Abstract

Hollow waveguides operating near 550 nm wavelength were fabricated by guided formation of delamination buckles within ${\mathrm{Ta}}_2{\mathrm{O}}_5/{\mathrm{SiO}}_2$ multilayers. The fabrication process employed a pair of sequentially deposited 10-period Bragg mirrors separated by a patterned, low-adhesion fluorocarbon layer. Propagation loss as low as a few dB/cm was measured, consistent with theoretical predictions.

© 2016 Optical Society of America

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