Phased Array Ut PDF
Phased Array Ut PDF
Overview
• Probe modeling
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Array Probe
A
e
A – aperture
e – element width
g – gap
L p – pitch
L – element length
p g
• An array is basically a large single element transducer,
which has been subdivided by cutting it into small segments
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A B C
Beam divergence is also a function
of frequency, lower frequencies will
give more divergence than higher.
Small Flaw
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Typical Parameters
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Electronic Focusing
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Uniform Arrays - I
Uniform Arrays - II
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Uniform Arrays - IV
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A2
Near-field to far-field distance N
4
6 dB angular beam divergence sin 0.5
A
F
Focusing power (when focusing S
option is used) N
F
Beam dimension at focal
distance (in steering plane)
d st
A
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• Steering width determined sin st 0.5 L
by element width e e
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Simulations at 5 MHz in Al
Simulations at 5 MHz in Al
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0.8
0.8
0.5 0.5
N = 16, d = /2
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Grating Lobes
For an N-element array, inter-element spacing d,
time-delay between adjacent elements , the
steering angle is given by
c
s sin 1
d
H ( ) H1 ( ) H 2 ( )
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Normal Incidence Beam Steered to 39º Focused On-axis Focused & Steered to 39º
0 0 0 0 1
Axial Distance (mm)
20 20
20 20
40 40
40 40
60 60
80 60 80 60
100 100
80 80
120 120 0
-60 -40 -20 0 20 40 60 -60 -40 -20 0 20 40 60 -60 -40 -20 0 20 40 60 -60 -40 -20 0 20 40 60
Lateral Distance (mm)
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Refraction
point X axis or Scan axis
Interface
Law scan offset
Depth
Refracted Angle
The calculator searches the Snell point. It considers the center of the active aperture
(from elements 2 to 7 in this example). Then, the X, Z point of the focal point is
determined. The wedge delay is calculated and the focal law is offset accordingly.
Interface
Time
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Tandem Scans
Phased arrays allow for dynamic scanning using the tandem technique.
Separate array groups are defined as transmit and receive "virtual
probes" and scanned to cover the test area.
This technique can be used for testing weldments in thick sections.
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Tube Inspection
Rotating water
system segment
arrays for mid-size
pipes
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5 4.8 4.7
7 7.2 7.4
Comparison of simulated and experimental B-scan images of 7-mm bottom surface crack
obtained for the various angles of incidence. (a) 35, (b) 45 and (c) 55 angle inspections
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L. Satyanarayan et al., Inverse method for detection and sizing of cracks in thin sections ..., Theor.
Appl. Fract. Mech. (2008)
AATT - Principle
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AATT Examples
PA
A
B
C
Steel specimen
Schematic
Snapshot
Scanned Images
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A 10
20
B A
30
B
20
C
40
30
C
50
60
40
70
50
80
90
Experiment 60 Simulation
10 15 20 25 30 35 40 10 15 20 25 30 35 40
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S-scan
S-scans are stacked A-scans
Examples of S-scan
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PE complements TOFD
TOFD
PE 45 SW
PE 60 SW
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Small Flaw
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Example of SAFT
Element by element pulse-echo from a 1.5 mm dia SDH in Al
100 100 100
100
200 200
200 200
300 300
300 300
400 400
400
400
RAW
500 500
Image
500
500
600 600
600
600
10 20 30 40 50 60 10 20 30 40 50 60
10 20 30 40 50 60
10 20 30 40 50 60
100
100 100 100
200
200 200 200
300
300 300 300
400
400 400 400
500
500
SAFT 500 500
600
Image
600 600 600
10 20 30 40 50 60
10 20 30 40 50 60 10 20 30 40 50 60 10 20 30 40 50 60
X: 45
1 1 Y: 0.9681
X: 27 X: 27 X: 36 1
Y: 1 Y: 1 X: 45
Y: 0.9146 X: 43 X: 25 X: 35 1
Y: 1 Y: 1 Y: 0.9315
Y: 0.9681 X: 35 X: 49
0.9 0.9 X: 44 X: 27 Y: 1 Y: 1
Y: 0.9255 Y: 0.9589
X: 24 X: 34 0.9 X: 43
X: 47
X: 29 X: 40 Y: 0.9505
Y: 0.8902 Y: 0.8171 Y: 0.9178 0.9
Y: 0.8049 Y: 0.8049 X: 36
Y: 0.9146
0.8 0.8 X: 42 X: 22
Y: 0.8298 0.8 Y: 0.8764
X: 35
0.8
Y: 0.7397
X: 40 X: 29
0.7 0.7 Y: 0.6809 Y: 0.6986
X: 32
Y: 0.6489 0.7 X: 22
Y: 0.6438
0.7
0.6
0.6 X: 27 X: 53
0.6 Y: 0.5802 Y: 0.5802
0.6
X: 36
X: 34
Y: 0.5309
0.5 Y: 0.5054 X: 18
0.5 Y: 0.4938
0.5
0.5
0.4 X: 31
0.4 X: 35
Y: 0.3422 X: 33 0.4
Y: 0.3466 0.4
Y: 0.3148
X: 36
0.3 Y: 0.2977 X: 34
0.3 X: 37 X: 37
Y: 0.254
0.3 0.3 Y: 0.2826
Y: 0.2653
X: 30
Y: 0.2619
0.2
0.2 0.2
X: 29 0.2
Y: 0.115 X: 34
X: 40 X: 32
Y: 0.1011 X: 40
Y: 0.112 X: 39 Y: 0.1241
0.1 X: 33 X: 32
Y: 0.1107
Y: 0.09162
0.1 Y: 0.0715 0.1 Y: 0.07272 0.1
0
0 10 20 30 40 50 60 70
0 0 0
0 10 20 30 40 50 60 70 0 10 20 30 40 50 60 70 0 10 20 30 40 50 60 70
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• Coupling
• Frequency, attenuation etc.
• Acoustic impedance mismatch requirements
• Dead zones
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ASME Codes
• Code cases for manual S-scans and • TOFD, PA and TOFD/PE techniques
E-scans first submitted Feb 2006. allowed
Now approved.
• Phased arrays specifically approved
• Code cases for encoded E-scans for ASME CC
and S-scans expected for August
2006. Now Approved
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