Intrinsic Semiconductors: - Ideally 100% Pure Material
Intrinsic Semiconductors: - Ideally 100% Pure Material
Ideally100%purematerial
Elementalsemiconductors
Silicon(Si)
Mostcommonsemiconductorusedtoday
Germanium(Ge)
Firstsemiconductorusedinpndiodes
Compoundsemiconductors
GalliumArsenide(GaAs)
Silicon(Si)
EffectofTemperature
EnergyBandDiagram
Ev Maximumenergyofavalenceelectronorhole
Ec Minimumenergyofafreeelectron
Eg Energyrequiredtobreakthecovalentbond
MovementofHoles
A valence electron in a
nearby bond can move to
fill the broken bond,
making it appear as if the
hole shifted locations.
ExtrinsicSemiconductors
Impurityatomsreplacesomeoftheatomsin
crystal
ColumnVatomsinSiarecalleddonorimpurities.
ColumnIIIinSiatomsarecalledacceptorimpurities.
Phosphorous DonorImpurityinSi
Phosphorous (P) replaces a Si atom and forms four covalent bonds with
other Si atoms.
The fifth outer shell electron of P is easily freed to become a conduction
band electron, adding to the number of electrons available to conduct
current.
Boron AcceptorImpurityinSi
Boron (B) replaces a Si atom and forms only three covalent bonds with
other Si atoms.
The missing covalent bond is a hole, which can begin to move through
the crystal when a valence electron from another Si atom is taken to form
the fourth B-Si bond.
ElectronandHole
Concentrations
n=electronconcentration
p=holeconcentration
n-type:
n n p
2
i
p ni2 / N D
p-type:
p = NA, the acceptor concentration
n n / NA
2
i
DriftCurrents
DiffusionCurrents
p-n Junctions
A simplified 1-D sketch of a p-n
junction (a) has a doping profile
(b).
The 3-D representation (c) shows
the cross sectional area of the
junction.
BuiltinPotential
This movement of
carriers creates a
space charge or
depletion region
with an induced
electric field near
x = 0.
A potential
voltage, vbi, is
developed across
the junction.
ReverseBiasedpnjunction
ForwardBiasedpnJunction
MinorityCarrierConcentrations
CurrentVoltage(IV)
Characteristics
The p-n junction only
conducts significant
current in the forwardbias region.
iD is an exponential
function in this region.
Essentially no current
flows in reverse bias.
Diode Equation
A fit to the I-V characteristics of a diode yields the
following equation, known as the ideal diode
equation:
qv
I D I s (e
nkT
1)
I D I s (e
vD
VT
1)
DiodeEquation
log e
log(iD )
vD log( I s )
nVT
The y intercept is equal to IS.
The slope is proportional to 1/n.
When n = 1, iD increased by ~ one
order of magnitude for every 60-mV
increase in vD.
CircuitSymbol
Anode
Cathode
Anode
Cathode
BreakdownVoltage
The magnitude of the
breakdown voltage (BV)
is smaller for heavily
doped diodes as
compared to more lightly
doped diodes.
Current through a diode
increases rapidly once
breakdown has occurred.
TransientResponse
DCModelofIdealDiode
Equivalent Circuits
Assumes vbi = 0.
No current flows when reverse biased (b).
No internal resistance to limit current when forward biased (c).
HalfWaveDiodeRectifier
LoadLineAnalysis
The x intercept of the load line is
the open circuit voltage and the
y intercept is the short circuit
current.
The quiescent point or Q-point is
the intersection of diode I-V
characteristic with the load line.
I-V characteristics of diode must
be known.
PiecewiseLinearModel
Two linear
approximations are
used to form piecewise
linear model of diode.
DiodePiecewiseEquivalent
Circuit
Qpoint
The x intercept of the load line is the open circuit voltage and the
y intercept is the short circuit current.
The Q-point is dependent on the power supply voltage and the
resistance of the rest of the circuit as well as on the diode I-V
characteristics.
LoadLine:ReverseBiasedDiode
EquivalentCircuits
SmallSignalEquivalentModel
Simplified model,
which can only be
used when the
diode is forward
biased.
Complete model
ExcessCarriers
Valenceelectronsmayacquiresufficientenergyto
breakcovalentbondsandbecomefreeelectrons (eg.
duetointeractionwithphotonsoracquiringheat)
n=no+n
p=po+p
Where,
noandpo arethermalequilibriumconcentrationofelectrons
andholes
nandpareexcesselectronandholeconcentration
Electronholerecombination>Steadystate
(excesscarrierlifetime)
IntrinsicCarrierConcentration
ni BT e
32
Eg
2 kT
ElectronandHoleConcentrations
n=electronconcentration
p=holeconcentration
n-type:
n n p
2
i
p ni2 / N D
p-type:
p = NA, the acceptor concentration
n n / NA
2
i
DriftCurrentDensities
Jn=qnvdn=qn(nE)=+qnnE
Jp=qnvdp=qn(+pE)=qnpE
J=Jn +Jn =E
Where,
Jn=Driftcurrentdensityofelectrons(A/cm2)
Jp=Driftcurrentdensityofholes(A/cm2)
q=Magnitudeofelectroniccharge(1.6021019 C)
n=Electronconcentration(/cm3)
p=Holeconcentration(/cm3)
Vdn=Driftvelocityofelectrons(cm/s)
Vdp=Driftvelocityofholes(cm/s)
n=Mobilityofelectron(1350cm2/Vs)
n=Mobilityofelectron(480cm2/Vs)
=Conductivity
DiffusionCurrentDensities
Jn=qDn(dn/dx)
Jn=qDp(dp/dx)
Dn/n=Dp/p=kT/q0.026V
Where,
Jn=Diffusioncurrentdensityofelectrons
Jn=Diffusioncurrentdensityofholes
Dn=Electrondiffusioncoefficient
Dp=Holediffusioncoefficient
p-n Junctions
A simplified 1-D sketch of a
p-n junction (a) has a doping
profile (b).
Builtinpotentialbarrier
Vbi=(kT/e)ln(NaNd/ni2)=VT ln (NaNd/ni2)
=0.7V(Si)or0.3V(Ge)
Where
VT=0.026Visthermalvoltage
Diode Equation
A fit to the I-V characteristics of a diode yields the
following equation, known as the ideal diode
qv D
equation:
I D I s (e
nkT
1)
I D I s (e
VT
1)
ACDiodeCircuitAnalysis
EquivalentCircuit(DC)
DiodebasedThermometer
Use of temperature dependence of the
forward-bias characteristics to design a
simple electronic thermometer.
ZenerDiode
IVCharacteristics
Circuit Symbol
Diodepackages
Through-hole packages
(medium to high ID)