%0 Journal Article
%@ 1094-4087
%A Ding, W.
%A Gorbach, A.V.
%A Wadsworth, W.J.
%A Knight, J.C.
%A Skryabin, D.V.
%A Strain, M.
%A Sorel, M.
%A De La Rue, R.M.
%D 2010
%F enlighten:54026
%I Optical Society of America
%J Optics Express
%N 25
%P 26625-26630
%R 10.1364/OE.18.026625
%T Time and frequency domain measurements of solitons in subwavelength silicon waveguides using a cross-correlation technique
%U https://eprints.gla.ac.uk/54026/
%V 18
%X We report time domain measurements of the group-velocity-dispersion-induced and nonlinearity-induced chirping of femtosecond pulses in subwavelength silicon-on-insulator waveguides. We observe that at a critical input power level, these two effects compensate each other leading to soliton formation. Formation of the fundamental optical soliton is observed at a peak power of a few Watts inside the waveguide. Interferometric cross-correlation traces reveal compression of the soliton pulses, while spectral measurements show pronounced dispersive waves emitted by solitons into the wavelength range of normal group velocity dispersion.