EInfochips Double Patterning Technology
EInfochips Double Patterning Technology
I
n 1965 Gordon Moore, co-founder of Intel, researching various photolithographic techniques
made an observation that the number of such as extreme UV, Nano-imprint lithography and
transistors per square inch on integrated the latest directed self-assembly for nanometer
circuits doubles approximately every two years process nodes. The Extreme ultraviolet uses around
since the integrated circuit was invented. 13nm wavelength for next generation
His prediction has turned to be uncannily accurate photolithography but, unfortunately it hasn't been
as it had become a driving force in the able to intersect the industry roadmap and is
semiconductor industry for setting long-term goals expected to miss the 10nm node too. The lack of a
and targets for research and development. power source, lack of defect free masks, resist
As the semiconductor industry is racing towards technology and metrology infrastructure, have
new technology nodes, the fabs are getting a real postponed the production use of this technology.
hard time to imprint the new masks. The reason The answer to current needs is the double
being simple; Fabs are now reaching the limits of patterning technique. The DP technique will allow
the single exposure 193nm lithography for printing the fabs to continue using 193nm wavelength for
the 20 nm and below, which corresponds to a printing 20nm and below features using the current
layout minimum pitch of around 80 nm. tools and manufacturing facilities. The concept
In order to keep up with the Moores law, the fabs behind Double-patterning technology is to
must adopt lower wavelengths of light or the design breakdown the traditional layout mask of dense
must be split into two sets of alternating structures, patterns into two separate masks of sparse patterns.
each more dense than the other but utilizing the Thus, the actual manufacturing pitch in each mask
resource completely. Not to so say the resource is increased to enable higher resolution and better
being silicon over here. printability. The only additional cost is the need for a
Be it soothing and promising to hear that reducing second mask exposure for each double-patterning
the wavelength could cut our problems but in real layer.
world its quite the opposite. Scientists are There are various processes with which double
SEMICONDUCTOR DESIGN
away.
LFLE: In this technique the
first pattern is exposed onto
the silicon. The already
developed layer is then Figure 2. Double-Patterning Hotspot Due to a Wire in the Nonpreferred Direction
chemically frozen and
coated with a layer of resist. A second pattern is
Mask 1
exposed, doubling pattern density. The unprotected
silicon is engraved with the final, double-density
pattern in a single etching operation.
SADP: In this technique a dummy pattern is created
on the silicon. Around the dummy lines a film is Mask 2