5.

Phased Array Test Setup and

Display Format

This chapter provides further insight into how phased array images are
constructed. In particular, it further explains required inputs, and the
relationships of the various phased array display types with respect to the
actual probe assembly and part being inspected. The chapter also explains
the typically available A-scan views associated with the phased array
image.

5.1 Instrument Setup Considerations

Figure 5-1 Typical phased array inspection using the OmniScan

As discussed previously, there are many factors that need to be identified

in order to properly perform any ultrasonic inspection. In summary, there
are material-specific characteristics and transducer characteristics needed
to calibrate the instrument for a proper inspection.

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Material
1. Velocity of the material being inspected needs to be set in order to
properly measure depth. Care must be taken to select the proper velocity
mode (longitudinal or shear). Compressional straight beam testing
typically uses longitudinal waves, while angle beam inspections most
often use shear wave propagation.
2. Part thickness information is typically entered. This is particularly
useful in angle beam inspections. It allows proper depth measurement
relative to the leg number in angle beam
applications. This also allows correct position markers on S-scans.
3. Radius of curvature should be considered when inspecting nonflat
parts. This curvature can be algorithmically accounted for to make more
accurate depth measurements.

Probe
1. The frequency must be known to allow for proper pulser
parameters and receiver filter settings.
2. Zero Offset must be established in order to offset electrical and
mechanical delays resulting from coupling, matching layer, cabling, and
electronic induced delays for proper thickness readings.
3. The amplitude response from known reflectors must be set and
available for reference in order to use common amplitude sizing
techniques.
4. Angle of sound beam entry into the material being inspected.
5. For phased array probes, the number of elements and pitch need to
be known.

Wedge
1. Velocity of sound propagation through the wedge.
2. Incident angle of the wedge.
3. Beam index point or front of probe reference. 4.
First element height offset for phased array.
In conventional ultrasonic testing, all of the above steps must be taken
prior to inspection to achieve proper results. Because a single element
probe has a fixed aperture, the entry angle selection, zero offset, and
amplitude calibration are specific to a single transducer or
transducer/wedge combination. Each time a transducer or its wedge is
changed, a new calibration must be performed.

Using phased array probes, the user must follow these same principles.
The main advantage of phased array testing is the ability to change
aperture, focus, and/or angle dynamically, essentially allowing the use of
several probes at one time. This imparts the additional requirement of
extending calibration and setup requirements to each phased array probe
state (commonly referred to as a focal law). This

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not only allows accurate measurements of amplitude and depth across
the entire programmed focal sequence, but also provides accurate and
enhanced visualization through the images that phased array instruments
produce.

One of the major differences between conventional and phased array

inspections, occurs in angle beam inspections. With conventional UT, input
of an improper wedge angle or material velocity will cause errors in
locating the defect, but basic wave propagation (and hence the resultant A-
scan) is not influenced, as it relies solely on mechanical refraction. For
phased array, however, proper material and wedge velocities, along with
probe and wedge parameter inputs, are required to arrive at the proper
focal laws to electronically steer across the desired refracted angles and to
create sensible images. In more capable instruments, probe recognition
utilities automatically transfer critical phased array probe information and
use well-organized setup libraries to manage the user selection of the correct
wedge parameters.

The following values must normally be entered in order to program a

phased array scan:

Probe parameters
• Frequency
• Bandwidth
• Size
• Number of elements
• Element pitch

Wedge parameters
• Incident angle of the wedge
• Nominal velocity of the wedge
• Offset Z = height to center of first element
• Index offset X = distance from front of wedge to first element
• Scan offset Y = distance from side of wedge to center of elements

offsetx

offset y
velocity

offset z
angle

Figure 5-2 Wedge parameters

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Focal law setup
The instrument must have the basic probe and wedge settings entered,
either manually or by using automatic probe recognition. Along with
typical UT settings for the pulser, receiver, and measurement gate setup,
the user must also set probe beam and electronic steering (focal law) values.

Required user inputs

• Material velocity
• Element quantity (the number of elements used to form the
aperture of the probe)
• Selection of the total number of elements to be used to set probe
aperture
• Element step (defines how the defined aperture moves across the
probe) for linear scans
• Desired focus depth, which must be set less than the near-field
length (N) to effectively create a focus
• Angle(s) of inspection
For S-scans, the latter parameter is expanded into three settings:
- The first angle of the scan - The last
angle of the scan
- The increment at which angles are to be stepped

5.2 Normal Beam Linear Scans

Normal beam linear scans are usually easy to conceptualize on a display
because the scan image typically represents a simple cross- sectional view
of the test piece. As described in chapter 3, a phased array system uses
electronic scanning along the length of a linear array probe to create a
cross-sectional profile without moving the probe. As each focal law is
sequenced, the associated A-scan is digitized and plotted. Successive
apertures are "stacked," creating a live cross-sectional view. The effect is
similar to a B-scan presentation created by moving a conventional single
element transducer across a test piece and storing data at selected
intervals. To gain the full advantages of linear array scanning, a minimum
of 32 elements is typically used. It is even more common to use 64
elements. More elements allow larger apertures to be stepped across the
probe, providing greater sensitivity, increased capacity of focusing, and
wider area of inspection.

In practice, this electronic sweeping is done in real time so a live part cross
section can be continually viewed as the probe is physically moved. The
actual cross section represents the true depth of reflectors in the material as
well as the actual position typically relative to the front of the probe
assembly. Figure 5-3 is an image of holes in a test block made with a 5L64-
A2, 64-element, 5 MHz linear phased array

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probe. The probe has a 0.6 mm pitch.

In this example, the user programmed the focal law to use 16 elements to
form an aperture and sequenced the starting element increments by one. So
aperture 1 consists of elements 1 through 16, aperture 2 consists of
elements 2 through 17, aperture 3 consists of elements 3 through 18, and so
on. This results in 49 individual waveforms that are stacked to create the
real-time, cross-sectional view across the probe's length.

Figure 5-3 Normal beam linear scanning

The result is an image that clearly shows the relative position of the holes
within the scan area (see Figure 5-4). The image is displayed along with the
A-scan waveform from a single selected aperture, in
this case the 30th aperture out of 49, formed from elements 30-46,
marked by the user-controlled blue cursor. This is the point where the beam
intersects the second hole.

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 Figure 5-4 Normal beam linear scan

The vertical scale at the left edge of the screen indicates the depth or
distance to the reflector represented by a given peak in the A-scan. The
horizontal scale of the A-scan indicates relative echo amplitude. The
horizontal scale under the linear scan image shows the reflector position with
respect to the leading edge of the probe, while the color scale on the right edge
of the screen relates image color to signal amplitude.

Alternately, the instrument can be set to display an "all laws" A-scan, which
is a composite image of the waveforms from all apertures. In this case, the
A-scan includes the indications from all four holes within the gated
region. This is a particularly useful mode in zero- degree inspections,
although it can also be confusing when working with complex geometries
that produce numerous echoes. In the Figure 5-5 example, the screen
shows an "all laws" A-scan in which the signals from all apertures is
summed, thus showing all three hole indications simultaneously.

Figure 5-5 Normal beam linear scan image with all laws A-scan

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Yet another A-scan source mode on some more advanced instruments
allows the A-scan to be sourced from the first or maximum signal within
the gated region.

5.3 Angle Beam Linear Scans

A linear scan can also be programmed at a single fixed angle, much like
the beam from a conventional single-element angle beam transducer. This
single-angle beam scans across the length of the probe, allowing the user to
test a larger volume of material without moving the probe (Figure 5-6). This
can cut inspection time, especially in weld scanning applications, where the
entire volume of the weld can be tested with a probe at a fixed standoff
distance.

Active group
16
1 128

Scanning direction

Figure 5-6 Single-angle beam scanning across the length of the probe

In the example of Figure 5-7, the beam is sweeping across the test piece at a
45 degree angle, intercepting each of three holes as it moves (top). The beam
index point (BIP), the point at which the sound energy exits the wedge, also
moves from left to right in each scan sequence. The A-scan display, at any
given moment, represents the echo pattern from a given aperture, while the
S-scan shows the summed view from all the beam positions (bottom).

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 Figure 5-7 Angle beam linear scan (top), with A-scan and linear scan display
(bottom)

In any angle scan not involving very thick materials, it is also necessary to
consider the actual position of reflectors that fall beyond the first leg, the
point at which the beam first reflects from the bottom of the test piece. This
is usually a factor in tests involving typical pipes or plates. In the case of
Figure 5-8, as the beam scans from left to right, the beam component from
the center of the probe reflects off the bottom of the steel plate and hits the
reference hole in the second leg.

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 Figure 5-8 Measurement to second leg reflector

The screen display has been set up to show, by means of the dotted
horizontal cursors, the positions of the end of the first leg and the end of the
second leg on the image. Thus, this hole indication, which falls between
the two horizontal cursors, is identified as being in the second beam leg.
Note that the depth scale on the left edge of the screen is accurate only for
the first leg. To use the scale beyond that, it would be necessary to subtract
the test piece thickness (in this case 25 mm) to determine the depth of
second leg indicators, or twice the test piece thickness for third leg
indicators. Most instruments are able to do this automatically and display
the result, as noted in chapter 4.

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 5.4 S-Scan Display Examples
In the case of S-scans, interpretation can be more complex because of the
possibility of multiple leg signals that have reflected off the bottom and
top of the test piece. In the first leg (the portion of the sound path up
through the first bounce off the bottom of the part), the display is a simple
cross-sectional view of a wedge-shaped segment of the test piece. However,
beyond the first leg, the display requires more careful interpretation, as it
also does when using a conventional flaw detector.

A conventional flaw detector, used with common angle beam assemblies,

displays a single-angle A-scan. Modern digital instruments use
trigonometric calculation based on measured sound path lengths and
programmed part thicknesses to calculate the reflector depth and surface
distance. Part geometry might create simultaneous first-leg and second-leg
indications on the screen, as seen here in Figure 5-9 with a 5 MHz
transducer and a 45 degree wedge. In this case, a portion of the beam
reflects off the notch on the bottom of the part and a portion reflects
upward and off the upper- right corner of the block. Leg indicators and
distance calculators can
then be used to confirm the position of a reflector (see Figure 5-10).

Figure 5-9 Conventional angle beam test

The first-leg indication is a large reflection from the notch on the bottom of
the test block. In Figure 5-10, the depth indicator (upper-left corner of screen
image) shows a value corresponding to the bottom of a 25 mm thick block,
and the leg indicator (lower-right corner of screen image) shows that this is
a first-leg signal.

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 Figure 5-10 First-leg indication

The second-leg indication is a small reflection from the upper corner of the
block. In Figure 5-11, the depth indicator shows a value corresponding to
the top of a 25 mm thick block, and the leg indicator shows that this is a
second-leg signal. (The slight variation in depth and surface distance
measurements from the expected nominal values
of 0 mm and 50 mm respectively, is due to beam spreading effects.)

Figure 5-11 Second-leg indication

When the same test is performed with a 5 MHz phased array probe
assembly scanning from 40 to 70 degrees, the display shows an S-scan

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 that is plotted from the range of angles, while the accompanying
A-scan typically represents one selected angular component of the scan.
Trigonometric calculation uses the measured sound path length and
programmed part thickness to calculate the reflector depth and surface
distance at each angle. In this type of test, part geometry might create
simultaneous first-leg and second-leg indications on the screen as well as
multiple reflectors from a single angle. Leg indicators in the form of
horizontal lines overlayed on the waveform and image segment the
screen into first, second, and third leg regions, while distance calculators
help confirm the position of a reflector.

In the Figure 5-12, Figure 5-13, and Figure 5-14 S-scan examples, we see
three indications from a single probe position as the beam sweeps through
a 40 degree to 70 degree scan. The 58 degree beam component creates a
reflection from the notch on the bottom of the test block and a first-leg
indication. The 69 degree component reflects from the bottom corner of
the block, creating another first-leg indication. Meanwhile, the 42 degree
component bounces off the bottom and top surfaces of the block and
creates another reflection from the bottom corner, that one being the third
leg.

Figure 5-12 The 58° beam component

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 Figure 5-13 The 69° beam component

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 Figure 5-14 The 42° beam component

5.5 Interpreting Reflector Positioning

Phased array instruments, like quality conventional ultrasonic flaw
detectors, offer software tools for identifying the position of defects and
other reflectors. Typically, these instruments locate: (1) a reflector in terms
of its horizontal position with respect to the probe; (2) its depth with
respect to the material surface; and (3) the sound path distance between
the beam index point and the reflector. In addition, when skip paths are
employed, the instrument should identify the skip leg in which the
reflector occurs.

First, it is important to remember that the beam index point (the point at
which the center of the sound beam exits the wedge) is a fixed location for
a conventional wedge (Figure 5-15a), and a moving point for phased array
wedges (Figure 5-15b). In the case of linear scans, the beam index point
moves progressively along the length of the probe as the scan progresses.
In the case of S-scans, different angular components exit the wedge at
different points.

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 a b

Figure 5-15 Beam index points on a conventional wedge (a) and phased array
wedge (b)

Conventional flaw detectors normally use the single beam index point of
the wedge as the reference from which depths and distances are
calculated. Because the beam index point of a phased array probe is
variable, a common way of referencing a flaw position is in relation to the
front edge of the wedge rather than the BIP. The dimensions shown in
Figure 5-16 can then be calculated from the beam
information:

RA
PA
DA

SA

Figure 5-16 Dimensions for referencing a flaw position

DA = depth of the reflector in Gate A

PA = forward position of the reflector with respect to the tip of
the wedge
RA = distance between the wedge reference point and the
reflector
SA = sound path length to the reflector
In this display format, the transition between the first and second leg
and second and third leg regions of the display, is marked by dotted
horizontal lines. In the example below, the bottom-corner reflector occurs
at the transition between the first and second leg zones (Figure 5-17), and
the top-corner reflector is at the transition between the

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second and third legs (Figure 5-18). In addition, the position readouts
at the top of the screen show the reflector's location.

Figure 5-17 Bottom corner reflector

Figure 5-18 Top corner reflector

In a sense, the screen image projects the second leg as a continuation of the
beam in a straight direction. While the beam actually reflects upward from
the bottom of the test piece, the screen image displays it
as if the beam were to continue along the same axis (see Figure 5-19).

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 Top

B0 Bottom

45°

T1 Top

Figure 5-19 Display of the second leg compared to the path in the test piece

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 Overview
The philosophy behind OmniScan
How To Easily Demo the Startup
OmniScan MX “Manual”
Tips
Suggested inspection demo:
–0° Linear Scan (with calibration)
–Angle Linear Scan
–Sectorial Scan
1

Navigation
 The OmniScan navigation is based on an essentially very
simple structure. Indeed, each parameter is classified into
a specific sub-category, which is included within a global
The OmniScan category.
Menu > Sub-Menu > Parameters
Philosophy  For instance, if the rectification display mode must be
adjusted, go to:
(1) (2) (3) RF
UT Setting > Receiver > Rectifier = HW+
HW-
FW
2
3

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 Navigation – Menu (UT Setting) Navigation – Sub-Menu (Receiver)

PA <> UT

4
5

j1

Navigation – Parameters (Rectifier) Menu Description

There are 3 different menu levels:

Setup
Inspection
Tools
6
7

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 Menu Description – Setup Menu Description – Inspection
Wizard
UT Settings  All parameters that are regularly
modified during inspection can be
 Using the Wizard menu, a complete found in this menu.
application setup can be created. This step-
Gate/Alarm  Gate position and mode, alarm
by-step approach prevents the user from conditions, and sizing curve
missing a parameter change. A very useful (DAC/TCG) parameters are available
in this menu.
online help feature gives specific information
Measurements  Manages the options related to
on the parameters to be set. various measurement options and
statistical tools
 Calibration is also an important part of the
setup creation step. Thus, the Wizard menu Display  Manages the options related to the
also includes complete step-by-step data views and the information
visible on screen
calibration assistance.9
10

Menu Description – Tools

File  Allows the user to open or save a file.
It also allows one to format and build
an inspection report.

Preferences  All parameters that are seldom

modified are available in this menu.
For example, the measurement unit
(mm or in.) is selected and kept in
memory.
Startup
PA <> UT  Used to switch between Phased Array
and Conventional UT operating
mode.

11
12

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