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IEEE STD C57.13.7-2018

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IEEE STD C57.13.7-2018

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eae ele le) Bais IEEE Standard for Current Transformers with Maximum Milliampere Secondary Current of 250 mA IEEE Power and Energy Society Sponsored by the Transformers Committee IEEE IEEE Std C57.13.7™-2018 3 Park Avenue New York, NY 10016-5997 USA IEEE Std €57.13.7-2018 IEEE Standard for Current Transformers with Maximum Milliampere Secondary Current of 250 mA ‘Sponsor Transformers Committee of the IEEE Power and Energy Society Approved 5 December 2018 IEEE-SA Standards Board Important Notices and Disclaimers Concerning IEEE Standards Documents IEEE documents are made available for use subject to important notices and legal disclaimers. These notices and disclaimers, or a reference to this page, appear in all standards and may be found under the heading ‘Important Notices and Disclaimers Concerning IEEE Standards Documents." 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Participants A the time this IEEE standard was completed, the PCS7.13.7 Working Group had the following membership Henry Alton, Chair Adnan Rashid, Vice Chair Viadimir Khatin Paul Millward Zohn Roman Jim MeBride Randolph Mullin ‘Thomas Sizemore Scott MeClosky Rudolph Ogajano Fikdy So Ross MeTaggart David Wallace ‘The following members of the individual balloting committee voted on this voted for approval, disapproval, or abstention. tandard. Balloters may have ALALAWazi John Lackey’ ‘Thomas Rozek Roy Alexander Chang-Yiu Lam Ryan Ryan Henry Alton Lee Matthews Daniel Saver Bary Beast William MeBride Barticn Sayouo Thomas Blackburn Mack Menally Nikunj Shab Arben Bu Ross McTaggart DDevki Sharma Flaridge Byron Daleep Mola ‘Suresh Shrimavle Paul Cardinal Daniel Mulkey Hiyeong Sim Stephen Conrad Randolph Mallikin \Vesclin Skondzic Gary Donner KR M.Nair Jerry Smith Sergio Flores Michael Nevrman David Tepen Marcel Fortin TW. Olsen Juan Thierry Prodi Friend Lorraine Paden Francois Trichon Jalal Goh Bansi Patol James Van De Ligt Edwin Goodwin Dhhis Patel Roger Verdolin| Randall Groves Alvaro Potillo John Verzis Wemer Hoel! TulianProfr Jane Verner Philip Hopkinson Famnoosh Rahmatian avid Wallace Richard Jackson Johannes Rickman John Wang. John John Charles Rogers Jennifer Yu Sheldon Kennedy Zoltan Roman Tian Yu Jim Kulehisky Xi Zhu When the IFFE-SA Standards Board approved this standard on S December 2018, it had the following ‘membership: Jean-Phillipe Faure, Chair Gary Hoffman, Nice Chair John D. Kulick, Past Chair Konstantinos Karachalios, Secretary Ted Burse Xiaohui Liu Robby Robson Guido Hierwz KevinLu Dorothy Stanley (Christel Hunter Daleep Moda Mehmet Ulema Joseph Koepfinger® Andrew Myles Phil Wennblom Thomas Kosty Paul Nikolich Philip Winston Hung Ling Ron Petersen Howard Wolfman Dong Liu Anete Reilly Singyi Zhou "Member Emeritas Introduction “This introduction isnot part of IEEE Std CS7.13.7-2018, IEEE Standard for Current Transformers with Meximam | Milliampere Secondary Current of 250 mA, ‘This standard was prepared by the Working Group on Milliampere Current Transformers (CTs) of the Instrument Transformer Subcommittee of the Transformers Committee ofthe IEEE Power and Energy Society “The purpose of this standard is not only to allow the evaluation, certification, and specification of milliampere CCTs similar to the present process available for $-A secondary output CTs under IEEE Std C57.13™.2016, since 80-mA and 100-mA CTs are now approved in Canada, but also to take into consideration certain applications in the use of the milliampere CTs that has the advantage of a much lower voltage drop in the secondary leads when the burden is located ata farther distance from where the installed ma CT is located, Also, forthe same voltage drop across the burden ofa milliampere CT, its power dissipation in the burden is ‘much less than that when using the 5-A CT. However, with a milliampere CT, care should be taken to minimize environmental interference due to the much lower secondary current as compared to that ofthe $-A CT, since itwould be more susceptible to noise/interference, etc. Contents 1, Overview LI Scope. 1.2 Purpose. 2. Normative references, 3. Definitions, acronyms, and abbreviations 3.1 Definitions. 3.2 Acronyms and abbreviations 4, Ratings: 5, Rated burden... 6, Accuracy cco 6.1 Assignment ofaccuracy class. 6.22 Basis for measurement accuracy classes, 6.3 Requirements for accuracy and accuracy of calibration systems 7. Calibration systems/methods Annex A (informative) Bibliography. oll nL I B IEEE Standard for Current Transformers with Maximum Milliampere Secondary Current of 250 mA 1. Overview ‘The scope of IEEE Std C57.13™! does not currently address the milliampere ran ‘This standard provides the evaluation, specification, certification and use of milliampere CTs, separate from the electricity measurement device, similar to the present process available for S-A secondary output CTs. ‘current transformer (CT). 1.4 Scope ‘This standard is intended to define the requirements for CTs with a maximum of secondary output of 250 mA. ‘These requirements of ratios, accuracy classes, burdens, and test methods supplement but are not subordinate to IEEE C57.13. These transformers are for both indoor and outdoor applications. 1.2 Purpose ‘The purpose of tis standard is to provide the performance requirements for electrical system and test inter- changeability for CTs with milliampere output 2. Normative references The following referenced documents are indispensable for the application of this dacument (i, they shall bbe understood and used, so each referenced document is cited in text and its relationship fo this docurnent is explained). For dated references, only the edition cited applies. For undated references, the latest edition ofthe referenced document (including any amendments or corrigend) applies. IEEE Std C37.13", IEEE Standard Requirements for Instrument Transformers.” NCSLZ540.3:2006, Requirements forthe Calibration of Measuring and Test Equipment.’ Tafrmaion ou vfreaces canbe fond in Clase? The IEEE snd or produ fferred on this cause are ademas of The Insite of letia and Fletonis Engineers Ine IEEE pubaton are aval rm Ths Ista of Eloereal and laconic Engines (a standards eo.) “Available in: shore IEEE sé 057.19,7-2018 IEEE Standard for Curent Transformers with Maximum Willampere Secondary Current of 250 mA 3. Definitions, acronyms, and abbreviations 3.1 Definitions ‘The requirements for metering are defined in 5.1 and 5.2 of IEEE Std C57.13™.2008 as applicable to CTs. In Canada, regulatory references are specifically made 80 mA and 100 mA and therefore require a specific category for each of them. The JEEE Standards Dictionary Ontine should be consulted for terms not defined inthis clause.’ 3.2 Acronyms and abbreviations eT current transformer DuT transformer under test RCF ratio correction factor TCP transformer correction factor TUR test uncertainty ratio 4. Ratings ‘Current ratings of 80-mA class measuring CTs shall be in accordance with the values in Table I Table 1—Current rating for 80-mA cl measuring CTs Primary ewrrent(A) | Secondary current (mA) Ratio 3 0 5:1 100 oO 125031 200 0 2500:1 400 = 500051 600 30) 750031 00 oO To 000 Current rating of 100+ \A class measuring CTs shall be in accordance with the values in Table 2. ‘Table 2—Current rating for 100-mA class measuring CTs Primary current (A) | Secondary current (mA) Ratio 5 100) 50:1 700 100) T0001 200 100 20001 400 100) 40001 00 100) 0001 800 100, 8000-1 5. Rated burden ‘Standard burdens for CTs with 80-mA and 100-mA rated secondary current re defined in Table 3 and Table 4 1 Standards Disionary Online i wala tp itonsy ies ong IEEE sw 057.19,7-2018 EEE Stancard for Current Transformers with Maximum Mikampere Secondary Curent of 250m Table 3—Standard burdens for 80-mA class measuring CTs ‘Characteristics for 60-112 80- mA secondary cur Characteristics burden Resistance | Inductance | Impedance an Power 2 (call) @ factor 176 2 20 ons 09 352 45 9 025 09 BID 1055 BS 7 075 09 195 176 226 195 125 09 ‘Table 4—Standard burdens for 100-mA class measuring CTs. ‘Characteristics for 60-Hz 100- Standard oem mA secondary current burden | Resistance | Inductance | Impedance a Power @ (ct) @) Factor 3 1 a 25 09) 225 2 3 025 09 OTS 7 3 075 09 m2 5 1s 125 09, Ifthe CT secondary winding is rated at other than 80 mA or 100 mA, the VA and power factor shall be the same as used in Table 3 and Table 4. VAVIsIs rounded to an integer shall derive the impedance. The burden designation shall be the letter “B” followed by the impedance value. For example, a90-mA secondary winding for a VA of 0.25 would have an impedance of 31 and a standard burden of B-31 as 0.25/0,09/0.09 = 30.86 which rounded to unity is 31 6. Accuracy 6.1 Assignment of accuracy class A measuring milliampere CT shall be given an accuracy class as specified in Table 5 for each standard burden, as specified in Table 3 and Table 4, up tothe maximum for which itis designed. Table 5—Accuracy classes and corresponding limits, of transformer correction factors for CTs Aecuracyelase | 10094 ratedeurrent™ | 10Yo,ated current ‘Worated current os (0.9985. 1.0015 0997. 1.008 03 (0.997-1.003 0.994-1.006 — 05, (0.994-1,006 0988-1012 = “These limits also shall be applicable at the maximum continuous current rating Factor. 6.2 Basis for measurement accuracy classes Accuracy class for a milliampere measuring CT is based on the requirement that the transformer correction factor (TCE) shall be within specified limits forthe following conditions: 2) 100% ofrated primary current or the corresponding continuous current factor IEEE SW.C57.13.72018 IEEE Standard for Curent Transformers wih Maximum ¥illampere Secondary Curent of 250 mA, 'b) 10%or5% of rated primary current ©) Power factor (lagging) of metered power load from 0.60 1.0 4) Burden ofa specific standard value ©) Normal service conditions 1) 100% of ated primary current or corresponding continuous current factor 8) AL5% or 10% of rated primary current, the permissible error is twice the error at 100% rated primary ‘current 1h) The relationships between the limits of the ratio correction factors (RCF) and the phase angle for the limiting values of the TCF specified in Table 5 are shown in the parallelograms in Figure 1, Figure 2, and the following equation: B= 2600x(RCF—TCF) where B- isthe phase angle in minutes 1.018 1.009 1.012. 1.006 1.006 1.003 : yeas i 0.994 0.997 ose ose | #1 i | | TY Seale: 1% = 001 ROF arin 0982 0.901 oki oe m7 0 09 © 2m ee ee ee ee a Legging Phase angle—minutes Leading —> Figure 1—Limits of 0.3 and 0.6 accuracy classes for me: IEEE sé 057.19,7-2018 IEEE Standard for Curent Transformers with Maximum Willampere Secondary Current of 250 mA 1.003 1.000 Ratio correction factor ose? gt | YY ‘Scale: 1% = 0.01 ROF 34.4 min toad 20 “10 0 10 20 — Lagging Phase angle ~ minutes Leading —> Figure 2—Limits of 0.15 accuracy class for measuring current transformers 6.3 Requirements for accuracy and accuracy of calibration systems The accuracy performance shall be in accordance with Table 5 ‘The accuracy ratings of all milliampere CTs shall he verified and determined using calibration techniques and ‘methods with an overall uncertainty, ie. atest uncertainty ratio (TUR) of 4:1. In other words, the tolerance of the milliampere CT specification being tested shall be equal to or greater than four times the combined ‘uncertainties ofall the measurement standards employed in the test as specified in NCSL Z540,3:2006, For ‘example, for milliampere CTs with accuracy ratings of 0.3 that have been designed for metering applications, the deviation from the marked values shall remain within 0.3% for ratio and 3 mrad(10.3 min) for phase angle. ‘Therefore, the overall uncertainty ofthe calibration system to verify the corresponding accuracy class shall be equal to, or less than, 0.075% for ratio and 0.75 mrad (2.6 min) for phase angle The calibration system used for accuracy tests shall be traceable tothe ST units through national/international standards maintained by a National Metrology Institute. Records of accuracy verification forthe calibration systems by an independent laboratory shall be regularly maintained. Traceability is a process by which the assigned value of a measurement is compared, directly or indirectly, through a series of unbroken chain comparisons to the value established by appropriate national/international standards all having. stated ‘uncertainty. 7. Calibration systems/methods In principle, any calibration system/method deseribed in 6.3 of IEEE Std C57. 13-2008 ean be used, including digital measurement method, provided it has documented evidence that it meets the accuracy and traceability requirements, In practice the most used ealibration methods, including commercial ealibration systems, are the comparison-null methods in which the eurrent transformer under test (DUT) is compared with a reference ccurrent ratio standard through a current null detector, which could be an impedance network or a magnetic circuit zero-flux detector. The small difference current between the output secondary currents ofthe current IEEE sé 057.19,7-2018 IEEE Standard for Curent Transformers with Maximum Willampere Secondary Current of 250 mA ratio standard and that of the DUT offer the lowest uncertainty in the measurement of the DUT ratio and phase angle errors. This means thatthe current ratio errors and the overall combined uncertainties of the reference ‘current ratio standard shall not only be known, but also shall meet the TUR requirements of at least four times less than the tolerance specifications of the DUT. The difference method with a current comparator (sce Moore [B2]") as the reference current ratio standard provides the lowest uncertainty. If standard CTs of comparable stability and accuracy were available, they would serve equally well and the same method would yield comparably low uncertainty. ‘Table | and Table 2 indicate that the majority of 80-mA and 100-mA elass measuring CTs have current ratios ‘of greater than 1000:1. In general, the lowest uncertainty achievable withthe comparison-null method is when ‘the current ratios of the reference current rato standard and the DUT are the same, Thus, for example, the 80- ‘mA class measuring CT with a primary current of 800 A and a secondary current of 80 mA, has a current ratio ‘of 10 000:1 and also requires a reference current ratio standard with a current ratio of 10 000:1. To design and construct a reference current ratio standard with such a high current ratio would practically be impossible, since it means that its secondary winding would have to be at least 10 000 turns. Attempts to utilize very hhigh current ratios in a reference current ratio standard merely by increasing the mumber of tums, either to accommodate large primary currents or milliampere-level secondary currents, incurs an increase in capacitive certors. The high capacitive errors would make it impossible to achieve low-current ratio errors. In practice, to have low and stable current ratio errors, the reference eurrent rato standards should have windings of no more than 1000 turns to limit its capacitive errors, For the reference current ratio standard with high current ratios to achieve acceptable low current ratio errors ‘with low overall uncertainties, the reference current ratio standard would have to consist of at least two reference current standards connected in series/cascade, For example, reference current ratio standard | witha current ratio of m:1, €-g.,200:1, in series connection with reference current ratio standard 2 with acurrent ratio of n:1, eg, $0:1, results in having a cascaded reference current ratio standard with an overall current ratio of ‘mn: equal to 10 0001 ‘The current null detector should also have sufficient sensitivity and resolution to be able to measure the difference of the secondary output currents of the reference current ratio standard and the corresponding DUT at 10% of rated current for accuracy classes 0.3 and 0.6, and at 5% of rated current for accuracy class 0.15, without degradation of its overall uncertainty of the measurements due to insufficient sensitivity and resolution, Figure 3 shows a calibration cireuit using a easeaded arrangement of two current comparators as a reference ccurrent ratio standard with an impedance network as a null detector, while Figure 4 shows a cascaded arrangement of two reference CTs as a reference current ratio standard with either a current comparator bridge circuit, ora digital sampling system, as a null detector. The maibers in brackets correspon thos ofthe bibliography in Annes A, IEEE sw 057.19,7-2018 EEE Stancard for Current Transformers with Maximum Miampere Secondary Curent of 250m M, 5 u Lh R D E N Ratio Error Set N Current Current Current ‘Comparator Comparator Comparator Ratio - m/t Ratio - n/t Ratio- mn/t Figure 3—Calibration circuit with cascaded arrangement of two current comparators as a reference current ratio standard with an impedance network as a null detector IEEE sé 057.19,7-2018 IEEE Standard for Curent Transformers with Maximum Willampere Secondary Current of 250 mA Choe CT Ni Ni [ze i : t j Bridge (e.g. Current Comparator Test Set) Digital Sampling System Figure 4—Calibration circuit with cascaded arrangement of two reference CTs as a reference current ratio standard with either a current comparator bridge circuit, or a digital ‘sampling system, as a null detector IEEE sé 057.19,7-2018 IEEE Standard for Curent Transformers with Maximum Willampere Secondary Current of 250 mA AnnexA (informative) Bibliography Bibliographical references are resources that provide additional or helpful material but do not need to be understood or used to implement this standard. Reference to these resources is made for informational use only [BI] IEEE Std C57.13.6™, IEEE Standard for High-Accuracy Instrument Transformers, [B2] Moore, W. J. M.and P.N. Milianic, The Current Comparator. London: Peter Peregrinus Ltd, 1988. EE STANDARDS ASSOCIATION IEEE Consensus WE BUILD IT. Connect with us on: [Ej] Facebook: https://wwwfacebook.com/ieeesa (©) wwitter: aiceesa EE) Linkedin: hitp://mmm.linkedin.com/groups/IEEESA-OfficialIEEE-Standards-Association-1791118 (©) teee-sa standards insight blog: http://standardsinsight.com [) Youtube: 1EEe-SA Channel IEEE standards.ieee.org Phone: +1 732 981 0060 Fax: +1 732 562 1571 © IEEE

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