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IEC 61850 Testing - Equipment Requirements and Tools

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100% found this document useful (1 vote)
196 views

IEC 61850 Testing - Equipment Requirements and Tools

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IDI Energy
Copyright
© © All Rights Reserved
Available Formats
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IEC 61850 Testing - Equipment

Requirements and Tools

IEC 61850 Seminar


Dr. Alexander Apostolov

K02 03 20060309 Page: 1

© OMICRON K02 03 20060309


Intelligent Substation Automation Systems
Intelligent Sensor Comms Gateway HMI
Control Status
Analysis Tools
Advanced LAN
Merging Unit Switch Configuration Tools

Advanced Communications
Merging Unit Based Protection IED

Communications
Protection Based Protection IED
IED

Intelligent Sensor Communications


Status
Based Control IED
Control

Advanced
Communications
Merging Unit
Based Control IED

Protection Protection Communications Based


IED IED Monitoring/Recording IED

Communications Based
Monitoring/Recording IED

© OMICRON K02 03 20060309 Page: 2


Intelligent Substation Automation Systems
IMED IMED IEC 61850

IMED IMED

IMED IMED
Substation
Substation
Substation
Computer
PCMR Unit
Computer
IMED IMED

IMED IMED

IMED IMED IMED IMED

© OMICRON K02 03 20060309 Page: 3


Intelligent Substation Automation
Systems

Substation HMI

Substation Protection, Control,


Monitoring & Recording (PCMR)

Bay PCMR Bay PCMR

Device PCMR Device PCMR Device PCMR Device PCMR

© OMICRON K02 03 20060309 Page: 4


Substation Communications Architecture
Substation Substation
HMI Computer

Router WAN

Ethernet Switch Substation Bus

IED IED IED IED SCADA Master

Ethernet Switch Process Bus

MU IOU IOU MU

© OMICRON K02 03 20060309 Page: 5


Quality Process

© OMICRON K02 03 20060309 Page: 6


Type test

• The verification of correct behavior of


the IEDs of the SAS by use of the
system tested software under the
environmental test conditions
corresponding with the technical data.
• Marks the final stage of the hardware
development and is the precondition
for the start of the production.
• Type test must be carried out with IEDs
that have been manufactured through
the normal production cycle

© OMICRON K02 03 20060309 Page: 7


System test

• System test is used to check the


correct behavior of the IEDs and of the
overall SAS under various application
conditions.
• The system test marks the final stage
of the development of IEDs as part of a
SAS product family

© OMICRON K02 03 20060309 Page: 8


Factory Acceptance Test (FAT)

• The factory acceptance test (FAT) is a


customer agreed functional tests of the
specifically manufactured SAS-
installation or its parts, using the
parameter set for the planned
application.
• This test should be carried out in the
factory of the system integrator by the
use of process simulating test
equipment

© OMICRON K02 03 20060309 Page: 9


Site Acceptance Test (SAT)

• The site acceptance test (SAT) is the


verification of each data and control
point and the correct functionality
inside the SAS and between the SAS
and its operating environment at the
whole installed plant by use of the final
parameter set.
• The SAT is a precondition for the SAS
being put into operation

© OMICRON K02 03 20060309 Page: 10


Test responsibilities
• The manufacturer is responsible for the
correct handling of type tests and
system tests of his individual products
and the SAS product family.
• Type tests and system tests are
preconditions for starting the regular
delivery.
• All IEDs have to pass device specific
routine tests defined by the
manufacturer to ensure quality before
the products are handed over for
delivery.

© OMICRON K02 03 20060309 Page: 11


Test responsibilities
• Customer specific verifications and
approvals may be required according to
the customer’s philosophy and shall be
negotiated between the system integrator
and the customer.

• The system integrator is obliged to prepare


and carry out these special investigations
with individual products and the overall
SAS.
• The system integrator is obliged to prove
the fulfillment of the technical
requirements, including performance
criteria.

© OMICRON K02 03 20060309 Page: 12


Test responsibilities
• When introducing an SAS, the system
integrator is responsible for ensuring that
all functions are jointly tested by the
representatives of the system integrator
and the customer

• The Factory Acceptance Test (FAT) is


optional
• The Site Acceptance Test (SAT) is
mandatory
• Both are performed with the specific
configuration and parameter set of the
customer.

© OMICRON K02 03 20060309 Page: 13


Test responsibilities
• The successful finishing of the FAT (if
required) is the precondition for the
equipment delivery and the further site
acceptance test at the customer’s
premises.
• FAT and SAT, as well as their contents,
shall be negotiated between the customer
and the system integrator.
• The commissioning of the SAS on site is
normally the responsibility of the system
integrator.
• Commissioning is followed by a trial
operation phase.

© OMICRON K02 03 20060309 Page: 14


Test Equipment

• Test equipment: all tools and instruments which


simulate and verify the input/outputs of the operating
environment of the SAS such as switchgear, transformers,
network control centers or connected telecommunication
units on the one side, and the communication channels
between the IEDs of the SAS on the other

• The test equipment shall support:


• normal process simulation
• transient and fault process simulation
• communication check and simulation

© OMICRON K02 03 20060309 Page: 15


Normal Process Test Equipment

• Basic Process test equipment must be


able to provide:
• all alarms and position indications for the
substation control system
• enable the simulation of measured values
(including overrange)
• be able to display all commands from the
SAS.

© OMICRON K02 03 20060309 Page: 16


Normal Process Test Equipment
• More complex test equipment must be
able to simulate reactions of the
switchgear in real time.
• There is a need to be able to generate
various conditions for the reactions,
such as to simulate an earth fault on
one busbar section during a switching
sequence.
• Test equipment should also be capable
of generating a large quantity of data
traffic in a short time or intermittent
data traffic on a regular basis.

© OMICRON K02 03 20060309 Page: 17


Transient and Fault Test
Equipment
• This test equipment should be capable of injecting
programmable transients of voltages and currents
in a three-phase power system. It shall allow the
simulation of many kinds of faults or other
abnormal conditions such as:
• Short circuit faults
• Power swing
• Saturation of current transformers
• Others
• The test equipment should be capable of producing
simulated faults, thus producing disturbance
records.

© OMICRON K02 03 20060309 Page: 18


Communications Test
Equipment
• This test equipment is used for performing tests at
all communication channels for:
• internal links of the SAS
• telecommunication
• The communication test system should be a
convenient and efficient tool which enables the
performance of the following functions at all
required levels (network control center, substation,
bay and process level):
• simulation of a server, simulation of a client, monitoring of
the data traffic;
• quality analysis of the data traffic (for example, the quality
of electrical signals, time breaks, etc.).

© OMICRON K02 03 20060309 Page: 19


Basic Test Requirements
• The manufacturer should provide a test concept that
covers all activities beginning with prototype
functional tests in the development state to the final
type and system tests.
• The scope and object of tests, the test procedures
and the passing criteria must be specified.
• All tests shall be documented in such a way that the
results are reproducible.

• All tests should be performed by an internal part of


the manufacturer’s organization that is qualified for
performing the tests and has the organizational
independence to state whether a product has passed
the tests or not.

© OMICRON K02 03 20060309 Page: 20


System Test Requirements
• The system test is the proof of correct functionality
and the performance of each IED under different
application conditions (different configuration and
parameters) and in co-operation with other IEDs of
the overall SAS product family including all tools.

© OMICRON K02 03 20060309 Page: 21


Type Test Requirements
• The “fitness for use” of a newly designed
product shall be proven by a type test.
• The type test shall be performed using
samples from the manufacturing process.
• The type test is the verification of the
product against the technical data which
are specified, such as:
• mechanical withstandability
• electromagnetic compatibility
• climatic influences
• functional correctness and completeness

© OMICRON K02 03 20060309 Page: 22


Routine Test Requirements

• The routine test consists of special


hardware and functionality tests
• The routine tests should be carried out for
each product before leaving the
manufacturer.
• Routine tests include:
• Function tests
• Insulation test
• Burn-in test

© OMICRON K02 03 20060309 Page: 23


Conformance Test

• The conformance tests are performed on


the communication channels of IEDs.
• They include the verification of the
communication procedure in accordance
with the standard or its parts.
• Conformance Testing is defined in IEC
61850 -10.

© OMICRON K02 03 20060309 Page: 24


Required documentation

• Model Implementation Conformance


Statement (MICS): details the standard data
object model elements supported by the
system or device
• The Protocol Implementation Conformance
Statement (PICS) is a summary of the
capabilities of the system to be tested.
• Protocol Implementation eXtra Information for
Testing (PIXIT) contains system specific
information regarding the capabilities of the
system to be tested and which are outside the
scope of the 61850 standard. The PIXIT shall
not be subject to standardisation.

© OMICRON K02 03 20060309 Page: 25


Conformance Test Process

© OMICRON K02 03 20060309 Page: 26


Conventional Multifunctional
IED Performance
Process

Analog Sensor Function Outputs Process


Sensor Module Module Module Control

Process
Status Input Multifunctional
Sensor Module IED

Process

Event Start Event End

tSM tFM tOM tPC

tEVT

© OMICRON K02 03 20060309 Page: 27


IEC 61850 Based Hybrid
Function Performance
Process
Merging Unit Protection IED

Analog Sensor Interface LAN Interface Function Outputs


Sensor Module Module Switch Module Module Module

Process
Status Input Interface Control
Sensor Module Module

Input/Output Unit Process


Process

Event Start Event End

tSM tIM1 tLAN tIM2 tPM tOM tPC

tEVT

© OMICRON K02 03 20060309 Page: 28


IEC 61850 Based Hybrid Function Performance
Process
Merging Unit

Analog Sensor Interface


Sensor Module Module

LAN
Switch

GOOSE SAV Protection IED


Interface Interface
Module Module

Function Outputs
Modules Module

Process
Control

Process

© OMICRON K02 03 20060309 Page: 29


IEC 61850 Based Function Performance
Process
Merging Unit Protection IED

Analog Sensor Interface LAN Interface Function


Sensor Module Module Switch Module Module

Status Input Interface


Sensor Module Module

Outputs
Module Control Interface
Process
Unit

Process
Control
Event Start Event End

tSM tIM1 tLAN1 tIM2 tFM tIM3 tLAN2 tIM4 tOM tPC

tEVT

© OMICRON K02 03 20060309 Page: 30


Functionality

• Protection
• Control
• Monitoring
• Recording
• Analysis
• Metering
• Remote interface

© OMICRON K02 03 20060309 Page: 31


Conventional Functional Test
Setup

Multifunctional
IED

V I 52a Trip

Test Laptop
Device Computer

© OMICRON K02 03 20060309 Page: 32


Test setup

Ethernet Laptop
Switch Computer

GOOSE
or GSSE
Ethernet
IEC 61850
GOOSE Based IED
or GSSE
Trip
V I

IEC 61850
Ethernet Based Test
Device

© OMICRON K02 03 20060309 Page: 33


Test setup
Laptop
Computer

Ethernet
Switch

GOOSE
Ethernet or GSSE

IEC 61850 IEC 61850


GOOSE Based MU Based IED
or GSSE
V I Trip

IEC 61850 Based


Ethernet Test Device

© OMICRON K02 03 20060309 Page: 34


NET-1 Option for the CMC 256

© OMICRON K02 03 20060309 Page: 35


NET-1 Option for the CMC 256

© OMICRON K02 03 20060309 Page: 36


Protection Testing
Conventional Hard-Wired
Protection
Relay Sampled Values
Test Set
Hard-wired
Analog
Signals

Hard-wired
binary outputs to binary inputs

GSE

© OMICRON K02 03 20060309 Page: 37


The Vision: Fully Networked
Protection Testing

GOOSE, GSSE
Protection Test Set
Relay

SV (Sampled Values)

© OMICRON K02 03 20060309 Page: 38


The GOOSE Module

© OMICRON K02 03 20060309 Page: 39


GOOSE Module Functions
• Configuration of the CMC 256 + NET-1
• Subscriptions
• Simulations (Publishing GOOSE)
• Editing GOOSE Data
• GOOSE Parameters
• Datasets
• Mapping
• To / from binary Inputs / Outputs
• Importing GOOSE Data from SCL

© OMICRON K02 03 20060309 Page: 40


OMICRON's Layering

Test Modules

Binary Inputs Binary Outputs


Mappings
GOOSE GOOSE
Subscriptions Simulations

Network

© OMICRON K02 03 20060309 Page: 41


Getting the GOOSE Data
• Import SCL File
• File | Import Configuration
• SCL File (*.icd, *.cid, *.scd)

• All GOOSE Data are imported


• Both for Subscription and Simulation
• Delete what is not needed / wanted
• New Import adds Data again

• Eventually Edit GOOSE Data

© OMICRON K02 03 20060309 Page: 42


GOOSE Parameters

Identification
(GOOSE
Header)
Dataset
(Payload)

© OMICRON K02 03 20060309 Page: 43


Mapping is Simple

© OMICRON K02 03 20060309 Page: 44


Virtual Wiring

• GOOSE Configuration is
another Type of HCC

• Binary I/Os of Test Set are assigned

• Fully Automatic
• Totally virtual
• No changing of Wires
• No User Interaction

© OMICRON K02 03 20060309 Page: 45


Multiple GOOSE Mappings
• Map only Data
needed for a Specific Test
• Re-Assign Binary I/Os of the Test
Set as needed
• Fully automatic

• Use Standard Assignments


• Bin In 1 = Trip
• Bin In 2 = Start
• Minimal Setup Work
• Re-use of Existing Test Plans

© OMICRON K02 03 20060309 Page: 46


Test setup

© OMICRON K02 03 20060309 Page: 47


Test results

© OMICRON K02 03 20060309 Page: 48


The IEC 61850 Functional System Test

ICD ICD
File File

IEC 61850 Network


Standard System System Scheme Other Test
Configuration Tool Simulator Testing Tool Modules

IED
IED
IEC 61850 IED
Simulator
Standard Test Simulator
Simulator
SCD
File Configuration
Tool MU
MU
Simulator
MU
Simulator
Simulator

Test Device

© OMICRON K02 03 20060309 Page: 49


The IEC 61850 Functional System Test
IEC 61850 Network
Standard System System Scheme Other Test
Configuration Tool Simulator Testing Tool Modules

IED
IED
IEC 61850 IED
Simulator
Standard Test Simulator
Simulator
SCD
File Configuration
Tool MU
MU
Simulator
MU
Simulator
Simulator
IEC 61850
Standard IED CID
CID
File
Configuration CID
File
Tool File

Test Device
Test Device
Test Device

© OMICRON K02 03 20060309 Page: 50

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