Module

8
Testing of Embedded
System
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 Lesson
39
Design for Testability
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Instructional Objectives
After going through this lesson the student would be able to

• Explain the meaning of the term ‘Design for Testability’ (DFT)

• Describe some adhoc and some formal methods of incorporating DFT in a system level
design
• Explain the scan-chain based method of DFT
• Highlight the advantages and disadvantages of scan-based designs and discuss
alternatives

Design for Testability

1. Introduction
The embedded system is an information processing system that consists of hardware and
software components. Nowadays, the number of embedded computing systems in areas such as
telecommunications, automotive electronics, office automation, and military applications are
steadily growing. This market expansion arises from greater memory densities as well as
improvements in embeddable processor cores, intellectual-property modules, and sensing
technologies. At the same time, these improvements have increased the amount of software
needed to manage the hardware components, leading to a higher level of system complexity.
Designers can no longer develop high-performance systems from scratch but must use
sophisticated system modeling tools.
The increased complexity of embedded systems and the reduced access to internal nodes has
made it not only more difficult to diagnose and locate faulty components, but also the functions
of embedded components may be difficult to measure. Creating testable designs is key to
developing complex hardware and/or software systems that function reliably throughout their
operational life. Testability can be defined with respect to a fault. A fault is testable if there
exists a well-specified procedure (e.g., test pattern generation, evaluation, and application) to
expose it, and the procedure is implementable with a reasonable cost using current technologies.
Testability of the fault therefore represents the inverse of the cost in detecting the fault. A circuit
is testable with respect to a fault set when each and every fault in this set is testable.
Design-for-testability techniques improve the controllability and observability of internal nodes,
so that embedded functions can be tested. Two basic properties determine the testability of a
node: 1) controllability, which is a measure of the difficulty of setting internal circuit nodes to 0
or 1 by assigning values to primary inputs (PIs), and 2) observability, which is a measure of the
difficulty of propagating a node’s value to a primary output (PO) [1-3]. A node is said to be
testable if it is easily controlled and observed. For sequential circuits, some have added
predictability, which represents the ability to obtain known output values in response to given
input stimuli. The factors affecting predictability include initializability, races, hazards,
oscillations, etc. DFT techniques include analog test busses and scan methods. Testability can
also be improved with BIST circuitry, where signal generators and analysis circuitry are
implemented on chip [1, 3-4]. Without testability, design flaws may escape detection until a

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product is in the hands of users; equally, operational failures may prove difficult to detect and
diagnose.
Increased embedded system complexity makes thorough assessment of system integrity by
testing external black-box behavior almost impossible. System complexity also complicates test
equipment and procedures. Design for testability should increase a system’s testability, resulting
in improved quality while reducing time to market and test costs.
Traditionally, hardware designers and test engineers have focused on proving the correct
manufacture of a design and on locating and repairing field failures. They have developed
several highly structured and effective solutions to this problem, including scan design and self
test. Design verification has been a less formal task, based on the designer’s skills. However,
designers have found that structured design-for-test features aiding manufacture and repair can
significantly simplify design verification. These features reduce verification cycles from weeks
to days in some cases.
In contrast, software designers and test engineers have targeted design validation and
verification. Unlike hardware, software does not break during field use. Design errors, rather
than incorrect replication or wear out, cause operational bugs. Efforts have focused on improving
specifications and programming styles rather than on adding explicit test facilities. For example,
modular design, structured programming, formal specification, and object orientation have all
proven effective in simplifying test.
Although these different approaches are effective when we can cleanly separate a design’s
hardware and software parts, problems arise when boundaries blur. For example, in the early
design stages of a complex system, we must define system level test strategies. Yet, we may not
have decided which parts to implement in hardware and which in software. In other cases,
software running on general-purpose hardware may initially deliver certain functions that we
subsequently move to firmware or hardware to improve performance. Designers must ensure a
testable, finished design regardless of implementation decisions. Supporting hardware-software
codesign’ requires “cotesting” techniques, which draw hardware and software test techniques
together into a cohesive whole.

2. Design for Testability Techniques

Design for testability (DFT) refers to those design techniques that make the task of subsequent
testing easier. There is definitely no single methodology that solves all embedded system-testing
problems. There also is no single DFT technique, which is effective for all kinds of circuits. DFT
techniques can largely be divided into two categories, i.e., ad hoc techniques and structured
(systematic) techniques.
DFT methods for digital circuits:
ƒ Ad-hoc methods
ƒ Structured methods:
• Scan
• Partial Scan
• Built-in self-test (discussed in Lesson 34)
• Boundary scan (discussed in Lesson 34)

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2.1 Ad-hoc DFT methods
Good design practices learnt through experience are used as guidelines for ad-hoc DFT. Some
important guidelines are given below.

Things to be followed
ƒ Large circuits should be partitioned into smaller sub-circuits to reduce test costs. One of
the most important steps in designing a testable chip is to first partition the chip in an
appropriate way such that for each functional module there is an effective (DFT)
technique to test it. Partitioning must be done at every level of the design process, from
architecture to circuit, whether testing is considered or not. Partitioning can be functional
(according to functional module boundaries) or physical (based on circuit topology).
Partitioning can be done by using multiplexers and/or scan chains.
ƒ Test access points must be inserted to enhance controllability & observability of the
circuit. Test points include control points (CPs) and observation points (OPs). The CPs
are active test points, while the OPs are passive ones. There are also test points, which are
both CPs and OPs. Before exercising test through test points that are not PIs and POs, one
should investigate into additional requirements on the test points raised by the use of test
equipments.
ƒ Circuits (flip-flops) must be easily initializable to enhance predictability. A power-on
reset mechanism controllable from primary inputs is the most effective and widely used
approach.
ƒ Test control must be provided for difficult-to-control signals.
ƒ Automatic Test Equipment (ATE) requirements such as pin limitation, tri-stating, timing
resolution, speed, memory depth, driving capability, analog/mixed-signal support,
internal/boundary scan support, etc., should be considered during the design process to
avoid delay of the project and unnecessary investment on the equipments.
ƒ Internal oscillators, PLLs and clocks should be disabled during test. To guarantee tester
synchronization, internal oscillator and clock generator circuitry should be isolated
during the test of the functional circuitry. The internal oscillators and clocks should also
be tested separately.
ƒ Analog and digital circuits should be kept physically separate. Analog circuit testing is
very much different from digital circuit testing. Testing for analog circuits refers to real
measurement, since analog signals are continuous (as opposed to discrete or logic signals
in digital circuits). They require different test equipments and different test
methodologies. Therefore they should be tested separately.

Things to be avoided
ƒ Asynchronous(unclocked) logic feedback in the circuit must be avoided. A feedback in
the combinational logic can give rise to oscillation for certain inputs. Since no clocking is
employed, timing is continuous instead of discrete, which makes tester synchronization
virtually impossible, and therefore only functional test by application board can be used.

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 ƒ Monostables and self-resetting logic should be avoided. A monostable (one-shot)
multivibrator produces a pulse of constant duration in response to the rising or falling
transition of the trigger input. Its pulse duration is usually controlled externally by a
resistor and a capacitor (with current technology, they also can be integrated on chip).
One-shots are used mainly for 1) pulse shaping, 2) switch-on delays, 3) switch-off delays,
4) signal delays. Since it is not controlled by clocks, synchronization and precise duration
control are very difficult, which in turn reduces testability by ATE. Counters and dividers
are better candidates for delay control.
ƒ Redundant gates must be avoided.
ƒ High fanin/fanout combinations must be avoided as large fan-in makes the inputs of the
gate difficult to observe and makes the gate output difficult to control.
ƒ Gated clocks should be avoided. These degrade the controllability of circuit nodes.

The above guidelines are from experienced practitioners. These are not complete or universal. In
fact, there are drawbacks for these methods:
ƒ There is a lack of experts and tools.
ƒ Test generation is often manual
ƒ This method cannot guarantee for high fault coverage.
ƒ It may increase design iterations.
ƒ This is not suitable for large circuits

2.2 Scan Design Approaches for DFT

2.2.1Objectives of Scan Design

ƒ Scan design is implemented to provide controllability and observability of internal state
variables for testing a circuit.
ƒ It is also effective for circuit partitioning.
ƒ A scan design with full controllability and observability turns the sequential test problem
into a combinational one.

2.2.2 Scan Design Requirements

ƒ Circuit is designed using pre-specified design rules.
ƒ Test structure (hardware) is added to the verified design.
• One (or more) test control (TC) pin at the primary input is required.
• Flip-flops are replaced by scan flip-flops (SFF) and are connected so that they
behave as a shift register in the test mode. The output of one SFF is connected to
the input of next SFF. The input of the first flip-flop in the chain is directly
connected to an input pin (denoted as SCANIn), and the output of the last flip-
flop is directly connected to an output pin (denoted as SCANOUT). In this way,
all the flip-flops can be loaded with a known value, and their value can be easily

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 accessed by shifting out the chain. Figure 39.1 shows a typical circuit after the
scan insertion operation.
• Input/output of each scan shift register must be available on PI/PO.
ƒ Combinational ATPG is used to obtain tests for all testable faults in the combinational
logic.
ƒ Shift register tests are applied and ATPG tests are converted into scan sequences for use
in manufacturing test.

Primary Primary
Inputs Outputs

SFF SCANOUT
Combinational
Logic
SFF

SFF

TC
SCANIN
CLK
Fig. 39.1 Scan structure to a design
Fig. 39.1 shows a scan structure connected to design. The scan flip-flips (FFs) must be
interconnected in a particular way. This approach effectively turns the sequential testing problem
into a combinational one and can be fully tested by compact ATPG patterns. Unfortunately, there
are two types of overheads associated with this technique that the designers care about very
much. These are the hardware overhead (including three extra pins, multiplexers for all FFs, and
extra routing area) and performance overhead (including multiplexer delay and FF delay due to
extra load).

2.2.3 Scan Design Rules

ƒ Only clocked D-type master-slave flip-flops for all state variables should be used.
ƒ At least one PI pin must be available for test. It is better if more pins are available.
ƒ All clock inputs to flip-flops must be controlled from primary inputs (PIs). There will be
no gated clock. This is necessary for FFs to function as a scan register.
ƒ Clocks must not feed data inputs of flip-flops. A violation of this can lead to a race
condition in the normal mode.

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2.2.4 Scan Overheads
The use of scan design produces two types of overheads. These are area overhead and
performance overhead. The scan hardware requires extra area and slows down the signals.
ƒ IO pin overhead: At least one primary pin necessary for test.
ƒ Area overhead: Gate overhead = [4 nsff/(ng+10nff)] x 100%, where ng = number of
combinational gates; nff = number of flip-flops; nsff = number of scan flip-flops; For full
scan number of scan flip-flops is equal to the number of original circuit flip-flops.
Example: ng = 100k gates, nff = 2k flip-flops, overhead = 6.7%. For more accurate
estimation scan wiring and layout area must be taken into consideration.
ƒ Performance overhead: The multiplexer of the scan flip-flop adds two gate-delays in
combinational path. Fanouts of the flip-flops also increased by 1, which can increase the
clock period.

2.3 Scan Variations

There have been many variations of scan as listed below, few of these are discussed here.
ƒ MUXed Scan
ƒ Scan path
ƒ Scan-Hold Flip-Flop
ƒ Serial scan
ƒ Level-Sensitive Scan Design (LSSD)
ƒ Scan set
ƒ Random access scan

2.3.1 MUX Scan

ƒ It was invented at Stanford in 1973 by M. Williams & Angell.
ƒ In this approach a MUX is inserted in front of each FF to be placed in the scan chain.

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 C/L
X Z

SI M FF M FF M FF SO
C
T

DI L1 L2
D Q D Q
SI
T
C
Fig. 39.2 The Shift-Register Modification approach

ƒ Fig. 39.2 shows that when the test mode pin T=0, the circuit is in normal operation mode
and when T=1, it is in test mode (or shift-register mode).
ƒ The scan flip-flips (FFs) must be interconnected in a particular way. This approach
effectively turns the sequential testing problem into a combinational one and can be fully
tested by compact ATPG patterns.
ƒ There are two types of overheads associated with this method. The hardware overhead
due to three extra pins, multiplexers for all FFs, and extra routing area. The performance
overhead includes multiplexer delay and FF delay due to extra load.

2.3.2 Scan Path

ƒ This approach is also called the Clock Scan Approach.
ƒ It was invented by Kobayashi et al. in 1968, and reported by Funatsu et al. in 1975, and
adopted by NEC.
ƒ In this approach multiplexing is done by two different clocks instead of a MUX.
ƒ It uses two-port raceless D-FFs as shown in Figure 39.3. Each FF consists of two latches
operating in a master-slave fashion, and has two clocks (C1 and C2) to control the scan
input (SI) and the normal data input (DI) separately.
ƒ The two-port raceless D-FF is controlled in the following way:
• For normal mode operation C2 = 1 to block SI and C1 = 0 →1 to load DI.
• For shift register test mode C1 = 1 to block DI and C2 = 0 →1 to load SI.

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 C2
SI

DI DO
SO

C1 L2
L1

Fig. 39.3 Logic diagram of the two-port raceless D-FF

ƒ This approach gives a lower hardware overhead (due to dense layout) and less
performance penalty (due to the removal of the MUX in front of the FF) compared to the
MUX Scan Approach. The real figures however depend on the circuit style and
technology selected, and on the physical implementation.

2.3.3 Level-Sensitive Scan Design (LSSD)

ƒ This approach was introduced by Eichelberger and T. Williams in 1977 and 1978.
ƒ It is a latch-based design used at IBM.
ƒ It guarantees race-free and hazard-free system operation as well as testing.
ƒ It is insensitive to component timing variations such as rise time, fall time, and delay. It is
faster and has a lower hardware complexity than SR modification.
ƒ It uses two latches (one for normal operation and one for scan) and three clocks.
Furthermore, to enjoy the luxury of race-free and hazard-free system operation and test,
the designer has to follow a set of complicated design rules.
ƒ A logic circuit is level sensitive (LS) iff the steady state response to any allowed input
change is independent of the delays within the circuit. Also, the response is independent
of the order in which the inputs change

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 D
C
CD +L
D 0 0 L
L L +L 0 1 L
C 1 0 0
1 1 1

Fig. 39.4 A polarity-hold latch

DI +L1
DI
C L1 +L1
SI
A
C
SI
+L2 B L2 +L2

A
B

Fig. 39.5 The polarity-hold shift-register latch (SRL)

LSSD requires that the circuit be LS, so we need LS memory elements as defined above. Figure
39.4 shows an LS polarity-hold latch. The correct change of the latch output (L) is not dependent
on the rise/fall time of C, but only on C being `1' for a period of time greater than or equal to data
propagation and stabilization time. Figure 39.5 shows the polarity-hold shift-register latch (SRL)
used in LSSD as the scan cell.
The scan cell is controlled in the following way:
• Normal mode: A=B=0, C=0 → 1.
• SR (test) mode: C=0, AB=10→ 01 to shift SI through L1 and L2.

Advantages of LSSD
1. Correct operation independent of AC characteristics is guaranteed.
2. FSM is reduced to combinational logic as far as testing is concerned.
3. Hazards and races are eliminated, which simplifies test generation and fault simulation.

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Drawbacks of LSSD
1. Complex design rules are imposed on designers. There is no freedom to vary from the
overall schemes. It increases the design complexity and hardware costs (4-20% more
hardware and 4 extra pins).
2. Asynchronous designs are not allowed in this approach.
3. Sequential routing of latches can introduce irregular structures.
4. Faults changing combinational function to sequential one may cause trouble, e.g., bridging
and CMOS stuck-open faults.
5. Test application becomes a slow process, and normal-speed testing of the entire test
sequence is impossible.
6. It is not good for memory intensive designs.

2.3.4 Random Access Scan

ƒ This approach was developed by Fujitsu and was used by Fujitsu, Amdahl, and TI.
ƒ It uses an address decoder. By using address decoder we can select a particular FF and
either set it to any desired value or read out its value. Figure 39.6 shows a random access
structure and Figure 39.7 shows the RAM cell [1,6-7].

Combinational PO
Logic
PI RAM
CK nff bite
TC SCANOUT
SCANIN

Select
Address Address
Log2 nff bites Decoder

Fig. 39.6 The Random Access structure

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 D Q
From comb. logic To comb.
SD logic
SCANIN Scan flip-flop
(SF

CK

TC

SCAN
SE OUT

Fig. 39.7 The RAM cell

ƒ The difference between this approach and the previous ones is that the state vector can
now be accessed in a random sequence. Since neighboring patterns can be arranged so
that they differ in only a few bits, and only a few response bits need to be observed, the
test application time can be reduced.
ƒ In this approach test length is reduced.
ƒ This approach provides the ability to `watch' a node in normal operation mode, which is
impossible with previous scan methods.
ƒ This is suitable for delay and embedded memory testing.
ƒ The major disadvantage of the approach is high hardware overhead due to address
decoder, gates added to SFF, address register, extra pins and routing

2.3.5 Scan-Hold Flip-Flop

ƒ Special type of scan flip-flop with an additional latch designed for low power testing
application.
ƒ It was proposed by DasGupta et al [5]. Figure 39.8 shows a hold latch cascaded with the
SFF.

ƒ The control input HOLD keeps the output steady at previous state of flip-flop.
ƒ For HOLD = 0, the latch holds its state and for HOLD = 1, the hold latch becomes
transparent.
ƒ For normal mode operation, TC = HOLD =1 and for scan mode, TC = 1 and Hold = 0.
ƒ Hardware overhead increases by about 30% due to extra hardware the hold latch.
ƒ This approach reduces power dissipation and isolate asynchronous part during scan.
ƒ It is suitable for delay test [8].

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 To SD of

next SHFF
D
Q
S
SFF
T
Q
CK

HO

Fig. 39.8 Scan-hold flip-flop (SHFF)

Partial Scan Design

ƒ In this approach only a subset of flip-flops is scanned. The main objectives of this
approach are to minimize the area overhead and scan sequence length. It would be
possible to achieve required fault coverage
ƒ In this approach sequential ATPG is used to generate test patterns. Sequential ATPG has
number of difficulties such as poor initializability, poor controllability and observability
of the state variables etc. Number of gates, number of FFs and sequential depth give little
idea regarding testability and presence of cycles makes testing difficult. Therefore
sequential circuit must be simplified in such a way so that test generation becomes easier.
ƒ Removal of selected flip-flops from scan improves performance and allows limited scan
design rule violations.
ƒ It also allows automation in scan flip-flop selection and test generation
ƒ Figure 39.9 shows a design using partial scan architecture [1].
ƒ Sequential depth is calculated as the maximum number of FFs encountered from PI line
to PO line.

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 PI PO

Combinational
circuit

CK1
FF

FF
CK2 SCANOUT
SFF
TC
SFF

SCANIN

Fig. 39.9 Design using partial scan structure

Things to be followed for a partial scan method

ƒ A minimum set of flip-flops must be selected, removal of which would eliminate all
cycles.
ƒ Break only the long cycles to keep overhead low.
ƒ All cycles other than self-lops should be removed.

3. Conclusions
Accessibility to internal nodes in a complex circuitry is becoming a greater problem and thus
it is essential that a designer must consider how the IC will be tested and extra structures will
be incorporated in the design. Scan design has been the backbone of design for testability in
the industry for a long time. Design automation tools are available for scan insertion into a
circuit which then generate test patterns. Overhead increases due to the scan insertion in a
circuit. In ASIC design 10 to 15 % scan overhead is generally accepted.

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References

[1] M. L. Bushnell and V. D Agarwal, “Essentials of Electronic Testing” Kluwer academic

Publishers, Norwell, MA, 2000.
[2] M. Abramovici, M.A. Breuer, and A.D. Friedman, “Digital Systems Testing and Testable
Design”, IEEE Press 1990.
[3] V.D. Agrawal, C.R. Kime, and K.K. Saluja, “ATutorial on Built-In Self-Test, Part 1:
Principles,” IEEE Design and Test of Computers,Vol. 10, No. 1, Mar. 1993, pp. 73-82.
[4] V.D. Agrawal, C.R. Kime, and K.K. Saluja, “ATutorial on Built-In Self-Test, Part 2:
Applications,” IEEE Design and Test of Computers, Vol. 10, No. 2, June 1993, pp. 69-77.
[5] S. DasGupta, R. G. Walther, and T. W. Williams, “ An Enhencement to LSSD and Some
Applications of LSSD in Reliability,” in Proc. Of the International Fault-Tolerant
Computing Symposium.
[6] B. R. Wilkins, Testing Digital Circuits, An Introduction, Berkshire, UK: Van Nostrand
Reinhold, 1986[RAM].
[7] T.W.Williams, editor, VLSI Testing. Amsterdam, The Netherlands: North-Holand, 1986
[RAM].
[8] A.Krstic and K-T. Cheng, Delay Fault Testing for VLSI Circuits. Boston: Kluwer
Academic Publishers, 1998.

Review Questions
1. What is Design-for-Testability (DFT)? What are the different kinds of DFT techniques
used for digital circuit testing?
2. What are the things that must be followed for ad-hoc testing? Describe drawbacks of ad-
hoc testing.
3. Describe a full scan structure implemented in a digital design. What are the scan
overheads?
4. Suppose that your chip has 100,000 gates and 2,000 flip-flops. A combinational ATPG
produced 500 vectors to fully test the logic. A single scan-chain design will require about
106 clock cycles for testing. Find the scan test length if 10 scan chains are implemented.
Given that the circuit has 10 PIs and 10 POs, and only one extra pin can be added for test,
how much more gate overhead will be needed for the new design?
5. For a circuit with 100000 gates and 2000 flip-flops connected in a single chain, what will
be the gate overhead for a scan design where scan-hold flip-flops are used?
6. Calculate the syndromes for the carry and sum outputs of a full adder cell. Determine
whether there is any single stuck fault on any input for which one of the outputs is
syndrome-untestable. If there is, suggest an implementation possibly with added inputs,
which makes the cell syndrome-testable.
7. Describe the operation of a level-sensitive scan design implemented in a digital design.
What are design rules to be followed to make the design race-free and hazard-free? What
are the advantages and disadvantages of LSSD?

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 8. Consider the random-access scan architecture. How would you organize the test data to
minimize the total test time? Describe a simple heuristic for ordering these data.
9. Make a comparison of different scan variations in terms of scan overhead.
10. Consider the combinational circuit below which has been portioned into 3 cones (two
CONE X’s and one CONE Y) and one Exclusive-OR gate.

J
A
B CONE X G
C

D K
CONE Y CONE X
H
E

For those two cones, we have the following information.

• CONE X has a structure which can be tested 100% by using the following 4 vectors and
its output is also specified.

A/G B/H C/F OUTPUT

0 0 1 0
0 1 1 0
1 1 0 1
1 0 0 1

• CONE Y has a structure which can be tested 100% by using the following 4 vectors and
its output is also specified.

C D E OUTPUT
0 0 1 0
0 1 0 1
1 0 1 1
1 1 1 0

Derive a smallest test set to test this circuit so that each partition is applied the required 4
test vectors. Also, the XOR gate should be exhaustively tested.

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Fill in the blank entries below. (You may not add additional vectors).

A B C D E F G H J K
0 0 1 1 0
0 1 1 0
1 1 0 1 1
1 0 0 1

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