User Manual

Contact us
TECHNICAL SUPPORT and AFTER SALES

[email protected]

ADDRESS
Miniparc du Verger – Bat. H
1 rue Terre Neuve
91940 Les Ulis
FRANCE

Tel: +33 (0)1 60 92 39 65

Fax: +33 (0)1 60 92 57 31

https://support.m2m-ndt.com
www.m2m-ndt.com

© Eddyfi Europe
1, rue de terre neuve, Bâtiment H, 91940 Les Ulis, FRANCE
Eddyfi Europe. M2M, Mantis, Capture, Enlight and their associated logos are trademarks or registered
trademarks of Eddyfi Technologies in France and/or other countries. Eddyfi Technologies
reserves the right to change product offerings and specifications without notice.
CAPTURE_user_manual_v3.0_US-A | 2019-03-20
 CAPTURE manual #3

Summary
INTRODUCTION .................................................................................................. 8
PART 1. CAPTURE GENERAL OVERVIEW ................................................. 10
1. HARDWARE OVERVIEW .......................................................................... 10
1.1 GEKKO overview ................................................................................. 10
1.2 MANTIS overview ................................................................................ 12
2. HOME PAGE .............................................................................................. 13
3. TOUCH SCREEN ....................................................................................... 14
3.1 Navigating the touch screen................................................................. 14
3.1.1 Top banner ................................................................................... 14
3.1.2 Backward/validation buttons ......................................................... 15
3.2 Touch screen tips ................................................................................. 16
3.2.1 Multiple-choice buttons ................................................................. 16
3.2.2 On-screen keyboard ..................................................................... 16
3.2.3 Invalid values ................................................................................ 17
4. GENERAL SETTINGS................................................................................ 18
4.1 System parameters .............................................................................. 19
4.2 UT preferences .................................................................................... 20
4.3 CAPTURE upgrade .............................................................................. 20
5. LAUNCH AN APPLICATION ..................................................................... 20
5.1 Select a Wizard .................................................................................... 21
5.1.1 The Wizards «Conventional UT» .................................................. 21
5.1.2 The Wizards « Beam forming phased array »............................... 21
5.1.3 The Wizards « Total focusing method (TFM) » ............................. 22
5.1.4 The Wizards « Adaptive total focusing method (ATFM)» .............. 23
5.1.5 The Wizards « Multi-groups techniques» ...................................... 23
5.2 Create an application file...................................................................... 24
5.3 Open an application file ....................................................................... 25
5.4 Application and inspection files management ...................................... 26
6. IMPORT/EXPORT ...................................................................................... 27
6.1 Import files ........................................................................................... 27
6.1.1 Import application or inspection files ............................................. 27
6.1.2 Import pictures .............................................................................. 29

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 CAPTURE manual #4

6.2 Export files ........................................................................................... 29

6.2.1 Export applications or inspections files ......................................... 29
6.2.2 Screenshot manager..................................................................... 30
6.2.3 Export and erase error reports ...................................................... 31
6.2.4 Application recovery ..................................................................... 32
PART 2. EQUIPMENT .................................................................................... 34
1. SPECIMEN ................................................................................................. 35
1.1 Geometry ............................................................................................. 36
1.1.1 Plates ............................................................................................ 36
1.1.2 Cylinders ....................................................................................... 36
1.1.3 Nozzle ........................................................................................... 37
1.1.4 Fillet weld ...................................................................................... 38
1.2 Weld ..................................................................................................... 39
1.2.1 Define a plate with/without weld .................................................... 40
1.2.2 Define a cylinder with/without weld ............................................... 41
1.2.3 Modify weld ................................................................................... 42
1.3 dxf image import .................................................................................. 43
1.3.1 Feature description ....................................................................... 43
1.3.2 dxf files management .................................................................... 44
1.3.3 Examples ...................................................................................... 45
1.3.3.1 Calibration blocks representation ........................................................45
1.3.3.2 Weld cap /taper ..................................................................................46
1.3.3.3 Slopes representation .........................................................................47
1.4 Material ................................................................................................ 49
1.4.1 Material library .............................................................................. 51
1.5 Specimen library .................................................................................. 52
1.5.1 Save a new specimen ................................................................... 52
1.5.2 Manage the specimen library ........................................................ 53
2. PROBE ....................................................................................................... 55
2.1 Configuration........................................................................................ 56
2.1.1 Probe definition ............................................................................. 56
2.1.2 Digitizer ......................................................................................... 56
2.1.3 Pulser............................................................................................ 56
2.2 Dicing / Geometry ................................................................................ 57
2.2.1 Pulse Echo configuration: ............................................................. 57
2.2.1.1 Linear array ........................................................................................58
2.2.1.2 Matrix array ........................................................................................58
2.2.1.3 Conventional probe ............................................................................61
2.2.2 Pair of TOFD probes ..................................................................... 62
2.2.3 Dual configuration ......................................................................... 63
2.2.3.1 Dual Linear Array................................................................................65
2.2.3.2 Matrix Array ........................................................................................66

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2.2.3.3 Dual Conventional probe ....................................................................68

2.3 Wedge.................................................................................................. 69
2.3.1 Angled wedge ............................................................................... 70
2.3.2 L0 wedge ...................................................................................... 70
2.3.3 Wedge for Dual transducers ......................................................... 71
2.3.4 Wedge velocity ............................................................................. 73
2.3.5 Wedge library................................................................................ 74
2.4 References........................................................................................... 74
2.4.1 Probe reference without wedge or with a flat wedge .................... 75
2.4.2 Phased-array probe reference with angled wedge ....................... 75
2.4.3 Conventional probe reference with angled wedge ........................ 77
2.4.4 TOFD references .......................................................................... 78
2.5 Multi-probe configuration...................................................................... 80
2.6 Probe library......................................................................................... 80
2.6.1 Save a new probe ......................................................................... 80
2.6.2 Manage the probe library .............................................................. 81
3. SCANNER .................................................................................................. 82
3.1 Scanner definition ................................................................................ 82
3.2 Scanner calibration wizard ................................................................... 83
3.3 Scanner library ..................................................................................... 84
PART 3. SETTINGS ....................................................................................... 86
1. PHASED ARRAY SETTINGS .................................................................... 86
1.1 Focal laws ............................................................................................ 87
1.1.1 Ray tracing and Scan Plan ........................................................... 88
1.1.2 Sectorial Scan (S-Scan)................................................................ 89
1.1.3 Linear Scan (E-Scan).................................................................... 91
1.1.4 Compound Scan (Compound S-Scan).......................................... 92
1.1.5 CIVA laws ..................................................................................... 93
1.1.6 Probe positioning .......................................................................... 94
1.1.7 Focusing parameters .................................................................... 96
1.1.8 Focusing with Matrix probe ........................................................... 99
1.1.9 3D views ..................................................................................... 100
1.2 Gate settings ...................................................................................... 101
1.3 Amplitude calibration .......................................................................... 104
1.3.1 TCG calibration (Basic TCG) ...................................................... 105
1.3.2 TCG calibration (Advanced TCG) ............................................... 108
1.3.3 DGS calibration ........................................................................... 113
2. TOFD SETTINGS ..................................................................................... 114
2.1 TOFD calibration ................................................................................ 114
2.1.1 Gate settings............................................................................... 115
2.1.2 TOFD calibration ......................................................................... 116

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 CAPTURE manual #6

2.2 Gates in TOFD ................................................................................... 119

2.3 Amplitude calibration settings in TOFD .............................................. 121
3. PULSE-ECHO SETTINGS ........................................................................ 121
3.1 Gate settings (Pulse Echo) ................................................................ 122
3.2 Amplitude calibration (Pulse Echo) .................................................... 123
4. TOTAL FOCUSING METHOD (TFM) SETTINGS .................................... 124
4.1 Basic principles of TFM ...................................................................... 124
4.2 Total Focusing Method settings in CAPTURE ................................... 125
4.3 Amplitude calibration .......................................................................... 129
4.3.1 Basic TCG calibration (TFM Mode) ............................................ 129
4.3.2 Advanced TCG calibration (TFM Mode) ..................................... 131
5. MULTI-SALVO SETUP............................................................................. 135
PART 4. CONFIGURATION ......................................................................... 138
1. MOTION .................................................................................................... 139
1.1 References......................................................................................... 139
1.2 Trajectory ........................................................................................... 141
1.3 1D trajectory: 1-axis scanner ............................................................. 141
1.4 2D trajectory: 1 axis scanner + increment .......................................... 142
1.5 2D trajectory – 2-axis scanner ........................................................... 145
1.6 2D trajectory – Rotating arm .............................................................. 146
1.7 2D trajectory – Nozzle inspection....................................................... 146
1.8 PRF – Pulse Repetition Frequency .................................................... 148
2. DISPLAY .................................................................................................. 150
2.1 Layout ................................................................................................ 150
2.2 Available views .................................................................................. 151
2.3 A-Scan view ....................................................................................... 152
2.4 Mechanical B-Scan view .................................................................... 153
2.5 E-Scan / S-Scan view ........................................................................ 153
2.6 C-Scan ............................................................................................... 154
2.7 D-Scan ............................................................................................... 154
2.8 Top view............................................................................................. 155
2.9 Side view............................................................................................ 155
2.10 Map X-Y / Map R- ......................................................................... 156
2.11 3-D view ......................................................................................... 156
PART 5. INSPECTION ................................................................................. 158
1. TOP BANNER SETUP ............................................................................. 158
1.1 UT parameters ................................................................................... 158
1.2 Indicator measurement ...................................................................... 159
2. VISUALIZATION OF ULTRASONIC DATA ............................................. 160

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3. INSPECTION MANAGEMENT ................................................................. 161

PART 6. DATA ANALYSIS .......................................................................... 166
1. LAYOUT EDITION .................................................................................... 166
2. INDICATORS ............................................................................................ 167
3. ANALYSIS BOXES .................................................................................. 167
3.1 Overview ............................................................................................ 167
3.2 Add an indication ............................................................................... 167
4. VIEW TOOLS ........................................................................................... 170
4.1 Toolbar buttons .................................................................................. 170
4.2 Axis colour description ....................................................................... 172
5. TOFD ANALYSIS ..................................................................................... 172
6. INSPECTION REPORT ............................................................................ 175
LIST OF ABBREVIATIONS ............................................................................. 177
LIST OF FIGURES........................................................................................... 178
LIST OF TABLES ............................................................................................ 185

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 CAPTURE manual #8

INTRODUCTION
The M2M GEKKO is the first portable phased-array system on the market able to drive matrix arrays
and use real-time Total Focusing Methods (TFM). In addition to standard Phased-array and
UT techniques, the GEKKO handles most advanced inspection methods, and benefits from
the latest CIVA features natively embedded. The rugged design and touchscreen make the
battery powered GEKKO ideal for field use.
The M2M MANTIS is completing the portable phased array system family.

The M2M CAPTURE software has been developed to drive both GEKKO and MANTIS for all levels of
operators. The step-by-step interface simplifies the use of menus and reduces the risk of
errors.

CAPTURE has been designed to be upgradable and to allow easy integration of new techniques.
Upgrades are the means to:

• Maintain compliance with International NDT Codes and Standards.

• Ensure compatibility with the latest UT inspection techniques. For example, to handle flexible
probes and other real-time adaptive techniques.
• Allow integration of new applications (Note: EDDYFY TECHNOLOGIES can tailor or develop
new applications on demand).

ABOUT THE CAPTURE USER MANUAL

The CAPTURE User Manual is a step-by-step guide to navigate through the unit from input and
inspection parameters through data acquisition and display.
At each step, the parameters that can be accessed are described and explained.
Recommendations, tips and warnings are marked with the following icons:

Tip, note and recommendation

Warning and disclaimer

This manual refers to the CAPTURE software version V3.0

Ref: CAPTURE_user_manual_v3.0_US-A
 GEKKO manual #9

PART 1.
Capture
General Overview

Réf: GEKKO_user_manual_v1.2_US-A
CAPTURE GENERAL OVERVIEW CAPTURE manual #10

PART 1. CAPTURE GENERAL OVERVIEW

1. Hardware overview

1.1 GEKKO overview

Figure 1: GEKKO connectors overview

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CAPTURE GENERAL OVERVIEW CAPTURE manual #11

Figure 2: GEKKO front-panel buttons

For more information about GEKKO connectors, front panel and hardware description, please refer to
GEKKO_TECHNICAL_DOCUMENT_AX available online at https://support.m2m-ndt.com/

Ref: CAPTURE_user_manual_v3.0_US-A
CAPTURE GENERAL OVERVIEW CAPTURE manual #12

1.2 MANTIS overview

Figure 3: MANTIS front-panel buttons

Figure 4: MANTIS connectors overview

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CAPTURE GENERAL OVERVIEW CAPTURE manual #13

2. Home page
Press the ON/OFF button to turn the system ON.

On/Off

The Home panel appears on the screen (Figure 5).

2 6
3
1
4 5

7 8

10

11 12

Figure 5: Home panel

1: Battery level / Time

2: Top banner (Part 1 Section 3.1.1)

3: User manager access
4: Error report export (Part 1 Section 6.2.3)
5: Screenshot manager (Part 1 Section 6.2.2)
6: General settings (Part 1 Section 4)

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CAPTURE GENERAL OVERVIEW CAPTURE manual #14

7: Wizards, Applications & Inspection files tab (Part 1 Section 5)

8: Resume / current selection information.
9: Apps & data files management
10: Hard disk capacity
11: Quit and turn off the unit or access to WINDOWS explorer
12: Begin the study

3. Touch screen
A few simple gestures - press, swipe, drag - are all you need to use the unit. The following icons are
used in the manual:

Press Swipe Drag

3.1 Navigating the touch screen

CAPTURE software follows a simple and intuitive colour code, which guides the operator and offers
an overview of the actions already completed and parameters that remain to be defined.

In general:
- orange colour is used to guide the operator to the next step.
- light grey colour is used to indicate the current step or the current parameter selection.
- dark grey is used to indicate the steps or parameters previously set.
- red colour is used to indicate an invalid numeric value.

3.1.1 Top banner

Figure 6: Navigation arrows

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CAPTURE GENERAL OVERVIEW CAPTURE manual #15

In all configuration files, navigation through the GUI is from left to right using the arrows located in the
top banner (Figure 6). The arrows accessibility depends on the context:

1: Previous step (dark grey).

2: Current step (light grey).
3: Next step to edit (orange).
4: Step not available (dull grey).

3.1.2 Backward/validation buttons

In sub-panels, modification of parameters is done using Edit button.

An Edit button highlighted in white means that the panel can be accessed and modified.
An Edit button highlighted in orange means that the sub-panel HAS TO be edited before moving to the
next step (Figure 7).

Figure 7: Edit button

The changes are activated by pressing the Next button in main panels and OK button in sub-panels. If
the Cancel button is pressed the parameters are reset to their previous values (Figure 8).

Figure 8: Backward/Forward buttons

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CAPTURE GENERAL OVERVIEW CAPTURE manual #16

3.2 Touch screen tips

CAPTURE GUI offers several editorial tools according to the operator and setup needs.

3.2.1 Multiple-choice buttons

Press the multiple-choice button to display the drop-down selection list (Figure 9), then press the
correct field to validate the selection.

Figure 9: Drop-down list

For the double-option buttons, the selected field is displayed in white text on a grey background
(Figure 10).

Figure 10: Double option button

3.2.2 On-screen keyboard

Press on any white field box to edit a text or a numeric value (Figure 11). Text or numbers can be
entered using the on-screen keyboard (Figure 12).

Figure 11: Editable blank box

Figure 12: On-screen keyboard

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CAPTURE GENERAL OVERVIEW CAPTURE manual #17

Use the on-screen keyboard settings to change the numeric value or text.

It is possible to use an external keyboard instead of the touchscreen one.

Plug it on the USB port.

Numbers can be set using either the on-screen keyboard or an embedded

digital scroll wheel (Figure 13), which can be activated by pressing
on the keyboard (Figure 12).
1: Swipe the scroll wheel up and down to increase or decrease the value.

2: Fine tuning can be achieved by tapping on the + and – buttons, after

selection of the appropriate step.

3: Press to return to the on-screen keyboard.

When the scroll wheel is active, press outside its tactile area to confirm the
modification and hide the wheel.
The “step”, “+” and “–“ buttons located on the front panel also allow to
adjust numerical values.
The real mechanical wheel can be used as well in the same manner. Just
click on it to validate the value setting.

Figure 13: Digital scroll wheel

3.2.3 Invalid values

In CAPTURE, each parameter has a validity range and inconsistency with other parameters is
checked. An invalid or inconsistent value is highlighted in red (Figure 14). As long as fields
highlighted in red are not edited, it is not possible to access to the next step.

Figure 14: Invalid value

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CAPTURE GENERAL OVERVIEW CAPTURE manual #18

4. General settings
From the Home panel, press to access to the General settings.
General settings panel provides access to the System parameters and UT preferences (Figure 15).

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CAPTURE GENERAL OVERVIEW CAPTURE manual #19

Figure 15: General settings

4.1 System parameters

1: Localization
▪ Language
The available languages in CAPTURE are Chinese (CH), German (DE), English (EN), Spanish (ES),
French (FR), Italian (IT), Japanese (JP), Portuguese (PT) and Russian (RU).

Please inform us if you notice translation missing or any translation errors.

▪ Date, time and time zone

Press to edit these parameters.

2: Screen
▪ Brightness
▪ Touchscreen
If the touch screen is not behaving correctly, the recommendation is to Calibrate then Linearize.
During the calibrating and linearization process, a blue cross will appear and flash. It is
recommended to use the stylus to precisely press on the crosses.

Touchscreen behaviour can be verified by using the Test assistant.

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CAPTURE GENERAL OVERVIEW CAPTURE manual #20

4.2 UT preferences

3: Units
▪ Length
Length measurements expressed inch or mm.
▪ Amplitude
Amplitude measurements expressed in % FSH or in dB.

4: A-Scan
▪ Representation
The A-Scan time base can be expressed in time-of-flight, sound path or true-depth.
▪ Signal

Use a RF signal, rectified signal or envelope mode.

5: Calibration TCG
▪ Reference level
Adjust the calibration reference level and the tolerance threshold in %.

4.3 CAPTURE upgrade

Press Upgrade (6) to install new releases of CAPTURE software when available. The upgrade file
Capture_Update_x.x.x.cap should be stored in the root (not in a sub-folder) of a USB flash
drive. When the USB drive is plugged, the detection of the upgrade is automatic and will be
done when confirming “Upgrade to version Vx.x”.

5. Launch an application
Several possibilities are offered to launch an application. The first one is to create a new application
from the Wizard panel. The second is to run an existing application from the Applications
panel. The third possibility is to open an inspection file from the Inspection files panel, which
contains all settings information. This will open the inspection in the Analysis panel, then end
the Analysis panel to run the same application or modify the settings.

Ref: CAPTURE_user_manual_v3.0_US-A
CAPTURE GENERAL OVERVIEW CAPTURE manual #21

5.1 Select a Wizard

The Wizard panel contains the generic file source of techniques from which one application can be
derived.
They present all single techniques available and offer some multi-group templates.

5.1.1 The Wizards «Conventional UT»

Pressing Conventional UT (Figure 16) highlights the 3 conventional techniques

• Dual element transducer: conventional transmitting and receiving separate element technique

• Single element transducer: single element pulse-echo technique

• Time of flight diffraction (TOFD): one pair of TOFD probe technique

Figure 16: Wizards “Conventional UT”

5.1.2 The Wizards « Beam forming phased array »

Pressing Beam forming phased array (Figure 17) highlights the different phased array techniques
available.

➢ Dual linear array: dual linear array probe (DLA) with sectorial and/or linear scan technique.

➢ Dual matrix array: dual matrix array probe (DMA) with skewed sector scans technique.

➢ Linear array: linear array probe with sectorial and/or linear scan technique.

➢ Matrix array: matrix array probe with skewed sector scans technique.

For more information about Dual probes, go to Part 2 Section 2.2.3

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CAPTURE GENERAL OVERVIEW CAPTURE manual #22

Figure 17: Wizards “Standard phased array”

5.1.3 The Wizards « Total focusing method (TFM) »

Pressing 3 – Total focusing method (TFM) (Figure 18) highlights the different TFM techniques.

➢ TFM Dual linear array: dual linear array probe (DLA) with TFM reconstruction.

➢ TFM Dual matrix array: dual matrix array probe (DMA) with skewed TFM possibility.

➢ TFM Linear array: linear array probe with TFM reconstruction.

➢ TFM Matrix array: matrix array probe with skewed TFM possibility.

For more information about TFM technique, go to PART 3 Section 4.1

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CAPTURE GENERAL OVERVIEW CAPTURE manual #23

Figure 18: Wizards “Total Focusing Method (TFM)”

5.1.4 The Wizards « Adaptive total focusing method (ATFM)»

Pressing Adaptive total focusing method (ATFM) highlights the template for ATFM Linear Array.
This module is optional and available only on GEKKO units.

5.1.5 The Wizards « Multi-groups techniques»

Pressing Multi-groups techniques (Figure 19) highlights the different combinations of technique
available.

• 1 PA + TOFD: one phased array probe and one pair of TOFD probes.

• 1 PA multi-salvos: one phased array probe combining electronic and sectorial scanning.

• 2 PA + Dual: two phased array probes and one dual element transducer.
• 2 PA + TOFD: two phased array probes and one pair of TOFD probes.

• 2 PA multi-salvos: two phased array probes, each one combining electronic and sectorial
scanning.

It is possible to change the probe configuration, to add or delete probes and to add or remove
salvos (groups) from any wizards except TFM.

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CAPTURE GENERAL OVERVIEW CAPTURE manual #24

Figure 19: Wizards “Multi-groups techniques”

5.2 Create an application file

To create a new application, select a technique or a combination of techniques in the Wizards list. The
right side of the panel shows a schematic of associated technique or combination.
When selected, the Start button of the bottom banner turns from light grey to orange.
Press Start to create the Application. Then it requires a folder location and application name to save
the new application (Figure 20).

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CAPTURE GENERAL OVERVIEW CAPTURE manual #25

Figure 20: Application creation pop-up

The default location is in the root of the Applications panel. Otherwise, select any existing application
folder or press to create a new folder as the application location.
Press the application name to rename the application. The default application name is the Wizard
name.
Press OK to switch to application setup screens.

Application files can be organised and edited from the application panel (Part 1 Section 5.4).

5.3 Open an application file

On first run, the Applications tab contains four single-technique applications located in the Tests
folder. All the new applications (generated from the Wizards, imported or edited – Part 1
Section 6) will be stored at this location.
To open an application file, select the application then press Start. If the application is located in an
application folder, press on the folder then select the application file (Figure 21).

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Figure 21: Open an application file

5.4 Application and inspection files management

In contrast to the Wizards, Applications and Inspection files can be organised, edited, imported…
Depending on the type of element selected (file, folder, or none), some editing buttons are
available (Figure 22).

Figure 22: Applications/Inspection files buttons

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CAPTURE GENERAL OVERVIEW CAPTURE manual #27

The available file management buttons – accessible in the Applications and the Inspection files
panels - are surrounded by an orange border in figure 20, and allow to:

Import file or folder

Export file or folder

Create a new folder

Delete file or folder

Rename file or folder

Cut a file

Paste a file

6. Import/Export
CAPTURE allows importation and exportation of pictures, applications, inspection files and inspection
reports. Importation and exportation procedures are described in the next two chapters.

6.1 Import files

6.1.1 Import application or inspection files

Application and inspection files can be imported from a USB flash drive. Select the Applications or
Inspection files panel then press to import related files (Figure 23).

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CAPTURE GENERAL OVERVIEW CAPTURE manual #28

Figure 23: Import files

If an application or an inspection file is selected, the button is not active. Press the
Applications or Inspections tab to deselect all or select a folder before importation.

When the pop-up window appears, select the USB flash drive in which the file or file folder is located
(Figure 24).

Figure 24: File-import pop-up

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CAPTURE GENERAL OVERVIEW CAPTURE manual #29

Navigate through the folders to select the file then press Import (Figure 25).

Figure 25: File selection

The file or file folder is now available in the CAPTURE home panel.

Some external hard drive with USB port requires some power to run properly. Its mays occur
that the unit odes not deliver enough current to access the hard drive.
Prefer USB memory stick or see the document Installation Guide for Connectivity
explaining how to connect the unit to a computer which is available here:
https://support.m2m-ndt.com/gekko/documentation.html

6.1.2 Import pictures

The CAPTURE GUI can be customised and dedicated to a specific inspection using a picture. This
feature is available from the Equipment panel, after pressing the pencil icon of the specimen,
probe or scanner picture (Figure 29 – 3), to associate a personalised image or photo to the
equipment.

6.2 Export files

6.2.1 Export applications or inspections files

To export applications or inspection files, select a file in the list. To export a set of applications or
inspections, select the associated folder then press (Figure 26) to open the exportation
pop-up.

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CAPTURE GENERAL OVERVIEW CAPTURE manual #30

Select the USB flash drive and navigate through the folders to select the appropriate location then
press Export.

Figure 26: Export files

6.2.2 Screenshot manager

At any time, press the Screen Copy ( ) button located on the unit front panel to perform a

screenshot. The screenshot manager is available from the Home page. (Figure 5 – 5) :
Once in the screenshot manager pop up window, click on the images to select them (ticking their box
in green) and use the buttons to export, delete and rename the selected screenshot(s).

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Figure 27: Screenshot manager

1: Access the pop up from the homepage with this icon

2: Available screenshots overview
3: Management buttons:

Press to export the screenshot selection to a USB flash drive

Press to delete screenshot selection

Press to rename the selected screenshot (available when only one screenshot is selected)

4: Select all the screenshots

5: Press OK to close the pop up

6.2.3 Export and erase error reports

Although each CAPTURE software update is rigorously tested before release, undetected issues may
slip through the net.
If a serious error occurs, a pop up will notice the user and the software will automatically generate an
error report. As for the screen copies, it is possible to export them to a USB flash drive.
To access the export pop up window, click on the dedicated button from the Home page (Figure 5 – 4)
During exportation, a file named like this one « [0xEA8F2E1C]_ErrorReport_2019-02-18-15-49-
02.capture_errlog» and containing any unexpected error reports is automatically created on
the USB flash drive and the error report files are erased from the unit.

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CAPTURE GENERAL OVERVIEW CAPTURE manual #32

Please send these files with a brief description of how the error occurred to

[email protected] so that we can fix it as quickly as possible.

6.2.4 Application recovery

It is possible to reload the last application file after a serious error.

When the unit switches on after the error, a pop up allows the user to recover the last application file
(Figure 28).

Figure 28: Application recovery

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CAPTURE GENERAL OVERVIEW CAPTURE manual #33

PART 2.
Equipment

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EQUIPMENT CAPTURE manual #34

PART 2. EQUIPMENT
The Equipment panel appears when any application is loaded. It is the first step of the application
definition.

Figure 29: General overview of the equipment panel

The Equipment panel shows the specimen, probe and scanner sub-panels (Figure 29). A summary of
the current equipment is presented. When all equipment is correctly set, press Next to go to
the Settings panel.
1: Top banner – Equipment step
2: Equipment sub-panels (Specimen / Probe / Scanner)
3: Edit the equipment picture
4: Summary of the current parameters
5: Load equipment (Part 2 Section 1.5)
6: Edit / check the settings

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EQUIPMENT CAPTURE manual #35

1. Specimen
Press Edit from the Specimen sub-panel (Figure 29 - 6) to define or check the specimen settings.
This section contains all the defining elements of the part to be inspected: part geometry, weld
preparation details and material properties (Figure 30).

Figure 30: Specimen definition

1: Top banner: not accessible in the specimen sub-panel

2: Summary of the current specimen (sketch and parameters)
3: Specimen tabs (geometry, weld and material)
4: Parameters to be set
5: Open specimen library / save specimen
6: Import 2D CAD image of specimen (See PART 2 Section 1.3)
7: Accept or cancel any changes made

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EQUIPMENT CAPTURE manual #36

1.1 Geometry

Press Geometry tab to access the geometrical properties of the specimen to be inspected.
Following geometries are available:
• Plate
• Cylinder
• Nozzle

• T/Y
There are some restrictions according to the unit versions.

1.1.1 Plates

The default geometry is a plate (Figure 30).

Plate parameters are length, width and thickness.

The essential parameter for plates is the thickness.

1.1.2 Cylinders

Press the shape drop-down menu to select Cylinder (Figure 31).

Figure 31: Cylindrical geometry

Cylinder parameters are length, external radius, thickness and angular sector.

The essential parameters for cylinders are the thickness and the external radius.

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EQUIPMENT CAPTURE manual #37

1.1.3 Nozzle

Press the shape drop-down menu to select Nozzle (Figure 32)

This allows the definition of the full nozzle geometry (except weld) and a real-time display of the cross-
section of the nozzle superimposed to sectorial data.

Figure 32: Nozzle selection

Nozzle geometry is available from the dedicated application template “PA – Nozzle inspection” and for
all wizard techniques except TFM, ATFM and TOFD.

Press the box “Nozzle configuration” to fully define the nozzle geometry.

Define the main cylinder geometry.

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EQUIPMENT CAPTURE manual #38

Define the secondary cylinder geometry.

Define the fillet geometry.

1.1.4 Fillet weld

Press the shape drop-down menu to select Fillet weld (Figure 33)

This allows the definition of the T or Y shape geometry, including weld preparation. Chamfer and back
strip settings are available from the Weld tab.

Figure 33: Fillet weld geometry

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EQUIPMENT CAPTURE manual #39

Figure 34: Chamfer and back strip setting

For analysis, it is then possible to display rebounds off the geometry to detect where the indications
are coming from. It also helps the user to determine if an echo is related to the specimen
geometry or to a real defect.
Filet weld geometry is available from the dedicated application template “PA – Fillet weld inspection”
and for all wizard techniques except TFM, ATFM and TOFD.

1.2 Weld

Figure 35: Cylinder with weld

Press Weld tab to access weld definition parameters (Figure 35).

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EQUIPMENT CAPTURE manual #40

1: Enable/disable the weld display.

2: Probe orientation (circumferential or longitudinal) for cylinders.
3: Parameters to be set.
4: Modify weld preparation geometry
5: Sketch of the current weld profile.

1.2.1 Define a plate with/without weld

Figure 36: Plate with weld

Figure 37: Plate without weld

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EQUIPMENT CAPTURE manual #41

1.2.2 Define a cylinder with/without weld

Figure 38: Cylinder with circumferential weld

Figure 39: Cylinder with longitudinal weld

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EQUIPMENT CAPTURE manual #42

Figure 40: Cylinder without weld

The presence and the orientation of the weld leads to a default orientation of the
transducer(s) on the component, always perpendicular to the axis of the weld.
When a cylindrical component without weld is selected, it is still possible to select the
orientation of the probe by selecting “Circum.” or “Longi.”

1.2.3 Modify weld

Press Modify Weld (Figure 35– 4) to open a graphical wizard that allows defining 25 bevel shape,
classified by: symmetry of the bevel (Figure 41) and bevel profile (Figure 42).

Figure 41: Symmetrical or asymmetrical weld

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EQUIPMENT CAPTURE manual #43

Figure 42: Weld bevel profile

Press the left or right arrows to select another weld profile. The sketch and parameters of each bevel
are updated when scrolling.
Adjust the weld profile parameters then press OK to confirm or press Cancel to quit the Modify Weld
menu.

1.3 dxf image import

This feature allows superimposing a CAD image of a specimen to the ultrasonic data. This feature is
particularly useful when one wants to analyse the origin of the various echoes and distinguish
between geometry echoes and echoes from defects.

In CAPTURE, dxf compatibility is limited to 2D dxf images containing segments and arcs. The feature
is also limited to an image import, which means it is still necessary to define a basic
specimen (plane or cylinder, with or without a weld) to position the probe and calculate the UT
paths.

1.3.1 Feature description

As mentioned in introduction, dxf file import is at this time limited to 2D image import and not true CAD
compatibility.

Please see below the main advantages and limitations of the dxf image feature:

▪ Automatic positioning of the dxf image on the specimen: from a corner of the specimen or from
the weld centreline if a weld is defined. It is up to the user to define correctly the origin of the
dxf file to match the origin of the geometry.

▪ Automatic adjustment along the length direction if plane geometry, auto-adjustment along the
angular sector in case of cylindrical geometry.

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EQUIPMENT CAPTURE manual #44

▪ Geometry shape, thickness, width and eventually radius (if cylindrical shape chosen) have to
be manually adjusted in order to match the dxf image profile.

▪ Probe positioning, delay-law computation and signal visualization are still dependant on the
specimen. So, it is not possible to visualize reflexion off the surfaces of the dxf image.

▪ dxf image appears in the 3D view and in the corrected B-scan views (S-Scan, E-Scan and T-
Scan)

▪ Both the dxf file and the geometry of the component appear in the various views. It is not
possible to remove the component defined as a specimen in CAPTURE.

1.3.2 dxf files management

dxf image import is available from the Specimen panel, in the Geometry tab (Figure 30– 6).

Press to import a dxf file. When the pop-up window appears, select the USB flash drive in which
the file or file folder is located (Figure 43).

Figure 43: Import dxf file

Select the dxf file(s) then press Import.

You can import several dxf files and superimpose them on your specimen profile

Press to delete dxf file. When the pop-up window appears, select the dxf file(s) then press OK.

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EQUIPMENT CAPTURE manual #45

Figure 44: Delete dxf file

1.3.3 Examples

1.3.3.1 Calibration blocks representation

Block ASTM E2491

Figure 45: After dxf import

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EQUIPMENT CAPTURE manual #46

Figure 46: dxf image with sectorial scan and focal laws

The S-Scan, E-Scan and TFM are all static images meaning that they are displayed for a fixed
position of the dxf file. These views don’t change even if an encoder is attached to the probe.
If one wants to see the data move along the dxf file, the trajectory must be defined along the
inspection plane. In the Configuration/Motion/Reference panel the Orientation of the probe
must be set to 0 and in the Trajectory panel the main axis must be along X. It is now possible
to see the ultrasonic data dynamically in a 3D view of the component.

1.3.3.2 Weld cap /taper

The Figure 47 shows the Focal laws panel after the dxf import of a tapered weld with a weld bead. The
thickness of the component was modified to be equal to the thickness entered in the dxf file.
As explained earlier, both the component and the dxf files are represented at the same time so
we see the front and backwall surfaces of the plane component defined in CAPTURE and the
dxf file.

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EQUIPMENT CAPTURE manual #47

Figure 47: Specimen panel after dxf import and without adjusting

With the dxf image, an operator will be able to analyse properly echoes coming from defects located
along the tapered bottom surface and not confuse them for defects inside the weld.

1.3.3.3 Slopes representation

To use a block dxf image as the stainless steel block in Figure 48, one needs to adjust the thickness
and the width of the specimen.

Figure 48: Picture of a stainless-steel block

One can see that the echoes are superimposed with the SDH and the backwall of the dxf file
(Figure 49).

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EQUIPMENT CAPTURE manual #48

Figure 49: 3D view of the stainless-steel block in CAPTURE

If the thickness of the specimen does not match the dxf import, some tools and calculations
can’t be used. For example, the rebound tool (in the 3D view and in analysis), the
PCS calibration and the half-skip or the one skip mode in TFM depend on the
thichness defined in the Specimen panel.

Rebounds are not considered on the dxf drawing.

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EQUIPMENT CAPTURE manual #49

1.4 Material

Press the Material tab to define the material and the wave velocities in the material (Figure 50).

Figure 50: Material

1: Velocity calibration assistant.

2: Parameters to be set.
3: Load material.
4: Save material.

Press Velocity calibration (Figure 50 – 1) to open the velocity measurement assistant in the
specimen (Figure 51).
This wizard provides step-by-step calibration instructions to measure the speed of sound in a given
material from a block of known thickness and geometry.

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EQUIPMENT CAPTURE manual #50

5
4

8
7
6

Figure 51: Velocity calibration

1: UT parameters
Set the delay, range and gain to visualize the backwall echoes on the A-scan. Adjust the gain so that
the strongest echo is not saturated and has an amplitude equal to 80% FSH.

2: Instructions
Follow the instructions to achieve the measurement.
If it is not possible to capture two echoes in the measurement gate when the amplitude of the
strongest echo is displayed at 80% FSH, it is possible to make two sequential measurements.
For the first echo, set the amplitude to 80% FSH and position the calibration gate on this echo
only; then press Measure. For the second measurement, increase the gain so that the next
echo is visible. Position the calibration gate on this echo and press Measure again.

3: Current settings summary

By default, the parameters used are based on the current probe defined in the Probe sub-panel (Part

2 Section 2). It is also possible to load another probe from the library database with the
button located below.

4: Parameters to edit

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EQUIPMENT CAPTURE manual #51

Load a transducer from the library or reset the default probe. By default, with a Phased Array probe
the software will use an aperture of 16 elements without any focal law applied, i.e. the natural
refracted angle will be generated. Select the type of wave (longitudinal or transverse) to
consider for the calibration, set the distance d1 and d2 in mm according to the instruction
sketch.

5: A-scan view with gates to adjust

A-scan tools are accessible from the left bottom arrow of the view. See Part 6 Section 2.3 for details.
The gate threshold and position can be adjusted using the touchscreen (by pressing on the
gate then swiping in the vertical or horizontal direction).

6: 80% button.
Use this button will adjust automatically the gain to get the echo in the gate at 80% FSH. This button is
not active if the signal in the gate is saturated.

7: Press Measure to make the measurement or press Reset to start over.

8: Accept or Cancel the modifications.

1.4.1 Material library

Once the material name or velocities are updated, press to record a new material in the library
(Figure 50 - 4).

Press to open the material library (Figure 50 - 3). Swipe the list and select a material then press
OK (Figure 52). Material can be removed by pressing .

Figure 52: Materials list

Materials library is common to all applications.

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EQUIPMENT CAPTURE manual #52

1.5 Specimen library

1.5.1 Save a new specimen

Once a new specimen has been defined, press to record it in the specimen library (Figure 53).

Figure 53: Save the specimen

Name the specimen and select the destination folder then press OK (Figure 54)

Figure 54: Name the specimen

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EQUIPMENT CAPTURE manual #53

By default, no specimen folder is present. They can be created from the specimen library
(Part 2 Section 1.5.2)

1.5.2 Manage the specimen library

In the specimen panel, press (Figure 55) to open the specimen library (Figure 56).

Figure 55: Open the specimen library

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EQUIPMENT CAPTURE manual #54

Figure 56: Specimen library

1: Specimen list.
2: Summary of the selected specimen.
3: Delete the specimen.
4: Create a new folder.
5: Cut / paste specimen.
6: Select a specimen then press OK to load it.
Organize the specimen library by creating specific folders then moving each specimen file in the
dedicated folder (use the cut and paste buttons to move them).

Open directly the specimen library by pressing from the Equipment panel (Figure 29– 5).

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EQUIPMENT CAPTURE manual #55

2. Probe
Once the specimen has been defined or loaded from the library, press Edit on the probe subpanel to
check or modify the probe details. (Figure 57).

Figure 57: Edit probe

This section contains all the elements related to the probe definition and the UT setup for the pulser
and the signal processing (Figure 58).

Figure 58: Probe definition

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EQUIPMENT CAPTURE manual #56

1: Top banner: not accessible in the Probe sub-panel.

2: Probe tabs (Configuration, Dicing/Geometry, Wedge and Reference).
3: Probe assistants.
4: Summary of the current probe (sketch and parameters).
5: Parameters to be set.
6: Multi-probe management – Part 2 Section 2.5.
7: Open probe library / save probe.
8: Accept or cancel modifications.

2.1 Configuration

Configuration tab allows defining the probe configuration and to set the pulser and signal processing
parameters (Figure 58).

2.1.1 Probe definition

1. Frequency in MHz
- For phased-array: minimum frequency = 0.4MHz; maximum frequency = 20MHz.
- for conventional probes: minimum frequency = 0.4MHz; maximum frequency= 25MHz.
2. Transmit/receive configuration: Pulse-echo, Dual (PART 2 Section 2.2.3) or TOFD.

2.1.2 Digitizer

1. Enable or disable filtering: bandpass filters are adjustable

2. Sampling frequency: adjustable from 10 to 100 MHz
3. Averaging: adjustable from 1 (no averaging) to 32. Define the number of A-Scans used to
display one A-Scan on the screen.

For multiple probes, the Sampling frequency and Averaging are global values and are applied
to all the probes similarly.

2.1.3 Pulser

Transmission voltage:
- for phased-array:
minimum voltage = 24V (12V for Gekko Rev C);

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EQUIPMENT CAPTURE manual #57

maximum voltage = 120V (100V for Gekko Rev C);

- for conventional probes:
minimum voltage =24V (12V for Gekko Rev C);
maximum voltage = 200V;
Pulse width:
it is set automatically using the probe frequency to half the period (optimal theoretical pulse width).
It is possible to set manually the pulse width or reset the default value by pressing Init.

Battery life is affected by the voltage selected; lower voltages will extend the battery life.

For phased arrays, this panel provides an amplitude balancing assistant to ensure that all elements
provide the same output. This wizard is also available in the Probe dicing tab and is described
in the next section.

2.2 Dicing / Geometry

Press the Dicing tab (Figure 59) to set the probe footprint and element parameters.
For conventional probes, the tab is named Geometry (Figure 64).

2.2.1 Pulse Echo configuration:

Figure 59: Dicing

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EQUIPMENT CAPTURE manual #58

1: Amplitude balancing assistant for PA probes.

2: Footprint setup (linear or matrix array, circular or rectangular probe).
3: Probe definition (parameters updated according to the dicing selected).
4: Probe view (view updated according to the dicing/wedge selected).

2.2.1.1 Linear array

Select Linear footprint to define a linear phased-array probe (Figure 59). Parameters to be set for
linear PA probes are:

• Number of elements of the probe: from 2 to 64 or 128 according to the unit.

• 1st channel: define the channel number of the system connected to the 1st element of the
linear array.

• Elevation (e): passive aperture of the element.

• Pitch (p): distance between the centres of two adjacent elements.

• Gap (g): space between two adjacent elements.

• Length: total length of the linear array, automatically calculated from the number of elements,
the pitch and the gap.

2.2.1.2 Matrix array

Select Matrix footprint to define a rectangular matrix array probe (Figure 60).

Figure 60: Matrix probe

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EQUIPMENT CAPTURE manual #59

Parameters for matrix arrays are defined in 2 dimensions, relative to the array length and width:
• Number of elements: from 2 to 32 or 64 according to the unit.
• Pitch (p): distance between the centres of two adjacent elements.
• Gap (g): space between two adjacent elements.
The total number of elements (lines x columns) cannot exceed 64 or 128 according to the unit

Matrix probe numbering assistant

For matrix arrays, a numbering assistant is available from Dicing tab.

Press the button Numbering (Figure 60) to open the assistant (Figure 61).

Figure 61 : Matrix probe numbering

Three buttons are available (horizontal or vertical symmetry, row-column inversion) to allow the
definition of any standard matrix array numbering system. A sketch showing the two-scale axis
and the top-left element highlighted eases probe definition.

Amplitude balancing assistant

For linear or matrix arrays, an amplitude balancing assistant is available from the Configuration or
Dicing tab.
Press Amplitude balancing (Figure 59– 1) to open the PA probes balancing wizard (Figure 62).

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EQUIPMENT CAPTURE manual #60

Figure 62: Amplitude balancing

The amplitude balancing screen (Figure 62) displays two data windows on the left-hand side of the
screen. The top-left window displays the B-scan made with elementary A-scans. The top-right
window displays the A-scan, with a signal encompassed within the white gate, corresponding
to the vertical line in the echo-dynamic window (lower left).
Instructions can be displayed by pressing Instructions. (Figure 63)

Figure 63: Amplitude balancing instructions

To balance the probe elements, perform the following steps:

1. Position the PA probe on a flat block (or a flat wedge) with no defect underneath the probe.
2. Adjust the delay, range and gain to visualize a backwall echo.

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EQUIPMENT CAPTURE manual #61

3. Position the gate on the backwall echo in the A-Scan view to visualize a response for all
channels in the echo-dynamic view.
4. Press 80% to set the response of the higher amplitude signal to 80% FSH.
5. Press Balance or press Reset to start over.
6. Press OK to accept the amplitude balancing or press Cancel to discard changes

The gain applied to each channel can be accessed by pressing Info.

12 dB is the maximum gain available. When more than 12 dB are needed (dead elements),
the pulser is disabled.

Click on Channel status to check the gain values and/or disable the channels you want. Green colour
is set for less than 12dB compensation. Others are red.

2.2.1.3 Conventional probe

Select a Circular or a Rectangular footprint to define a rectangular or a circular crystal conventional

probe (Figure 64 and Figure 65).

Figure 64: Conventional circular probe

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EQUIPMENT CAPTURE manual #62

Figure 65: Conventional rectangular probe

For both cases, set the diameter or the length and width of the piezo-electric element then the physical
channel (LEMO output) to which the conventional probe is connected.

2.2.2 Pair of TOFD probes

To define a TOFD probe, select first a Circular or Rectangular crystal footprint in the Geometry tab
(Figure 64 and Figure 65), then set TOFD configuration in the Configuration tab (Figure 58).
In the geometry tab, define the emission and the reception channels (Figure 66).
TOFD probes may be connected using the conventional channels 1 up to 4. These channels have a
maximum voltage of 200V. Nevertheless, if the user needs to extend the number of TOFD
channels, it is possible by using the Phased Array channels. In this case the maximum
available voltage is 120V (100V for Gekko Rev C). To use Phased Array channels to perform
TOFD inspections it’s advisable the use of a pre-amplifier in order to improve the RSB.

Upon request a Split Box with 4 LEMO 00 connectors is available as accessory. For more information,
please contact your local sales representative.
The user should then select Connector = PAUT 128 LEMO Splitter or Connector = PAUT 64 LEMO
Splitter upon the case.
The PAUT 64 LEMO Splitter has 2 PA connector connected with the channel 1-30 and 33-62. The
LEMO connectors are available using the channels 31, 32, 63, 64.
The PAUT 128 LEMO Splitter has 2 PA connector connected with the channel 1--62 and 65-126. The
LEMO connectors are available using the channels 63, 64, 127, 128.

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EQUIPMENT CAPTURE manual #63

Figure 66: TOFD setup

For UT Conventional channels, is advisable to avoid the 1-2 and 3-4 channels combinations
to limit the crosstalk between channels.

2.2.3 Dual configuration

TRL (Transmit Receive Longitudinal) Probes have separate transmit and receive transducers which
are acoustically isolated from each other, therefore transmitted sound waves do not interfere
with received sound waves, this gives advantages in near surface inspection and inspection of
austenitic, coarse grained and dissimilar materials.

TRL probes are traditionally conventional UT probes composed of two crystals set at a specific roof
angle and therefore having a fixed focal depth. Now with developments in Phased Array we
are able to use Dual Linear Arrays (DLA) and Dual Matrix Arrays (DMA) coupled to an
acoustically isolated wedge, giving us the opportunity to combine the benefits of phased array
and TRL probes.

It is possible to create applications that utilize each of these; TRL (conventional UT), DLA & DMA and
even combine advanced phased array imaging techniques such as TFM. These options are
available from each dedicated wizard but can also be set by selecting “DUAL” in the
Configuration tab.

The presence of wedge is mandatory for ALL dual probes (conventional, linear or matrix).

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EQUIPMENT CAPTURE manual #64

Figure 67: Dual probe configuration (DUAL)

3
2

Figure 68: Dicing (Dual linear array)

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EQUIPMENT CAPTURE manual #65

1: Footprint setup (linear or matrix array, circular or rectangular probe).

2: Probe definition (parameters updated according to the dicing selected).
3: Probe view (view updated according to the dicing/wedge selected).

The footprint setup and probe definitions are set for the transmitting probe and are applied to
both transmitting and receiving parts.

2.2.3.1 Dual Linear Array

Select Linear footprint to define a Dual linear phased-array probe (Figure 68). Parameters to be set
are identical as for linear PA probes:

• Number of elements of the probe: from 2 to 32 or 64 according to the unit version.

• 1st channel configuration: define the channel number of the system connected to the 1st
element of each linear array

• Elevation (e): passive aperture of the element.

• Pitch (p): distance between the centres of two adjacent elements.

• Gap (g): space between two adjacent elements.

• Length: total length of the linear array, automatically calculated from the number of elements,
the pitch and the gap.

Dual Linear probe numbering assistant

Press the button Numbering (4) to open the assistant (Figure 69). A sketch showing the two-scale
axis and the top-left element highlighted eases probe definition.

Figure 69: Dual linear probe numbering

Select appropriate numbering: Independent or Continuous.

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In case of ‘Independent’:
'Transmission' should be set to 1;
'Reception' should be set to number of elements per array +1.

Apply symetry if required to put 1st element at top or bottom position.

2.2.3.2 Matrix Array

Select Matrix footprint to define a Dual matrix array probe (Figure 70).

Figure 70: Dual Matrix probe

Parameters for matrix arrays are defined in 2 dimensions, relative to the array length and width.
Parameters to be set are identical as for matrix array probes:
• Number of elements: from 2 to 32 according to the unit version. The total number of elements
(lines x columns) cannot exceed 32 or 64 according to the unit version.
• Pitch (p): distance between the centres of two adjacent elements.

• Gap (g): space between two adjacent elements.

• 1st channel configuration: define the channel number of the system connected to the 1st
element of each matrix array.

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Dual Matrix probe numbering assistant

As for Matrix array, a numbering assistant is available for Dual matrix arrays from Dicing tab.
Press the button Numbering (Figure 70) to open the assistant (Figure 71). A sketch showing the two-
scale axis and the top-left element highlighted eases probe definition.

Figure 71: Dual Matrix probe numbering

Three buttons are available (horizontal or vertical symmetry, row-column inversion) to allow the
definition of any standard matrix array numbering system.
There are two predefined layouts in the drop-down menu 'identical' and 'symmetrical'

• Identical – for probes set in the same orientation (as shown)

• Symmetrical – for probes where element layouts mirror each other.

Select as appropriate, the image showing each individually numbered element will update in real time
showing the elements relative position in the x and y planes, with the bottom left element
highlighted on both the probe & wedge image and the element numbering diagram detailing

'Transmission' should be set to 1;

'Reception' should be set to number of elements per array +1.
The total number of elements (lines x columns) cannot exceed 32 or 64 according to the unit
version.
each probe.

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2.2.3.3 Dual Conventional probe

Select a Circular or a Rectangular footprint to define a rectangular or a circular crystal conventional

probe (Figure 72 and Figure 73).

Figure 72: Conventional Dual circular probe

Figure 73: Conventional Dual rectangular probe

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For both cases, set the diameter or the length and width of the piezo-electric element then the physical
channel (LEMO output) to which the Transmission and the Reception element is connected.

Avoid to use the 1-2 and 3-4 channels combinations to limit the crosstalk between channels.

2.3 Wedge

Press the Wedge tab to define a wedge or to set a transducer without a wedge (Figure 74).

Figure 74: Wedge definition

1: Wedge velocity calibration assistant.

2: Enable or disable the wedge (not available in Dual configuration: wedge is mandatory for Dual).
3: Define the type of wedge (if any).
4: Parameters to be set.
5: Summary of the current wedge (3D view, name and parameters).
6: Velocity in the wedge.
7: Open wedge library / save a new wedge.

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2.3.1 Angled wedge

Select With wedge then press Angled for the Type of wedge to define an inclined wedge (Figure 74).
Parameters to be set for angled wedges are:
• Incident or refracted angle: the other field is automatically updated according to the wave type
selected (see below) and the velocities for the wedge and material (material velocity is as
previously defined in specimen sub-panel (Part 2 section 1.4)).

• Wave type: select the type of wave used for the refracted angle (it will select the correct
specimen velocity for the calculation).

• Wedge dimensions: set the length and width (Figure 75). The wedge height is editable in the
References tab (Part 2 Section 2.4).

Figure 75: Angled wedge dimension

• Longitudinal wave velocity: set the correct wedge velocity or use the wedge velocity calibration
assistant to calculate the correct wedge velocity (Part 2 Section 2.3.3).

For linear PA probes, there is a specific assistant to calculate automatically the correct
incident angle and height of the wedge (Part 2 Section 2.4.2)

2.3.2 L0 wedge

Select With wedge then press L0 for the Type of wedge to define a flat wedge (Figure 77).
Parameters to be set for L0 wedges are:
• Wedge dimension: set the height, length and width of the wedge (Figure 76).

Figure 76: L0 wedge dimension

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• Longitudinal wave velocity: set the correct wedge velocity or use the wedge velocity calibration
assistant to calculate the correct wedge velocity (Part 2 Section 2.3.3).

Figure 77: L0 wedge

2.3.3 Wedge for Dual transducers

Dual transducers require specific wedges with additional parameters: Roof angle, Gap and Squint.

It is not possible to define a Dual transducer without a wedge.

Defining a small thickness like 0.1mm is equivalent to define a transducer without wedge.

Figure 78: Wedge parameters for Dual probes

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Figure 79: Angled wedge for Dual probes

Figure 80: L0 wedge for Dual probes

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2.3.4 Wedge velocity

If a wedge has been defined, it is necessary to define the correct LW velocity value.
You can get this value from the wedge manufacturer. In most cases, wedges are built from REXOLITE
(LW velocity = 2350m/s) or PERSPEX (LW velocity = 2650m/s).
CAPTURE offers the ability to accurately measure the wedge LW velocity using the dedicated wedge
velocity calibration assistant.

Velocity calibration assistant

Press Velocity (Figure 74– 1) to open the velocity calibration assistant for angled or flat wedges
(Figure 81).

2
2

1
1

5
5
3 4
3 4
Figure 81: Wedge velocity assistant

This wizard provides step-by-step calibration instructions to measure LW velocity for removable
wedges.

1: Enter the wedge thickness (an accurate value is essential).

2: Place the probe on one of the wedge faces. Set the measurement gate on the A-scan window to
contain 2 echoes.

3: Adjust the gain for the strongest echo amplitude to be 80% FSH.
4: Press Measure.

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The measurement can be achieved in two steps, by positioning the gate and measuring successively
each backwall echo time-of-flight.

5: Press OK to accept the measurement or press Reset to start over.

This wizard only applies to removable wedges.

2.3.5 Wedge library

Press to record a new wedge in the library (Figure 74– 7), or press to open the wedge library
( Figure 82).

Figure 82: Wedge library

The wedge library panel can be managed similarly to the specimen library (Part 2 Section 1.5).

2.4 References

Press the References tab to define the probe origin and set the wedge height and front length in case
of angled wedge (Figure 83).

Figure 83: References

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1: PA angle/height assistant for angled wedges.

2: Coordinate system references (beam exit point or front of the wedge).
3: Normalized height (H) and front length (l) for angled wedges.
4: First element location – defines orientation of probe on wedge useful as some scanners require
probe to be set in a reverse position

2.4.1 Probe reference without wedge or with a flat wedge

If a probe without a wedge or with a L0 wedge has been defined, the References tab is only dedicated
to the coordinate system reference setup (Figure 84): at the front, at the middle (beam exit
point) or at the back of the wedge.

Figure 84: Coordinate system reference without a wedge/ with a L0 wedge

2.4.2 Phased-array probe reference with angled wedge

If an angled wedge has been defined, the normalized height (H) and the front length (l) of the wedge
have to be set in this tab (Figure 83).

For PA probes, CAPTURE offers three different ways to define the normalized height “H”:
A. Height between the middle of the probe and the beam exit point (id CIVA).
B. Height measured at the middle of the probe face.
C. Height to the centre of the first probe element.
D.

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Angle / Height assistant

For phased array probes, CAPTURE provides a calculation assistant to measure the incident angle
and the height of the wedge for linear arrays only. A delay path correction is available for
conventional probes.
This wizard is compatible with flat, AOD and COD contoured wedges as shown below (Figure 85).

Figure 85: Phased-array wedges compatible with the angle/height assistant

Matrix probes are not compatible with the angle/height assistant

Press Angle/Height (Figure 83– 1) to open the wedge angle/ height assistant (Figure 86).

1
2

4 5

Figure 86: Angle / Height assistant

1: B-scan channels visualisation.

2: A-Scan view.
3: Probe setup summary.
4: Instructions for making the measurements.
5: Measurement results.

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The top left window displays the B-scan for all activate elements individually. The middle window
displays the A-scan signal of the single element currently selected, by the orange cursor in the
B-scan view.

To make the measurements:

• Fix the probe on its wedge.
• Adjust the UT parameters and the gate position/threshold to select the wedge echoes. Avoid
selecting any echoes from emission as it will affect the results. Avoid also saturation.

• Make sure that the small white crosses are displayed on the B-Scan view. It means that the
wedge echoes are correctly detected, otherwise readjust the gate or the gain value.

• Press Measure and check the consistency of the calculated values.

• Press OK to validate or press Reset to start over.

2.4.3 Conventional probe reference with angled wedge

For conventional probes with angled wedges, two options for the normalized height “H” are available
(Figure 87):
A. Height between the middle of the probe and the beam exit point (e.g. CIVA).
B. Height measured at the middle of the probe face.

Figure 87: Conventional probes reference panel

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2.4.4 TOFD references

For TOFD probes, the probe reference is the centre of the two probes (Figure 88).

Figure 88: TOFD reference panel

Zero calibration assistant

CAPTURE provides a path-delay correction for conventional probes using the measurement of the
height of the wedge.
Press Zero calibration from the References tab (Figure 87/ Figure 88) to open time base calibration
for conventional probes (Figure 89).

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Figure 89: Zero calibration assistant

1: UT parameters.
2: Probe setup summary.
3: Instructions to make the measurement.
4: A-Scan view.
5: Transmission channel selection (additionally, reception channel selection for TOFD or Dual
transducers).
6: Wedge height.
7: Adjust the amplitude to 80% FSH.
8: Achieve or reset the measurement.
9: Validate or cancel the modifications.

This wizard is not active for conventional probes without a wedge.

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2.5 Multi-probe configuration

A total of six different probes can be managed by CAPTURE. A pair of TOFD probes is considered as
one probe. Probes can be added when the probe icon is available as indicated in the
following panel (Figure 90). When selected, a probe can be changed to another type in the
Configuration and Dicing tab or removed by pressing .

Figure 90: Multi-probe configuration

By default, the probe added is a copy from the previous one, with the same parameters and
active channels. CAPTURE auto-checks the availability of channels and highlights
the part to edit in orange in case of incompatibility.

2.6 Probe library

2.6.1 Save a new probe

When a probe is selected, press to save it in the specimen library (Figure 91).

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Figure 91: Save/load a probe

Name the probe and select the destination folder as for specimen then press OK (Part 2
Section1.5.1).

2.6.2 Manage the probe library

In the probe panel, press (Figure 91) to open the probe library (Figure 92).

Figure 92: Probe library

Probe library can be managed as the specimen library (Part 2 Section 1.5.2).

The probe library contains probes from Ekoscan, GE, Imasonic, Karl Deutsch, Krautkramer,
M2M, Metalscan, Olympus, Sonatest, Sonaxis, Zetec.
Library is fully customizable to add your own probes.

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3. Scanner
Press Edit on the Scanner panel to check or modify the scanner characteristics (Figure 93).

Three encoder inputs can be read by CAPTURE on GEKKO and MANTIS EXPERT and
MANTIS MASTER. Other MANTIS versions have only 2 encoder inputs.

Figure 93: Edit Scanner

3.1 Scanner definition

This section allows user to define a 1, 2 or 3 axis encoded scanner or a time encoded inspection.

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Figure 94: Scanner definition

1: Number of encoded axis available.

2: Scanner parameters to be set (if any).
To invert/reverse the direction along one axis, tick the 'Opposite direction' box.
3: Scanner resolution calibration assistant.
4: Open scanner library/ save a scanner.
5: Real time scanning position.
6: Reset encoder(s) position to zero

3.2 Scanner calibration wizard

. Press Calibration (Figure 94 – 3) to open the encoder resolution calibration assistant (Figure 95).

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Figure 95: Encoder calibration assistant

Check that the encoder has been correctly plugged.

1: Enter a distance in the Length box.

2: Press to start the calibration. Move the encoder from the above-mentioned distance. Once
achieved, press to stop and measure the accurate resolution.

3: Press OK to validate or press Reset to start over.

3.3 Scanner library

Scanner library can be managed as the specimen library (Part 2 Section 1.5.1).

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PART 3.
Settings

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PART 3. SETTINGS
This panel is dedicated to the main acoustic setups for the CAPTURE.
The setting panel is divided into subpanels which differ according to the NDT technique used:
- Specific settings for Phased array probes
- Specific settings for TOFD probes
- Specific settings for Pulse Echo
- Specific settings for Total Focusing Method
In the following chapters, the GUI is described for each single NDT technique.
The advanced concepts of salvos, multi-probes and multi-salvos are described in a dedicated chapter
called multi-salvos setup.

1. Phased array settings

The phased array settings panel is divided into three subpanels (Figure 96).

Figure 96: Phased-array settings

1: Focal law computation.

2: Gate settings.
3: Amplitude calibration - Time Corrected Gain (TCG) or Distance Gain Size (DGS)

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1.1 Focal laws

The subpanel Focal laws is dedicated to compute the delay laws and set the probe positioning.

1 2

4
3

Figure 97: Focal laws (Configuration Panel)

1: Ultrasonic parameters (Time base Delay & Range, Gain)

2: Advanced Settings (PRF & Gain Management)
3: 3D view showing the component to be inspected, probe and corrected UT views for phased arrays,
and ray tracing for Scan Plan.
4: Focal laws management
5: Aperture Element settings for Sectorial scan only

This panel is organized in two different tabs: Configuration and Focusing

On Configuration panel the user will defines all parameters for the definition of the focal laws:
- Sweep: Sectorial Scan, Linear Scan, Compound Scan or CIVA laws;
- Wave Type: LW – Longitudinal Waves, SW – Shear Waves;
- Definition: Definition of parameters like Aperture, Linear/Angular range and Resolution
- Probe: Probe Index, Orientation
On Focusing panel, the user may apply focalization over these ray paths. Three different types of
focalization are possible to be set:
- True depth;

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- Sound path;
- Projection;

The Definition parameters are dependent on the scanning type. Capture software supports the
following type of scanning:
- Sectorial Scan: where the active aperture is fixed, and electronically the beam angles are
changed within a defined angular sector;
- Linear Scan: where the ultrasonic beam angle is fixed, and the beam is moved electronically,
through the active apertures of the array;
- Compound Scan: combination between a sectorial and a linear scan. The beam angle and the
active aperture will change consistently, allowing to increase the ultrasonic beam coverage
from a single probe position;
- CIVA laws: where the user may import a set of focal laws previously calculated in CIVA
software.

The following example illustrates different inspection strategies applied for a weld inspection
using the different type of scanning that are available on GEKKO/MANTIS

Sectorial Scan Linear Scan Compound Scan

1.1.1 Ray tracing and Scan Plan

In the 3D view (3), the rays are computed and displayed following the definition which can be set by

pressing which displays the Beam display mode pop up window.

Figure 98: Beam display mode

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Direct (half skip) W - transmission (double bounce) V - transmission (full skip) Manual (N-skips)

Figure 99: Ray tracing in the 3D view – Mirror views

Direct (half skip) W - transmission (double bounce) V - transmission (full skip) Manual (N-skips)

Figure 100: Ray tracing in the 3D view – folded views

1.1.2 Sectorial Scan (S-Scan)

Figure 101: Sectorial scan

1: Wave type LW (Longitudinal Waves) or SW (Shear Waves) ;

2: Sector scan definition:
- Aperture and 1st element;

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- Angle range of the scanning;

- Angle step °;
Note: The number of beams is automatically computed using the previous parameters but limited to a
maximum of 200 shots.
3: Probe positioning (Section 1.1.6)
4: Computes the delay laws and updates the 3D view accordingly
Once computed, press OK to validate the delay law computation or Cancel to quit the Focal laws
menu.
5: Element selection customisation for Transmission and Reception. When Custom is selected, click

on in order to select or unselect the elements in the aperture (Figure 102). T/R pattern
can be identical or independent.

Figure 102: Custom aperture definition

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1.1.3 Linear Scan (E-Scan)

Figure 103: Linear scan

1: Wave type LW (Longitudinal Waves) or SW (Shear Waves) ;

2: Linear scan definition:
- Aperture and refracted angle of the electronic scanning.
- Elements range of the scanning;
- Element Step;
Note: The number of beams is automatically computed using the previous parameters.

3: Probe positioning (Section 1.1.6)

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4: Computes the delay laws and updates the 3D view accordingly;

Once computed, press OK to validate the delay law computation or Cancel to exit the Focal laws
menu.

1.1.4 Compound Scan (Compound S-Scan)

Figure 104: Compound scan

1: Wave type LW (Longitudinal Waves) or SW (Shear Waves) ;

2: Compound scan definition:
- Active Aperture;
- Elements range of the scanning;
- Angle range of the scanning;
- Resolution (Fine, Standard, Coarse);
Note: The number of beams is automatically computed using the previous parameters.

3: Probe positioning (Section 1.1.6);

4: Computes the delay laws and updates the 3D view accordingly;
Once computed, press OK to validate the delay law computation or Cancel to exit the Focal laws
menu.

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The following example illustrates the interlacing between the selected aperture and the angle
to form the compound scan:

70° (Elements 21-32) 55° (Elements 9-20) 45° (Elements 1-12)

1.1.5 CIVA laws

The CIVA laws tab is dedicated to handle delay law configuration that are not implemented natively in
the Capture software (for example, algorithms other than Angle and Depth algorithms).
Figure 105 illustrates one example based on a CIVA model with one inspection using immersion. In
this example were used a set of focal laws with focalization points located over the inside
diameter of the cylindrical component:

Figure 105: CIVA model - Example

In Figure 106 we illustrate how to load this configuration. The file to be imported should be the CIVA
folder file *.CIVA.

The piece and probe defined in CAPTURE should be the same as defined on CIVA software;
There are some limitations on the focal laws generated by CIVA that can be imported, namely:
- The group of emitting and receiving elements should be the same. The current version doesn’t
allow to configure pitch and catch configurations;
- The focal laws can have one sequence and multiple shots or multiple sequences and a single
shot. Multiple sequences with multiples shots simultaneously cannot be handled by CAPTURE;

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Figure 106: CIVA laws import

1: Button to select the *.CIVA file folder to be loaded. The folder should be located on a USB drive;
2: The software retrieves the following information from the CIVA folder:
- Wave type LW (Longitudinal Waves) or SW (Shear Waves) ;
- Shot Number (Number of shots)
- Type (Scan Type): Sectorial Scanning, Linear Scanning

1.1.6 Probe positioning

Positioning of the probe over the specimen to be inspected is fully managed in the motion subpanel of
the configuration panel (Part 4).
The index offset box manages the distance between the specimen reference (plotted as a green dot)
and the probe reference (plotted as a red dot)

Probes with wedge may be referenced to:

Front Beam exit point

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Probe without wedge may be referenced to:

Front Centre Back

The index offset depends on the geometry of the specimen:

- + - +

Plane & Cylindrical (Circumferential orientation) Cylindrical (Longitudinal orientation)

- +

Fillet weld (Face P1) Fillet weld (Face P2)

Figure 107: Axis offset (Plane, Cylindrical & Fillet Weld)

Nozzle (Main & Secondary Inspection Face)

Figure 108: Axis offset (Nozzle)

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For nozzle configurations, the probe is always referenced in relation to the Beam exit point.

The orientation angle is defined by the rotation along Z axis.

For cylinders along longitudinal orientation only 90° and 270° can be entered.

90° 270°
0°

Increment axis

Scan axis
Scan axis

180°

Plane, Cylindrical & Fillet weld Plane & Fillet Weld

Figure 109: Orientation (Plane, Cylindrical & Fillet Weld)

1.1.7 Focusing parameters

On Focusing panel, the user may define the use of focalization. The focus points can be set
according one of the followings:

- True-depth: focus points are set along the defined depth range; the algorithm ensures the
beam angle AND the focal depth are respected;

- Sound path: focus points are set with a constant sound path; the algorithm ensures that the
uncorrected sound path is the same for every angle;

- Projection: focus points are set along a line oriented in any direction;

Focusing everywhere is not possible! In an acoustic point of view, it is impossible to

concentrate the acoustic beam energy further than the natural near field of a probe. Using a
bigger aperture or a larger probe increases the focusing capabilities as the near field gets
pushed farther.

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TRUE-DEPTH

The algorithm used for focalization is the same as CIVA optimized Focalization and Depth focusing. It
is defined by two parameters:

- Initial depth: which defines the focus initial depth. This value will be linked to Initial angle
defined on Configuration panel;

- Final depth: which defines the focus final depth. This value will be linked to Final angle
defined on Configuration panel;

The Angle range and the depth range are discretized in rigorously equal steps as shown in the next
picture:

Plane geometry Cylindrical geometry

Figure 110: True depth Focusing

Finding an intersection of a refracted beam angle is

not always possible.

When this happens, a red warning message is displayed in

the focal laws panel.

SOUND PATH

The algorithm used for constant sound path guaranties that the uncorrected sound path is the same
for every angle.

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The following example shows the results obtained with a sound path focalization located at 50 mm.
All the side drilled holes at this position are well detected. We can see the influence of the
beam focalization outside this position. For the holes located at 25mm the beam distortion is
evident, leading to an image and SNR relatively poor.

Figure 111: Sound path Focusing (Focus sound path 50mm – ASTM E2491 Block)

PROJECTION

Projection focusing allows to focus along a line oriented in any direction. It is defined by two
parameters:

- Projection: which defines the distance between the reference point of the wedge (red dot)
and the centre of the line of focusing points;

- Tilt: which defines the orientation of the line of focusing points. It is possible to enter negative
values;

Projection focusing allows to focus along chamfers. For example, the acoustic beam will be focused
along the first bevel preparation (probe side) on full skip and along the second bevel
preparation (probe opposite side) on half skip. This scanning strategy will improve the
detection of planar defects oriented along the fusion line as lack of fusion. Figure 112 and
Figure 113 illustrates the benefices of such type of focusing applicable to a V shape weld
preparation.

Figure 112: Projection Focusing (V bevel weld inspection)

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Figure 113: Projection Focusing (V bevel weld inspection)

1.1.8 Focusing with Matrix probe

Matrix arrays allow to steer the acoustic beam on 3D plans of incidence, improving the detectability of
misoriented discontinuities.
The Configuration panel has the same parameters described previously. With this type of probes, the
sweep mode is restricted to Sectorial scan. It is also possible to import CIVA laws that were
previously configured with CIVA software.
On Focusing panel, the user can adjust the sweep angles along the skew direction:

Figure 114: S-scan matrix probe

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1: With / Without – Activate the skewed plane

2: Skew scan definition:
- Initial and Final skew angle;
- Angle step;
Note: The number of planes as the number of beams are automatically computed using the previous parameters
but limited to a maximum of 200 shots.

1.1.9 3D views

The 3D view shows 3D management buttons. Table 1 describes the associated actions.

Button Associated action How to proceed?

Select the zoom function then press and

Activate zoom
swipe the 3D view crosswise
Automatically carried out once selected
Centre and resize specimen view

Select the function then press and swipe the

Slide specimen
3D view
Select the function then press and swipe the
Rotate specimen
3D view
Activate/Deactivate backwall reflexion of UT Automatically carried out once selected
data and select Beam display mode
Click
Switch between ray tracing and UT display
/

Display the specimen viewing angle Select the viewing angle of the specimen

Table 1: 3D view tools

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1.2 Gate settings

Press Edit to access the Gates subpanel (Figure 115).

Figure 115: Edit gates

One signal gate, containing the A-Scan data, is automatically set and displayed in white (Figure 116).
Swipe the gate rectangle on the A-Scan view to move the gate position. The Corrected view is
automatically updated.

Figure 116: Gates

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1: Four additional peak gates (saving amplitude and time of flight) can be added by pressing .
One additional Sync gate is available, if either one of those four gates will be synchronized.

2: Each gate can be set by pressing (Figure 118).

3: Remove the selected gate.

To position the gate:

- Edit the start, width or threshold fields at the bottom of the panel
OR
- Swipe right or left to define the beginning and end of the gates. Swipe up or down the gate
threshold to increase or to decrease it (Figure 117).

Figure 117: A-Scan zoom

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5
3
1
2
4

Figure 118: Gate settings

1: The Detection type can be selected from the drop-down menu. These detections can be
associated to a positive, negative or absolute value of the RF signals (Figure 119). The
Detection type drop down menu allows selecting the:
• Max peak: this option stores the amplitude and time-of-flight value associated to the maximum
echo above the threshold.

• First peak: this option stores the amplitude and time–of-flight value associated to the first
echo above the threshold.
• Last peak: this option stores the amplitude and time-of-flight value associated to the last echo
above the threshold.

• Max flank: this option stores the amplitude and time-of-flight value right above the gate
threshold associated to the Max echo.
• First flank: this option stores the amplitude and time-of-flight value right above the gate
threshold associated to the first echo.

Max peak First peak Last peak Max flank First flank

Figure 119: Detection mode

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The A-scan is stored for all range of the time base independently the gate position and gate
detection mode. A-Scan information will be stored if the recording mode is set to All data, in
Recording panel (Section 4)

2: The Phase can be selected from the drop-down menu. The following options are available:
• Positive: this option will consider only the positive sign of the RF signal for the detection
according with one of the above detection methods;
• Negative: this option will consider only the negative sign of the RF signal for the detection
according with one of the above detection methods;

• Absolute: this option will consider either the positive or negative sign of the RF signal for the
detection according with one of the above detection methods;
3: The Synchronized button can be selected to synchronize the gate with a reference signal.
A synchronized Gate is typically used for L0 inspection when using an immersion tank or a water
wedge (Hydroform type or Roller probe)
The variation in the height of the water column needs to be compensated to have a true depth
measurement
A synchronized gate is positioned at the front surface echo, it is being used to measure the reflexion
off that surface. The second gate is synchronized with this gate GSync and moves with it.
4: The Colour drop-down menu allows to change the gate colour
5: The Mode button can be selected to choose between true-depth and sound path gate setting

Often the front surface echo appears saturated. The 16-bit dynamic of the GEKKO/MANTIS
allows to still measure the maximum up to 800% FSH. If the value goes to 800%, it is
recommended to switch the synchronization to a First Threshold

1.3 Amplitude calibration

By default, Amplitude calibration is disabled (Off selected). Press On to activate the amplitude
calibration panel.
Press Edit to access the Amplitude calibration subpanels (Figure 120).

The following options are available:

• Advanced TCG: this option will used when different TCG curves will be applied for each
shot/sequence; This option is normally used when the configuration uses a phased array
probe with a wedge for S-Scan and E-Scan configuration;
• Basic TCG: this option will used when the same TCG curve will be applied for all the
shots/sequences; This option is normally used when the configuration uses a phased array
probe with a 0° LW configuration, as well for conventional probes;

• DGS: this option will used when to calculate the ERS- Equivalent Reflector Size in comparison
with a response obtained from a flat bottom hole oriented perpendicularly with the beam.

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SETTINGS CAPTURE manual #105

Figure 120: Amplitude calibration settings

TCG calibration is a Time-Corrected-Gain wizard which is designed to equalize the amplitude of all
A-scans from the different focal laws over the sound path range, using a collection of reflectors
located at different depths.
This is the same function as a conventional single channel instrument; The main difference is in this
case is that is applicable to all focal laws or A-scans simultaneously.
The basics of phased-array TCG calibration is to scan over the reference reflectors and to compute a
TCG curve per shot/sequence. The TCG compensation will set all reflectors to the same
amplitude previously defined. The default reference value is 80% and the tolerance value is
5%. These two values can be modified in the Preference panel (Part 1 Section 4.2).
The TCG in CAPTURE can compensate between -6 dB and +20 dB meaning that signals can be
saturated as much as 200% FSH.
However, when CAPTURE applies negative compensation, it changes the dynamic of the acquisition.
If – 6dB are applied in the TCG then the dynamic will be 400% instead of 800%. It is thus
recommended to bring the strongest signal at 80% FSH by adjusting the gain.

1.3.1 TCG calibration (Basic TCG)

Basic TCG calibration will apply the same TCG curve to all the shots/sequences. This means that will
no individual compensation per shot/sequence will exists;
Basic TCG is usually used for LW 0° inspection like corrosion mapping and composite inspection for
which all the sequences have the same delay laws. It can also be used to set the TCG curve
for a conventional monolithic or TR probe;
In the following example, a calibration block with four side-drilled holes located at depths of 10mm,
20mm, 30mm and 40mm will be used to demonstrate the use of this tool.

Ref: CAPTURE_user_manual_v3.0_US-A
SETTINGS CAPTURE manual #106

The calibration steps are listed hereafter:

• Position the probe on the calibration block;

• Press Play
• Move the probe front and backwards to record the amplitude and TOF for each one of
the sequences. An image with all superimposed E-Scans is being displayed. The A-Scan view
displays the recorded signal for the selected shot/sequence, and the respective echo dynamic;

If necessary, to restart the TCG recording press . This will clear all recorded signals from
the E-Scan and A-Scan view

Figure 121: Basic TCG recording

• After finish, press Stop

• Press Detect
Capture will detect automatically the peaks over the threshold and display them in a list.
It is possible to delete some points if needed;

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SETTINGS CAPTURE manual #107

Figure 122: Basic TCG computation

• Press Apply

• The TCG curve is drawn on the A-Scan view.

Figure 123: Basic TCG result

• Press OK to accept TCG

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SETTINGS CAPTURE manual #108

It is possible to create manually a TCG by adding points pressing the sign. The operator will be
prompt about the sound path and gain for the point to be added:

Figure 124: Basic TCG – manual TCG points

It is possible to Save/Load the TCG. If the operator uses the same probe, same wedge, the same
material, and the same focal laws, it might simpler to load a TCG previously done

Figure 125: TCG calibration – Open and Save features

1.3.2 TCG calibration (Advanced TCG)

In the following example, four side-drilled holes located at depths of 15mm, 30mm, 45mm and 60mm,
using ISO 19675 calibration block will be used to demonstrate the use of this tool.

The calibration steps are listed hereafter:

• Position the probe on the calibration block;

• Press Play

• Move the probe front and backwards to record the amplitude and TOF for each one of
the shots/sequences. An image with all superimposed S-Scans is being displayed. The A-
Scan view displays the recorded signal for the selected shot/sequence, and the respective
echo dynamic.

• After finish, press Stop

• Press Next

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SETTINGS CAPTURE manual #109

Corner Echo
1st Hole 1st Hole

2nd Hole
2nd Hole
rd
3 Hole

3rd Hole
4th Hole

4th Hole

Figure 126: Advanced TCG signal recording

In this step the user will define zones to retrieve the amplitude and TOF data from the superimposed
S-Scan view:

• Press to add a Zone

• Position the zone in the S-Scan to encompass the response of the 1st hole

• The echo dynamic displays the response of the hole for all shots (angles)
• Add as many zones as required by the procedure and the required thickness to be
inspected
• Adjust the Threshold to set the gate record level (set typically to 10% - 20%).

• Press . A message is displayed, with the information about the number of

angles and points per curve calculated in the TCG

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SETTINGS CAPTURE manual #110

Figure 127: Advanced TCG Computation

The corner echo from the R50 reflector from block ISO 19675, does not allow to add computation zones
over the 3rd and 4th holes.

After Compute press , to return to the TCG Recording menu, and thus record the 3rd and 4th
holes, from a different probe position, avoiding to record the corner echo.

NOTE: Since current version of Capture, does not handle with different gain settings during the TCG
recording, the gain setting should not be changed.

• After Compute Press , returning to the TCG Recording menu, in order to record
again the amplitude response for the 1st and 2nd hole. The aim is to check if the TCG
compensation was set properly;

• Press Play
• Move the probe front and backwards to record the amplitude and TOF for each one of
the shots/ sequences

• After finish, press Stop

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SETTINGS CAPTURE manual #111

Figure 128: Advanced TCG signal recording (TCG Verification)

• Press Next
• Verify if the echo dynamic for each one of the zones, fits inside the shadow green area

• Press OK to accept TCG or to add more TCG points

Figure 129: Advanced TCG Computation (TCG Verification)

For the case of this example, press to repeat the entire procedure for the 3rd and 4th hole. The
final result is illustrated on Figure 130, where the 4 holes are set at 80% ±5% for all the shots
(angles) and depth range:

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SETTINGS CAPTURE manual #112

1st Hole

2nd Hole

3rd Hole

4th Hole

Figure 130: Advanced TCG Verification

It is possible to Save and Open TCG similarly to the Basic TCG.

When loading a TCG the software checks if there is the same number of shots for compatibility issues:

Figure 131: Advanced TCG calibration – Focal Laws Compatibility during TCG load

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SETTINGS CAPTURE manual #113

1.3.3 DGS calibration

DGS is a sizing technique that relates the amplitude of the echoes and return an estimation of the
equivalent size by comparison with a flat bottom hole located at a position with the same
sound path. This value is known as Equivalent Reflector Size or ERS.
Traditionally this technique involves the comparison between the echo amplitude from a reflector with
reference curves using abacus curves that were available either in printed forms or directly
embedded in the instruments. One abacus curve is associated to each transducer
(propagation media, crystal shape and dimension, frequency).
The limitation of this technique is frequent since it will not work for the probes for which there are no
abacus available as is the case of most phased-array probes.
Capture software uses CIVA modelling tool to estimate the ERS for each position in the S-Scan and
for any probe including phased-array probes
DGS calibration wizard allows to express signal amplitude in ERS diameter. By recording a reference
amplitude value from a SDH for one shot/sequence at one know sound path, the software will
be able to calculate the ERS value for all shots/sequences, and for any sound paths.

The calibration steps are listed hereafter:

• Select the reference angle and position the gate on SDH echo;
• Set the correct SDH diameter;
• Optimize the echo amplitude and then press Compute REF ;

The sound path to the reference must be larger than 2 nearfields.

Once computed, the A-Scan view will be frozen indicating the ERS value calculated (Figure 132).
Press Reset to repeat the measurement or press OK to apply computation.
The ERS value will then be displayed either in inspection as in analysis mode.

Figure 132: AVG calibration panel

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SETTINGS CAPTURE manual #114

2. TOFD Settings
The TOFD panel is divided into three sub-panels. The first one addresses the PCS calibration, the
second one regards gate settings and the third one is for amplitude calibration (Figure 133).

Figure 133: TOFD Settings panel

2.1 TOFD calibration

The TOFD calibration panel is used to measure the PCS – Probe Centre Separation of the TOFD
probes. For TOFD inspection, PCS value is required to retrieve the depth of the indications
(Figure 134).
In this menu, the operator can access the following calibration parameters.
1: Specifications of the probe used are called from the probe panel (Part 2 Section 2.2.4);
2: The PCS value is computed by default, from the refraction angle considering the Rays intersection
located at 2/3 of the thickness. This PCS value may be edited manually, or may be computed
using the TOFD calibration procedure, described above;
3: Two gates are available. The first one is used to detect the lateral wave echo. The second one is
used to detect the backwall echo. For each gate, detection mode and threshold may be
specified by the user (Part 3 Section 1.2);
4: Two views may be displayed: A-Scan and mechanical B-Scan views;
5: Pressing the TOFD calibration button calibrates the TOFD settings; (Part 3 Section 2.1.2);

If no PCS calibration is performed, hyperbolic cursors and depth scale are not available
in acquisition.

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SETTINGS CAPTURE manual #115

1 4

Figure 134: TOFD calibration panel

2.1.1 Gate settings

In order to edit the detection mode

Figure 135) and the threshold type (Figure 136) of the lateral wave and back wall echoes, press the
button .

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SETTINGS CAPTURE manual #116

Figure 135: Gate settings detection

Available detection modes are the same as the ones presented in Part 3 Section 1.2.

Figure 136: Gate threshold type

Available threshold types are positive, negative and absolute, respectively enabling the detection of
positive peaks, negative peaks and absolute value peaks.

2.1.2 TOFD calibration

There are three methods to perform a TOFD calibration with Capture, i.e. to convert the TOFD scale
on the A-Scan and B-Scan from TOF to depth (mm).

Ref: CAPTURE_user_manual_v3.0_US-A
SETTINGS CAPTURE manual #117

- Using lateral wave echo and backwall echo

If both lateral wave and back wall echoes can be observed, check the two boxes and position each
gate on the respective echo. Then press the TOFD Calibration button. PCS is automatically
computed from the TOF retrieved from the gate information. TOFD scale is now calibrated and
may be displayed in mm in the A-Scan view (Figure 137). Press the Reset button to erase the
calibration.

The input parameters used for this calibration are the thk - thickness and the vLW - sound
speed.
Based on the measurement of tLW – time of flight of lateral wave and tBW – time of flight of
backwall echo the software may compute the PCS and the probe delay according to:

Figure 137: TOFD Calibration (Lateral wave, Backwall echo and thickness)

The TOFD depth scale will be computed based on PCS, the probe delay and the vLW -
sound speed, according to:

Ref: CAPTURE_user_manual_v3.0_US-A
SETTINGS CAPTURE manual #118

- Using lateral wave echo and PCS

If only the lateral wave echo can be observed, the TOFD scale may be calibrated using this echo and
the PCS value. To achieve this, check only the Lateral wave box and position the gate onto
the associated echo. Measure and enter the PCS value that matches with the probe centre
separation probe. Press the TOFD Calibration button to calibrate and adjust TOFD scale
(Figure 138). The scale of the A-scan view may now be displayed in mm.

The input parameters used for this calibration method are the PCS and the vLW - sound
speed.
Based on the measurement of tLW – time of flight of lateral wave, the software may
compute the delay.

Figure 138: TOFD Calibration (Lateral wave and PCS)

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SETTINGS CAPTURE manual #119

- Using backwall echo and PCS

If only the Backwall echo can be observed, the TOFD scale may be calibrated using this echo and the
PCS value. To achieve this, only check box the Backwall echo and position the gate over this
signal. Measure and enter the PCS value that matches with the probe centre separation
probe. Press the TOFD Calibration button to calibrate and adjust the TOFD scale (Figure
139).

The input parameters used for this calibration method are the PCS, the thk - thickness and
the vLW - sound speed.

Based on the measurement of tBW – time of flight of Backwall echo, the software may
compute the delay.

Figure 139: TOFD Calibration (Backwall echo, PCS and Thickness)

2.2 Gates in TOFD

Press the Edit button to enter the Gate panel (Figure 140).

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SETTINGS CAPTURE manual #120

Figure 140: Edit gates in TOFD

Gate management in TOFD and conventional modes (Figure 141) are the same as gate management
in phased-array mode (Part 3 Section 1.2.).

1 2

Figure 141: Gate settings in TOFD

1: The operator may add up to five gates by pressing the button (max number of gates is 4)

2: Each gate parameter may be set by pressing the button. Pressing the button deletes the
selected gate.

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SETTINGS CAPTURE manual #121

In TOFD mode, the signal is always displayed in RF mode and the button located at the bottom
left of the A-Scan enables to choose between millimeters (depth scale) and microseconds
(time-of-flight scale).

2.3 Amplitude calibration settings in TOFD

Since TOFD technique is a non-amplitude technique, the amplitude calibration is not normally required
to be performed. Nevertheless, the equipment allows to perform such compensation. To
enable the Amplitude calibration, press On, and then press the Edit button to enter the panel
(Figure 142).

Figure 142: Amplitude calibration settings in TOFD

The amplitude calibration process for this module follows the same steps that are applicable to
conventional UT probes, and it will be described in detail in Section 3.2.

3. Pulse-Echo settings
The Pulse-Echo settings panel is divided into two sub panels. The first part addresses gate settings
and the second one deals with amplitude calibration (Figure 143).

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SETTINGS CAPTURE manual #122

Figure 143: Pulse-Echo settings panel

3.1 Gate settings (Pulse Echo)

The edition of gate settings shown in Figure 144 is the same as described in TOFD mode Part 3
Section 2.2.
The choice of the scale unit – between mm and µs – should be made in the System preferences panel
(Part 1 Section 44).

Figure 144: Gate settings in Pulse Echo

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SETTINGS CAPTURE manual #123

3.2 Amplitude calibration (Pulse Echo)

Amplitude calibration is the same as described in the TOFD section (Part 3 Section 2.3), see Figure
146.
In pulse echo mode, the software allows to display the ultrasonic signals either in TCG representation
as well as DAC curve drawn over the screen, as a conventional UT device. The Figure 145
illustrates the same UT signal displayed by both methods. To switch between both
representations, press the button as desired.

Figure 145: DAC Display vs TCG Display

Figure 146: Amplitude calibration for Pulse Echo

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SETTINGS CAPTURE manual #124

4. Total Focusing Method (TFM) settings

4.1 Basic principles of TFM

The Total Focusing Method, also known as TFM, is a high-resolution imaging algorithm achieved into
two steps: first the data collection (Full Matrix Capture) and then the image processing (TFM
itself).
Full Matrix Capture (FMC) is a specific data-acquisition process using ultrasonic phased-array probes
(Figure 147 and Figure 148). For an array of N elements, each element is successively used
as the transmitter, while all other elements are used a receiver. Figure 147 illustrates the
sequencing of the shots fired by a phased-array probe used with FMC. The data are organized
in a matrix Sij that contains all the acquired signals. Sij contains the signal transmitted by
element i and received by element j, as illustrated in Figure 149.

Figure 147: Transmission and reception by the first element of the probe

Figure 148: Transmission on i th element and reception on N th element of the probe

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SETTINGS CAPTURE manual #125

Figure 149: FMC matrix

For a trigger mechanical position, once the full data is acquired, this is FMC matrix is full, all the data
are ready for processing. The signal processing is called as total focusing method (TFM). A
computation zone is defined for the data reconstruction. This zone of interest is meshed, and
for each point in the grid, the correspondent time of flight from the ith emitter to the jth receiver
is calculated for a specific mode of wave propagation (Figure 149).
The TFM algorithm consists in coherently summing all the signals sij(t) from the dataset to focus at
every points of a Region of Interest (ROI) in a specimen.
Mathematically this can be expressed as:

where tij(P) represents the theoretical time-of-flight corresponding to the propagation time between the
ith transmitter and the jth receiver, through point P.

Figure 150: TFM Technique

In CAPTURE, this reconstruction is performed in a 256x256 pixels zone with a rate of 25 frames/sec;
each pixel corresponding to one of the focused points of the ROI.

4.2 Total Focusing Method settings in CAPTURE

In the Settings panel, enter the sub-panel named TFM settings to edit the TFM parameters
(Figure 151).

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SETTINGS CAPTURE manual #126

Figure 151: TFM settings panel

Press the Edit button to specify TFM options. The panel shown in Figure 152 is now active.

3
5
6

Figure 152: TFM settings

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SETTINGS CAPTURE manual #127

1: The following wave propagation computation modes are natively embedded in CAPTURE software:
- Wave Type L (Longitudinal Waves)
LL: longitudinal waves in Half Skip;
LLL: longitudinal waves in Pitch-And-Catch configuration;
LLLL: longitudinal waves in Full Skip;
- Wave Type T (Shear Waves)
TT: shear waves in Half Skip;
TTT: shear waves in Pitch-And-Catch configuration;
TTTT: shear waves in Full Skip;
- Conversion mode techniques
TLT: shear-longitudinal-shear in Pitch-And-Catch configuration;
TLL: shear-longitudinal-longitudinal in Pitch-And-Catch configuration;
LTT: longitudinal-shear-shear in Pitch-And-Catch configuration;
Ultrasonic paths are used by CIVA to calculate the times-of-flight to process the TFM images. These
travel paths only deal with waves propagating inside the component.

2: The computation Zone is the area where the mesh will be applied, and the algorithm will apply the
TFM reconstruction.
The Depth and X-Offset parameters defines the position of the zone of interest. The reference is the
middle of the red line at the top of the zone of interest as illustrate in Figure 153

Figure 153: Location of the zone reference

3: Index offset and Orientation allow to position the referential of the transducer with respect to the
component referential.
4: Gain; The maximum analogue value is limited to 40dB. It is recommended to set the gain between
30 and 40 dB to have a good detection capability.
5: Press the Calculate button to start CIVA calculation and to see the real-time TFM display.
6: Press the Adjust button to adjust automatically the gain;
7: Press the TFM options button to adjust image resolution, aperture and computation speed (TFM
mode); it displays the panel as seen on Figure 154.

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SETTINGS CAPTURE manual #128

Figure 154: TFM Options

Figure 155: Example of an inspection using TFM

The TFM is a powerful processing method. It is however sensitive to:

• The characteristics of the probe (pitch, height, wedge, height)

• The velocity of the waves
• The thickness of the sample for modes with rebounds
These values need, as much as possible, to be calibrated with available wizards or
carefully measured to obtain the best results.

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SETTINGS CAPTURE manual #129

For the modes with rebounds, i.e. all available modes except LL and TT, is better to define
the zone of interest within the component.

When the thickness is not perfectly known, or if the thickness is varying, it is most efficient
to compute the TFM image in direct mode (LL or TT), and define an area of
interest >2x thickness

4.3 Amplitude calibration

By default, Amplitude calibration is disabled (Off selected). Press On to activate the amplitude
calibration panel.
Press Edit to access the Amplitude calibration subpanels.

4.3.1 Basic TCG calibration (TFM Mode)

The Basic and Advanced TCG described earlier is also available for TFM technique.
Advanced TCG works exactly the same as for phased array except that the operator needs to move
the probe slower. With a frequency of 20-25 Hz it is necessary to move at around 2 mm/s.
The advantage of TCG applied to TFM is that it works great with a focused beam as the TFM focuses
the energy everywhere.

In the following example, four side-drilled holes located at depths of 10mm, 20mm, 30mm and 40mm,
will be used to demonstrate the use of the tool.

The calibration steps are listed hereafter:

• Position the probe on the calibration block;

• Press Play

• Move the probe front and backwards to record the amplitude and TOF associated to
each one of the pixels. An image with all superimposed T-Scans (TFM-Scan) is being
displayed.
The vertical echo dynamic view displays the recorded signal along the vertical column located
at the middle of the TFM image;

• After finish, press Stop

• Press Detect
Capture detects automatically the peaks over the threshold and display them in the list. It is possible to
delete some points if needed;

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SETTINGS CAPTURE manual #130

Figure 156: Basic TCG recording (TFM mode)

Figure 157: Basic TCG computation (TFM mode)

• Press Apply

• The TCG curve is drawn in the A-Scan.

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SETTINGS CAPTURE manual #131

Figure 158: Basic TCG result (TFM mode)

• Press OK to accept TCG

4.3.2 Advanced TCG calibration (TFM Mode)

The calibration steps are listed hereafter:

• Position the probe on the calibration block;

• Press Play
• Move the probe front and backwards to record the amplitude and TOF associated to
each one of the pixels. An image with all superimposed T-Scans (TFM-Scan) is being
displayed.
The vertical echo dynamic view displays the recorded signal along one vertical column of the
TFM image, selectable by the user.

• After finish, press Stop

• Press Next

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SETTINGS CAPTURE manual #132

Figure 159: Advanced TCG signal recording (TFM mode)

In this step the user will define zones to retrieve the amplitude and TOF data from the superimposed
T-Scan (TFM-Scan) view:

• Press to add a Zone

• Position the zone in the T-Scan to encompass the response of the 1st hole
• The echo dynamic displays the maximum response of the hole for all the pixels along
the vertical direction

• Add as many zones as required by the procedure and the required thickness to be
inspected

• Adjust the Threshold to set the gate record (set typically to 10% - 20%).

• Press . A message is displayed, with the information about the number of

angles and points per curve calculated in the TCG

Ref: CAPTURE_user_manual_v3.0_US-A
SETTINGS CAPTURE manual #133

Figure 160: Advanced TCG Computation (TFM mode)

• After Compute Press , returning to TCG Recording menu, in order to record again
the amplitude response of the reflectors. The aim is to check if the TCG compensation was set
properly;
• Press Play
• Move the probe front and backwards to record the amplitude and TOF for each one of
the pixels;
• After finish, press Stop
• Press Next

Figure 161: Advanced TCG signal recording (TCG Verification)

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SETTINGS CAPTURE manual #134

• Verify if the echo dynamic for each one of the zones, fits inside the green shadow area;

• Press OK to accept TCG or to add more TCG points;

1st Hole

2nd Hole

3rd Hole

4th Hole

Figure 162: Advanced TCG Verification (TFM mode)

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SETTINGS CAPTURE manual #135

5. Multi-salvo setup
A multi-salvo setup allows performing multiple configurations with different ultrasonic settings with the
same phased-array probe at the same time.
CAPTURE allows a multi-salvo setup with up to 6 probes, phased-array probes each performing
multiple salvos as well as single-crystal probes used in pulse-echo or TOFD. By extension, the
TOFD or Pulse-Echo modes defined in the Probe Tab are defined as unique salvos.

CAPTURE can manage up to eight salvos. Table 2 shows the various combinations.

Combined
wit PA TFM TOFD PE
h
PA x x x
TFM
TOFD x x x
PE x x x
Table 2: Multi-salvo combinations

Due to the required processing power, the TFM can only be applied to one salvo (specific
wizard).

Multi-salvos can be defined in the Settings panel, when the icons and are available at the
bottom of the screen (Figure 163). The creation of multi-salvo applications requires to start
from a Combination Wizard.

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SETTINGS CAPTURE manual #136

Figure 163: Multi-salvo setup

When a salvo is selected, press the button to add a salvo to the transducer. The new salvo will
copy automatically the parameters previously selected. Then, select the salvo and modify the
delay laws to fix a new set of laws.

When several salvos are available for one transducer, press the button to remove the selected
salvo.

Ref: CAPTURE_user_manual_v3.0_US-A
SETTINGS CAPTURE manual #137

PART 4.
Configuration

Ref: CAPTURE_user_manual_v3.0_US-A
 GEKKO manual #138

PART 4. CONFIGURATION

All configuration panels, required to start an Inspection, are included in this part: the probe positioning
and the control trajectory can be set in the Motion panel, the layouts and the content of
acquisition view can be organized in the Display panel and the Pulse Repetition Frequency
(PRF) can be adjusted from the Configuration summary panel (Figure 164).
This panel is dedicated to present the configuration panels that are required to be configured before
starting the Inspection. The configuration panel is divided into the following subpanels:
1: Motion: where the user sets the probes positioning, the scanning trajectory, and the Pulse
Repetition Frequency (PRF);
2: Display: where the user configures the display panels;
3: Recording: where the user configures the recording mode and defines the information that will
be included on the test report;
The Configuration panel is independent from the techniques previously defined.

1 2 3

Figure 164: Configuration panel overview

These subpanels are described in the following chapters:

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1. Motion
The subpanel Motion contains two tabs: References and Trajectory. The References tab allows
positioning of each probe with respect to the probe holder reference point and the specimen
reference point (Part 4 Section 1.1). The Trajectory tab defines the scanning trajectory (Part 4
Section 1.2).

With phased-array probes, the orientation and the index offset can be defined in the
Settings panel (Part 3 Section 1.1.5.).

1.1 References

In this tab, each probe or group of probes location can be managed. In addition to the 3D visualization
window, three main sections are available:

Figure 165: References

Probes: To set the probe positioning (applied to a single probe)

Scan: To set the scan positioning (applied to all set of probes)
Specimen: To set the specimen reference point

These subpanels are described in the following chapters:

1: Probes

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 GEKKO manual #140

Each probe is associated to a red dot representing the probe reference in the 3D visualization window;
After select the probe on the right panel, the associated probe (pair of probes for TOFD) will be
highlighted in blue on the 3D view;
The values Index offset, Scan offset and Orientation, are independently linked with each one of the
probes, represented in 3D view by the red dot;

2: Scan
The Scan offset or group offset (yellow dot), allow to add an offset applied to all set of the probes with
respect to the specimen reference (green dot);

To define a probe as the group reference, select a probe, and press ; When a probe is
used as group reference, the yellow dot is merged with a red dot linked with the probe;

3: Specimen reference
Depending on the specimen type, the origin can be selected with the drop-down menu, Specimen
border or Specimen centre;

Specimen Ref. Index offset 1

Scan offset

Probe Ref.

Scan Ref.

Figure 166: References (Scan direction along X)

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 GEKKO manual #141

1
Specimen Ref. Scan offset
Index offset

Probe Ref.

Scan Ref.
2

Figure 167: References (Scan direction along Y)

1.2 Trajectory

The trajectories menu will be dependent on the type of component to be inspected, as well the type of
scanner to be used during the inspection.

1.3 1D trajectory: 1-axis scanner

The 1D trajectory is automatically defined when the selected scanner only has one axis.
The 3D representation is a live view, i.e. when the user moves the scanner, the probe displacement
can be seen directly over the 3D view. This allows the user to verify the probe path and check
the direction of scanning.

1: Orientation
The direction of scanning should be defined, to match along X or Y direction;

2: Distance
The Distance is the total length of the acquisition area (expressed in mm). For pipe components, the
user needs to calculate and enter the perimeter of the pipe;

3: Step
The Step is the acquisition step between two consecutive data points;

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4: Scanning direction
The acquisition direction may be reversed by checking the box Reverse the trajectory on the 3D
view;

5: Auto Stop
The acquisition will be automatically stopped after the user records all data along the defined distance
by checking Automatic acquisition stop;

6: Encoder Reset

Clicking the will resets the coder

2 3
4

Figure 168: One-axis application (Weld application without overlapping)

1.4 2D trajectory: 1 axis scanner + increment

The 1D trajectory + increment is similar to 1D trajectory, but it allows to add a discrete increment in the
index direction. The increment will be added manually, either by software or by using the index
button in the scanner, if available.

Normally, for the case of linear scan with 0° LW, the increment step value is about 90% of the sweep
range of the probe. This overlap allows to assure the complete beam coverage along the
material to be inspected;

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Example 1: Corrosion Mapping with 1D trajectory + increment

- 64 phased-array probe with a 0.6 mm pitch:
- Linear scan with 8 elements
- Sweep Range:

- Recommended Increment step value:  30mm

Figure 169: One-axis application (Corrosion mapping with manual triggered overlapping)

In this example the increment Step was defined to 33mm, and the Distance to 165mm, which means
that the coverage area of 165mm will be filled after 5 steps of 33mm, as illustrated in Figure
169

Example 2: Weld Inspection with 1D trajectory + increment

- 64 phased-array probe with a 0.6 mm pitch
- Wedge with an incidence angle of 36°,
- Linear scan with 12 elements, 60° SW
- Sweep Range: 39.8mm (Measured over the S-Scan view)

- Recommended Increment step value:  35mm

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In this example the Step was defined to 35mm, and the Distance to 70mm; The acquisition will be
performed with 3 steps (Increment Y=0, Y=35 and Y=70mm), ensuring the full weld coverage
with a single acquisition file, without the need of posterior post-processing to merge the data.
The Figure 171 illustrates the achieved weld coverage using this type of scanning strategy:

Figure 170: One-axis application (Weld application with manual triggered overlapping)

Figure 171: Weld coverage for scan with index overlapping (Thickness: 25mm)

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1.5 2D trajectory – 2-axis scanner

The 2D trajectory is automatically defined when the selected scanner has two axis, 3 axis and 1-axis
+ increment.

The parameters are identical to the 1D trajectory except that the user has to define the Distance and
Step for both the Scan and Index axis.

While for the trajectory 1D trajectory + increment the index values are pre-set, for the
2D trajectory the index value will be the value provided by the encoder linked to the index
axis of the scanner.

On Figure 172, the Scan axis is being feed by Coder 1, and the Index axis by Coder 2.

Nevertheless, the increment Step value needs to be set for the equipment trigger the acquisition after
the index have been moved of that value.

Figure 172: Two-axis application (Corrosion mapping with encoder triggered overlapping)

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1.6 2D trajectory – Rotating arm

When using a 3-axis rotating arm, the trajectory is similar to a 2D trajectory after calibration of the
scanner
It is possible recalibrate it by pressing the “Set Sinus” button at the bottom of the screen
Regarding the trajectory, set the scan axis (along R) and second axis distance and step as for
standard 2D Mapping application.

Figure 173: Three-axis application (Corrosion map application)

1.7 2D trajectory – Nozzle inspection

When using the nozzle inspection module, the acquired data axis and respective trajectory paths will
rely on the Inspection face where the inspection will be performed:
- For Set-In nozzle -> Inspection face: Main;
- For Set-On nozzle -> Inspection face: Secondary;
-
The Inspection face is defined on tab Equipment -> Specimen -> Weld.
For further information consult Part 2 Section 1.2.;

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Inspection face: Main

When then inspection is performed from the Main component, i.e. from the main shell plate, the
software allows to acquire data along the axis: R and Ɵ. The Scan axis is automatically set to
Ɵ, and
Index (Incremental) axis set to R.
Additionally, the software will compute the corrected cross-sectional views (S-Scan and/or E-Scan)
considering the probe skew orientation Ɵ3.
The 3D representation is a live view, i.e. when the user moves the scanner, the probe displacement is
being displayed directly over the 3D view, showing the probe movement on the 3 axis R, Ɵ
and Ɵ3.

Ɵ – Scan axis encoded along angular direction (°);

R – Index axis encoded along radius direction (mm);
Ɵ3 – Probe skew (°);

Ɵ – Scan axis position. For further information consult Part 3 Section 1.1.5.

Ɵ offset: 0° Ɵ offset: 90° Ɵ offset: 180° Ɵ offset: 270°

Ɵ3 – Probe skew orientation:

Ɵ3 orientation: 45° Ɵ3 orientation: 90° Ɵ3 orientation: 135°

In Figure 174 is illustrated the trajectory panel for an inspection that is being performed from the main
component. In this case the trajectory was set to scan 360°, i.e. all around the circumferential
perimeter of the nozzle connection. The increment Step was defined to 10mm, and the
Distance to 100mm, which means that the coverage area of 100mm will be filled after 10
steps of 10mm.

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Figure 174: Three-axis application (Nozzle weld inspection)

Inspection face: Secondary

When the inspection is performed from the Secondary component, i.e. from the nozzle side, the
software allows to acquire data along the axis: R and Ɵ. The Scan axis is automatically set to
Ɵ, and
Index (Incremental) axis set to R.
In this case, the software doesn’t compute the corrected cross-sectional views (S-Scan and/or E-
Scan) considering the probe skew orientation Ɵ3.

When the inspection is being performed from the Secondary component, the scanner type
needs to be changed from 3-axis nozzle scan to 1-axis scanner;

1.8 PRF – Pulse Repetition Frequency

The PRF is the frequency at which the pulsers are firing, it is expressed as the inverse in time
between two excitations, i.e., between two shots (sectorial scan) or two sequences (linear
scan).
The frequency to perform a complete E-Scan or S-Scan is the PRF divided by the number of
sequences or shots within that group. For Multigroup, it is the total number of sequences or
shots that is considered for all the groups.
The PRF is directly related to how fast the probe or probes can move either manually or connected to
a scanner without missing data.

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The maximum scanning speed is limited by the value of the PRF setting. To scan faster, the user
should increase as much as possible the PRF value. The maximum scanning speed can be
calculated by the following expression:

By other hand, the time between two consecutive firing cannot be less the required time that the
sound takes to propagate for the time base range. The maximum PRF that can be applied
during an acquisition without generate “ghost echoes” may calculated by the following
expression:

Capture software calculates automatically the maximum PRF and the maximum scanning speed that
can be achievable with the present configuration taking into consideration:

- : Total number of sequences/shots for all groups;

- : The number of averaged signals;

- : The maximum acquisition speed (mm/s);

- : The acquisition scan step (mm)

- Velocity of sound speed (m/s)

- Total length of time range (mm)

The PRF can be accessed through Motion panel as well Gates, TCG and Inspection panels. Press
to access to PRF management window located at top right of the screen;

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Figure 175: PRF edition

2. Display

2.1 Layout

This subpanel is dedicated to setting the inspection layouts (Figure 176).

Figure 176: Display subpanel

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1: Up to four specific tabs are available for the inspection panel to display a large variety of ultrasonic
images dispositions. Press on the button to add a layout panel.
2: Name or rename each layout panel.
3: Each tab can be managed individually and a maximum of six different windows is configurable per
tab. Press the left or right arrows to switch the available layouts (Figure 177).

Figure 177: Display subpanel windows

4: A colour code is associated to each window. For the different views, use the drop-down menus to
select the salvo, the gate and the type of view.

5: Press to delete the current tab.

2.2 Available views

The available views depend from the configuration that is being used.
Table 4.3 summarises the views that are currently available, for all the components, trajectories and
inspection techniques available on CAPTURE:
Trajectory Phased Array TFM UT TOFD
Views
B-Scan Mec.

B-Scan Mec.
EchoDyn Z
EchoDyn X
Side View

Side View
Top View
Map X-Y

Map R-
A-Scan

A-Scan

A-Scan

A-Scan
C-Scan

D-Scan

C-Scan

D-Scan

C-Scan
E-Scan
S-Scan

T-Scan
1D

2D

3D

3D

3D

Component
X X X X X X X X X X X X X X X X X X X X
Plane
X X X X X X X X X X X X X X X X

X X X X X X X X X X X X
Fillet Weld
X X X X X X X X X X X

X X X X X X X X X X X X X X X X X X X X
Cylindrical (Circular Orientation)
X X X X X X X X X X X X X X X X

X X X X X X X X X X X X X X X X X X X X
Cylindrical (Longitudinal Orientation)
X X X X X X X X X X X X X X X X

Nozzle (Main Component) X X X X X X X X X X

Nozzle (Secondary Component) X X X X X X X X X X

Table 4.3: Available views

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Only one 3D view can be defined for the whole inspection.

To simplify the reading of the data from the different views, the scales are codified by colours to be
easier to read the physical values that encompasses each one of the views, according the
following convention:

Amplitude [dB] or [%]

Time of flight [µs]
True-Depth [mm]
Scan position [mm]
Index (Incremental) position [mm]
Shots [°] /Sequences [Elts]

In the following paragraphs we will describe shortly each one of the views.

2.3 A-Scan view

The A-Scan view is the basic representation of any ultrasonic signal. This view represents the
ultrasonic data, where the Y-Axis is Amplitude of the ultrasonic signal [% FSH] or [dB], and
the X-axis is the TOF [µs] or [mm] or the True-Depth [mm];
The Figure 15 illustrate this data representation, where the X-axis is codified as True-Depth, since this
axis is coloured as dark blue.

Figure 178: A-Scan view

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2.4 Mechanical B-Scan view

The Mechanical B-Scan view is a stack of A-Scan views that is used to represent the ultrasonic data
from the conventional UT techniques as well from the TOFD technique. The colour scheme of
the view provides information from the signal amplitude, the Y-Axis the TOF [µs], and the X-
axis the Mechanical Scan position [mm];

Figure 179: Mechanical B-Scan view

2.5 E-Scan / S-Scan view

The E-Scan (Electronic Scanning) and the S-Scan (Sectorial Scanning) are the basic views to
represent the ultrasonic data from the Phased Array technique. This view is an angle
corrected view, where the ultrasonic signals are represented considering the refraction angles
for each one of the shots/sequences.
The colour scheme of the view provides information from the signal amplitude, the Y-Axis represents
the True-Depth [mm], and the X-axis represent the Index position [mm];

Figure 180: S-Scan view

Although the data representation is similar, normally it is designated as E-Scan for the Linear Scan
inspection, and S-Scan for the Sectorial Scan inspection.

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2.6 C-Scan

The C-Scan view represents the uncorrected view of the ultrasonic data. The C-Scan view displays
always the data from one specific Gate and consider the detection mode of the Gate (First
Echo, Max Echo, etc).
The colour scheme of the view provides either the information from the signal amplitude or the time of
flight or the depth. The Y-Axis represents the Angle or the Sequence, and the X-axis
represent the Mechanical Scan position [mm];

Figure 181: C-Scan view

2.7 D-Scan

The D-Scan view represents the uncorrected view of the ultrasonic data. For each selected Angle or
Sequence, one D-Scan view is available.
The colour scheme of the view provides information from the signal amplitude, the Y-Axis represents
the Depth [mm] or the Time of Flight [µs], and the X-axis represent the Mechanical Scan
position [mm];

Figure 182: D-Scan view

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2.8 Top view

The Top-View represents the corrected top projection of the ultrasonic data.
The colour scheme of the view provides either the information from the signal amplitude or the time of
flight or the depth. The view represents a true X-Y projection over specimen [mm];
This view projects the ultrasonic data directly over the component top surface in a corrected projection
that consider the different parameters as Mechanical Position, Index Offset, Probe Orientation,
Refracted Angles, Skew Angles and Surface curvature.

Figure 183: Top view

This view uses the raw A-Scan data for the reconstruction, so it might be heavy in terms of
computational processing. By this reason, we recommend to use this view only with Capture
PC version.

2.9 Side view

The Side-View represents the corrected side projection of the ultrasonic data.
The colour scheme of the view provides information from the signal amplitude. The view represents a
true X-Z projection (when the scanning is done along X) or Y-Z projection (when the
scanning is done along Y) over specimen [mm];
This view projects the ultrasonic data directly over the component side surface in a corrected
projection that consider the different parameters as Mechanical Position, Index Offset, Probe
Orientation, Refracted Angles, Skew Angles and Surface curvature.

Figure 184: Side view

This view uses the raw A-Scan data for the reconstruction, so it might be heavy in terms of
computational processing. By this reason, we recommend to use this view only with Capture
PC version.

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2.10 Map X-Y / Map R-

The Map X-Y / Map R- view represents the uncorrected view of the ultrasonic data. This view is used
when the acquisition uses one primary axis as the Mechanical Scan axis, and a secondary
axis as the Increment or Index axis. This type of acquisition is used for example in the butt-
weld inspection when the full coverage is achieved from 2 or more index positions, or for the
weld nozzle inspection when the scanner has 3 degrees of freedom. For those cases the C-
Scan is not suitable to display the ultrasonic data and it is replaced by these views.
The Map X-Y / Map R- views display always the data from one specific Gate and consider the
detection mode of the Gate (First Echo, Max Echo, etc). The view Map X-Y / Map R- (at fixed
shot) displays the ultrasonic data for the selected Angle or Sequence.
The colour scheme of the view provides either the information from the signal amplitude or the time of
flight or the depth. The Y-Axis represents the Index position, and the X-axis represent the
Mechanical Scan position [mm];

Figure 185: Map R- view

2.11 3-D view

The 3-D view displays the E-Scan (Electronic Scanning) or the S-Scan (Sectorial Scanning)
superimposed over the 3-D view of the component.

Figure 186: 3-D view

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PART 5.
Inspection

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PART 5. INSPECTION
Once all the application parameters have been set, CAPTURE allows the inspection to be performed.
The inspection panel is divided into 3 mains zones (Figure 187).

Figure 187: Inspection panel

1: Top banner setup.

2: Ultrasonic data visualization.
3: Inspection management.

1. Top banner setup

Top banner allows visualization of UT parameters and gain adjustment or indicators setup (accessible
by pressing ).

1.1 UT parameters

The default banner shows the current UT settings: delayed time-base sweep (delay), time base range
(range) and Gain. These values have been set in the Gate or Amplitude calibration panel and
cannot be modified. Nevertheless, it is possible to add or subtract gain before launching the
inspection using the +/- box (Figure 188).

Figure 188: Default top banner

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The UT parameters displayed are linked to the current salvo: select another salvo to update the UT
parameters.

1.2 Indicator measurement

Press to switch the top banner display and visualize indicator measurement (Figure 189).

Figure 189: Indicator measurement

This measuring tool allows to access the live values for amplitude, time-of-flight or true depth.
Press on any of the four live gates values to change the type and source of the indicator. A pop-up
menu shows the parameters to be set (Figure 190).

Figure 190: Indicator parameters

Select in the drop-down menu the salvo and the gate for the measurement.
Press the drop-down menu to select the value to be displayed (Amplitude, Time-of-flight or Depth).
If Amplitude value is set, measurement can be displayed in dB or % with the associated drop down.
When Current shot box is unselected, the value displayed by the indicator is the gate measurement
according to the type of gate setup (first peak, first threshold…), for all sequences (in case of
linear scan) or all shots (in case of sector scan).
When Current shot box is checked, the value displayed by the indicator is the gate measurement
according to the type of gate setup (first peak, first threshold…), for the current selected shot
or sequence (selected from the S-Scan or E-Scan view).
For conventional or TOFD configurations, this parameter is not available. Information mentioned in the
indicator box are detailed below (Figure 191).

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INSPECTION CAPTURE manual #160

Figure 191: Indicator information

For matrix configurations, the skew information is displayed in the bottom right of each indicator box
(Figure 192).

Figure 192: Indicator information for matrix configuration with skew

Regardless of whether or not the Current shot box is checked, the measurement always considers all
the available skews.

2. Visualization of ultrasonic data

This zone is dedicated to the visualization of ultrasonic data. Layouts are set in the Configuration
panel (Part 4 Section 2.1).

Figure 193: Visualization of ultrasonic data

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For each view, generic and specific tools are available from the toolbar buttons. The axis colour code
gives also information to the operator. All these features are presented in the Part 6 Section 4.

3. Inspection management
The Bottom banner is dedicated to data acquisition and management (Figure 194).

4 1 2 3

Figure 194: Inspection management banner (1/2)

1: Press to start the inspection or to freeze the screen.

2: Press to reset the encoder value. The current encoder position is displayed in the adjacent box.

3: Press to go back to the Configuration panel (Part 4).

4: Press to access Cursors settings or Offsets settings. This access is also managed by
pressing the physical button MODE on the unit front panel.

Once started, and buttons turn to and buttons (Figure 195) and some actions and
buttons are disabled until the end of the inspection.

Figure 195: Inspection management banner (2/2)

When the inspection is completed or stopped by pressing the Square, the following is displayed:

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INSPECTION CAPTURE manual #162

If Save or Save & Analysis is selected, a pop up asks to save the inspection file (Figure 196). Name
the inspection file and select the destination folder (located in the Inspection tab in the Home
page) then press OK to validate.

Figure 196: Saving data

If the inspection is not recorded, it is not possible to analyse data.

Once the file is saved without Analysis, the following window appears (Figure 197) allowing to:

• Go back to the Home page

• Go back to Equipment

• Go back to Settings

• Go back to Configuration
• Cancel and remain in the Inspection Panel

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Figure 197: Select the action after saving data

In the Inspection Panel, by pressing Scan, it gives access to Cursors settings and Offset settings.

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INSPECTION CAPTURE manual #164

1. Cursor settings:
1 cursor

2 cursors

3 cursors

2. Offset settings:

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PART 6.
Data analysis

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PART 6. DATA ANALYSIS

The data analysis window is quite similar to the inspection window with the exception of the banner at
the bottom of the (Figure 198). We can add and remove gain in analysis, and also change the
Dynamic range from 100%, 200%, 400% or 800%.

3 1

Figure 198: Data analysis overview

The various analysis tools are:

• Indicators
• Analysis boxes

• Specific tools associated to the various views (colour scales, cursors, rebound…)
• Inspection report

1. Layout edition

By clicking on this icon , it is possible to edit and modify the layout, in the same way as it is
described in the PART 4 2.1.
1

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2. Indicators
The indicators presented in Part 5 Section 1.2 are also available in the Data Analysis. It works similarly
except that instead of returning information about the live signals, they return information about
the recorded signals.

3. Analysis boxes

3.1 Overview

Each indication can be measured in amplitude, length and height thanks to the analysis boxes.

These analysis files are compatible with ENLIGHT and CIVA Analysis for advanced analysis
tools, signal processing.

3.2 Add an indication

Pressing the tool allows to create an analysis box (Figure 199).

Figure 199: Tool tab

Then drag the analysis box surrounding the indication in a B-scan or C-scan view (Figure 200). It is not
possible to define an analysis box in an A-scan view.

Figure 200: Zone selection in C-scan

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Figure 201: Indication accuracy

Press the icon, at the left bottom of the screen, to list the indications (Figure 201). For each
indication in the list, a square with or without an eye is present at the end of the line. This field
allows activating or deactivating the display of the analysis box in the various views.

Press the icon, at the right bottom of the pop-up window, to add data about the selected indication
or on the to remove the indication from the list.

Figure 202: Indication settings

Select the type of indication in the Tag part of the pop-up window (Figure 202). It is possible to add
remarks or to associate a picture by pressing .

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Figure 203: Indications pictures

The picture can be loaded from the screen captures done with the unit (Figure 203) or they can be
imported from a USB flash drive by pressing the button (Part 1 section 6)

The data in the indication list are included in the inspection report by default.

Press OK to go back to the analysis panel.

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4. View tools

4.1 Toolbar buttons

Table 4 lists all the buttons accessible in the CAPTURE from the views toolbar as well as their
associated availability, with the exception of button available in the 3D views which are
explained in PART 3 Section 1.1.9.

Button Button operation View availability Configuration availability

Change the amplitude

A-Scan For all configurations
scale in %

Change the amplitude

A-Scan For all configurations
scale in dB

Not available for TOFD in

Display the rectified RF
A-Scan Inspection and
signal
Analysis

Not available for TOFD in

Display the RF signal A-Scan Inspection and
Analysis

Not available for TOFD in

Display the envelope signal A-Scan Inspection and
Analysis

Deactivate persistence A-Scan Not in Analysis

Activate persistence A-Scan Not in Analysis

Erase persistence A-Scan Not in Analysis

Activate Zoom In All views For all configurations

Activate Zoom Out All views For all configurations

A-Scan, S-Scan and E-

For all configurations except
Display/Hide the gate Scan in
TFM
inspection only

Activate Full Screen All views For all configurations

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Deactivate Full Screen All views For all configurations

Activate the simple or

double or triple All views in inspection
For all configurations
cursors deactivate and analysis
both

Activate or deactivate the S-Scan and E-Scan in

For PA configurations
rebound analysis

Activate or deactivate the

S-Scan and E-Scan For PA configurations
mirror view

Display or hide the TCG

A-scan If TCG has been computed
curve

Display or hide the EFBH

calculation (linked
A-scan If AVG has been computed
to the cursor
position)

Display amplitude, time-of-

flight or depth C-Scan For all configurations
colour scale

E-Scan, S-Scan and C- For all configurations except

Adjust the colour scale
Scan TOFD

A-Scan and mechanical TOFD if PCS calibration has

Change scale (µs or mm)
B-Scan been achieved

Table 4: Available tools for all views

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4.2 Axis colour description

Table 5 summarizes the various colour codes available in CAPTURE and their signification.

Axis colour Information Views concerned

Green Scan axis A-Scan, B-Scan

Light Blue Time-of-flight and travel path A-Scan and D-Scan

Dark Blue True depth A-Scan, B-Scan and D-Scan

Grey Amplitude A-Scan, EchoDyn

Red X position, Increment B-Scan, Corrected C-Scan

Purple Mechanical scanning and time C-Scan and mechanical B-Scan

Shot # (sectorial scan) and

Orange Sequence # (linear C-Scan
scanning)

Red Increment C-Scan 2 axis

Table 5: Axis colour code

5. TOFD Analysis
For the salvos that contains TOFD data; a specific menu is available. To access this menu, press the
button “Mode” and select the TOFD option as shown in – TOFD ToolsFigure 204.

Figure 204 – TOFD Tools

The basic TOFD calibration tool allows to recalculate the wedge delay, to match the starting depth value
with the lateral wave signal. To perform the calibration, adjust the gate over the lateral wave
using either the A-Scan or the Mechanical B-Scan view (Start, Width and Threshold), and select
the A-Scan data line that will be used as the reference signal for the calibration. The Figure 205
illustrates the procedure:

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Figure 205 –A-Scan selection as refence for the Wedge Delay calibration

The detection mode and the phase of the signal can be adjusted accessing the icon tools. We
recommend using the same detection mode and phase that were used during the PCS
calibration. Figure 206 illustrates the TOFD settings menu:

Figure 206 – TOFD Settings

After adjusting the gate settings, to perform the calibration press the button ON, and if the result is
satisfactory press OK to accept the changes. The light blue scales (time of flight) became dark
blue and the scale now displays the depth units. Moreover, the TOFD parabolic cursors are
displayed, allowing to dimension properly the indications. The Figure 207 illustrates the result:

Figure 207 – TOFD Calibration Mode = Wedge Delay (WD)

In addition to WD-Wedge Delay, the software allows two other calibration modes:
- WD + Lateral Synchro
- WD + Lateral Synchro + Lateral Wave Removal

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DATA ANALYSIS CAPTURE manual #174

The first option proceeds to align all the A-Scan data, using the detection peak from the lateral wave for
all the A-Scans. To activate this option, change the calibration mode from Wedge Delay to WD
+ Lateral Synchro. It is advisable to carefully adjust the gate parameters as the Start, Width
and Threshold to achieve good synchronization results. The Figure 208 illustrates the result:

Figure 208 TOFD Calibration Mode = Wedge Delay + Lateral Synchro (WD+LS)

After the calibration, the TOFD hyperbolic cursors are displayed. The shape of this cursors depends of
the scannnig type Non-Parallel or Paralell, that were previously defined in the menu Motion.
Note: Non-Parallel Scan = Along X
Parallel Scan = Along Y

This cursors are normally used to dimension the flaw length and height and shown in Figure 209 below:

Figure 209 – Length and Height measuring using the parabolic cursors

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6. Inspection report
Press (Figure 210) to open the inspection report (Figure 211).

Figure 210: Open the inspection report

Figure 211: Inspection report

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On the left hand-size, one can select or unselect the elements to be put in the report.
Scroll the screen to check the content of the report (Figure 212).

Figure 212: Report preview

Press to save and export the inspection report to a USB flash drive (Figure 213).

Figure 213: Saving report

Press OK to save the file to a .pdf format.

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 CAPTURE manual #177

LIST OF ABBREVIATIONS

DGS (AVG): distance gain size

EFBH: equivalent flat bottom hole

ERS: Equivalent reflector size

FMC: full matrix capture

FSH: full screen height

LW: longitudinal wave

NA: not applicable

NDT: non-destructive testing

PA: phased array

PCS: probe centre spacing

PE: pulse-echo

PRF: pulse repetition frequency

RF: radio frequency

TCG: time-corrected gain

TFM: total focusing method

TOFD: time-of-flight diffraction

SW/TW: shear wave / transverse wave

UT: ultrasonic testing

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 CAPTURE manual #178

LIST OF FIGURES
Figure 1: GEKKO connectors overview 10
Figure 2: GEKKO front-panel buttons 11
Figure 3: MANTIS front-panel buttons 12
Figure 4: MANTIS connectors overview 12
Figure 5: Home panel 13
Figure 6: Navigation arrows 14
Figure 7: Edit button 15
Figure 8: Backward/Forward buttons 15
Figure 9: Drop-down list 16
Figure 10: Double option button 16
Figure 11: Editable blank box 16
Figure 12: On-screen keyboard 16
Figure 13: Digital scroll wheel 17
Figure 14: Invalid value 17
Figure 15: General settings 19
Figure 16: Wizards “Conventional UT” 21
Figure 17: Wizards “Standard phased array” 22
Figure 18: Wizards “Total Focusing Method (TFM)” 23
Figure 19: Wizards “Multi-groups techniques” 24
Figure 20: Application creation pop-up 25
Figure 21: Open an application file 26
Figure 22: Applications/Inspection files buttons 26
Figure 23: Import files 28
Figure 24: File-import pop-up 28
Figure 25: File selection 29
Figure 26: Export files 30
Figure 27: Screenshot manager 31
Figure 28: Application recovery 32
Figure 29: General overview of the equipment panel 34
Figure 30: Specimen definition 35
Figure 31: Cylindrical geometry 36
Figure 32: Nozzle selection 37
Figure 33: Fillet weld geometry 38
Figure 34: Chamfer and back strip setting 39

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Figure 35: Cylinder with weld 39

Figure 36: Plate with weld 40
Figure 37: Plate without weld 40
Figure 38: Cylinder with circumferential weld 41
Figure 39: Cylinder with longitudinal weld 41
Figure 40: Cylinder without weld 42
Figure 41: Symmetrical or asymmetrical weld 42
Figure 42: Weld bevel profile 43
Figure 43: Import dxf file 44
Figure 44: Delete dxf file 45
Figure 45: After dxf import 45
Figure 46: dxf image with sectorial scan and focal laws 46
Figure 47: Specimen panel after dxf import and without adjusting 47
Figure 48: Picture of a stainless-steel block 47
Figure 49: 3D view of the stainless-steel block in CAPTURE 48
Figure 50: Material 49
Figure 51: Velocity calibration 50
Figure 52: Materials list 51
Figure 53: Save the specimen 52
Figure 54: Name the specimen 52
Figure 55: Open the specimen library 53
Figure 56: Specimen library 54
Figure 57: Edit probe 55
Figure 58: Probe definition 55
Figure 59: Dicing 57
Figure 60: Matrix probe 58
Figure 61 : Matrix probe numbering 59
Figure 62: Amplitude balancing 60
Figure 63: Amplitude balancing instructions 60
Figure 64: Conventional circular probe 61
Figure 65: Conventional rectangular probe 62
Figure 66: TOFD setup 63
Figure 67: Dual probe configuration (DUAL) 64
Figure 68: Dicing (Dual linear array) 64
Figure 69: Dual linear probe numbering 65

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Figure 70: Dual Matrix probe 66

Figure 71: Dual Matrix probe numbering 67
Figure 72: Conventional Dual circular probe 68
Figure 73: Conventional Dual rectangular probe 68
Figure 74: Wedge definition 69
Figure 75: Angled wedge dimension 70
Figure 76: L0 wedge dimension 70
Figure 77: L0 wedge 71
Figure 78: Wedge parameters for Dual probes 71
Figure 79: Angled wedge for Dual probes 72
Figure 80: L0 wedge for Dual probes 72
Figure 81: Wedge velocity assistant 73
Figure 82: Wedge library 74
Figure 83: References 74
Figure 84: Coordinate system reference without a wedge/ with a L0 wedge 75
Figure 85: Phased-array wedges compatible with the angle/height assistant 76
Figure 86: Angle / Height assistant 76
Figure 87: Conventional probes reference panel 77
Figure 88: TOFD reference panel 78
Figure 89: Zero calibration assistant 79
Figure 90: Multi-probe configuration 80
Figure 91: Save/load a probe 81
Figure 92: Probe library 81
Figure 93: Edit Scanner 82
Figure 94: Scanner definition 83
Figure 95: Encoder calibration assistant 84
Figure 96: Phased-array settings 86
Figure 97: Focal laws (Configuration Panel) 87
Figure 98: Beam display mode 88
Figure 99: Ray tracing in the 3D view – Mirror views 89
Figure 100: Ray tracing in the 3D view – folded views 89
Figure 101: Sectorial scan 89
Figure 102: Custom aperture definition 90
Figure 103: Linear scan 91
Figure 104: Compound scan 92

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Figure 105: CIVA model - Example 93

Figure 106: CIVA laws import 94
Figure 107: Axis offset (Plane, Cylindrical & Fillet Weld) 95
Figure 108: Axis offset (Nozzle) 95
Figure 109: Orientation (Plane, Cylindrical & Fillet Weld) 96
Figure 110: True depth Focusing 97
Figure 111: Sound path Focusing (Focus sound path 50mm – ASTM E2491 Block) 98
Figure 112: Projection Focusing (V bevel weld inspection) 98
Figure 113: Projection Focusing (V bevel weld inspection) 99
Figure 114: S-scan matrix probe 99
Figure 115: Edit gates 101
Figure 116: Gates 101
Figure 117: A-Scan zoom 102
Figure 118: Gate settings 103
Figure 119: Detection mode 103
Figure 120: Amplitude calibration settings 105
Figure 121: Basic TCG recording 106
Figure 122: Basic TCG computation 107
Figure 123: Basic TCG result 107
Figure 124: Basic TCG – manual TCG points 108
Figure 125: TCG calibration – Open and Save features 108
Figure 126: Advanced TCG signal recording 109
Figure 127: Advanced TCG Computation 110
Figure 128: Advanced TCG signal recording (TCG Verification) 111
Figure 129: Advanced TCG Computation (TCG Verification) 111
Figure 130: Advanced TCG Verification 112
Figure 131: Advanced TCG calibration – Focal Laws Compatibility during TCG load 112
Figure 132: AVG calibration panel 113
Figure 133: TOFD Settings panel 114
Figure 134: TOFD calibration panel 115
Figure 135: Gate settings detection 116
Figure 136: Gate threshold type 116
Figure 137: TOFD Calibration (Lateral wave, Backwall echo and thickness) 117
Figure 138: TOFD Calibration (Lateral wave and PCS) 118
Figure 139: TOFD Calibration (Backwall echo, PCS and Thickness) 119

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Figure 140: Edit gates in TOFD 120

Figure 141: Gate settings in TOFD 120
Figure 142: Amplitude calibration settings in TOFD 121
Figure 143: Pulse-Echo settings panel 122
Figure 144: Gate settings in Pulse Echo 122
Figure 145: DAC Display vs TCG Display 123
Figure 146: Amplitude calibration for Pulse Echo 123
Figure 147: Transmission and reception by the first element of the probe 124
Figure 148: Transmission on i th element and reception on N th element of the probe 124
Figure 149: FMC matrix 125
Figure 150: TFM Technique 125
Figure 151: TFM settings panel 126
Figure 152: TFM settings 126
Figure 153: Location of the zone reference 127
Figure 154: TFM Options 128
Figure 155: Example of an inspection using TFM 128
Figure 156: Basic TCG recording (TFM mode) 130
Figure 157: Basic TCG computation (TFM mode) 130
Figure 158: Basic TCG result (TFM mode) 131
Figure 159: Advanced TCG signal recording (TFM mode) 132
Figure 160: Advanced TCG Computation (TFM mode) 133
Figure 161: Advanced TCG signal recording (TCG Verification) 133
Figure 162: Advanced TCG Verification (TFM mode) 134
Figure 163: Multi-salvo setup 136
Figure 164: Configuration panel overview 138
Figure 165: References 139
Figure 166: References (Scan direction along X) 140
Figure 167: References (Scan direction along Y) 141
Figure 168: One-axis application (Weld application without overlapping) 142
Figure 169: One-axis application (Corrosion mapping with manual triggered overlapping) 143
Figure 170: One-axis application (Weld application with manual triggered overlapping) 144
Figure 171: Weld coverage for scan with index overlapping (Thickness: 25mm) 144
Figure 172: Two-axis application (Corrosion mapping with encoder triggered overlapping) 145
Figure 173: Three-axis application (Corrosion map application) 146
Figure 174: Three-axis application (Nozzle weld inspection) 148

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Figure 175: PRF edition 150

Figure 176: Display subpanel 150
Figure 177: Display subpanel windows 151
Figure 178: A-Scan view 152
Figure 179: Mechanical B-Scan view 153
Figure 180: S-Scan view 153
Figure 181: C-Scan view 154
Figure 182: D-Scan view 154
Figure 183: Top view 155
Figure 184: Side view 155
Figure 185: Map R- view 156
Figure 186: 3-D view 156
Figure 187: Inspection panel 158
Figure 188: Default top banner 158
Figure 189: Indicator measurement 159
Figure 190: Indicator parameters 159
Figure 191: Indicator information 160
Figure 192: Indicator information for matrix configuration with skew 160
Figure 193: Visualization of ultrasonic data 160
Figure 194: Inspection management banner (1/2) 161
Figure 195: Inspection management banner (2/2) 161
Figure 196: Saving data 162
Figure 197: Select the action after saving data 163
Figure 198: Data analysis overview 166
Figure 199: Tool tab 167
Figure 200: Zone selection in C-scan 167
Figure 201: Indication accuracy 168
Figure 202: Indication settings 168
Figure 203: Indications pictures 169
Figure 204 – TOFD Tools 172
Figure 205 –A-Scan selection as refence for the Wedge Delay calibration 173
Figure 206 – TOFD Settings 173
Figure 207 – TOFD Calibration Mode = Wedge Delay (WD) 173
Figure 208 TOFD Calibration Mode = Wedge Delay + Lateral Synchro (WD+LS) 174
Figure 209 – Length and Height measuring using the parabolic cursors 174

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Figure 210: Open the inspection report 175

Figure 211: Inspection report 175
Figure 212: Report preview 176
Figure 213: Saving report 176

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 CAPTURE manual #185

LIST OF TABLES

Table 1: 3D view tools 100

Table 2: Multi-salvo combinations 135
Table 4.3: Available views 151
Table 4: Available tools for all views 171
Table 5: Axis colour code 172

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