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Smith Chart: © Copr. 1949-1998 Hewlett-Packard Co

Hp journal del luglio 1979. Viene presentato il mitico HP8505A
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© © All Rights Reserved
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0% found this document useful (0 votes)
74 views16 pages

Smith Chart: © Copr. 1949-1998 Hewlett-Packard Co

Hp journal del luglio 1979. Viene presentato il mitico HP8505A
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 16

JUIY 1976

SMITH CHART

4 5

058

© Copr. 1949-1998 Hewlett-Packard Co.


A Direct-Reading Network Analyzer for
the 500-kHz-to-1.3-GHz Frequency Range
B e s i d e s m e a surement s of gain, los s , p h a se sh ift a n d
reflection coefficient, this new all-in-one measuring
set makes direct measurements of equivalent electrical
length, group delay, and deviation from linear phase shift.

by Hugo Vifian

CHARACTERIZING CIRCUITS in the frequency source, a three-input tracking receiver, a CRT dis
domain is a fundamental activity in both the play, a frequency counter, and an autoranging volt
design and the testing of electronic circuits. Only by meter that gives direct digital readout of gain/loss,
knowing the gain/phase-vs-frequency characteristics phase, deviation from linear phase, and group delay.
and the input-output impedances of each circuit can An internal digital processor controls the instrument's
one assemble a complete device capable of meeting operation, simplifying the way the instrument operates
performance objectives. and enhancing the clarity of the data presentation.
Over the past ten years there has been a dramatic The three inputs, all of which have 100-dB dy
growth in the use of network analyzers to characterize namic range, enable simultaneous display of both the
component and circuit performance. By providing transmission and reflection coefficients of a device or
plots of gain or loss, phase shift, and reflection co
efficient versus frequency, these instruments have
given electronic engineers practical insight into Cover: The subject of this
circuit and component behavior, leading to more pre month's issue, Model 8505 A
cise designs. The more precise designs have led to Network Analyzer presents
tighter system performance specifications — for ex swept-frequency measure
ample, closer packing of communications channels — ments in either Cartesian or
and this in turn has led to a demand for even better polar coordinates on its CRT
measuring instruments. display and its digital dis
Such a new instrument is the Model 8505A Net plays give the frequency,
work Analyzer (Fig. 1). Intended for use in the RF, magnitude, phase, and de
VHF and lower UHF frequency ranges, it makes lay of any point selected on the CRT trace by a
traditional measurements of driving point and trans movable marker.
fer characteristics with a greater frequency range (500
kHz — 1.3 GHz), greater dynamic range (100 dB), bet In this Issue:
ter resolution and higher accuracy than its prede A Direct-Reading Network Analyzer
cessors, and it does this with considerably more con for the 500-kHz-to- 1.3-GHz Frequency
venience. It also makes direct measurements of equiv Range, by Hugo Vifian page 2
alent electrical line length, of deviations from linear
phase and of group delay with much greater facility Processing Wide-Range Network
than has hitherto been possible. With these capabil Analyzer Signals for Analog and Digi
ities, the new network analyzer makes it possible tal Display, by William S. Lawson and
to characterize a network quickly with a minimum D a v i d D . S h a r r i t p a g e 8
of ambiguity. A Precision RF Source and Down-
Converter for the Model 8505A Net
All-in-One Test System work Analyzer, by Rolf Dalichow and
The new network analyzer is a complete measuring D a n i e l R . H a r k i n s p a g e 1 2
system that includes a precision swept-frequency

Printed in U S A ©Hewlett-Packard Company. 1976

© Copr. 1949-1998 Hewlett-Packard Co.


Fig. 1. Model 8505 A Network
Analyzer is shown here measuring
the transmission and reflection
coefficients of a 50ÃI filter using
the Model 8502A Transmission/
Reflection Test Set. With its digital
readouts, in addition to a dual-
mode CRT display, this new instru
ment can characterize circuits and
components in the 0.5 - 1300-MHz
frequency range more quickly,
more accurately, and with greater
convenience and less ambiguity
than its predecessors.

its gain and phase responses. The display can be electrical length by substitution. The delay line, a
either in rectangular or polar coordinates (Fig. 2) and new development, is simulated electronically, giving
both a rectangular and a polar plot may be displayed calibrated, finger-tip control of line length up to the
at the same time. Up to five markers can be placed equivalent of ±1500 meters (it can also add negative
anywhere on the display and the frequency and amp delay), a much greater length than would be possible
litude or phase of the signal at any point designated with a mechanical line stretcher. It has the added
by a marker can be displayed digitally (Fig. 3), giving advantages of not contributing mismatch errors
a measurement resolution of 0.01 dB in amplitude, or attenuation.
0.1° in phase, and 100 Hz in frequency, an order of Because the line has a constant time-delay-versus-
magnitude better resolution than that obtainable frequency characteristic at any one delay setting, the
from a CRT display alone. phase shift through the line varies linearly with fre
quency as it does through a coaxial cable. During
Electronic Delay Line measurements of phase shift, the line may be inserted
A continuously-variable delay line may be inserted to subtract a phase shift equivalent to a device's elec
in the measurement channel to match the electrical trical length so the display will show the deviations
length of either the A or B input to the reference. It from linear phase shift caused by the device as a func
also enables the measurement of a device's equivalent tion of frequency (Fig. 4). Interest in this measure-

Fig. 2. Swept-frequency mea


surements may be displayed in
either cartesian or polar coor
dinates. Transparent Smith-chart
overlays, as shown in the photo of
a filter input impedance at right,
are provided for direct readout of
impedance with the polar dis
plays. Overlays with logarithmic
scales are also provided for logar
ithmic sweeps, as in the photo at
left showing the response of a
65-MHz high-pass filter over a
100-dB dynamic range, swept
from 1 to 1000 MHz.

© Copr. 1949-1998 Hewlett-Packard Co.


the instrument remotely. Each front-panel control is
labelled with the address code used by a calculator
to set that particular control, so there is no need to
memorize codes. For example, when programming
the instrument to sweep its full frequency range, the
MODE switch is set to the LIN FULL position. The pro
gram code for that setting is M2, where M stands for
MODE, as indicated on the front panel, and 2 stands
for the second position of the switch.
The instrument, however, provides an even easier
way to program control settings, a result of the instru
Fig. 3. Digital readouts give three-digit resolution measure
ment's digital architecture. This is the "Learn" mode.
ments of frequency, gain/loss, phase, or delay at the point in After the appropriate part of the instrument is address
the response curve indicated by the positive-going marker. ed (source or receiver), the single keystroke com
mand "L" on the controller/calculator will cause the
ment has been growing in recent years because of the instrument to "read" the front-panel switch settings
necessity of preserving phase relationships in multi and make the readings available to the interface bus.
plexed signals and preserving the shape of com Without bothering with control program codes, the
plex waveforms. user may set up test sequences on the front-panel
The instrument can also directly display group controls, store them (e.g. on tape), and then recall
delay, a plot whose magnitude corresponds to the them when needed.
slope of the phase response curve (Fig. 4). A new tech Factory-assembled automatic network analyzers
nique for measuring group delay directly, described that include the Model 8505A, a 9830A Calculator
on page 11, makes it possible to resolve variations in with printer, an s-parameter test set, and appropriate
delay with a resolution of 1 ns/div. cables and fixtures are available as Model 8507A
(Fig. 5).
Automated Operation
Accuracy Enhancement
Designed to work with the HP Interface Bus (HP's One of the most important applications of calcu
implementation of IEEE Standard 488-1975), the new lator- or computer-controlled network analyzers is the
network analyzer can work in an automatic system for removal of system errors from the measurement
setting up measurements, reading data, and correcting data. These errors arise from non-ideal test fixtures,
for errors. When equipped with the HP-IB option, the mismatches, and other instrumentation problems.
new analyzer can be incorporated into an automatic For example, the input impedance of a device in
system simply by connecting it to a controller with an environmental chamber is to be measured at the
the appropriate cables. end of a long cable. As shown in Fig. 6, an imperfect
In most cases, the controller will be a calculator. cable severely influences measurement results, lead
Considerable attention was paid to defining pro ing to results that are meaningless. An accuracy-en
gramming codes that would make it easy for a user hancement program supplied with the calculator-
who is not experienced in programming to control controlled network analyzer can correct the data, as

+ 9 0 _

I
I

600 MHz + 16 MHz

Fig. 4. Dual trace display shows swept measurement of Fig. 5. Factory-assembled and tested automatic systems
group delay (lower trace) and deviation from linear phase designed around the Model 8505/4 Network Analyzer are
shift (upper trace). Group delay is defined as the negative furnished with example programs and programs for accuracy
rate of change of the phase deviation curve. enhancement, system verification, and diagnostic testing.

© Copr. 1949-1998 Hewlett-Packard Co.


Instrument Organization
A simplified block diagram of the network analyzer
is shown in Fig. 7. A sweep-frequency test signal any
=2. a
where within a 0.5-1300 MHz range is generated by
mixing a YIG-tuned 4. 2105-5. 5100-GHz sweep signal
with the output of a fixed 4.2100-GHz oscillator.
A second sweep-frequency signal, offset from the
RF output by 100 kHz, is generated by mixing the
HB YIG-tuned signal with the output of a 4.2099-GHz
oscillator. This signal is used as a local-oscillator
(LO) signal to convert the test signals to 100-kHz IF
signals for use in the signal-processing section of
the instrument.
The test-signal frequency is measured at any point
si nnz/piv
selected by a marker during the sweep by a counter
(the counter actually measures the LO signal and then
Fig. 6. Accuracy enhancement program removes cable corrects the reading for the offset). The counter uses
errors from upper trace to give accurate display of device a technique that measures the frequency at a single
gain (lower trace). point indicated by a marker without stopping the
sweep (see box, next page).
shown by the corrected plot in Fig. 6. First, calibra The magnitude and phase information impressed
tion measurements are made with the test device re on the test signals by the device under test is trans
placed by a short-circuit termination, then an open- lated through the down-converters and detected by
circuit termination, and finally a 50Ã1 (or 75Ã1) termin the analyzer's amplitude and phase detectors. This
ation. With that information stored, the calculator information is presented on the CRT display either in
computes the error terms and corrects the data. cartesian coordinates (Bode plot) or polar coordinates
(Nyquist plot). A sample-and-hold circuit retains the

.5-1300 MHz Signal Processor XY-Display

100 kHz

YIG-Oscillator
4.2105-
5.5100 GHz

Sweep Generator
(Start/Stop
Control)

Fig. 7. Organization of the Model 8505/4 Network Analyzer.

© Copr. 1949-1998 Hewlett-Packard Co.


displayed magnitude or phase level at any selected
Hugo Vifian
point in the sweep for measurement and display by .A Swiss native, Hugo Vifian at
the built-in digital voltmeter. tended college on a scholarship
Details of the operation of all these circuits are de after working eight years in the
scribed in the articles that follow. production, design and test of
telecommunications equipment,
Acknowledgments learning a Diplom Ingenieur from
Many talented people, whom the author would like the Swiss Federal Institute of
Technology in 1967. He later
to thank in the name of the design team, made signifi j earned a PhD from the same
cant contributions to the Model 8505A Network Ana school (1973) with Stanford Uni-
lyzer. Special thanks go to Dave Eng and Roy Church versity coordinating his thesis
for the industrial design, and to Doug Rytting, Kit work. He joined HP in 1969, was
principal designer for the 8755A
Keiter and Cyril Yansouni for their leadership, sup
Frequency Response Test Set
port and encouragement during the development of land is now program manager
the Model 8505A.5? for the 8505A Network Analyzer instrument family. Spare
time activities include canoeing with his wife and twin sons.

ABRIDGED SPECIFICATIONS
HP Model 8505A Network Analyzer
Sourct O 5-130 MHz 05-1 300 MHz
FREQUENCY RANGE: 500 kHz lo 1 3 GHi INPUT CONNECTORS Type N female
±1.Wm ±19.9 cm
SWEPT FREQUENCY ACCURACY: ±1°. of rango (linear sweep. MAGNITUDE CHARACTERISTICS:
FREQUENCY COUNTER: measures frequency al continuously variable marker RANGE -lOdBmtO -110 dBm
position without interrupting frequency sweep ABSOLUTE FREQUENCY RESPONSE -i5dB ACCURACY ±3% of reading ± 1% of range
COUNTER ACCURACY; ±2 counts • time-ease accuracy RATtO FREQUENCY RESPONSE (A R. BR). =1 5 dB LINEARITY i* = 0.5% « 1 2t (MHz) * 1 (meters)
TIME-BASE ACCURACY ±5 ppm = 1 ppnVC ± 3 pprrvBO days DYNAMIC ACCURACY (rom :001 dB-dB between -20 and -40 dBm to LINEAR PHASE SUBSTITUTION fdegrae* scan)
FREQUENCY STABILITY: •- ±0 01% of reaOng - O.OISot range =4.0 dB below - 100 dBm RANGE - 1 700° per scan with 0* offset ± 1 .4 Km scan width (MHz) or -4.75
POWER OUTPUT RANGE: - 10 oBm to -72 dBm REFERENCE OFFSET ACCURACY ±0.02 dB ±0.003 dB dB of oflset scan width (MHz)
LEVELING: ±0 Ã- dB from 500 kHz to 1 .3 GHz PHASE CHARACTERISTICS: ACCURACY ±3% of reading ± iff/scan.
SOURCE IMPEDANCE: 500, »16 dB return loss at - 10 flBm output level FREQUENCY RESPONSE -3' fromO 510 750MHz. -5= from 75010 1300MHz
RESIDUAL FM: 20 Hi rms. 500 kHz * 13 MHz range (1 KHz bandwidth) RANGE Ã- 180' General
200 Hz rms. 500 kHz - 130 MHz range (1 kHz bandwidth) ACCURACY ±0 Or degree to ±170"; ±0.0r/degree ±0.5" tor -180°. AUXILIARY OUTPUTS: Channels 1 and 2 and sweep (0 25V drv). pen lift
2 KHz rms. 500 kHz - 1 300 MHz range ( 1 0 kHz bandwidth) DYNAMIC ACCURACY from -0.02' dB Between -20 to -40 OBm to ±3' POWER: TOO 120. 220. or 240V. ±5%. -10%. 50 to 60 Hz. 275 W
HARMONICS: >25 dB below mam signal al - 10 dBm output level between -70 and -90 dBm WEIGHT: 36 kg (86 Ib)
SUBHARMONICS AND SPURIOUS: Below -50 dBm at -10 dBm output level REFERENCE OFFSET ACCURACY ±0.5% of oflset DIMENSIONS: 426 mm W • 279 mm H • 553 mm D (1W» x 11 x 21% in)
SWEEP MODES: linear log, start stop 1. start stop 2. all. CW = AF POLAR CHARACTERISTICS: Dynamic response and reference oflset specifi OPTIONS: 001 HP Interface Bus
SWEEP TIMES: to ms to 100 sec. cations same as magnitude and phase characteristics. ACCESSORIES: Model B 502 A B Transmission/ Reflection Test Sel (50 or 7511)
TRIGGER MOOES: auto, line sync, external sync, single scan FULL-SCALE MAGNITUDE RANGE 0 01 to 1 in 1-2-5 sequence Model B503A 8 S-Parameter Test Sel (50 or 7511)
OUTPUT CONNECTOR: Type N female DELAY CHARACTERISTICS: Model 1 1850A B 3-Way Power Splitter (50 or 750)
FREQUENCY RESPONSE ±1 ns from 500 kHz to 1.3 GHz. PRICES IN U.S.A.: Model 8505A. $22.500, Opt 001, add 52950
Receiver DELAY ACCURACY - 3°= of reading ~ 3 ur»ts (unl = 1 ns for 0.5-1300-MHz Model 8502A B $1850. Model 8503A.B. $3700
INPUT CHARACTERISTICS [Three channels. R. A. and B) range. 10 ns lor 05-130-MHz range. 100 ns for 0 5-13-MHz range) Model 11850AB $450
IMPEDANCE 500. 320 dB return loss ItypicaHy -26 dB). RANGE: Oto 80 M* (0.5-13 MHz) to 8 «s (05-130 MHz), to BOO ns (05-1300 MHzl MANUFACTURING DIVISION: Santa Rosa Division
DAMAGE LEVEL -20 dBm o* *50 V dC. ELECTWCAL LENGTH/REFERENCE PLANE EXTENSION CHARACTERISES: 3273 Airway Dnve
Santa Rosa. California 95401. U.S.A.

Measuring a Linearly Changing Frequency

A common problem in swept-frequency measurements is


how to measure the frequency of any selected point in the
sweep a the sweep is progressing. In early instruments, a
¡
frequency reading was derived by reading the CRT graticule in
conjunction with the start/stop frequency settings. Crystal-con I
trolled frequency markers improved accuracy but it still took
time to interpolate the readings and arrive at an answer.
Later instruments used conventional frequency counters but Time
had to stop the sweep long enough for the counter measure
quency increases linearly during the counter gate, however, so
ment. The difficulty of stopping the sweep quickly and precisely
the total count is higher than wanted. The counter pauses, then
limited the precision of this method and the act of stopping the
counts down on the RF for another gate time (f3 to f4).
sweep often introduced transients into the measurement pro
Analysis shows that if the gate times shown in the diagram
cess. Other techniques involved stopping the sweep for mea
are used, the number of cycles counted during up-down count
surement during the sweep flyback, but hysteresis in the sweep
ing is the same as the number counted at a constant frequency
return affected the accuracy of doing it this way.
f, for a gate time equal to T. Thus, the instantaneous frequency
A new approach that uses an up-down counter sidesteps
at a point indicated by a marker can be measured without stop
these problems. When a marker pulse occurs, the counter
ping or otherwise interfering with the sweep.
starts counting up on the RF frequency and continues counting
for a selected gate time (f-, to f2 in the diagram). The RF fre- --Frederick Woodhull

© Copr. 1949-1998 Hewlett-Packard Co.


A Family of Test Sets for the 500 kHz-1.3 GHz Range

Whether or not good data is obtained from a measurement at Transmission and Reflection Test Set
high frequencies may be determined by the way the device Much time can be saved by making transmission and reflec
under test is connected to the measuring instrument. Impe tion in simultaneously. This is especially true in
dance mismatches, loose connections, and phase shifts through applications where the device under test must meet certain
unequal cable lengths can degrade a measurement signifi return loss specifications as well as having a given trans
cantly. To minimize these problems, and thus to assure mission characteristic, since the two almost always interact.
consistent accuracy in measurements made by the new Model The Model 8502A/B Transmission/Reflection Test Set enables
8505A Network Analyzer as well as for other applications in Reference
the frequency range between 500 kHz and 1.3 GHz, a new = -19 dB
-6dB
family of test sets has been developed. j—
RF
Three-Way Power Splitter Input
For making comparison measurements such as matching
networks, as described in the measurement shown below,
0-70 dB
Step
to 8505A Attenuator
RF out from 8505A R A B

*AtOdB
Attenuation Setting

dc Bias

this to be done with a minimum of external cabling.


As shown in the diagram below, the test set has a two-way
power splitter for splitting off a reference signal and it has a
bridge circuit that separates the reflected signal from the inci
dent signal. The power level at the test port can be reduced by
the built-in step attenuator without affecting the reference signal
in applications, for example such as making measurements on
sensitive amplifiers. DC bias up to 30V and 200 mA can be
applied to the test port through the bias input for measurements
on the parameters of active components.
The 8502A/B Test Set is available in both 50Ã1 and 75Ã1 ver
sions. Sets of cables matched for electrical length within 2° at
a three-way power splitter is an important tool. The Model 1.3 GHz are available for making the necessary intercon
1 1850A/B Power Splitter was designed to match signal track nections for the 8502A/B test set, and also for the three-way
ing between any two ports within 0.1 dB in magnitude and power splitter.
1 .5° in phase. It is available in both 50fi and 75Ã1 versions.
The results of the typical application shown in the diagram The S-Parameter Test Set
are seen in the CRT photos. The photo at left shows the group All four s-parameters of a device can be measured quickly
delays through a filter and a compensating equalizer. The with the aid of the Model 8503A S-Parameter Test Set. Basically
use of be three-way power splitter enables adjustments to be it is like the 8502A Transmission/Reflection Test Set but it
made on the individual networks, and the results observed, includes a second directional bridge for the output port of the
before the networks are cascaded for final verification, as in device under test and a relay that alternately switches each
the photo at right. bridge to the power source and to a power sink for reversing
the direction of RF power flow during measurements of
s-parameters. It is fully programmable through the HP Inter
face Bus for use in automatic systems, as well as being
operable manually.

Acknowledgments
Steve Lund and Brent Palmer did initial design work on the RF
bridge and Jim Jones contributed circuit design. Product de
sign was by Bill Misson and Oleg Volhontseff. Dave Eng and
Roy Church did the industrial design.

--Julius Botka

© Copr. 1949-1998 Hewlett-Packard Co.


Processing Wide-Range Network Analyzer
Signals for Analog and Digital Display
by William S. Lawson and David D. Sharrit

TEST SIGNALS, AFTER PASSING through or ments such as simultaneous display of a device's
being reflected from a device under test, are transmission and reflection characteristics. This
down-converted to a constant 100-kHz IF in the channel has the electronic line stretcher that intro
Model 8505A Network Analyzer and then sent to the duces up to ±1700° of electrical length.
instrument's signal processor for measurement. Processor operation is under control of a ROM-
The signal processor detects the amplitudes, phase based digital processor. It stores independent offsets
relationships, and delays of the test signals, and for magnitude and delay for both measurement chan
conditions the results for display on the CRT and for nels, and independent electrical length offsets for the
measurement by the built-in voltmeter. Display con- A and B inputs. It also has calibration storage regis
tioning includes magnification and offsetting, con ters that enable the 0-dB reference line on the display
version to polar coordinates if desired, and the to correspond to any input power level.
switching required for displaying two quantities
simultaneously. Internal Details
The instrument has two identical processing chan A simplified block diagram of the analog signal
nels, permitting the simultaneous measurement and processing circuits is shown in Fig. 1. The signals fed
display of two independent quantities. Two channels to the input connectors first go to the down-conver
also make possible measurements of the ratio of two ters (not shown) and the resulting 100-kHz IF sig
input signals and the delay and phase relationships nals go to the signal processor where they are buf
between them. One of the processing channels is fered and bandpass filtered before being sent to the
time-shared by the A and B measurement input ports, magnitude and phase detectors. The gain of the buf
enabling concurrent display of two ratio measure fer amplifier is changed by 20 dB in accordance with

Tuning
Voltage

Fig. Model . Analyzer. block diagram of the signal processor in the Model 8505/4 Network Analyzer.

© Copr. 1949-1998 Hewlett-Packard Co.


A Wide-Range, Continuously-
Variable Line Stretcher
A line-stretcher is an indispensable tool for high-frequency which yields: V=A cos (&iIFt+c£OFS)
network analysis because it enables the electrical reference Thus, the original IF input signal is recovered but with a phase
point of a phase measurement to be placed physically any offset equal to the offset between the two oscillators.
where required by the measurement. Usually, the reference A block diagram of the electronic line stretcher is shown below.
point is placed at the input to a device to enable measurement A voltage ramp derived from the RF source sweep-con
of the phase shift through the device. Knowing the phase shift trol voltage is added to the phase detector output to give a
as a function of frequency, the equivalent electrical length of the phase offset proportional to RF frequency. The ramp is scaled
device can be derived. By inserting into the reference path an according to the effective line length desired. A dc offset de
additional length equivalent to that of the device, the deviations rived from the instrument's offset storage register is added to
from linear phase shift through the device can then be deter permit control of the steady-state phase shift.
mined.
Telescoping sections of coaxial line plus fixed sections of line
of various lengths have been used for adjusting the electrical
Sideband
length of an RF path for these measurements. Besides the ob Filter
vious also of doing it this way, this arrangement also 100 kHz
contributes to measurement errors because of the imperfect
impedance matches that connectors inevitably introduce into
the test signal path.
The electronic line-stretcher used in the Model 8505A Net
work Analyzer makes it much easier and faster to shift the phase
Crystal
reference point over an extremely wide range, and it introduces Oscillator
no mismatch errors. Basically, it is a voltage-controlled phase 893 kHz
shifter that introduces a phase shift proportional to the RF test-
signal frequency, thus simulating a fixed time delay. dc Offset
The basic scheme is to up-convert the incoming IF signal
(1 00 kHz) by mixing it with a local oscillator signal and removing
all but the first-order upper sideband mixing products with a
narrowband filter. The signal is then down-converted to 100
kHz by a second local oscillator that is phase-locked to the first.
A phase offset proportional to the RF frequency is introduced
into the phase-lock loop so the phase shift of the IF output The phase detector is a conventional 0-360° detector. To
varies with respect to the IF input in proportion to the RF extend a offset range, the oscillator outputs are divided by a
frequency. factor of 10 before the phase comparison, allowing the VCO to
The theory behind this operation is as follows. The output of be offset almost as much as 3600° from the reference. By suit
the reference (first) oscillator is cos(o>mt+4>ref). When the ref able choice of a voltage level to place the zero offset condition
erence frequency is mixed with the incoming IF frequency, «up, at the center of the phase detector's range, the offset operates
the mixer output has many components: N<om±M<0|F. The narrow over a range of ±1700°
band filter removes all but the first-order upper sideband, It is possible to obtain a wider phase-shift range by dividing
namely <om+<alf. This is then mixed with the voltage-controlled- the oscillators' outputs by factors greater than 1 0 but noise per
oscillator signal, cos(cumt+</>vCO). formance would then suffer and the filtering required to keep
The output of the second mixer is feedthrough in the phase detector out of the control loop would
V=Acos[üjm+o>IF)t+4>ref]xcos[ü>J+<<>vco] be more difficult.
The trigonometric terms when expanded become Although it would be preferable to use a higher oscillator fre
'/2[ cos euIFtxcos quency for reasons of noise and loop stability, the sideband
filtering requirements establish a practical limit. The lower side
1/2Sin wIFtxsin (4>ref-4>vco) -V2Sin(2&im+coIF)t sin (<A band must be suppressed more than 70 dB below the upper side
band to keep "sideband" noise below visible threshold on the
Low pass filtering removes the higher order terms. Substituting
CRT trace.
<t>ofs 'or <¿>ref-<Ã->vcO' tne mixer output then becomes:
V=A (cos (U|Ftxcos 0QPS+VÃ sin <aif\ sin 4>OFs) --William Lawson

the setting of the MAX INPUT LEVEL switch (-10 dBm, crosstalk between them more than 120 dB down.
— 30 dBm), which enables improved accuracy when The magnitude detector is similar to conventional
measuring low-level signals. average-responding meter-rectifier circuits. The
The A and B inputs time-share the measurement resulting dc is processed through a logarithmic amp
channel by means of the electronic switches shown at lifier and buffered before going to the input multi
the IF inputs. To eliminate interference between the plex switch. The two magnitude detectors can be
channels, the switches were designed for 130-dB calibrated to track within 0.1 dB over a range of input
"off" isolation; careful shielding and layout keeps levels greater than 60 dB.

© Copr. 1949-1998 Hewlett-Packard Co.


Phase Detection nated by a marker. This is done by sampling the re
For phase detection, 1C line receivers perform a sponse of the selected detector wherever the particu
limiting function on the incoming sinusoids to lar marker occurs during a sweep. A sample-and-hold
achieve constant-level signals. The test signal then circuit retains the detected value for conversion by a
goes through the electronic line stretcher (see box, page 2000-count dual-slope A-to-D converter, which sends
9) while the reference signal goes through a compen the results to the digital processor where the counts
sating bandpass filter. Both signals are squared in are averaged. The processor drives the appropriate
Schmitt triggers and then used to drive a J-K flip- digital readout on demand.
flop that performs the phase comparison. The result The sample-and-hold circuit is preceded by a
ing rectangular pulses, whose widths are proportion low-pass filter and an amplifier that has switchable
al to the phase difference between the two signals, x l or x 10 gain. The x 10 gain is switched in to retain
are integrated in a low-pass filter to derive a dc level 3-digit resolution whenever the measured quantity
proportional to phase difference. This signal goes to is less than 10 dB or 100°.
the input multiplex switch. Besides reading the value of the quantity displayed
With the limiting provided, this phase detector can on the CRT trace at the frequency of the selected
work over a 100-dB range of input signal levels. Mea marker, the digital readout can also show the offset
surement uncertainty is shown in Fig. 2 as a function corresponding to the measurement mode selected,
of signal level. At levels greater than -60 dBm, detec i.e. magnitude or delay. The choice of readout is made
tion accuracy is better than 0.01°/degree. by the pushbuttons labeled MKR (for marker) and REF
Following the input multiplexer, offsets are added (for reference)
to the detected signals (magnitude and delay) and the While being displayed digitally, the offset can be
results are amplified according to the settings of the modified by the three pairs of UP/DOWN increment
SCALE/DIV switches. Video filtering can be introduced buttons, one pair for each digit in the display. The
here if the displayed signal is particularly noisy. Fin display can be returned quickly to its calibrated posi
ally, the signals enter the display multiplex where tion by pressing the CLR button momentarily, which
they are switched to the display according to the dis clears the corresponding offset register.
play mode selected. The marker waveforms are added Once set, an offset is retained in a storage register
to the displayed signals at this point. even though the measurement mode may be changed.
Markers are generated in response to triggers de The offsets in storage are sequentially loaded into a
rived from comparators that respond to the level of pulse-width modulator that drives each of four low-
the sweep tuning ramp. The combination of a single pass filters in turn, giving dc values for the four off
unipolar triangle (^\_) for the vertical deflection sets used in the analog signal processing.
and a bipolar dual triangle ( /\^- ) for the horizon In addition to storage registers for offsets, the in
tal generates a diamond-shaped marker that is easily strument has storage registers for display calibration.
discerned regardless of the slope of the displayed For example, it is often convenient to establish the
response curve. 0-dB reference level at the signal level within the
passband of a filter regardless of the filter's insertion
Digital Readout
loss. Finding the 3-dB points or other points of inter
As mentioned previously, in addition to the real est is then straightforward, with no need to account
time CRT display of a network's swept response, for insertion loss.
Model 8505A provides digital readout of the net
work's gain, phase or delay at the frequency desig- There are two ways the operator can change the
display calibration. One is to switch to the REFERENCE
mode, use the UP/DOWN buttons to move the desired
part of the trace to the reference line, then press the
- ±10--
ZRO pushbutton. This adds the contents of the appro

I:::: priate offset register to the corresponding calibration


register and clears the contents of the offset register.
The digital display goes to 0.00 and the REL indicator
turns on to show that a non-zero number is in the
Spec Typical
calibration register.
- 1 0 - 3 0 - 5 0 - 7 0 -90 -110
The second way is to use the MARKER mode, posi
Input Level (dBm) tion the selected marker at the desired point on the
trace, then press the ZRO button. The digital proces
sor compares the stored offset to the value of the mea
Fig. 2. Accuracy of phase measurement over a 100-dB sured signal at the point designated by the marker,
range of input levels. and increments the offset until this difference is zero.

10

© Copr. 1949-1998 Hewlett-Packard Co.


A Wide-Range, High-Resolution
Group Delay Detector
Measurement of the group delay of a network is important ment is reduced, as it is in other methods of delay measure
for the evaluation of the distortion characteristics of a trans ment. With slow and/or narrow frequency sweeps, the Model
mission device. A distortionless device introduces a phase shift 8505A obtains calibrated group delay measurements with
that is a linear function of frequency so it has the same time acceptable signal-to-noise ratio by superimposing a small
delay for all frequencies. When a complex signal passes linear 1 -kHz sawtooth waveform on the sweep tuning ramp and
through a device that delays some frequency components making the delay measurement coincident with the peak of the
with respect to the others, the device distorts the signal even sawtooth. The frequency "aperture" may then be kept small
though the relative amplitudes may remain the same. so ripples in the delay-versus-frequency curve are not
Group delay (tD), a term originating in the telephone industry, smoothed out.
is defined as the negative rate of change of phase with fre
quency: tD = -d</>/d&i. A plot of group delay versus fre Measurement
quency in a distortionless device is then a straight horizontal Channel
line. With typical devices the phase shift does not vary linearly Voltage
so the phase slope, and hence the group delay, varies as a Proportional
function of frequency. to Group Delay
The linear sweep-frequency characteristics of the Model
8505A Network Analyzer enable direct measurement of group
delay. The sweep-frequency test signal supplied to the device
under test can be represented as:
Vin = A cos (u)0 + '/2at)t Tuning Voltage
where A is the signal peak amplitude, eu0 is the frequency at
t = 0 and a is the rate of change of frequency.
The output of the device, assuming a quasi-stationary solu
The block diagram for the circuits performing the group
tion, can then be expressed as: delay measurement is shown above. The two discriminators
Vout = GxA cos {K+y2a(t-tD)](t-tD)+4> } obtain voltages proportional to the frequencies at the input
where G. tD and d> are the gain, delay, and residual phase of and output of the device, and a voltage proportional to the
the device at ta0. frequency difference Ao> is obtained by subtracting one from
The shift in frequency between input and output is A(ti=-atD; the other. The tuning ramp from the frequency sweep control
so the delay is tD = -A<o/a. In the Model 8505A, the delay is differentiated to obtain a, the rate of change of frequency,
at frequency w0 is measured by determining the frequency and used to divide Aw to obtain tD.
difference between input and output of the device under test For slow and/or narrow sweeps, the sawtooth voltage is added
during a sweep, and dividing by the rate of change of fre to the frequency control ramp. The output of the differentiator is
quency. For example when sweeping a 100-MHz band in a then filtered by a synchronous low-pass filter to obtain a dc
sweep time of 10 ms, a frequency shift of 10 Hz is equiva voltage proportional to the sawtooth up-slope. The output of
lent to a 1-ns delay. the divider is gated so the measurement is made at the peak of
At slow sweep rates or with narrow sweeps, the frequency the sawtooth waveform.
difference is small and the signal-to-noise ratio of the measure •-David Sharrit

Acknowledgments CRT display, and John Barr the HP-IB interface.


Roger Oblad designed the detectors, Jim Jones the Product design was by Oleg Volhontseff. ff

William S. Lawson David D. Sharrit


Project leader for the signal pro Graduating with a BSEE degree
cessor part of Model 8505A, Bill from Arizona State University in
Lawson previously worked on the 1 970, Dave Sharrit designed radar
Model 8600A Digital Marker and | signal processors before joining
the 86220A 10-1300-MHz RF HP in 1973 to work on the Model
•• Drawer. Prior to joining HP in 1969, 8505A Network analyzer. Dave
he worked two years on an electron is pursuing an MSEE degree in
paramagnetic resonance spectro- the HP Honors Co-op program,
'*J* meter at another firm. He has using the video link between Stan
a BSEE and MSEE degrees from ford University and HP's Santa
Stanford University. From southern Rosa facility. For recreation,
California, he now lives in Santa Dave enjoys outdoor activities,
Rosa with his wife and 5-week-old primarily bicycling.
son. Outside of work he golfs,
plays tennis and gardens.

11

© Copr. 1949-1998 Hewlett-Packard Co.


A Precision RF Source and
Down-Converter for the Model 8505A
Network Analyzer
by Rolf Dalichow and Daniel R. Harkins

WHILE SUPPLYING A CLEAN TEST signal The offset LO signal is generated by mixing the swept
with well-controlled amplitude over a multi- microwave signal with a fixed 4.2099-GHz signal, re
decade frequency range, the RF system of the Model sulting in a 0.6-1300.1-MHz signal that is always
8505A Network Analyzer has to supply a tracking 100 kHz above the RF output signal. If good tracking
signal that is precisely offset in frequency. It is used as characteristics are to be achieved, it is necessary
an LO signal by the input RF down-converters in the for each down-converter to receive this LO signal at the
receiver. same level and with the same phase as the others. Uni
A key factor in the analyzer's performance is the form drive characteristics are assured by mounting the
design of the down-converters. To be meaningful, three mixers in close proximity, an arrangement
network measurements require that the input ports that on the other hand, had interesting implications
have equal phase and magnitude characteristics. This in achieving 100-dB isolation between input chan
makes accurate ratio measurements possible. It is also nels. The solution to this is discussed in the box on
desirable that each input have a wide dynamic range, the next page.
as this broadens the range of applications.
Each of the three input ports of the Model 8505A Stabilized 4.2-GHz Oscillators
has a 100-dB dynamic range and tracks the other two Although operating at about 4.2 GHz, the two
in phase and magnitude over the 0.5-1300-MHz fre fixed oscillators of the RF generating system are off
quency range, as indicated by the ratio response plot set only 100 kHz from each other. The response char
ted in Fig. 1. Contributing to this performance is the acteristics of the receiver circuits require that this
use of only one frequency-conversion step, made pos frequency difference be maintained within ±50 Hz
sible by the choice of an IF frequency that is below the over the entire tuning range of the instrument. With
RF frequency range of the instrument. this and the requirement for frequency accuracy,
The basic organization of the RF system was indi some sort of phase-locking system is the obvious
cated in the diagram on page 5. The RF test signal is design choice. Phase-locking also offers improved
generated by mixing a 4. 2105-5. 510-GHz swept noise sidebands, necessary for achieving the goal of
microwave signal with a fixed 4.210-GHz signal and 100-dB dynamic range.
supplying the amplified and leveled difference fre Of the various ways of phase-locking two oscil
quency to the output port. The use of these high fre lators, an approach was selected that promised to be the
quencies results in a multi-decade stimulus signal most efficient in terms of circuit complexity. It is
that is quite free of higher-order mixing products. diagrammed in Fig. 2. The two microwave signals are
generated in identical thin-film microcircuit oscil
lators and each is phase-locked to a separate crystal
reference. The references, however, operate at much
Spec lower frequencies where the 100-kHz difference is
more easily maintained. The crystals are matched for
temperature coefficient so the 100-kHz difference
varies less than 25 Hz over a temperature range of 25-
10 100 1000 40°C, eliminating the need for a temperature stabil
Frequency (MHz) izing system.
Samplers perform the down-conversion for the
phase comparison at the lower frequencies. The
Fig. 1. Frequency response of the Model 8505/4 Network
Analyzer in making amplitude ratio measurements (A/R or
sampling rate is 100 MHz so the low-pass filtered out
B/R). Close tracking of the input mixers is required to obtain put of the sampler is the 10-MHz difference between
this performance. 4.210 GHz and the 42d harmonic of 100 MHz. At this

12

© Copr. 1949-1998 Hewlett-Packard Co.


Well-Matched Down-Converters

Input mixers of the Model 8505A Network Analyzer were of each amplifier is about the same as the transistor chip itself
to have a good input impedance match, less than 0.1 -dB (typically 36 dB at 1300 MHz). The coplanar structure also
compression at a -10-dBm input level, and a noise floor that allows variations in the spacing of the ground conductor for
would permit a 1 00-dB dynamic range. The mixers were to track better control of the inductance of the input capacitor and
closely in amplitude and phase and cross talk between them resistor.
was to be more than 100 dB down. The RF signal drives the diodes of the single-balanced mixer
To meet these requirements, the mixer design diagrammed by way of a resistive power divider. The LO drive is through a
below was developed. Constructing the mixers as thin-film, balun structure. A balun is required to balance the LO drive
hybrid microcircuits on a sapphire substrate assured uniformity. signal to ground, isolating the LO signal from the RF and IF
As shown in the diagram, both the signal and LO inputs to the paths. Three separate baluns are used. The first "lifts" the
mixer are through common-base amplifiers. This configuration input to the other two so the parasitic capacitance-to-ground of
was chosen for three reasons. First, the phase and amplitude their inputs is balanced, tending to cancel any RF and IF feed-
characteristics are consistent from transistor to transistor of through to the LO channel.
different lots. Second, the input impedance is only 2 to 4 ohms
throughout the 1300-MHz frequency range. Third, the configura
tion has high reverse isolation, necessary for achieving the
1 00-dB crosstalk specification.
The low input impedance allows the overall input impedance
to be set by a series input resistor, obtaining a typical return
loss of 24 dB with little signal loss. The noise figure of the input
mixer is about the same with the amplifier as it would be without,
but without the amplifier an input attenuator would be needed
to obtain a good return loss figure, and this would reduce the
dynamic range.
A coplanar waveguide structure rather than the usual micro-
strip transmission-line structure is used for the microcircuits
to keep the ground currents on the top surface. Chip connec
tions to ground can thus be made short for low inductance.
With the resulting very short base leads, the reverse isolation

The 1 00-kHz tank circuit in the IF output improves the signal-


to-noise ratio but its impedance in the RF range is higher than
wanted. The solution to this problem was to use an IF input
amplifier that has an input impedance of less than 3 ohms. The
IF input amplifier is not part of the microcircuit but it is mounted
close to the down converter for minimum line length. It is fol
lowed the a 300-kHz low-pass filter for further attenuation of the
LO and RF signals.
As shown by the photo of the microcircuit above, the three
mixers are arranged symmetrically with respect to the LO drive
input A establish an identical LO drive path for each mixer. A
-v single inductive loop in each branch of the LO power divider,
along with a chip capacitor, forms a low-pass filter to ground
for ¡mage feedthrough into the LO drive. Overall, the down-
converters achieve the design goals with respect to input
IF
Output return loss, dynamic range and crosstalk. Amplitude tracking
between mixers is better than ±3° up to 750 MHz, and within
±5° to 1300 MHz.

-Wayne Frederick

point, the sampler noise floor is some 10 dB below Dual-Tracking Sources


that of the oscillator, allowing for some noise im The 4.2-GHz oscillator outputs are translated down
provement within the bandwidth of the phase- to the 0.5-1300-MHz frequency range by the arrange
lock loop. ment shown in Fig. 3. The swept microwave source is
supplied through a hybrid power splitter as the high-

13

© Copr. 1949-1998 Hewlett-Packard Co.


9.9 MHz
straint on this design, aside from the need for very
Oscillator 4.2099 good stability, was the need for digital program-
GHz
mability.
Fig. 4 diagrams the technique for digitally setting
the stop and start frequencies of what is essentially an
100 MHz analog circuit. The sweep voltage is inverted and
Oscillator
offset in the inverting amplifier. Both the non-invert
ed and inverted ramps are attenuated by digitally-
controlled attenuators and then summed in the ramp
output amplifier. DCAl attenuates the inverted ramp
according to the selected start frequency (the non-
inverted ramp is always zero at the start) and DCA2
attenuates the non-inverted ramp according to the
desired stop frequency (the inverted ramp is always
zero at the end of the ramp).
Fig. 2. Source oscillators are phase-locked to crystal ref The digital data bus controlling the attenuators
erences to obtain WO-kHz frequency offset between oscil also drives the digital readouts for the start and stop
lators. frequencies. By eliminating the dials, scales, pointers
and dial cords usually used for frequency indication,
level ( + 10 dBm) LO signal to the double-balanced the digital system simplified the mechanical design
mixers. The stabilized 4.2-GHz oscillator outputs of the instrument to a great extent. It also made it
are the low-level inputs. possible to store and recall different frequency set
The principal design effort with these tracking tings, useful for alternate display of response curves
sources was directed towards maintaining greater over two different sweep frequency ranges.
than 90-dB isolation between the two output signals For the display of Bode plots, a logarithmic sweep,
to prevent spurious responses in the measurements. obtained by passing the linear ramp through an ex
The techniques used in obtaining this high isolation
ponential amplifier, is provided in three fixed ranges
are described in the box on the next page. Very clean
(1-10 MHz, 1-100 MHz, 1-1000 MHz).
spectrums for the two tracking sources were obtained
as a result of the high isolation, plus the fact that the Expanded Sweep
lowest ordered spurious mixing product falling within Any two frequencies within the range of the instru
the 0.5-1300-MHz band is a seventh-order product. ment may be selected for the start/stop end points of
Frequency Control the frequency sweep by the two front-panel FREQUENCY
The 4. 2105-5. 5100-GHz swept microwave signal is controls. When the MODE switch is set to LIN FULL or
generated by a YIG-tuned oscillator (YTOj tuned LOG FULL, causing the instrument to sweep its full
by a voltage ramp originating in a Miller-inte range, the selected end points are indicated by two
grator type sawtooth generator. The ramp also drives markers on the CRT trace. The operator can then use
the CRT horizontal deflection. the FREQUENCY controls to bracket a frequency range
Sweep oscillators like this have been designed and of interest, and then switch to the LIN EXPAND mode to
built many times before. However, the principal con- expand the selected range to full display width.

Digital
Input

1.1 f,2
4.210 GHz 4.2099 GHz

Controlled
Attenuator 2

Digital
f Input

Fig. 3. Stabilized oscillator outputs are mixed with the YIG-


tuned sweep-frequency signal to obtain the network an Fig. 4. Start and stop levels of the YIG-tuning ramp are con
alyzer's RF output and the offset tracking LO signal. trolled digitally by the arrangement shown here.

14

© Copr. 1949-1998 Hewlett-Packard Co.


Generating Well-Isolated
Tracking Source Signals
The photo below shows one of the two identical hybrid thin-
film 4.2-GHz oscillators used in the RF section of the Model
8505A Network Analyzer. Each oscillator is a push-pull, trans-
mission-line-coupled type similar to one previously described
for the HP Model 86602A Synthesizer RF Section.1 The phase-
lock circuits drive a varactor diode coupled to one end of the
resonator, giving a tuning range of about 15 MHz. A second
tuning input is provided by the collector circuit which allows
a 35-MHz variation in response to collector voltage variations.
This input is used for coarse tuning and for temperature com
pensation. Because of the constant-current characteristics of
the collector circuit, a simple thermistor network in series with
this to holds temperature-induced frequency variations to
less than 3 MHz over a 60°C temperature range.
Two outputs are coupled out of the oscillator. One goes to a
reflective modulator that has greater than 40-d B dynamic range.
It provides leveling and vernier control of the RF output. The
other goes to the sampler, shown in the left half of the micro- the f0 port of the second mixer, where it would be down-con
circuit in the photo. verted and introduced into the IF output of the second channel.
The sampler operates similarly to others previously used in Second was the third-order mixing product (2f0-f2) genera
HP instruments.2 By integrating each oscillator and its as ted in the first mixer leaking out the f0 port across the power
sociated sampler into a hybrid microcircuit, all of the microwave splitter into the second mixer. Third was the leakage of the sum
operations can be performed within the package, simplifying frequencies, f0 + fs, coupling from mixer to mixer across the
shielding and reducing the number of RF connectors to one. common LO path. This proved to be the most troublesome.
The basic circuitry for converting the oscillator outputs to
The first two sources of leakage depend on mixer balance be
the 1.3-GHz frequency range is diagrammed in Fig. 3 on the tween fc and („ ports, forward and reverse gain of the amplifiers,
opposite page. Control of three kinds of leakage was crucial in splitter isolation, and the two-tone conversion efficiency of the
attaining high isolation between the two output signals. First mixer a characteristics were well-controlled by the use of a
was the leakage of the signal frequency (fs in Fig. 3} through thin-film double-balanced mixer. The isolation in the LO drive
the first mixer across the LO amplifier and power splitter into path was improved significantly by the use of a two-section
hybrid power splitter with 3-dB pads at its port.
Leakage of the sum frequencies f0 + fs was further atten
uated by insertion of a 4-6-GHz bandpass filter between each
amplifier and its associated mixer. However, surface-wave
modes and the TE 10 waveguide mode were potential problems.
Therefore the package dimensions for the hybrid splitter, amp
lifiers and filters, shown in the photo above, were chosen in such
a way that any moding occurs above the frequency range of
interest.
••Mark Roos
-Philip Chen

References
1 R Hassun, M Humphreys, D Scherer. YD Kim. B Stnbling, and C Cook,
"Synthesized Signal Generation to 1 .3 Ghz. Hewlett-Packard Journal. March 1 973
2 J Merkelo, 'A dc-to-20-GHz Thin-Film Signal Sampler for Microwave Instrumen
tation, Hewlett-Packard Journal. April 1973.

The sweep WIDTH control has positions labelled end points are used alternately to control the sweep,
START/STOP i and START/STOP 2 allowing two causing simultaneous display of two frequency
sets of sweep end points to be selected and stored in sweeps. This provides a means, for example, of dis
RAM. When the control is moved, say, from position playing a high resolution view of a filter's passband
1 to position 2, the sweep end points selected while at the same time that the total filter response, includ
the switch was in position 1 are stored. The FRE ing the stop bands, is shown. The effect that adjust
QUENCY controls may then be used to select a new pair ments made on the passband have on the stop band
of end points. Moving the WIDTH control back to 1 are readily seen as the adjustments are made.
stores the new pair of points and recalls the pre When the WIDTH control is set to CW±AF, the
viously stored pair. left-hand FREQUENCY control selects the center fre
When the WIDTH control is set to ALT, the stored quency of a sweep and the right-hand control selects

15

© Copr. 1949-1998 Hewlett-Packard Co.


the sweep width. A sample of the RF output is applied directly toa low-
Markers noise discriminator and the output of the discrimina
Up to five markers can be positioned on the dis tor goes to the control-loop summing point to correct
played trace by the MARKER controls. Markers are the YIG tuning voltage for any drift or residual FM in
initiated by comparators that generate a pulse when the RF output. With this control system, residual FM
the frequency-control ramp reaches the dc level of a is only 20 Hz rms on the low range and 200 Hz rms
voltage set by the corresponding MARKER control. A on the middle range.
switch selects the number of markers displayed
(these are in addition to the two sweep end point mar Acknowledgments
kers displayed in the full sweep modes). The highest In addition to those credited in the boxes inserted
numbered marker initializes data taking by the digital in this article, there were many contributors to the
measurement circuits. This marker points up above project. Weldon Jackson, George Henry, Pete Planting,
the displayed trace while the others point downwards and Floyd Bishop provided assistance with the hy
YIG Oscillator Stabilization brid technology and Billy Knorpp and Rich Swain
For consistent measurements of Q over a wide fre contributed to the microelectronic development.
quency range, drift and residual FM have to be more Jerry Ainsworth and Les Brubaker were involved in
tightly controlled at the low end of the frequency the initial design and Rich Pope contributed several
range. Therefore, to allow full-scale display of low- circuit designs, including the YIG stabilization loop.
end narrowband sweeps, the network analyzer pro Product design was by Al Knack. Dennis Handlon
vides a choice of three frequency ranges with two and Ron Zimmerman guided the instrument into
low-end bands (0.5-13 MHz, 0.5-130 MHz) stabilized. production. ÃÃ

Rolf Dalichow Daniel R. Harkins

r Project leader for the RF fre


quency control section of the
Model 8505A, Rolf Dalichow came
Dan Harkins joined HP in 1969,
working initially on investigative
projects and subsequently be
to HP in 1973 after 12 years ex coming project leader for the
perience in hybrid RF circuits and Model 8505A Network Analyzer's
communications transmitter de j RF source/down-converter. He
sign both in the United States and I earned a BSEE degree from
in West Berlin, Germany. Rolf ob Seattle University (1969) and
tained an Ing. Grad degree in 1961 later obtained an MSEE degree
from the Staatliche Ingenieur Schule, from Stanford University in the
Giessen, Germany. When time HP Honors Co-op program. A
permits, Rolf, his wife, and their native of Snohomish, Washington,
two children, 4 and 7, enjoy travel Dan now lives in Santa Rosa, play
and camping in their camper. ing tennis and going hiking.

Bulk Rate
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Hewlett-Packard
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JULY 1976 Volume 27 • Number


Technical Information from the Laboratories of
Hewlett-Packard Company

Hewlett-Packard S.A . CH-1217 Meynn 2


Geneva. Switzerland
Yokogawa-Hewlett-Packard Ltd.. Shibuya-Ku
Tokyo 151 Japan

'ices. Typography • Anne


(BUR
European Production Manager • Michel Foglia
ÃTY
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© Copr. 1949-1998 Hewlett-Packard Co.

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