Ec2354/Vlsi Design Unit 1 - Cmos Technology
Ec2354/Vlsi Design Unit 1 - Cmos Technology
6. What is Body effect (or) Define Body effect coefficient (or) What
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is substrate-bias effect?
The threshold voltage Vt is not a constant with respect to the
voltage difference between the substrate and the source of MOS
transistor. This effect is called substrate-bias effect or body effect.
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12. Give the various color coding used in stick diagram?
Green – n-diffusion
Red – poly silicon
Blue – metal
Yellow-implant
Black-contact areas.
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Delay time is the time difference between input transition (50%)
and the 50% output level. This is the time taken for a logic
transition to pass from input to output.
3. Define fall time.
Fall time is the time taken for a waveform to fall from 90% - 10%
of its steady state value.
4. Define slope rate.
The time taken for a waveform raise between 20% - 80% its
steady state value.
5. What is aspect ratio?
The thickness to width ration is known as aspect ration.
6. Define logical effect.
It defined as the ratio of the input capacitance of the gate to the
input capacitance of an inverter.
7. Define interconnect.
The wire which connects transistor is known as interconnect.
8. Why does the interconnect increase the circuit delay?
The wire capacitance adds loading to each gate.
The wire resistance adds to distribute RC delay.
9. What are the sources of design margin?
Supply voltage
Operating temperature.
Process variation.
10. What is the influence of voltage scaling on power and
delay?
Due to voltage scaling the power dissipation will be reduced
with the speed.
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Delay will be increased.
11. What is PSPICE?
PSPICE stands for simulation program with integrated circuit
emphasis. It is used to analyze the various circuits.
Percentage mode
Evaluate mode
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It can rapidly respond to small differential input voltage.
It works low switching inputs and buses.
Certain path take longer time if other path less time. This
technique is called time borrowing.
UNIT-4/CMOS TESTING
1. Mention the levels at which testing of a chip can be done?
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2. What are the categories of testing? Or need for testing?
Functionality tests
Manufacturing tests
Fault model is a model for how faults occur and their impact on
circuits.
Parallel simulation
Serial simulation
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Test access port
Test architecture
TAP Control
Instruction register
Boundary scan register
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clause. The transport delay of the inter delay model by adding the
keyword transport to the signal assignment statement.
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