VDX 01
VDX 01
Introduction
Semiconductor material research and device testing often involve determining the
resistivity and Hall mobility of a sample. The resistivity of the semiconductor material is
often determined using a four-point probe technique. With a fourprobe, or Kelvin,
technique, two of the probes are used to source current and the other two probes are
used to measure voltage. Using four probes eliminates measurement errors due to the
probe resistance, the spreading resistance under each probe, and the contact
resistance between each metal probe and the semiconductor material. Because a high
impedance voltmeter draws little current, the voltage drops across the probe
resistance, spreading resistance, and contact resistance are very small. One common
Kelvin technique for determining the resistivity of a semiconductor material is the van
der Pauw (VDP) method. The van der Pauw method involves applying a current and
measuring voltage using four small contacts on the circumference of a flat, arbitrarily
shaped sample of uniform thickness. This method is particularly useful for measuring
very small samples because geometric spacing of the contacts is unimportant. Effects
due to a sample’s size, which is the approximate probe spacing, are irrelevant.
Description of Experimental Set-up
1. Probes Arrangement
Ge single crystal with four pure silver, spring type pressure
contacts is mounted on a sunmica coated bakelite strip.
Suitable connector is provided for connection connections
with the current source and hall voltage measuring devices.
2. Van der Pauw Set-up, VDP-01
The set-up, VDP-01 consists of two sub units to handle probe
current and hall voltage. While the probe current is generated
and measured by a constant current source (0-20mA) having
a resolution of 10mA, the hall voltage is measured by a high
input resistance millivoltmeter in the range 0-200mV having
a resolution of 100mV. The probe current and hall voltage are
both displayed on separate 3.5 digit LED panel meters.
Various combinations of Voltage and Current probe locations
used in Van der Pauw measurements can be conveniently
selected using bandswitch provided on the panel both for
Resistivity and Hall Effect measurements.
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