The document outlines a course on digital design for test (DFT) consisting of 15 modules. The modules cover topics such as digital basics, Verilog, Linux commands, DFT basics, ASIC flow, chip fabrication, ATE basics, scan insertion, scan architectures, scan compression techniques, on-chip clocking, at-speed testing, ATPG basics and algorithms, fault models, ATPG DRC checks, pattern generation, simulations, at-speed ATPG and simulations, LOC/LOS, scan simulations debugging, and revision of scan and ATPG concepts with guidance for a project.