Focus On Imaging
Focus On Imaging
New Books
Physics Today 49, 62 (1996); https://doi.org/10.1063/1.2807591
LR-700
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NEW PRODUCTS
The descriptions of the new products listed in this section are based on
information supplied to us by the manufacturers, and in some cases by
independent sources. PHYSICS TODAY can assume no responsibility for their ULTRA LOW NOISE
accuracy. lb facilitate inquiries about a particular product, a Reader Service AC RESISTANCE BRIDGE
Card is attached inside the back cover of the magazine.
• 10 ranges .002H TO 2 MegQ
• 20 microvolts to 20 milllivolts excitation
Focus ON IMAGING •
•
•
Each excitation can be varied 0-100%
Noise equiv: 20 ohms at 300 kelvin
Dual 5'k digit displays
2x16 characters alphanumeric
• Dual 5'k digit set resistance (R, X)
Field-Emission • Can display R, AR, 10AR, X, AX, 10AX,
R-set, and X-set
Scanning Electron • 10 nano-ohms display resolution
• Mutual inductance (X) option available
Microscope • Digital noise filtering .2 sec to 30 min
• IEEE-488, RS-232, and printer output
Hitachi's S-4200 field-emission scan- • Internal temperature controller available
ning electron microscope is intended • Drives our LR-130 Temperature Controller
for studies of materials in industry and • Multiplex units available 8 or 16 sensors
research. The device's conical objective
is said to boost signal-to-noise ratio
while reducing spherical and chromatic research and development. Chromex, LINEAR RESEARCH INC.
aberrations. As a result, the micro- 2705-B Pan American Freeway NE, 5231 Cushman Place, STE 21
scope delivers 5-nanometer resolution Albuquerque, New Mexico 87107 San Diego, CA 92110 USA
•Circle number 181 on Reader Service Card VOICE 619-299-0719
at an operating voltage of 1 kilovolt FAX 619-299-0129
and can operate at longer working dis-
tances than can conventional SEMs, Circle number 39 on Reader Service Card
we are told. Alignment of the micro-
scope's aperture and column is elec- Scanning Probe
tronically controlled, and there is an and Atomic Force TheABCsofX-Y-Zs
optional computerized stage control
that preserves all settings in memory. Microscopy Software MA 1000
The S-4200 can be used with uncoated Digital Instruments has released ver-
beam-sensitive and nonconductive sion 4.2 of its Nanoscope scanning
samples, and the tip usually lasts more probe-atomic force microscopy soft-
than one year. Hitachi Scientific In- ware. This version includes routines
struments, 755 Ravendale Drive, that allow the user to measure simul- MB 2000
Mountain View, California 94043 taneously the cantilever deflection and
•Circle number 180 on Reader Service Card
the force between the cantilever and
the sample. These measurements
yield information about surface prop-
erties such as attraction, adhesion,
Imaging Spectrograph repulsion and elasticity. Digital In-
struments, 520 E. Monteato Street,
and Scanning Santa Barbara, California 93103 MC 2000
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I am interested in the following product areas and would
like to receive further information.
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3 0) Institute/Company: D Superconducting Magnet Systems
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Department: • Materials Characterisation Systems
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Address: D High Energy Pulse Magnet Systems
D Electron Microscopy Products
D Superconducting Thin Films
D Ultra Low Temperatures
•D +J Town: D Cryogenic STM Systems
C Post code/zip code: • Laboratory Cryogenics
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<T3 D Surface science, UHV and STM • X-ray spectroscopy in third generation facilities
• Materials science and metallurgy • Optical whispering gallery modes in microspheres
• Condensed matter and other solid state physics • SQUID-based resistance comparison at BEMC 95
D Semiconductor physics D High Tc work continues to expand
d) D Spectroscopy
• Physical chemistry New Products:
• MagLabCMP D MagLab System2000
o • Biophysics, biophysical chemistry, medicine
• Metrology
• Optistat
• Space science/astrophysics
• Microscopy • Very much • Quite a lot D Certain sections • Not at all
• Other physics-based areas I found the technical content:
D Biological sciences and other
D Very high • High • Just right • Low
Oxford Instrument*
OXFORD INSTRUMENTS
SCIENTIFIC RESEARCH DIVISION
OLD STATION WAY, EYNSHAM,
WITNEY, OXON, 0X8 1TL
ENGLAND