IBIS models for RDT variation and for values at VCCAUX = 2.5V. IBIS values for RDT are valid for all temperature ranges.
3. VCCO2 is not required for data retention. The minimum VCCO2 for power-on reset and configuration is 1.65V.
4. Termination resistance to a VCCO/2 level.
Quiescent Current
Typical values for quiescent supply current are specified at nominal voltage, 25°C junction temperatures (Tj). Quiescent
supply current is specified by speed grade for Spartan-6 devices. Xilinx recommends analyzing static power consumption
using the XPOWER™ Estimator (XPE) tool (download at http://www.xilinx.com/power) for conditions other than those
specified in Table 5.
Notes:
1. Typical values are specified at nominal voltage, 25°C junction temperatures (Tj). Industrial (I) grade devices have the same typical values as
commercial (C) grade devices at 25°C, but higher values at 100°C. Use the XPE tool to calculate 100°C values.
Nominal VCCINT is 1.20V; use the XPE tool to calculate 1.23V values for the nominal VCCINT of the extended MCB performance range.
2. Typical values are for blank configured devices with no output current loads, no active input pull-up resistors, all I/O pins are 3-state and floating.
3. If differential signaling is used, more accurate quiescent current estimates can be obtained by using the XPOWER Estimator (XPE) or XPOWER
Analyzer (XPA) tools.
Notes:
1. The minimum VCCO2 for power-on reset and configuration is 1.65V
2. Spartan-6 FPGAs require a certain amount of supply current during power-on to insure proper device initialization. The actual current consumed
depends on the power-on ramp rate of the power supply. Use the XPOWER Estimator (XPE) or XPOWER Analyzer (XPA) tools to estimate current
drain on these supplies. Spartan-6 devices do not have a required power-on sequence.
Notes:
1. VCCO range required when using I/O standard for an output. Also required for PCI33_3, LVCMOS18_JEDEC, LVCMOS15_JEDEC, and
LVCMOS12_JEDEC inputs, and for LVCMOS25 inputs when VCCAUX = 3.3V.
2. For PCI systems, the transmitter and receiver should have common supplies for VCCO.
Table 8: Recommended Operating Conditions for User I/Os Using Differential Signal Standards
VCCO for Drivers
I/O Standard
V, Min V, Nom V, Max
LVDS_33 3.0 3.3 3.45
LVDS_25 2.25 2.5 2.75
BLVDS_25 2.25 2.5 2.75
MINI_LVDS_33 3.0 3.3 3.45
MINI_LVDS_25 2.25 2.5 2.75
LVPECL_33(1) N/A–Inputs Only
LVPECL_25 N/A–Inputs Only
RSDS_33 3.0 3.3 3.45
RSDS_25 2.25 2.5 2.75
TMDS_33(1) 3.14 3.3 3.45
PPDS_33 3.0 3.3 3.45
PPDS_25 2.25 2.5 2.75
DISPLAY_PORT 2.3 2.5 2.7
DIFF_MOBILE_DDR 1.7 1.8 1.9
DIFF_HSTL_I 1.4 1.5 1.6
DIFF_HSTL_II 1.4 1.5 1.6
DIFF_HSTL_III 1.4 1.5 1.6
DIFF_HSTL_I_18 1.7 1.8 1.9
DIFF_HSTL_II_18 1.7 1.8 1.9
DIFF_HSTL_III_18 1.7 1.8 1.9
DIFF_SSTL3_I 3.0 3.3 3.45
DIFF_SSTL3_II 3.0 3.3 3.45
DIFF_SSTL2_I 2.3 2.5 2.7
DIFF_SSTL2_II 2.3 2.5 2.7
DIFF_SSTL18_I 1.7 1.8 1.9
DIFF_SSTL18_II 1.7 1.8 1.9
DIFF_SSTL15_II 1.425 1.5 1.575
Notes:
1. LVPECL_33 and TMDS_33 inputs require VCCAUX = 3.3V nominal.
In Table 9 and Table 10, values for VIL and VIH are recommended input voltages. Values for IOL and IOH are guaranteed over
the recommended operating conditions at the VOL and VOH test points. Only selected standards are tested. These are
chosen to ensure that all standards meet their specifications. The selected standards are tested at a minimum VCCO with the
respective VOL and VOH voltage levels shown. Other standards are sample tested.
Notes:
1. Tested according to relevant specifications.
2. Using drive strengths of 2, 4, 6, 8, 12, 16, or 24 mA.
3. Using drive strengths of 2, 4, 6, 8, 12, or 16 mA.
4. Using drive strengths of 2, 4, 6, 8, or 12 mA.
5. For more information, refer to the Spartan-6 FPGA SelectIO Resources User Guide.
Notes:
1. LVPECL_33 and TMDS_33 maximum VICM is the lower of V (maximum) or VCCAUX – (VID/2)
2. When VCCAUX = 3.3V, the DCD can be higher than 5% for VICM < 0.7V when using these I/O standards: LVDS_25, LVDS_33, BLVDS_25,
LVPECL_25, LVPECL_33, RSDS_25, RSDS_33, PPDS_25, and PPDS_33.
3. The -1L devices require VCCAUX = 2.5V when using the LVDS_25, LVDS_33, BLVDS_25, LVPECL_25, RSDS_25, RSDS_33, PPDS_25,
and PPDS_33 I/O standards on inputs. LVPECL_33 is not supported in the -1L devices.
Notes:
1. Stresses beyond those listed under Absolute Maximum Ratings might cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those listed under Operating Conditions is not implied. Exposure to
Absolute Maximum Ratings conditions for extended periods of time might affect device reliability.
Notes:
1. Each voltage listed requires the filter circuit described in Spartan-6 FPGA GTP Transceivers User Guide.
2. Voltages are specified for the temperature range of Tj = –40C to +100C.
3. The voltage level of MGTAVCCPLL must not exceed the voltage level of MGTAVCC +10mV. The voltage level of MGTAVCC must not exceed the
voltage level of MGTAVCCPLL.
Notes:
1. Typical values are specified at nominal voltage, 25°C, with a 2.5 Gb/s line rate, with a shared PLL use mode.
2. Values for currents of other transceiver configurations and conditions can be obtained by using the XPOWER Estimator (XPE) or XPOWER Analyzer
(XPA) tools.
Notes:
1. Device powered and unconfigured.
2. Currents for conditions other than values specified in this table can be obtained by using the XPOWER Estimator (XPE) or XPOWER Analyzer (XPA)
tools.
3. GTP transceiver quiescent supply current for an entire device can be calculated by multiplying the values in this table by the number of available GTP
transceivers.
4. Does not include power-up MGTAVTTRCAL supply current during device configuration.
5. Typical values are specified at nominal voltage, 25°C.
Notes:
1. The output swing and preemphasis levels are programmable using the attributes discussed in the Spartan-6 FPGA GTP Transceivers User Guide
and can result in values lower than reported in this table.
2. Other values can be used as appropriate to conform to specific protocols and standards.
+V P
Single-Ended
Voltage
N
0
ds162_01_112009
+V
0 Differential
Voltage
–V P–N
ds162_02_112009
Table 17 summarizes the DC specifications of the clock input of the GTP transceiver. Consult the Spartan-6 FPGA GTP
Transceivers User Guide for further details.
Table 19: GTP Transceiver Dynamic Reconfiguration Port (DRP) Switching Characteristics
Speed Grade
Symbol Description Units
-3 -3N -2 -1L
FGTPDRPCLK GTP transceiver DCLK (DRP clock) maximum frequency 125 125 100 N/A MHz
TRCLK
80%
20%
TFCLK
ds162_05_042109
Performance Characteristics
This section provides the performance characteristics of some common functions and designs implemented in
Spartan-6 devices. The numbers reported here are worst-case values; they have all been fully characterized. These values
are subject to the same guidelines as the Switching Characteristics, page 18.
Notes:
1. Refer to XAPP1064, Source-Synchronous Serialization and Deserialization (up to 1050 Mb/s) and UG381, Spartan-6 FPGA SelectIO
Resources User Guide.
2. Refer to UG388, Spartan-6 FPGA Memory Controller User Guide.
3. Extended Memory Controller block performance for DDR2 and DDR3 can be achieved using the extended MCB performance VCCINT range
from Table 2.
4. The -3N speed grade does not support a Memory Controller block.
Switching Characteristics
All values represented in this data sheet are based on these Since individual family members are produced at different
speed specifications: v1.17 for -3, -3N, and -2; and v1.06 for times, the migration from one category to another depends
-1L. Switching characteristics are specified on a per-speed- completely on the status of the fabrication process for each
grade basis and can be designated as Advance, device.
Preliminary, or Production. Each designation is defined as
The -1L speed grade refers to the lower-power Spartan-6
follows:
devices. The -3N speed grade refers to the Spartan-6
Advance devices that do not support MCB functionality.
These specifications are based on simulations only and are Table 26 correlates the current status of each Spartan-6
typically available soon after device design specifications device on a per speed grade basis.
are frozen. Although speed grades with this designation are
considered relatively stable and conservative, some under- Table 26: Spartan-6 Device Speed Grade Designations
reporting might still occur. Speed Grade Designations
Device
Preliminary Advance Preliminary Production
These specifications are released once enough production XC6SLX45T -3, -3N, -2
silicon of a particular device family member has been XC6SLX75 -1L -3, -3N, -2
characterized to provide full correlation between
XC6SLX75T -3, -3N, -2
specifications and devices over numerous production lots.
There is no under-reporting of delays, and customers XC6SLX100 -1L -3, -3N, -2
receive formal notification of any subsequent changes. XC6SLX100T -3, -3N, -2
Typically, the slowest speed grades transition to Production
XC6SLX150 -1L -3, -3N, -2
before faster speed grades.
XC6SLX150T -3, -3N, -2
All specifications are always representative of worst-case
supply voltage and junction temperature conditions. Notes:
1. The XC6SLX4 is not available in the -3N speed grade.
Table 27: Spartan-6 Device Production Software and Speed Specification Release(1)
Speed Grade Designations(2)
Device
-3(3) -3N -2(4) -1L
XC6SLX4 ISE 12.4 v1.15 N/A ISE 12.3 v1.12(5)
XC6SLX9 ISE 12.4 v1.15 ISE 12.4 v1.15 ISE 12.3 v1.12(5)
XC6SLX16 ISE 12.1 v1.08 ISE 12.2 v1.11(6) ISE 11.5 v1.06
XC6SLX25 ISE 12.2 v1.11(6)
XC6SLX25T ISE 12.2 v1.11(6) N/A
XC6SLX45 ISE 12.1 v1.08 ISE 12.2 v1.11(6) ISE 11.5 v1.07 ISE 13.1 v1.06
XC6SLX45T ISE 12.1 v1.08 ISE 12.2 v1.11(6) ISE 12.1 v1.08 N/A
XC6SLX75 ISE 12.2 v1.11(6)
XC6SLX75T ISE 12.2 v1.11(6) N/A
XC6SLX100 ISE 12.2 v1.11(6)
XC6SLX100T ISE 12.2 v1.11(6) N/A
XC6SLX150 ISE 12.2 v1.11(6)
XC6SLX150T ISE 12.2 v1.11(6) N/A
Notes:
1. Blank entries indicate a device and/or speed grade in advance or preliminary status.
2. As marked with an N/A, LXT devices are not available with a -1L speed grade; LX4 devices are not available with a -3N speed grade.
3. Improved -3 specifications reflected in this data sheet require ISE 12.4 software with v1.15 speed specification.
4. Improved -2 specifications reflected in this data sheet require ISE 12.4 software and the 12.4 Speed Files Patch which contains the v1.17 speed
specification available on the Xilinx Download Center.
5. ISE 12.3 software with v1.12 speed specification is available using ISE 12.3 software and the 12.3 Speed Files Patch available on the Xilinx Download
Center.
6. ISE 12.2 software with v1.11 speed specification is available using ISE 12.2 software and the 12.2 Speed Files Patch available on the Xilinx Download
Center.
Notes:
1. Devices with a -1L speed grade do not support Xilinx PCI IP.
Notes:
1. Input waveform switches between VL and VH.
2. Measurements are made at typical, minimum, and maximum VREF values. Reported delays reflect worst case of these measurements. VREF values
listed are typical.
3. Input voltage level from which measurement starts.
4. This is an input voltage reference that bears no relation to the VREF / VMEAS parameters found in IBIS models and/or noted in Figure 4.
5. The value given is the differential input voltage.
PCI (Peripheral Component Interface) PCI33_3, PCI66_3 (rising edge) 25 10 (2) 0.94 0
33 MHz and 66 MHz, 3.3V PCI33_3, PCI66_3 (falling edge) 25 10 (2) 2.03 3.3
HSTL (High-Speed Transceiver Logic), Class I HSTL_I 50 0 VREF 0.75
HSTL, Class II HSTL_II 25 0 VREF 0.75
HSTL, Class III HSTL_III 50 0 0.9 1.5
HSTL, Class I, 1.8V HSTL_I_18 50 0 VREF 0.9
HSTL, Class II, 1.8V HSTL_II_18 25 0 VREF 0.9
HSTL, Class III, 1.8V HSTL_III_18 50 0 1.1 1.8
SSTL (Stub Series Terminated Logic), Class I, 1.8V SSTL18_I 50 0 VREF 0.9
SSTL, Class II, 1.8V SSTL18_II 25 0 VREF 0.9
SSTL, Class I, 2.5V SSTL2_I 50 0 VREF 1.25
Notes:
1. CREF is the capacitance of the probe, nominally 0 pF.
2. Per PCI specifications.
3. The value given is the differential output voltage.
Notes:
1. SSO limits greater than the number of I/O per VCCO/GND pair (Table 32) indicate No Limit for the given I/O standard. They are provided in
this table to calculate limits when using multiple I/O standards in a bank.
2. Not available (N/A) indicates that the I/O standard is not available in the given bank.
3. When used with the MCB, these signals are exempt from SSO analysis due to the known activity of the MCB switching patterns. SSO
performance is validated for all MCB instances. MCB outputs can, in some cases, exceed the SSO limits.
Notes:
1. TOSDCK_T2/TOSCKD_T2 (T input setup/hold with respect to CLKDIV) are reported as TOSDCK_T/TOSCKD_T in TRACE report.
Notes:
1. Delay depends on IODELAY2 tap setting. See TRACE report for actual values.
2. Maximum delay = integer (number of taps/8) TTAP8 + TTAPn (where n equals the remainder). For minimum delay consult the TRACE setup
and hold report. Minimum delay is greater than 30% of the maximum delay. Tap delays can vary by device. See TRACE report for actual
values.
3. Spartan-6 -1L devices only support tap 0.
Notes:
1. TRCKO_DO includes TRCKO_DOA and TRCKO_DOPA as well as the B port equivalent timing parameters.
2. TRCKO_DO_REG includes TRCKO_DOA_REG and TRCKO_DOPA_REG as well as the B port equivalent timing parameters.
3. The ADDR setup and hold must be met when EN is asserted (even when WE is deasserted). Otherwise, block RAM data corruption is possible.
4. TRDCK_DI includes both A and B inputs as well as the parity inputs of A and B.
Notes:
1. A Yes signifies that the component is in the path. A No signifies that the component is being bypassed. N/A signifies not applicable because
no path exists.
2. Implemented in the post-adder by adding to zero.
Notes:
1. The minimum READ pulse width is 8 ns, the maximum READ pulse width is 1 µs.
2. Also applies to TCK when reading DNA through the boundary-scan port.
Notes:
1. Maximum frequency and setup/hold timing parameters are for 3.3V and 2.5V configuration voltages.
2. To support longer delays in configuration, use the design solutions described in the Spartan-6 FPGA Configuration User Guide.
3. BPI mode is not supported in:
• LX4, LX25, or LX25T devices
• LX9 devices in the TQG144 package
• LX9 or LX16 devices in the CPG196 package.
4. Only during configuration, the last edge is determined by a weak pull-up/pull-down resistor in the I/O.
Notes:
1. LXT devices are not available with a -1L speed grade.
2. Values for this parameter are available in the Clocking Wizard.
3. The PLL does not filter typical spread spectrum input clocks because they are usually far below the bandwidth filter frequencies.
4. Includes global clock buffer.
5. Calculated as FVCO/128 assuming output duty cycle is 50%.
6. When using CLK_FEEDBACK = CLKOUT0 with BUFIO2 feedback, the feedback frequency will be higher than the phase frequency detector
frequency. FPFDMAX = FCLKFB / CLKFBOUT_MULT
Notes:
1. DLL specifications apply when using any of the DLL outputs: CLK0, CLK90, CLK180, CLK270, CLK2X, CLK2X180, or CLKDV.
2. When operating independently of the DLL, the DFS supports lower CLKIN_FREQ_DLL frequencies. See Table 53.
3. The CLKIN_DIVIDE_BY_2 attribute increases the effective input frequency range. When set to TRUE, the input clock frequency is divided by two as
it enters the DCM. Input clock frequencies for the clock buffer being used can be increased up to the FMAX (see Table 47 and Table 48 for BUFG and
BUFIO2 limits). When used with CLK_FEEDBACK=2X, the input clock frequency matches the frequency for CLK2X, and is limited to
CLKOUT_FREQ_2X.
4. CLKIN_FREQ_DLL input jitter beyond these limits can cause the DCM to lose LOCK, indicated by the LOCKED output deasserting. The user must
then reset the DCM.
5. When using both DCMs in a CMT, both DCMs must be LOCKED.
Table 52: Switching Characteristics for the Delay-Locked Loop (DLL)(1) (Cont’d)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
LOCK_DLL(3) When using the DLL alone: The time
from deassertion at the DCM’s reset
input to the rising transition at its
LOCKED output. When the DCM is
locked, the CLKIN and CLKFB – 5 – 5 – 5 – 5 ms
signals are in phase.
5 MHz < CLKIN_FREQ_DLL
< 50 MHz.
When using the DLL alone: The time
from deassertion at the DCM’s reset
input to the rising transition at its
LOCKED output. When the DCM is – 0.60 – 0.60 – 0.60 – 0.60 ms
locked, the CLKIN and CLKFB
signals are in phase.
CLKIN_FREQ_DLL > 50 MHz
Delay Lines
DCM_DELAY_STEP(5) Finest delay resolution, averaged
10 40 10 40 10 40 10 40 ps
over all steps.
Notes:
1. The values in this table are based on the operating conditions described in Table 2 and Table 51.
2. Indicates the maximum amount of output jitter that the DCM adds to the jitter on the CLKIN input.
3. For optimal jitter tolerance and faster LOCK time, use the CLKIN_PERIOD attribute.
4. Some jitter and duty-cycle specifications include 1% of input clock period or 0.01 UI. For example, this data sheet specifies a maximum jitter of
±(1% of CLKIN period + 150 ps). Assuming that the CLKIN frequency is 100 MHz, the equivalent CLKIN period is 10 ns. Since 1% of 10 ns is 0.1 ns
or 100 ps, the maximum jitter is ±(100 ps + 150 ps) = ±250 ps.
5. A typical delay step size is 23 ps.
Table 53: Recommended Operating Conditions for the Digital Frequency Synthesizer (DFS)(1)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
Input Frequency Ranges(2)
CLKIN_FREQ_FX Frequency for the CLKIN input. Also
0.5 375(3) 0.5 375(3) 0.5 333(3) 0.5 200(3) MHz
described as FCLKIN.
Input Clock Jitter Tolerance(4)
CLKIN_CYC_JITT_FX_LF Cycle-to-cycle jitter at the CLKIN input,
based on CLKFX output frequency: – ±300 – ±300 – ±300 – ±300 ps
FCLKFX < 150 MHz.
CLKIN_CYC_JITT_FX_HF Cycle-to-cycle jitter at the CLKIN input,
based on CLKFX output frequency: – ±150 – ±150 – ±150 – ±150 ps
FCLKFX > 150 MHz.
CLKIN_PER_JITT_FX Period jitter at the CLKIN input. – ±1 – ±1 – ±1 – ±1 ns
Notes:
1. DFS specifications apply when using either of the DFS outputs (CLKFX or CLKFX180).
2. When using both DFS and DLL outputs on the same DCM, follow the more restrictive CLKIN_FREQ_DLL specifications in Table 51.
3. The CLKIN_DIVIDE_BY_2 attribute increases the effective input frequency range. When set to TRUE, the input clock frequency is divided by two as
it enters the DCM. Input clock frequencies for the clock buffer being used can be increased up to the FMAX (see Table 47 and Table 48 for BUFG and
BUFIO2 limits).
4. CLKIN input jitter beyond these limits can cause the DCM to lose LOCK.
Table 54: Switching Characteristics for the Digital Frequency Synthesizer (DFS) for DCM_SP(1)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
Output Frequency Ranges
Frequency for the CLKFX and
CLKOUT_FREQ_FX 5 375 5 375 5 333 5 200 MHz
CLKFX180 outputs
Output Clock Jitter(2)(3)
Period jitter at the CLKFX and
CLKFX180 outputs. When Use the Clocking Wizard ps
CLKIN < 20 MHz
CLKOUT_PER_JITT_FX
Period jitter at the CLKFX and
CLKFX180 outputs. When Typical = ±(1% of CLKFX period + 100) ps
CLKIN > 20 MHz
Duty Cycle(4)(5)
Duty cycle precision for the CLKFX
and CLKFX180 outputs including the
CLKOUT_DUTY_CYCLE_FX Maximum = ±(1% of CLKFX period + 350) ps
BUFGMUX and clock tree duty-cycle
distortion
Phase Alignment(5)
Phase offset between the DFS
CLKFX output and the DLL CLK0
CLKOUT_PHASE_FX – ±200 – ±200 – ±200 – ±250 ps
output when both the DFS and DLL
are used
Phase offset between the DFS
CLKFX180 output and the DLL CLK0
CLKOUT_PHASE_FX180 Maximum = ±(1% of CLKFX period + 200) ps
output when both the DFS and DLL
are used
LOCKED Time
When 5 MHz < FCLKIN < 50 MHz,
the time from deassertion at the
DCM’s reset input to the rising
transition at its LOCKED output. The
– 5 – 5 – 5 – 5 ms
DFS asserts LOCKED when the
CLKFX and CLKFX180 signals are
valid. When using both the DLL and
the DFS, use the longer locking time.
LOCK_FX(2)
When FCLKIN > 50 MHz, the time
from deassertion at the DCM’s reset
input to the rising transition at its
LOCKED output. The DFS asserts
– 0.45 – 0.45 – 0.45 – 0.60 ms
LOCKED when the CLKFX and
CLKFX180 signals are valid. When
using both the DLL and the DFS, use
the longer locking time.
Notes:
1. The values in this table are based on the operating conditions described in Table 2 and Table 53.
2. For optimal jitter tolerance and a faster LOCK time, use the CLKIN_PERIOD attribute.
3. Output jitter is characterized with no input jitter. Output jitter strongly depends on the environment, including the number of SSOs, the output drive
strength, CLB utilization, CLB switching activities, switching frequency, power supply, and PCB design. The actual maximum output jitter depends on
the system application.
4. The CLKFX, CLKFXDV, and CLKFX180 outputs have a duty cycle of approximately 50%.
5. Some duty cycle and alignment specifications include a percentage of the CLKFX output period. For example, this data sheet specifies a maximum
CLKFX jitter of ±(1% of CLKFX period + 200 ps). Assuming that the CLKFX output frequency is 100 MHz, the equivalent CLKFX period is 10 ns, and
1% of 10 ns is 0.1 ns or 100 ps. Accordingly, the maximum jitter is ±(100 ps + 200 ps) = ±300 ps.
Table 55: Switching Characteristics for the Digital Frequency Synthesizer DFS (DCM_CLKGEN)(1)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
Output Frequency Ranges (DCM_CLKGEN)
CLKOUT_FREQ_FX Frequency for the CLKFX and
5 375 5 375 5 333 5 200 MHz
CLKFX180 outputs
CLKOUT_FREQ_FXDV Frequency for the CLKFXDV
0.15625 187.5 0.15625 187.5 0.15625 166.5 0.15625 100 MHz
output
Output Clock Jitter(2)(3)
CLKOUT_PER_JITT_FX Period jitter at the CLKFX and
Typical = ±[0.2% of CLKFX period + 100] ps
CLKFX180 outputs.
CLKOUT_PER_JITT_FXDV Period jitter at the CLKFXDV
Typical = ±[0.2% of CLKFX period + 100] ps
output.
CLKFX period change in free
running oscillator mode at the
Maximum = ±3% of CLKFX period ps
same temperature.
FCLKFX > 50 MHz
CLKFX_FREEZE_VAR
CLKFX period change in free
running oscillator mode at the
Maximum = ±5% of CLKFX period ps
same temperature.
FCLKFX < 50 MHz
CLKFX_FREEZE_TEMP CLKFX period will change in
_SLOPE free_oscillator mode over
temperature. Add to
CLKFX_FREEZE_VAR to Maximum = 0.1 %/°C
determine total CLKFX period
change. Percentage change for
CLKFX period over 1°C.
Duty Cycle(4)(5)
CLKOUT_DUTY_CYCLE_ Duty cycle precision for the
FX CLKFX and CLKFX180 outputs,
Maximum = ±[1% of CLKFX period + 350] ps
including the BUFGMUX and
clock tree duty-cycle distortion
CLKOUT_DUTY_CYCLE_ Duty cycle precision for the
FXDV CLKFXDV outputs, including the
Maximum = ±[1% of CLKFX period + 350] ps
BUFGMUX and clock tree
duty-cycle distortion
Lock Time
LOCK_FX(2) The time from deassertion at the
DCM’s Reset input to the rising
transition at its LOCKED output.
The DFS asserts LOCKED when
the CLKFX, CLKFX180, and
CLKFXDV signals are valid. – 50 – 50 – 50 – 50 ms
Lock time requires
CLKFX_DIVIDE < FIN/(0.50
MHz)
when:
5 MHz < FCLKIN < 50 MHz
when:
– 5 – 5 – 5 – 5 ms
FCLKIN > 50 MHz
Table 55: Switching Characteristics for the Digital Frequency Synthesizer DFS (DCM_CLKGEN)(1) (Cont’d)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
Spread Spectrum
FCLKIN_FIXED_SPREAD_ Frequency of the CLKIN input for
SPECTRUM fixed spread spectrum
(SPREAD_SPECTRUM = 30 200 30 200 30 200 30 200 MHz
CENTER_LOW_SPREAD/
CENTER_HIGH_SPREAD)
TCENTER_LOW_SPREAD(6) Spread at the CLKFX output for 100
Typical = ------------------------------------------
fixed spread spectrum CLKFX_DIVIDE ps
(SPREAD_SPECTRUM = Maximum = 250
CENTER_LOW_SPREAD)
TCENTER_HIGH_SPREAD(6) Spread at the CLKFX output for 240
Typical = ------------------------------------------
fixed spread spectrum CLKFX_DIVIDE
ps
(SPREAD_SPECTRUM=
Maximum = 400
CENTER_HIGH_SPREAD)
FMOD_FIXED_SPREAD_ Average modulation frequency
SPECTRUM
(6) when using fixed spread
spectrum
Typical = FIN/1024 MHz
(SPREAD_SPECTRUM =
CENTER_LOW_SPREAD /
CENTER_HIGH_SPREAD)
Notes:
1. The values in this table are based on the operating conditions described in Table 2 and Table 53.
2. For optimal jitter tolerance and a faster LOCK time, use the CLKIN_PERIOD attribute.
3. Output jitter is characterized with no input jitter. Output jitter strongly depends on the environment, including the number of SSOs, the output drive
strength, CLB utilization, CLB switching activities, switching frequency, power supply, and PCB design. The actual maximum output jitter depends on
the system application.
4. The CLKFX, CLKFXDV, and CLKFX180 outputs have a duty cycle of approximately 50%.
5. Some duty-cycle and alignment specifications include a percentage of the CLKFX output period. For example, this data sheet specifies a maximum
CLKFX jitter of ±(1% of CLKFX period + 200 ps). Assuming that the CLKFX output frequency is 100 MHz, the equivalent CLKFX period is 10 ns, and
1% of 10 ns is 0.1 ns or 100 ps. Accordingly, the maximum jitter is ±(100 ps + 200 ps) = ±300 ps.
6. When using CENTER_LOW_SPREAD, CENTER_HIGH_SPREAD, the valid values for CLKFX_MULTIPLY are limited to 2 through 32, and the valid
values for CLKFX_DIVIDE are limited to 1 through 4.
Table 56: Recommended Operating Conditions for the Phase-Shift Clock in Variable Phase Mode (DCM_SP) or
Dynamic Frequency Synthesis (DCM_CLKGEN)
Speed Grade
Symbol Description -3 -3N -2 -1L Units
Min Max Min Max Min Max Min Max
Operating Frequency Ranges
PSCLK_FREQ Frequency for the PSCLK input. 1 167 1 167 1 167 1 100 MHz
Input Pulse Requirements
PSCLK_PULSE PSCLK pulse width as a 40 60 40 60 40 60 40 60 %
percentage of the PSCLK period.
Table 57: Switching Characteristics for the Phase-Shift Clock in Variable Phase Mode(1)
Symbol Description Amount of Phase Shift Units
Phase Shifting Range
When CLKIN < 60 MHz, the maximum allowed ±(INTEGER(10 x (TCLKIN – 3 ns))) steps
number of DCM_DELAY_STEP steps for a
given CLKIN clock period, where T = CLKIN
clock period in ns. When using
CLKIN_DIVIDE_BY_2 = TRUE, double the
clock-effective clock period.
MAX_STEPS(2)
When CLKIN 60 MHz, the maximum allowed ±(INTEGER(15 x (TCLKIN – 3 ns))) steps
number of DCM_DELAY_STEP steps for a
given CLKIN clock period, where T = CLKIN
clock period in ns. When using
CLKIN_DIVIDE_BY_2 = TRUE, double the
clock-effective clock period.
Minimum guaranteed delay for variable phase ±(MAX_STEPS x DCM_DELAY_STEP_MIN) ps
FINE_SHIFT_RANGE_MIN
shifting.
Maximum guaranteed delay for variable phase ±(MAX_STEPS x DCM_DELAY_STEP_MAX) ps
FINE_SHIFT_RANGE_MAX
shifting
Notes:
1. The values in this table are based on the operating conditions described in Table 51 and Table 56.
2. The maximum variable phase shift range, MAX_STEPS, is only valid when the DCM has no initial fixed-phase shifting, that is, the PHASE_SHIFT
attribute is set to 0.
3. The DCM_DELAY_STEP values are provided at the end of Table 52.
Notes:
1. This limit only applies to applications that use the DCM DLL outputs (CLK0, CLK90, CLK180, CLK270, CLK2X, CLK2X180, and CLKDV). The DCM
DFS outputs (CLKFX, CLKFXDV, CLKFX180) are unaffected.
Table 61: Global Clock Input to Output Delay Without DCM or PLL
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, without DCM or PLL
TICKOF Global Clock and OUTFF without DCM or PLL XC6SLX4 6.12 N/A 7.68 9.41 ns
XC6SLX9 6.12 6.51 7.68 9.41 ns
XC6SLX16 5.98 6.42 7.48 9.10 ns
XC6SLX25 6.20 6.69 7.84 9.44 ns
XC6SLX25T 6.20 6.69 7.84 N/A ns
XC6SLX45 6.37 6.88 8.10 9.61 ns
XC6SLX45T 6.37 6.88 8.10 N/A ns
XC6SLX75 6.39 6.99 8.16 10.08 ns
XC6SLX75T 6.39 6.99 8.16 N/A ns
XC6SLX100 6.59 7.18 8.41 10.31 ns
XC6SLX100T 6.59 7.18 8.41 N/A ns
XC6SLX150 6.98 7.68 8.80 10.62 ns
XC6SLX150T 6.98 7.68 8.80 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
Table 62: Global Clock Input to Output Delay With DCM in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with DCM in System-Synchronous Mode.
TICKOFDCM Global Clock and OUTFF with DCM XC6SLX4 4.23 N/A 6.11 6.60 ns
XC6SLX9 4.23 5.17 6.11 6.60 ns
XC6SLX16 4.28 4.57 5.34 6.36 ns
XC6SLX25 3.95 4.18 4.59 6.91 ns
XC6SLX25T 3.95 4.18 4.59 N/A ns
XC6SLX45 4.37 4.70 5.50 6.85 ns
XC6SLX45T 4.37 4.70 5.50 N/A ns
XC6SLX75 3.90 4.23 4.77 6.31 ns
XC6SLX75T 3.90 4.23 4.77 N/A ns
XC6SLX100 3.86 4.16 4.66 7.25 ns
XC6SLX100T 3.90 4.16 4.66 N/A ns
XC6SLX150 4.03 4.33 4.83 6.63 ns
XC6SLX150T 4.03 4.33 4.83 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. DCM output jitter is already included in the timing calculation.
Table 63: Global Clock Input to Output Delay With DCM in Source-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with DCM in Source-Synchronous Mode.
TICKOFDCM_0 Global Clock and OUTFF with DCM XC6SLX4 5.03 N/A 7.21 8.05 ns
XC6SLX9 5.03 6.13 7.21 8.05 ns
XC6SLX16 5.08 5.51 6.44 7.96 ns
XC6SLX25 4.81 5.13 5.69 7.94 ns
XC6SLX25T 4.81 5.13 5.69 N/A ns
XC6SLX45 5.26 5.69 6.63 7.92 ns
XC6SLX45T 5.26 5.69 6.63 N/A ns
XC6SLX75 4.77 5.18 5.88 7.95 ns
XC6SLX75T 4.77 5.18 5.88 N/A ns
XC6SLX100 4.72 5.11 5.76 8.59 ns
XC6SLX100T 4.76 5.11 5.76 N/A ns
XC6SLX150 4.90 5.30 5.93 7.93 ns
XC6SLX150T 4.90 5.30 5.93 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. DCM output jitter is already included in the timing calculation.
Table 64: Global Clock Input to Output Delay With PLL in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with PLL in System-Synchronous Mode.
TICKOFPLL Global Clock and OUTFF with PLL XC6SLX4 4.57 N/A 6.25 7.34 ns
XC6SLX9 4.57 5.25 6.25 7.34 ns
XC6SLX16 4.41 4.64 5.39 6.92 ns
XC6SLX25 4.03 4.32 4.91 7.64 ns
XC6SLX25T 4.03 4.32 4.91 N/A ns
XC6SLX45 4.63 4.96 5.75 7.36 ns
XC6SLX45T 4.63 4.96 5.75 N/A ns
XC6SLX75 4.01 4.30 4.88 7.15 ns
XC6SLX75T 4.01 4.30 4.88 N/A ns
XC6SLX100 4.02 4.33 4.90 7.37 ns
XC6SLX100T 4.06 4.33 4.90 N/A ns
XC6SLX150 3.65 3.98 4.58 6.94 ns
XC6SLX150T 3.65 3.98 4.58 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. PLL output jitter is included in the timing calculation.
Table 65: Global Clock Input to Output Delay With PLL in Source-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with PLL in Source-Synchronous Mode.
TICKOFPLL_0 Global Clock and OUTFF with PLL XC6SLX4 5.49 N/A 7.44 8.55 ns
XC6SLX9 5.49 6.29 7.44 8.55 ns
XC6SLX16 5.23 5.77 6.79 8.21 ns
XC6SLX25 5.00 5.35 6.10 8.54 ns
XC6SLX25T 5.00 5.35 6.10 N/A ns
XC6SLX45 5.59 6.03 7.02 8.39 ns
XC6SLX45T 5.59 6.03 7.02 N/A ns
XC6SLX75 4.96 5.41 6.22 8.32 ns
XC6SLX75T 4.96 5.41 6.22 N/A ns
XC6SLX100 4.97 5.42 6.21 9.08 ns
XC6SLX100T 5.01 5.42 6.21 N/A ns
XC6SLX150 4.59 5.06 5.86 8.13 ns
XC6SLX150T 4.59 5.06 5.86 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. PLL output jitter is included in the timing calculation.
Table 66: Global Clock Input to Output Delay With DCM and PLL in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with DCM in System-Synchronous Mode
and PLL in DCM2PLL Mode.
TICKOFDCM_PLL Global Clock and OUTFF with DCM and PLL XC6SLX4 4.78 N/A 6.32 7.09 ns
XC6SLX9 4.78 5.24 6.32 7.09 ns
XC6SLX16 4.70 5.12 5.94 6.63 ns
XC6SLX25 4.70 5.09 5.92 7.30 ns
XC6SLX25T 4.70 5.09 5.92 N/A ns
XC6SLX45 4.63 4.98 5.83 7.26 ns
XC6SLX45T 4.63 4.98 5.83 N/A ns
XC6SLX75 4.68 5.04 5.88 6.90 ns
XC6SLX75T 4.68 5.04 5.88 N/A ns
XC6SLX100 4.72 5.07 5.92 7.77 ns
XC6SLX100T 4.76 5.07 5.92 N/A ns
XC6SLX150 4.44 4.73 5.31 6.96 ns
XC6SLX150T 4.44 4.73 5.31 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. DCM and PLL output jitter are already included in the timing calculation.
Table 67: Global Clock Input to Output Delay With DCM and PLL in Source-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
LVCMOS25 Global Clock Input to Output Delay using Output Flip-Flop, 12mA, Fast Slew Rate, with DCM in Source-Synchronous Mode
and PLL in DCM2PLL Mode.
TICKOFDCM0_PLL Global Clock and OUTFF with DCM and PLL XC6SLX4 5.58 N/A 7.42 8.54 ns
XC6SLX9 5.58 6.19 7.42 8.54 ns
XC6SLX16 5.50 6.06 7.05 8.24 ns
XC6SLX25 5.57 6.04 7.02 8.33 ns
XC6SLX25T 5.57 6.04 7.02 N/A ns
XC6SLX45 5.53 5.97 6.96 8.32 ns
XC6SLX45T 5.53 5.97 6.96 N/A ns
XC6SLX75 5.55 6.00 6.99 8.54 ns
XC6SLX75T 5.55 6.00 6.99 N/A ns
XC6SLX100 5.58 6.03 7.02 9.11 ns
XC6SLX100T 5.62 6.03 7.02 N/A ns
XC6SLX150 5.32 5.70 6.41 8.26 ns
XC6SLX150T 5.32 5.70 6.41 N/A ns
Notes:
1. Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and where all accessible
IOB and CLB flip-flops are clocked by the global clock net.
2. DCM and PLL output jitter are already included in the timing calculation.
Table 68: Global Clock Setup and Hold Without DCM or PLL
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSFD/ TPHFD No Delay Global Clock and IFF(2) without DCM XC6SLX4 0.10/ N/A 0.10/ 0.07/ ns
or PLL 1.56 1.83 2.54
XC6SLX9 0.10/ 0.10/ 0.10/ 0.07/ ns
1.56 1.57 1.84 2.54
XC6SLX16 0.12/ 0.12/ 0.12/ 0.13/ ns
1.42 1.48 1.64 2.19
XC6SLX25 0.18/ 0.18/ 0.18/ 0.11/ ns
1.64 1.75 1.99 2.57
XC6SLX25T 0.18/ 0.18/ 0.18/ N/A ns
1.64 1.75 1.99
XC6SLX45 –0.08/ –0.08/ –0.08/ –0.17/ ns
1.80 1.95 2.27 2.74
XC6SLX45T –0.08/ –0.08/ –0.08/ N/A ns
1.88 1.95 2.27
XC6SLX75 0.13/ 0.13/ 0.13/ –0.12/ ns
1.97 2.06 2.27 3.20
XC6SLX75T 0.13/ 0.13/ 0.13/ N/A ns
1.81 2.06 2.27
XC6SLX100 –0.14/ –0.14/ –0.14/ –0.17/ ns
2.15 2.24 2.56 3.44
XC6SLX100T –0.14/ –0.14/ –0.14/ N/A ns
2.03 2.24 2.56
XC6SLX150 –0.24/ –0.24/ –0.24/ –0.60/ ns
2.42 2.74 2.95 3.75
XC6SLX150T –0.24/ –0.24/ –0.24/ N/A ns
2.55 2.74 2.95
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage.
2. IFF = Input Flip-Flop or Latch.
Table 69: Global Clock Setup and Hold With DCM in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSDCM/ TPHDCM No Delay Global Clock and IFF(2) with DCM in XC6SLX4 1.54/ N/A 1.75/ 2.84/ ns
System-Synchronous Mode 0.06 0.12 0.27
XC6SLX9 1.54/ 1.63/ 1.75/ 2.84/ ns
0.06 0.12 0.12 0.27
XC6SLX16 1.72/ 1.87/ 2.13/ 2.31/ ns
–0.18 –0.17 –0.17 0.26
XC6SLX25 1.70/ 1.78/ 2.00/ 2.88/ ns
–0.03 –0.02 –0.02 0.20
XC6SLX25T 1.79/ 1.79/ 2.00/ N/A ns
0.07 0.08 0.08
XC6SLX45 1.74/ 1.84/ 2.02/ 2.64/ ns
–0.03 –0.02 –0.02 0.52
XC6SLX45T 1.76/ 1.84/ 2.02/ N/A ns
–0.01 0.00 0.00
XC6SLX75 1.86/ 1.98/ 2.20/ 2.96/ ns
0.11 0.12 0.12 0.58
XC6SLX75T 1.89/ 1.98/ 2.20/ N/A ns
0.11 0.12 0.12
XC6SLX100 1.64/ 1.72/ 1.97/ 2.70/ ns
0.07 0.08 0.08 0.99
XC6SLX100T 1.69/ 1.72/ 1.97/ N/A ns
0.09 0.10 0.10
XC6SLX150 1.53/ 1.62/ 1.82/ 2.75/ ns
0.39 0.40 0.40 1.00
XC6SLX150T 1.53/ 1.62/ 1.82/ N/A ns
0.39 0.40 0.40
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. These measurements include DCM CLK0 jitter.
2. IFF = Input Flip-Flop or Latch
3. Use IBIS to determine any duty-cycle distortion incurred using various standards.
Table 70: Global Clock Setup and Hold With DCM in Source-Synchronous Mode
Speed
Symbol Description Device Grade Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSDCM0/ TPHDCM0 No Delay Global Clock and IFF(2) with DCM in XC6SLX4 0.71/ N/A 0.72/ 1.58/ ns
Source-Synchronous Mode 0.65 1.22 1.18
XC6SLX9 0.71/ 0.71/ 0.72/ 1.58/ ns
0.69 1.19 1.36 1.18
XC6SLX16 0.86/ 0.92/ 1.04/ 1.02/ ns
0.52 0.57 0.60 1.06
XC6SLX25 0.84/ 0.90/ 1.01/ 1.58/ ns
0.58 0.59 0.59 1.07
XC6SLX25T 0.94/ 0.94/ 1.01/ N/A ns
0.58 0.59 0.59
XC6SLX45 0.85/ 0.90/ 0.98/ 1.34/ ns
0.70 0.76 0.79 1.34
XC6SLX45T 0.87/ 0.90/ 0.98/ N/A ns
0.73 0.76 0.79
XC6SLX75 1.00/ 1.06/ 1.15/ 1.65/ ns
0.62 0.63 0.63 1.46
XC6SLX75T 1.03/ 1.06/ 1.15/ N/A ns
0.71 0.72 0.72
XC6SLX100 0.81/ 0.81/ 0.94/ 1.42/ ns
0.68 0.69 0.69 2.07
XC6SLX100T 0.86/ 0.86/ 0.94/ N/A ns
0.68 0.69 0.69
XC6SLX150 0.68/ 0.69/ 0.79/ 1.45/ ns
0.98 0.99 0.99 1.60
XC6SLX150T 0.68/ 0.69/ 0.79/ N/A ns
0.98 0.99 0.99
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. These measurements include DCM CLK0 jitter.
2. IFF = Input Flip-Flop or Latch
3. Use IBIS to determine any duty-cycle distortion incurred using various standards.
Table 71: Global Clock Setup and Hold With PLL in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSPLL/ TPHPLL No Delay Global Clock and IFF(2) with PLL in XC6SLX4 1.37/ N/A 1.52/ 2.07/ ns
System-Synchronous Mode 0.25 0.41 0.69
XC6SLX9 1.37/ 1.48/ 1.52/ 2.07/ ns
0.21 0.21 0.26 0.69
XC6SLX16 1.33/ 1.53/ 1.60/ 1.57/ ns
–0.03 –0.02 –0.02 0.48
XC6SLX25 1.65/ 1.71/ 1.91/ 2.44/ ns
0.28 0.28 0.28 0.76
XC6SLX25T 1.70/ 1.71/ 1.91/ N/A ns
0.28 0.28 0.28
XC6SLX45 1.55/ 1.64/ 1.75/ 2.02/ ns
0.18 0.18 0.18 0.90
XC6SLX45T 1.57/ 1.64/ 1.75/ N/A ns
0.18 0.18 0.18
XC6SLX75 1.77/ 1.89/ 2.13/ 2.46/ ns
0.21 0.21 0.21 0.53
XC6SLX75T 1.80/ 1.89/ 2.13/ N/A ns
0.21 0.21 0.21
XC6SLX100 1.44/ 1.52/ 1.70/ 1.78/ ns
0.32 0.32 0.32 0.86
XC6SLX100T 1.51/ 1.52/ 1.70/ N/A ns
0.32 0.32 0.32
XC6SLX150 1.39/ 1.48/ 1.67/ 1.94/ ns
0.49 0.49 0.49 0.94
XC6SLX150T 1.41/ 1.48/ 1.67/ N/A ns
0.49 0.49 0.49
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. These measurements include PLL CLKOUT0 jitter.
2. IFF = Input Flip-Flop or Latch
3. Use IBIS to determine any duty-cycle distortion incurred using various standards.
Table 72: Global Clock Setup and Hold With PLL in Source-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSPLL0/ TPHPLL0 No Delay Global Clock and IFF(2) with PLL in XC6SLX4 0.47/ N/A 0.47/ 1.15/ ns
Source-Synchronous Mode 1.08 1.60 1.68
XC6SLX9 0.47/ 0.47/ 0.47/ 1.15/ ns
1.08 1.35 1.60 1.68
XC6SLX16 0.37/ 0.37/ 0.51/ 0.57/ ns
0.75 0.82 0.94 1.31
XC6SLX25 0.67/ 0.67/ 0.69/ 1.86/ ns
1.06 1.06 1.06 1.67
XC6SLX25T 0.69/ 0.69/ 0.69/ N/A ns
1.06 1.06 1.06
XC6SLX45 0.57/ 0.65/ 0.65/ 1.02/ ns
1.05 1.10 1.18 1.65
XC6SLX45T 0.59/ 0.65/ 0.65/ N/A ns
1.06 1.10 1.18
XC6SLX75 0.86/ 0.87/ 0.90/ 1.34/ ns
1.04 1.04 1.04 1.55
XC6SLX75T 0.88/ 0.88/ 0.90/ N/A ns
1.04 1.04 1.04
XC6SLX100 0.53/ 0.54/ 0.55/ 0.89/ ns
1.13 1.13 1.13 2.39
XC6SLX100T 0.61/ 0.61/ 0.61/ N/A ns
1.13 1.13 1.13
XC6SLX150 0.50/ 0.51/ 0.52/ 1.02/ ns
1.31 1.31 1.31 1.72
XC6SLX150T 0.52/ 0.52/ 0.52/ N/A ns
1.31 1.31 1.31
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. These measurements include PLL CLKOUT0 jitter.
2. IFF = Input Flip-Flop or Latch
3. Use IBIS to determine any duty-cycle distortion incurred using various standards.
Table 73: Global Clock Setup and Hold With DCM and PLL in System-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Input Setup and Hold Time Relative to Global Clock Input Signal for LVCMOS25 Standard.(1)
TPSDCMPLL/ No Delay Global Clock and IFF(2) with DCM in XC6SLX4 1.16/ N/A 1.39/ 2.36/ ns
TPHDCMPLL System-Synchronous Mode and PLL in 0.49 0.49 0.59
DCM2PLL Mode.
XC6SLX9 1.16/ 1.37/ 1.39/ 2.36/ ns
0.44 0.44 0.44 0.59
XC6SLX16 1.44/ 1.49/ 1.62 2.06/ ns
–0.08 –0.04 –0.04 0.55
XC6SLX25 1.52/ 1.65/ 1.83 2.52/ ns
0.42 0.42 0.42 0.43
XC6SLX25T 1.69/ 1.69/ 1.83 N/A ns
0.42 0.42 0.42
XC6SLX45 1.54/ 1.59/ 1.75/ 2.48/ ns
0.39 0.39 0.39 0.76
XC6SLX45T 1.57/ 1.59/ 1.75/ N/A ns
0.39 0.39 0.39
XC6SLX75 1.72/ 1.80/ 1.99/ 2.60/ ns
0.41 0.41 0.41 0.75
XC6SLX75T 1.74/ 1.80/ 1.99/ N/A ns
0.41 0.41 0.41
XC6SLX100 1.34/ 1.46/ 1.64/ 2.12/ ns
0.51 0.51 0.51 0.90
XC6SLX100T 1.46/ 1.46/ 1.64/ N/A ns
0.51 0.51 0.51
XC6SLX150 1.30/ 1.40/ 1.55/ 2.57/ ns
0.60 0.60 0.60 0.97
XC6SLX150T 1.35/ 1.40/ 1.55/ N/A ns
0.60 0.60 0.60
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. These measurements include CMT jitter; DCM CLK0 driving PLL, PLL CLKOUT0
driving BUFG.
2. IFF = Input Flip-Flop or Latch
3. Use IBIS to determine any duty-cycle distortion incurred using various standards.
Table 74: Global Clock Setup and Hold With DCM and PLL in Source-Synchronous Mode
Speed Grade
Symbol Description Device Units
-3 -3N -2 -1L
Example Data Input Set-Up and Hold Times Relative to a Forwarded Clock Input Pin,(1) Using DCM, PLL, and Global Clock Buffer. For
situations where clock and data inputs conform to different standards, adjust the setup and hold values accordingly using the values
shown in IOB Switching Characteristics, page 20.
TPSDCMPLL_0/ No Delay Global Clock and IFF (2) with DCM in XC6SLX4 0.43/ N/A 0.43/ 1.10/ ns
TPHDCMPLL_0 Source-Synchronous Mode and PLL in 1.07 1.43 1.67
DCM2PLL Mode.
XC6SLX9 0.43/ 0.45/ 0.45/ 1.10/ ns
1.03 1.14 1.43 1.67
XC6SLX16 0.74/ 0.74/ 0.74/ 0.77/ ns
0.93 1.12 1.21 1.35
XC6SLX25 0.67/ 0.76/ 0.84/ 1.23/ ns
1.02 1.11 1.18 1.46
XC6SLX25T 0.84/ 0.84/ 0.84/ N/A ns
1.02 1.11 1.18
XC6SLX45 0.65/ 0.65/ 0.71/ 1.18/ ns
0.99 1.04 1.12 1.58
XC6SLX45T 0.67/ 0.67/ 0.71/ N/A ns
1.00 1.04 1.12
XC6SLX75 0.86/ 0.88/ 0.94/ 1.29 ns
1.01 1.06 1.14 1.67
XC6SLX75T 0.89/ 0.89/ 0.94/ N/A ns
1.03 1.06 1.14
XC6SLX100 0.50/ 0.56/ 0.61/ 0.84/ ns
1.10 1.10 1.17 2.24
XC6SLX100T 0.63/ 0.63/ 0.63/ N/A ns
1.10 1.10 1.17
XC6SLX150 0.45/ 0.47/ 0.52/ 1.27/ ns
1.28 1.28 1.28 1.56
XC6SLX150T 0.50/ 0.50/ 0.52/ N/A ns
1.28 1.28 1.28
Notes:
1. Setup and Hold times are measured over worst case conditions (process, voltage, temperature). Setup time is measured relative to the Global Clock
input signal using the slowest process, highest temperature, and lowest voltage. Hold time is measured relative to the Global Clock input signal using
the fastest process, lowest temperature, and highest voltage. The timing values were measured using the fine-phase adjustment feature of the DCM.
These measurements include CMT jitter; DCM CLK0 driving PLL, PLL CLKOUT0 driving BUFG. Package skew is not included in these
measurements.
2. IFF = Input Flip-Flop
Notes:
1. LXT devices are not available with a -1L speed grade. The LX4 is not available in -3N speed grade.
2. These parameters represent the worst-case duty cycle distortion observable at the pins of the device using LVDS output buffers. For cases where
other I/O standards are used, IBIS can be used to calculate any additional duty cycle distortion that might be caused by asymmetrical rise/fall times.
3. The TCKSKEW value represents the worst-case clock-tree skew observable between sequential I/O elements. Significantly less clock-tree skew exists
for I/O registers that are close to each other and fed by the same or adjacent clock-tree branches. Use the Xilinx FPGA Editor and Timing Analyzer
tools to evaluate clock skew specific to your application.
Notes:
1. LXT devices are not available with a -1L speed grade.
2. This parameter indicates the total sampling error of Spartan-6 FPGA DDR input registers, measured across voltage, temperature, and process. The
characterization methodology uses the DCM to capture the DDR input registers’ edges of operation. These measurements include:
- CLK0 DCM jitter
- DCM accuracy (phase offset)
- DCM phase shift resolution
These measurements do not include package or clock tree skew.
3. This parameter indicates the total sampling error of Spartan-6 FPGA DDR input registers, measured across voltage, temperature, and process. The
characterization methodology uses the BUFIO2 clock network and IODELAY2 to capture the DDR input registers’ edges of operation. These
measurements do not include package or clock tree skew.
Revision History
The following table shows the revision history for this document.
The following changes to this specification are addressed in the product change notice
XCN10024, MCB Performance and JTAG Revision Code for Spartan-6 LX16 and LX45 FPGAs.
In Table 2, revised the VCCINT to add the memory controller block extended performance
specifications. In Table 25, changed the standard specifications and added extended performance
specifications for the memory controller block and note 2. Added Note 4 and updated values in
Table 33.
06/24/10 1.6 Production release of XC6SLX45T (-2 and -3 speed grades), XC6SLX16 and XC6SLX45 (-3 speed
grade) devices which includes changes to Table 26 and Table 27 (ISE v12.1 software with speed
specification v1.08).
Added the -3N speed grade, which designates Spartan-6 devices that do not support MCB functionality
(specifications are identical to the -3 speed grade). This includes changes to Table 2 (note 2), Table 25
(note 4), and Switching Characteristics (Table 26).
Updated Simultaneously Switching Outputs discussion. Added -3 speed grade values for TTAP and
FMINCAL values in Table 38. In Table 39, updated TRPW (-2 and -3 speed grade) values and FTOG (-3
speed grade) values. In Table 47, updated TGIO (-2 and -3 speed grade) values. Updated -3 values in
spread spectrum section of Table 55.
07/16/10 1.7 Production release of specific devices listed in Table 26 and Table 27 using ISE v12.2 software with
speed specification v1.11. Added note 4 advising designers of the patch which contains v1.11. Also
updated the -1L speed specification to v1.04. Updated numerous -4 and -1L values. Added -4 TTAP
values and FMINCAL to Table 38. Revised TCINCK/TCKCIN in Table 39. In Table 40, revised TSHCKO. In
Table 41, revised TREG. Added new -1L values to Table 46. Added and updated values in Table 76.
07/26/10 1.8 Production release of XC6SLX25, XC6SLX25T, XC6SLX100 and XC6SLX100T in the specific speed
grades listed in Table 26 and Table 27 using ISE v12.2 software with speed specification v1.11. Added
note 7 to Table 2 and moved VFS and RFUSE to a new Table 3. Added IHS and Note 4 to Table 4. Added
note 1 to Table 28. Added and updated SSO limits per VCCO/GND pairs in Table 33. Added note 3 to
Table 46. In Table 52, removed -1L specifications for CLKOUT_PER_JITT_DV1/2 and revised
CLKIN_CLKFB_PHASE and CLKOUT_PHASE_DLL values. Updated note 3 in both Table 54 and
Table 55.
08/23/10 1.9 Updated values for FGTPRANGE1, FGTPRANGE2, and FGPLLMIN in Table 18. Revised -3 and -4 values in
Table 21. Removed the -1L speed grade readback support restriction and Note 3 in Table 46.
11/05/10 1.10 Production release of XC6SLX4 and XC6SLX9 in the specific speed grades listed in Table 26 and
Table 27 using ISE v12.3 software with speed specification v1.12 for the -2 speed grade available in
the 12.3 Speed Files Patch. Added Note 3 advising designers of the patch which contains v1.12.
In Table 2, added Note 4. In Table 4, added Note 2. In Table 10, added Notes 2 and 3. In Table 43,
added Note 2. In Table 46, updated symbol for TSMWCCK/TSMCCKW , changed -1L values for
TUSERCCLKH and TUSERCCLKL , and added and revised the modes for FMCCK and FSMCCK. In Table 51,
redefined and expanded description for CLKIN_FREQ_DLL and rewrote Note 3. Updated title of
Table 56. Also in Table 75, revised TDCD_CLK for XC6SLX150 and XC6SLX150T. Changed description
of TPSFD/ TPHFD in Table 68.
For the -1L speed grade, updated data sheet to ISE 12.3 software with speed specification v1.05 which
revised the values in the following tables: Table 25, Table 28, Table 34, Table 35, Table 36, Table 39
through Table 42, Table 47 through Table 54, Table 60 through Table 75, Table 77, and Table 78.
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