eprintid: 54026 rev_number: 20 eprint_status: archive userid: 4757 dir: disk0/00/05/40/26 datestamp: 2011-08-24 15:31:32 lastmod: 2025-05-01 17:44:29 status_changed: 2011-08-24 15:31:32 type: article metadata_visibility: show item_issues_count: 0 creators_name: Ding, W. creators_name: Gorbach, A.V. creators_name: Wadsworth, W.J. creators_name: Knight, J.C. creators_name: Skryabin, D.V. creators_name: Strain, M. creators_name: Sorel, M. creators_name: De La Rue, R.M. creators_orcid: 0000-0001-8365-4496 creators_orcid: 0000-0001-9544-0647 title: Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique ispublished: pub divisions: 30305000 abstract: We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion. date: 2010-12-06 date_type: published publisher: Optical Society of America id_number: 10.1364/OE.18.026625 uniqueid: glaseprints:2010-54026 issn_online: 1094-4087 scopus_impact: 6 scopus_cluster: 2-s2.0-78650067612 scopus_datestamp: 2013-10-26 03:57:12 wos_impact: 5 wos_cluster: WOS:000285749500119 wos_datestamp: 2013-10-25 06:45:07 full_text_status: none publication: Optics Express volume: 18 number: 25 pagerange: 26625-26630 refereed: TRUE issn: 1094-4087 hoa_compliant: 305 hoa_date_pub: 2010-12-06 hoa_exclude: FALSE hoa_gold: FALSE citation: Ding, W., Gorbach, A.V., Wadsworth, W.J., Knight, J.C., Skryabin, D.V., Strain, M. , Sorel, M. and De La Rue, R.M. (2010) Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique. Optics Express , 18(25), pp. 26625-26630. (doi: 10.1364/OE.18.026625 )