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Mansour Keramat: Electrical & Computer Engineering Department University of Connecticut

This document discusses data converters and their testing. It introduces analog-to-digital (A/D) converters and digital-to-analog (D/A) converters which are needed for interfacing digital signal processing with analog signals. Different types of converter architectures are described that offer tradeoffs between speed and resolution. Testing of data converters is also covered, including static and dynamic testing methods and built-in self-test architectures. The document is intended to cover design and testing of data converters.

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Thomas George
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54 views

Mansour Keramat: Electrical & Computer Engineering Department University of Connecticut

This document discusses data converters and their testing. It introduces analog-to-digital (A/D) converters and digital-to-analog (D/A) converters which are needed for interfacing digital signal processing with analog signals. Different types of converter architectures are described that offer tradeoffs between speed and resolution. Testing of data converters is also covered, including static and dynamic testing methods and built-in self-test architectures. The document is intended to cover design and testing of data converters.

Uploaded by

Thomas George
Copyright
© © All Rights Reserved
Available Formats
Download as PDF, TXT or read online on Scribd
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Logic Analyzer

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Clock
Generator

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GPIB Bus

Mansour Keramat
Electrical & Computer Engineering Department
University of Connecticut
Fall 2000

Computer

Design and Test of


Data Converters

Fall 2000

Mansour Keramat
Electrical & Computer Engineering Department
University of Connecticut

Contents
Introduction
Part I:
Applications of Data Converters
1.1.

Why Data Converters

1.2.

Wireless Communications

1.3.

Wired Digital Communications

1.4.

Voiceband Digital Communications

1.5.

Smart Sensors

1.6.

Data Storage

1.7.

Digital Imaging

1.8.

Video Systems

1.9.

Test of Integrated Circuits

1.10.

Motor Control

1.11.

Digital Control

1.12.

References and Further Reading

Part II:
Design of Track and Hold
2.1.

Types of Analog Input Signals

2.2.

Signal Conditioning

2.3.

Bandwidth Issues

2.4.

Sampling Theory

2.5.

Simple Track and Hold Circuits

2.6.

Performance Measures of Track and Hold

2.7.

NMOS Switches

2.8.

Bottom-Plate Sampling

2.9.

Bootstrapped Switch

2.10.

CMOS Switches

2.11.

Diode Switches

2.12.

Practical Track and Hold Implementations

2.13.

References and Further Reading

Part III:
Nyquist Rate Analog-to-Digital Converters
3.1.

General Usage of Analog-to-Digital Converters

3.2.

Input/Output Characteristic

3.3.

Signal-to-Noise Ratio (SNR)

3.4.

Static Performances of ADCs

3.5.

Dynamic Performances of ADCs

3.6.

Flash A/D Architecture

3.7.

Bipolar and CMOS Comparators

3.8.

Subranging A/D Architecture

3.9.

Pipelined A/D Architecture

3.10.

Non-Ideal Effects in Pipelined Architecture

3.11.

Op-Amp Issues

3.12.

Commercial Flash/Pipelined ADCs

3.13.

Folding and Interpolating Architecture

3.14.

Interpolation Techniques

3.15.

Folding Techniques

3.16.

Successive Approximation ADC

3.17.

Recycling A/D Architecture

3.18.

Interleaved Architecture

3.19.

MATLAB Toolbox for Data Converters

3.20.

References and Further Reading

Part IV:
Oversampling A/D Converters
4.1.

Advantages of Sigma-Delta Architecture

4.2.

History of Sigma-Delta Converters

4.3.

Conventional and Oversampling ADC

4.4.

Advantages of Oversampling

4.5.

Block Diagram of Sigma-Delta Converters

4.6.

Simulation Tool of Sigma-Delta Converters

4.7.

First Order Continuous-Time Modulators

4.8.

Resolution of Sigma-Delta Converters

4.9.

Discrete- and Continuous-Time Modulators

4.10.

Equivalent Discrete-Time for Continuous-Time Filters

4.11.

High-Speed Second Order Sigma-Delta Modulator

4.12.

Modeling of Quantizer

4.13.

Notion of Quantizer Linearization

4.14.

Effect of Dither Frequency on In-Band-Noise (IBN)

4.15.

Describing Function (DF) Method

4.16.

Generalized Describing Function Method

4.17.

Prediction of Oscillations by Root Locus

4.18.

Effect of Delay on Quantizer Gain

4.19.

Effect of Delay on Limit Cycle

4.20.

Effect of Delay on Resolution

4.21.

Compensation of Loop Delay

4.22.

Decimation Filter

4.23.

References and Further Reading

Part V:
Digital-to-Analog Converters
5.1.

Reconstruction of Analog Signals

5.2.

Ideal Digital-to-Analog Converters

5.3.

DAC Output

5.4.

Multiplying DAC (MDAC)

5.5.

DAC Transfer Function

5.6.

DAC Inherent Distortion

5.7.

Static Performance of a DAC

5.8.

Dynamic Performance of a DAC

5.9.

Resistor Ladder Architecture

5.10.

Current Steering Architectures

5.11.

DAC with Differential Output

5.12.

Architecture of a Communication DAC

5.13.

Differential-to-Single Ended Output

5.14.

Tips for Op-Amp Selection

5.15.

Commercial DACs

5.16.

Charge Redistribution Architectures

5.17.

Sigma-Delta Architecture

5.18.

Interpolation Filter

5.19.

Noise Shaping Filter

5.20.

Decimation Filters

6.1.

References and Further Reading

Part VI:
Test of Data Converters
6.2.

Test Goals

6.3.

Test of Different Types of Circuits

6.4.

Analog and Mixed Signal Test Issues

6.5.

Built-In-Self-Test (BIST)

6.6.

Importance of Test Methodology

6.7.

Errors of Test Setup

6.8.

Introduction to Static Testing

6.9.

Ramp Test Method

6.10.

Servo-Loop Test

6.11.

Result of Static Testing

6.12.

Introduction to Dynamic Testing

6.13.

Histogram Testing

6.14.

Fast Fourier Transform (FFT) Testing

6.15.

Pulse Test

6.16.

References and Further Reading

Introduction
Analog-to-digital (A/D) converters and digital-to-analog (D/A) converters are needed in
all Digital Signal Processing (DSP) applications, which interface with the analog signal.
As DSP continues to gain ground over analog signal processing, the importance of these
converters increases correspondingly. The high-speed and high-resolution A/D converters
are required in numerous applications, such as wireless communications, ADSL, and
VDSL systems. Two key performance criteria are sampling rate and precision or bit
resolution. In general case, we deal with a trade-off between these criteria. Different
types of converter architectures offer system designers a range of choices in speed and
resolution for optimal use in their applications. Among the choices in A/D architectures
are flash, pipeline, successive-approximation register (SAR), and sigma-delta converters.
D/A architectures include resistorstring converters, current-mode converters, and wellknown sigma-delta converters that are used in high resolution applications. In addition,
the test of the data converters is becoming more and more important issue in mixed signal
applications. The test of A/D and D/A converters can be carried out by using the DSP
unit. Some mixed mode test architectures like Built-In-Self -Test (BIST) are described.

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