eprintid: 96235
rev_number: 9
eprint_status: archive
userid: 16852
dir: disk0/00/09/62/35
datestamp: 2014-08-20 14:02:54
lastmod: 2021-09-23 23:07:30
status_changed: 2014-08-20 14:02:54
type: book_section
metadata_visibility: show
item_issues_count: 1
creators_name: Mezosi, Gábor
creators_name: Sorel, Marc
creators_orcid: 0000-0001-8365-4496
title: Semiconductor micro-ring lasers
ispublished: pub
divisions: 30305000
abstract: This chapter is concerned with the design, fabrication, and characterization of deeply-etched III–V semiconductor ring lasers (SRL) whose radius is scaled down to sub-10 µm values. The laser threshold performances are experimentally investigated for different laser geometries. Compact racetrack-shape SRLs are shown to exhibit robust unidirectional bistable operation with direct extinction ratio and single mode rejection ratio of 20 and 30 dB, respectively.
date: 2014-04-25
date_type: published
publisher: Wiley-VCH
id_number: 10.1002/9783527655342.ch6
official_url: http://dx.doi.org/10.1002/9783527655342.ch6
chapter: 6
uniqueid: glaseprints:2014-96235
full_text_status: none
place_of_pub: Weinheim
pagerange: 231-256
pages: 302
isbn: 9783527655342
book_title: Compact Semiconductor Lasers
editors_name: De La Rue, Richard
editors_name: Siyuan, Yu
editors_name: Lourtioz, Jean-Michel
related_url_url: https://eleanor.lib.gla.ac.uk/record=b3063788
related_url_type: library
hoa_date_pub: 2014-04-25
hoa_exclude: FALSE
hoa_gold: FALSE
citation:    Mezosi, Gábor <https://eprints.gla.ac.uk/view/author/5745.html> and Sorel, Marc <https://eprints.gla.ac.uk/view/author/10351.html>  (2014)  Semiconductor micro-ring lasers.    In: De La Rue, Richard, Siyuan, Yu and Lourtioz, Jean-Michel (eds.) Compact Semiconductor Lasers.   Wiley-VCH: Weinheim, pp. 231-256.  ISBN 9783527655342 (doi: 10.1002/9783527655342.ch6 <https://doi.org/10.1002/9783527655342.ch6>)