Texas Instruments. Testing A Form of SMPS
Texas Instruments. Testing A Form of SMPS
Contents Off-Line SMPS Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SolutionCommon Power Supply Failures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Testing and Repair . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Negative Voltage Output Too High . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Output Capacitor Replacements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Output Diode Replacements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Substitute Diodes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . List of Figures 1 2 3 4 Typical Line Switch-Mode Power Converter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . The Push-Pull Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Typical Waveform at the Input and Output of the Driver Transistors in Continuous Mode . . . . . . . . . . Discontinuous-Mode Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 3 4 4 2 4 5 6 6 6 6 6
SLVA085
SLVA085
Switch 240 V AC Filter Fuse Rectifier Reservoir Capacitor
Transformer
Rectifier
Filter Fuse
Output
Isolation Barrier
Feedback
Figure 2 shows the ac and dc power paths with synchronous transistor switching elements. T1 typifies the line isolation and the output buck elements of D2, D3, L1, and C3.
+ C1 VI C2 Q2 PWM Control IC C3 Q1 N1 N1 T1 n:1 N2 N2 D2 LL RL VO D1
Figure 2. The Push-Pull Circuit The more common failure modes result from the power switching devices and from passive components associated with the power supplies. Typically, failure modes do not reside in these small control signalsthey are low voltage devices. These switching signals should still be checked to assure proper operation. A check of the PWM control signal at the base of the power transistor using a scope probe is a good way to verify the operation of the PWM controller. WARNING: Care should be taken when probing the primary-side components in an off-line power supply, since lethal voltages are present at these nodes. Isolation of ac-powered test equipment should also be required. Care should also be taken not to load these nodes during test: using a low-capacitance scope probe is best. Even low capacitance probes can affect the waveform. Figure 3 displays the typical waveform at the input and output of these driver transistors in continuous mode. Figure 4 displays the discontinuous-mode waveform, and describes the contributions due to various components. In Figure 3, channel 2 is the switching voltage at the collector of one of the power devices driving current into the transformer. The lower waveform of channel 1 is the actual gate signal applied by the control IC. In this case, the dc offset of this signal is 146 V.
SLVA085
Figure 3. Typical Waveform at the Input and Output of the Driver Transistors in Continuous Mode In Figure 4, the drain-to-source voltage drops to Vsat when FET is on and the inductor current increases. When the FET is turned off, the inductor current must continue to flow somewhere; as a result, the drain-to-source voltage rises to forward bias the output diode (Vo + Vdiode) as the inductor current discharges to zero. When the inductor is fully discharged, the drain node is floating and the voltage rings due to parasitic currents, eventually returning to the input voltage.
SLVA085
This is the common failure mode for a bipolar transistor P-N junction during a short-load event. The high current seen at the device junction displays a typical failure mechanism. During this overcurrent, the junction depletion regions grow so large that the majority carriers occupy both doped regions, creating a very low resistive region. The heat generated can cause a thermal runaway condition. This first failure state is thus the short circuit of the P-N, base-collector junction. This transistor failure is often caused by bad capacitors. It is extremely common to find output filter capacitors that are swollen or leaking electrolytic material. Any capacitor that is swollen or leaking should be replaced. The output filter capacitors are part of the stabilization network for the power supply and should be replaced only with equivalent components to insure reliable operation. Diode failure is another common problem. There are several diodes in a switching supply, and failure of any one of them can cause the supply to blow the fuse or to shut down. The most common diode failures are shorted 12-V or 5-V output rectifiers. Failure of these diodes will not blow the fuse. The supply simply detects the short and shuts itself down.
SLVA085
Substitute Diodes
The 12-V output diodes are usually rated at 3 amps. The 5-V output diodes are often similar. Good engineering practice dictates that high speed, fast-recovery diodes be used in this circuit. Normal diodes have been found to fail prematurely due to their higher switching losses and subsequent thermal stress, and as such they are unacceptable as substitutions.
Conclusion
Understanding the dead SMPS and the suspect power device stages helps provide clues about the causes of failure. The process simplifies as you work on understanding these power supplies weak links. This work is worth the effort when you consider that many power supply repairs are brought about by the replacement of a single diode or transistor.
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