Obsolete Product(s) - Obsolete Product(s) : 3.3 V, 1 Mbit (128 KB X 8) ZEROPOWER Sram
Obsolete Product(s) - Obsolete Product(s) : 3.3 V, 1 Mbit (128 KB X 8) ZEROPOWER Sram
Features
■ Integrated, ultra low power SRAM, power-fail
control circuit, and battery
■ Conventional SRAM operation; unlimited
WRITE cycles
( s )
■ 10 years of data retention in the absence of
power
u ct
■ Microprocessor power-on reset (reset valid
o d
■
even during battery backup mode)
Battery low pin - provides warning of battery
32
P
1
r
end-of-life
e t e
■ Automatic power-fail chip deselect and WRITE
o l
bs
protection PMDIP32 module
■ WRITE protect voltages
– VCC = 3.0 to 3.6 V; 2.7 V ≤ VPFD ≤ 3.0 V
- O
■
(VPFD = power-fail deselect voltage)
Self-contained battery in the CAPHAT™ DIP
( s )
package
c t
■
u
Pin and function compatible with JEDEC
d
■
standard 128 K x 8 SRAMs
RoHS compliant r o
P
– Lead-free second level interconnect
e
l e t
s o
O b
Contents
1 Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
2 Operation modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.1 READ mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
2.2 WRITE mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
2.3 Data retention mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
2.4 VCC noise and negative going transients . . . . . . . . . . . . . . . . . . . . . . . . . 11
( s )
3
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Maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
o d
4 r
DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
P
5 t e
Package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
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Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
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7 - O
Environmental information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
(s )
8
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Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
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List of tables
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List of figures
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1 Description
The M48Z129V ZEROPOWER® SRAM is a 1,048,576 bit non-volatile static RAM organized
as 131,072 words by 8 bits. The device combines an internal lithium battery, a CMOS SRAM
and a control circuit in a plastic 32-pin DIP module. The M48Z129V directly replaces
industry standard 128 K x 8 SRAM. It also provides the non-volatility of FLASH without any
requirement for special WRITE timing or limitations on the number of WRITEs that can be
performed.
VCC
( s )
A0-A16
17 8
DQ0-DQ7
u ct
o d
r
W RST
M48Z129V
E BL
e P
G
l e t
s o
O b
VSS
AI02309
DQ0-DQ7
c t (s
Address inputs
Pr
G Output enable
ete
W WRITE enable
ol
RST Reset output (open drain)
bs
BL Battery low output (open drain)
RST 1 32 VCC
A16 2 31 A15
A14 3 30 BL
A12 4 29 W
A7 5 28 A13
A6 6 27 A8
A5 7 26 A9
A4 8 M48Z129V 25 A11
A3 9 24 G
A2 10 23 A10
A1 11 22 E
A0 12 21 DQ7
DQ0 13 20 DQ6
DQ1 14 19 DQ5
( s )
ct
DQ2 15 18 DQ4
VSS 16 17 DQ3
AI02310
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Figure 3. Block diagram
r o
e P
let
VCC A0-A16
E
VOLTAGE SENSE
b
POWER
so 131,072 x 8
SRAM ARRAY
DQ0-DQ7
AND
SWITCHING
O
)-
E
CIRCUITRY W
INTERNAL
t ( s G
u c
BATTERY
o d
Pr
RST BL VSS
AI03608
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s ol
O b
2 Operation modes
The M48Z129V also has its own power-fail detect circuit. This control circuitry constantly
monitors the supply voltage for an out of tolerance condition. When VCC is out of tolerance,
the circuit write protects the SRAM, providing data security in the midst of unpredictable
system operation. As VCC falls, the control circuitry automatically switches to the battery,
maintaining data until valid power is restored.
du
READ VIL VIH VIH High Z Active
ro
Deselect VSO to VPFD (min)(1) X X X High Z CMOS standby
Deselect ≤ VSO(1) X X X
Note:
1. See Table 10 for details.
(s
enable) is low. The unique address specified by the 17 address inputs defines which one of
c t
the 131,072 bytes of data is to be accessed. Valid data will be available at the data I/O pins
within tAVQV (address access time) after the last address input signal is stable, providing the
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E and G access times are also satisfied. If the E and G access times are not met, valid data
r
access time (tGLQV). o
will be available after the latter of the chip enable access times (tELQV) or output enable
e P
The state of the eight three-state data I/O signals is controlled by E and G. If the outputs are
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activated before tAVQV, the data lines will be driven to an indeterminate state until tAVQV. If
the address inputs are changed while E and G remain active, output data will remain valid
s o for tAXQX (output data hold time) but will go indeterminate until the next address access.
tAVAV
A0-A16 VALID
tAVQV
tAXQX
AI02324
Note: Chip enable (E) and output enable (G) = low, WRITE enable (W) = high
tAVAV
A0-A16 VALID
tAVQV tAXQX
tELQV tEHQZ
tELQX
tGLQV tGHQZ
)
tGLQX
DQ0-DQ7 DATA OUT
( s
ct
AI01197
e t e 85 ns
ol
tELQV Chip enable low to output valid 85 ns
bs
tGLQV Output enable low to output valid 45 ns
(2)
tELQX Chip enable low to output transition 5 ns
tGLQX(2)
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Output enable low to output transition 5 ns
tEHQZ(2)
( s )
Chip enable high to output Hi-Z 40 ns
tGHQZ(2)
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Output enable high to output Hi-Z 25 ns
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tAXQX Address transition to output transition 5 ns
1.
o
Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 3.0 to 3.6 V (except where noted).
2.
r
CL = 5pF (see Figure 9).
P
e t e
s ol
O b
( s )
ct
tAVAV
A0-A16 VALID
tAVWH
d u
tAVEL
r otWHAX
tWLWH
e P
tAVWL
l e t
W
o
bs
tWLQZ tWHQX
tWHDX
-O
DQ0-DQ7 DATA INPUT
(s)
tDVWH
AI02382
Figure 7.
c t
Chip enable controlled, WRITE mode AC waveforms
d u
r o tAVAV
e P A0-A16 VALID
t
tAVEH
o l e E
tAVEL tELEH tEHAX
bs
tWLWH
O
tAVWL
tDVEH tEHDX
( s )
ns
tWHDX WRITE enable high to input transition 0
c t ns
tEHDX
tWLQZ(2)(3)
Chip enable high to input transition 15
d u ns
tAVWH
WRITE enable low to output Hi-Z
Address valid to WRITE enable high r o
75
30 ns
ns
tAVEH Address valid to chip enable high
e P 75 ns
tWHQX (2)(3) WRITE enable high to output transition
e t 5 ns
1.
ol
Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 3.0 to 3.6 V (except where noted).
s
2.
3.
CL = 5 pF (see Figure 9).
O b
If E goes low simultaneously with W going low, the outputs remain in the high impedance state.
) -
2.3 Data retention mode
c t (s
d u
With valid VCC applied, the M48Z129V operates as a conventional BYTEWIDE™ static
RAM. Should the supply voltage decay, the RAM will automatically deselect, write protecting
r o
itself when VCC falls between VPFD (max), VPFD (min) window. All outputs become high
impedance and all inputs are treated as “Don’t care”.
Note:
e P
A power failure during a WRITE cycle may corrupt data at the current addressed location,
l e t
but does not jeopardize the rest of the RAM’s content. At voltages below VPFD(min), the
memory will be in a write protected state, provided the VCC fall time is not less than tF. The
s o M48Z129V may respond to transient noise spikes on VCC that cross into the deselect
O b window during the time the device is sampling VCC. Therefore, decoupling of the power
supply lines is recommended.
When VCC drops below VSO, the control circuit switches power to the internal battery,
preserving data. The internal energy source will maintain data in the M48Z129V for an
accumulated period of at least 10 years at room temperature. As system power rises above
VSO, the battery is disconnected, and the power supply is switched to external VCC.
Deselect continues for tREC after VCC reaches VPFD(max).
For more information on battery storage life refer to the application note AN1012.
1N5817 is recommended for through hole and MBRS120T3 is recommended for surface
( s )
Schottky diode from VCC to VSS (cathode connected to VCC, anode to VSS). Schottky diode
ct
mount.
e P
t
VCC
0.1µF
o l e
DEVICE
b s VSS
O
)-
AI02169
t ( s
u c
o d
P r
e t e
o l
b s
O
3 Maximum ratings
Stressing the device above the rating listed in the absolute maximum ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the operating sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect device reliability.
du
VIO Input or output voltages –0.3 to 7 V
ro
VCC Supply voltage –0.3 to 7 V
IO
PD
Output current
Power dissipation
e P 20
1
mA
W
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1. Soldering temperature of the IC leads is to not exceed 260 °C for 10 seconds. Furthermore, the devices
s o
shall not be exposed to IR reflow nor preheat cycles (as performed as part of wave soldering). ST
recommends the devices be hand-soldered or placed in sockets to avoid heat damage to the batteries.
Caution:
b
Negative undershoots below –0.3 V are not allowed on any pin while in the battery backup
mode.
O
) -
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4 DC and AC parameters
This section summarizes the operating and measurement conditions, as well as the DC and
AC characteristics of the device. The parameters in the following DC and AC characteristic
tables are derived from tests performed under the measurement conditions listed in the
relevant tables. Designers should check that the operating conditions in their projects match
the measurement conditions when using the quoted parameters.
du
Input rise and fall times ≤5 ns
ro
Input pulse voltages 0 to 3 V
Input and output timing ref. voltages
e P 1.5 V
Note: Output Hi-Z is defined as the point where data is no longer driven.
l e t
Figure 9. AC testing load circuit
s o
DEVICE
O b 650Ω
-
UNDER
TEST
(s )
ct
CL = 100pF 1.75V
or 50pF(1)
d u
r o
e P CL includes JIG capacitance
AI03630
l e t
1. 50 pF for M48Z129V (3.3 V).
s o Table 7. Capacitance
O b Symbol
CIN
Parameter(1)(2)
Input capacitance
Min
-
Max
10
Unit
pF
CIO (3) Input / output capacitance - 10 pF
1. Effective capacitance measured with power supply at 5 V; sampled only, not 100% tested.
2. At 25 °C, f = 1 MHz.
3. Outputs deselected.
Table 8. DC characteristics
Sym Parameter Test condition(1) Min Max Unit
ILI Input leakage current 0 V ≤ VIN ≤ VCC ±1 µA
(2)
ILO Output leakage current 0 V ≤ VOUT ≤ VCC ±1 µA
ICC Supply current Outputs open 50 mA
ICC1 Supply current (standby) TTL E = VIH 4 mA
ICC2 Supply current (standby) CMOS E = VCC – 0.2 V 3 mA
VIL Input low voltage –0.3 0.6 V
VIH Input high voltage 2.2 VCC + 0.3 V
VOL Output low voltage IOL = 2.1 mA 0.4 V
VOH Output high voltage IOH = –1 mA 2.2
( sV)
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 3.0 to 3.6 V (except where noted).
c t
2. Outputs deselected.
d u
r o
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e t
s ol
O b
) -
c t (s
d u
r o
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l e t
s o
O b
VCC
VPFD (max)
VPFD (min)
VSO
tF tDR tR
tWPT
HIGH-Z
OUTPUTS VALID VALID
(PER CONTROL INPUT) (PER CONTROL INPUT)
( s )
ct
RST
AI03610
d u
r o
Table 9.
Symbol
Power down/up AC characteristics
Parameter(1)
e P Min Max Unit
o
bs
tFB(3) VPFD (min) to VSS VCC fall time 150 µs
tR VPFD (min) to VPFD (max) VCC rise time 10 µs
tRB VSS to VPFD (min) VCC rise time
- O 1 µs
)
t(s
tWPT Write protect time 40 250 µs
tREC VPFD (max) to RST high
u c 40
1. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 3.0 to 3.6 V (except where noted).
200 ms
o d
2. VPFD (max) to VPFD (min) fall time of less than tF may result in deselection/write protection not occurring until 200 µs after
VCC passes VPFD (min).
P r
3. VPFD (min) to VSS fall time of less than tFB may cause corruption of RAM data.
e t e
Table 10.
s ol Power down/up trip points DC characteristics
O b Symbol
VPFD
Parameter(1)(2)
2.7
Typ
2.9
Max
3.0
Unit
V
VSO Battery backup switchover voltage 2.45 V
(3)
tDR Expected data retention time 10 Years
1. All voltages referenced to VSS.
2. Valid for ambient operating temperature: TA = 0 to 70 °C; VCC = 3.0 to 3.6 V (except where noted).
3. At 25 °C, VCC = 0 V.
( s )
ct
A1 L C
S
e3
B e1 eA
d u
D
r o
e P
N
l e t
s
E
o
1
O b PMDIP
e P A
A1
9.27
0.38
9.52
–
0.365
0.015
0.375
–
O b D
E
42.42
18.03
43.18
18.80
1.670
0.710
1.700
0.740
e1 2.29 2.79 0.090 0.110
e3 38.1 1.5
eA 14.99 16.00 0.590 0.630
L 3.05 3.81 0.120 0.150
S 1.91 2.79 0.075 0.110
N 32 32
6 Part numbering
Device Type
M48Z
( s )
Speed
u ct
–85 = 85 ns
o d
P r
Package
e t e
PM = PMDIP32
o l
Temperature range
b s
1 = 0 to 70 °C
- O
(s )
Shipping method
c t
u
blank = ECOPACK® package, tubes
d
r o
e P
1. Device is not recommended for new design. Contact local ST sales office for availability.
For other options, or for more information on any aspect of this device, please contact the
l e t
ST sales office nearest you.
s o
O b
7 Environmental information
( s )
u ct
o d
P r
This product contains a non-rechargeable lithium (lithium carbon monofluoride chemistry)
te
button cell battery fully encapsulated in the final product.
e
o l
Recycle or dispose of batteries in accordance with the battery manufacturer's instructions
and local/national disposal and recycling regulations.
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8 Revision history
u ct
Updated Table 11, 12, footnote 1 of Table 5; added Ecopack® text to
22-Apr-2010 6
Section 5; reformatted document.
o d
23-Jun-2010 7
minor textual changes.
r
Updated Features, Table 11; added Section 7: Environmental information;
P
t e
Devices are not recommended for new design (updated cover page,
e
26-Sep-2011 8
l
Table 12); updated footnote of Table 5: Absolute maximum ratings;
o
updated Section 7: Environmental information; removed M48Z129Y.
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( s )
u ct
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t e
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e
o l
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- O
(s )
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c t
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d u
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